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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: 2SJ494
MANUFACTURER: NEC
Body Diode (Model Parameters) / ESD Protection Diode




                   Bee Technologies Inc.




     All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
MOSFET MODEL

Pspice model
                                      Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Modility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Transconductance Characteristic

Circuit Simulation Result



        15


        13


        11


        9
  gfs




        7


        5


        3                                                               Measurement
                                                                        Simulation
        1
             0              2             4              6             8              10
                                      - ID - Drain Current - A

Comparison table


                                               gfs
        Id(A)                                                                      Error(%)
                           Measurement                   Simulation
                 -0.2                     1.667                      1.667             0.000
                 -0.5                     3.300                      3.333             1.000
                   -1                     5.250                      5.263             0.248
                  -2                      7.650                      7.692             0.549
                  -5                     11.350                     11.364             0.123
                 -10                     15.350                     15.385             0.228




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Vgs-Id Characteristic

Circuit Simulation result

    -100A




    -1.0A




   -200mA
            0V                            -5V                  -10V                -15V
                 I(V3)
                                                V_V1
Evaluation circuit


                                                          V3


                                                               0Vdc



                                                    U13
                                                                       V2
                                                    2SJ494
                                     V1                               -10


                                 0




                                                0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Comparison Graph

Circuit Simulation Result
                               10
                                                                                                   Measurement
                                                                                                   Simulation
    - ID - Drain Current - A




                                1




                               0.1
                                     0.0                                  5.0                                   10.0
                                                           - VGS - Gate to Source Voltage - V
Simulation Result


                                                                    VGS(V)
                               ID(A)                                                                   Error (%)
                                                  Measurement                   Simulation
                                      -0.2                     -1.800                     -1.833                1.833
                                      -0.5                     -1.900                     -1.931                1.632
                                        -1                     -2.000                     -2.044                2.200
                                           -2                  -2.200                     -2.200                0.000
                                        -5                     -2.550                     -2.526                -0.941
                                       -10                     -2.900                     -2.911                0.379




                                            All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Rds(on) Characteristic

Circuit Simulation result
    -10A




     -5A




      0A
           0V                 -100mV             -200mV        -300mV       -400mV
                I(VD_Sense)
                                                 V_VDS
Evaluation circuit

                                                 VD_Sense


                                                    0Vdc



                                           U13

                                           2SJ494
                                                              VDS
                              VGS                             10Vdc

                              -10Vdc




                                       0



Simulation Result

      ID=-10A, VGS=-10V                Measurement            Simulation            Error (%)
                R DS (on)                            0.039             0.039               0



                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Gate Charge Characteristic
Circuit Simulation result
       -14V



       -12V



       -10V



        -8V



        -6V



        -4V



        -2V



         0V
              0                      -20n               -40n                -60n                  -80n
                  V(W1:4)
                                                      Time*-1mA
Evaluation circuit


                                       ION = 0uA
                                       IOFF = 1mA
                                       W                           U13
                                            -
                                            +                     2SJ494
                  I1 = 0               W1                                          D2       I2
                                I1                                                 Dbreak   20
                  I2 = 1m
                  TD = 0
                  TR = 10n                                                                   V1
                  TF = 10n
                  PW = 600u
                  PER = 1000u                                                                -48



                                0


Simulation Result

     VDD=-48V,ID=-20A                  Measurement                Simulation            Error (%)
        ,VGS=-10V
         Qgs (nC)                                   12.000                 12.069                  0.575
         Qgd(nC)                                    16.000                 16.035                  0.219
          Qg(nC)                                    74.000                 51.724                -30.103


                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Capacitance Characteristic


                                                           Measurement
                                                           Simulation




Simulation Result

                                    Cbd(pF)
           VDS(V)                                              Error(%)
                          Measurement        Simulation
                    0.1            2000               1995         -0.250
                    0.2            1800               1803          0.167
                    0.5            1500               1507          0.467
                      1            1250               1255          0.400
                      2            1000               1004          0.400
                      5             740                740          0.000
                     10             570                570          0.000
                     20             450                447         -0.667
                     50             310                308         -0.645




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Switching Time Characteristic

Circuit Simulation result
          -12V




           -8V




           -4V




            0V
           1.815us  1.900us    2.000us                   2.100us       2.200us   2.300us 2.400us
                V(L1:2)   V(L2:1)/3
                                                           Time
Evaluation circuit

                                                                        L2       R2
                                                                        50nH     3




                                           RG     L1
                                                                        U13

                     PER = 20u                                          2SJ494
                     PW = 1u                      30nH                                    V1
                     TF = 1n          10                                                  -30Vdc
                     TR = 1n                     R1
                     TD = 2u
                     V2 = 20     V2               10
                     V1 = 0




                                                                   0


Simulation Result

       ID=-10A, VDD=-30V
                                       Measurement                 Simulation         Error(%)
           VGS=0/-10V
            Ton(ns)                             25.000                 25.059              0.236



                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Output Characteristic

Circuit Simulation result
      -20A

                       -4V
      -18A


      -16A


      -14A

                                                                         -3.00V
      -12A


      -10A


       -8A


       -6A


       -4A


       -2A                                                               VGS=-2.00V


        0A
             0V      -2V     -4V   -6V    -8V       -10V       -12V    -14V       -16V   -18V -20V
                  I(V3)
                                                    V_V2

Evaluation circuit


                                                          V3


                                                                0Vdc




                                                    U13
                                                                              V2
                                                    2SJ494
                                                                              0
                                    V1


                                   -4




                                                0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Output Characteristic                                           Reference




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
BODY DIODE
Forward Current Characteristic

Circuit Simulation Result
      100A




       10A




      1.0A




     100mA
             0V                         1.0V                2.0V                   3.0V
                  I(VD_Sense)
                                                 V_VDS
Evaluation Circuit



                                               VD_Sense


                                               0Vdc




                                 VDS                                 U13
                                10Vdc
                                                                     2SJ494




                                                                0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Comparison Graph

Circuit Simulation Result

                                   100.000
                                                     Measurement
                                                     Simulation
   -Drain reverse current IDR(A)




                                    10.000




                                     1.000




                                     0.100
                                          0.00   0.20    0.40   0.60   0.80   1.00   1.20   1.40   1.60   1.80    2.00

                                                                - Source-Drain voltage VSD(V)

Simulation Result


                                                          VDS(V)                      VDS(V)
                                   IDR(A)               Measurement                  Simulation                  %Error
                                        -0.1                     -0.625                      -0.613                 -1.920
                                        -0.2                     -0.640                      -0.637                 -0.469
                                        -0.5                     -0.670                      -0.674                  0.597
                                           -1                    -0.700                      -0.711                  1.571
                                           -2                    -0.750                      -0.760                  1.333
                                           -5                    -0.850                      -0.851                  0.118
                                          -10                    -0.950                      -0.953                  0.316
                                          -20                    -1.125                      -1.127                  0.178




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Reverse Recovery Characteristic

Circuit Simulation Result
        400mA



        300mA



        200mA



        100mA



         -0mA



       -100mA



       -200mA



       -300mA



       -400mA
           0.4us 0.6us   0.8us     1.0us       1.2us   1.4us     1.6us   1.8us     2.0us   2.2us
               I(R1)
                                                       Time

Evaluation Circuit

                                                       R1


                                                            50



                                                                             U15
                            V1 = -9.4v    V1
                            V2 = 10.6v                                       2SJ494
                            TD = 92n
                            TR = 10ns
                            TF = 15ns
                            PW = 1us
                            PER = 100us




                                                                         0




Compare Measurement vs. Simulation

        Trr(ns)          Measurement                             Simulation                  Error (%)
        Trj+Trb                 291.000                                291.914                     0.314




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Reverse Recovery Characteristic                                        Reference




Trj=22.000(ns)
Trb=269.000(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
ESD PROTECTION DIODE
Zener Voltage Characteristic
Circuit Simulation Result
    10mA


     9mA


     8mA


     7mA


     6mA


     5mA


     4mA


     3mA


     2mA


     1mA


      0A
           0V       5V   10V     15V   20V             25V   30V         35V   40V   45V   50V
                I(R1)
                                                   V_V1


Evaluation Circuit


                                             R1



                                        0.01m




                                 V1
                          0Vdc
                                                  R2
                                                                   U29
                                        100MEG
                                                              2SJ494

                                 0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2007

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SPICE MODEL of 2SJ494 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameters) PART NUMBER: 2SJ494 MANUFACTURER: NEC Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 2. MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 3. Transconductance Characteristic Circuit Simulation Result 15 13 11 9 gfs 7 5 3 Measurement Simulation 1 0 2 4 6 8 10 - ID - Drain Current - A Comparison table gfs Id(A) Error(%) Measurement Simulation -0.2 1.667 1.667 0.000 -0.5 3.300 3.333 1.000 -1 5.250 5.263 0.248 -2 7.650 7.692 0.549 -5 11.350 11.364 0.123 -10 15.350 15.385 0.228 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 4. Vgs-Id Characteristic Circuit Simulation result -100A -1.0A -200mA 0V -5V -10V -15V I(V3) V_V1 Evaluation circuit V3 0Vdc U13 V2 2SJ494 V1 -10 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 5. Comparison Graph Circuit Simulation Result 10 Measurement Simulation - ID - Drain Current - A 1 0.1 0.0 5.0 10.0 - VGS - Gate to Source Voltage - V Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation -0.2 -1.800 -1.833 1.833 -0.5 -1.900 -1.931 1.632 -1 -2.000 -2.044 2.200 -2 -2.200 -2.200 0.000 -5 -2.550 -2.526 -0.941 -10 -2.900 -2.911 0.379 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 6. Rds(on) Characteristic Circuit Simulation result -10A -5A 0A 0V -100mV -200mV -300mV -400mV I(VD_Sense) V_VDS Evaluation circuit VD_Sense 0Vdc U13 2SJ494 VDS VGS 10Vdc -10Vdc 0 Simulation Result ID=-10A, VGS=-10V Measurement Simulation Error (%) R DS (on)  0.039 0.039 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 7. Gate Charge Characteristic Circuit Simulation result -14V -12V -10V -8V -6V -4V -2V 0V 0 -20n -40n -60n -80n V(W1:4) Time*-1mA Evaluation circuit ION = 0uA IOFF = 1mA W U13 - + 2SJ494 I1 = 0 W1 D2 I2 I1 Dbreak 20 I2 = 1m TD = 0 TR = 10n V1 TF = 10n PW = 600u PER = 1000u -48 0 Simulation Result VDD=-48V,ID=-20A Measurement Simulation Error (%) ,VGS=-10V Qgs (nC) 12.000 12.069 0.575 Qgd(nC) 16.000 16.035 0.219 Qg(nC) 74.000 51.724 -30.103 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.1 2000 1995 -0.250 0.2 1800 1803 0.167 0.5 1500 1507 0.467 1 1250 1255 0.400 2 1000 1004 0.400 5 740 740 0.000 10 570 570 0.000 20 450 447 -0.667 50 310 308 -0.645 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 9. Switching Time Characteristic Circuit Simulation result -12V -8V -4V 0V 1.815us 1.900us 2.000us 2.100us 2.200us 2.300us 2.400us V(L1:2) V(L2:1)/3 Time Evaluation circuit L2 R2 50nH 3 RG L1 U13 PER = 20u 2SJ494 PW = 1u 30nH V1 TF = 1n 10 -30Vdc TR = 1n R1 TD = 2u V2 = 20 V2 10 V1 = 0 0 Simulation Result ID=-10A, VDD=-30V Measurement Simulation Error(%) VGS=0/-10V Ton(ns) 25.000 25.059 0.236 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 10. Output Characteristic Circuit Simulation result -20A -4V -18A -16A -14A -3.00V -12A -10A -8A -6A -4A -2A VGS=-2.00V 0A 0V -2V -4V -6V -8V -10V -12V -14V -16V -18V -20V I(V3) V_V2 Evaluation circuit V3 0Vdc U13 V2 2SJ494 0 V1 -4 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 11. Output Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 12. BODY DIODE Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 0V 1.0V 2.0V 3.0V I(VD_Sense) V_VDS Evaluation Circuit VD_Sense 0Vdc VDS U13 10Vdc 2SJ494 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 13. Comparison Graph Circuit Simulation Result 100.000 Measurement Simulation -Drain reverse current IDR(A) 10.000 1.000 0.100 0.00 0.20 0.40 0.60 0.80 1.00 1.20 1.40 1.60 1.80 2.00 - Source-Drain voltage VSD(V) Simulation Result VDS(V) VDS(V) IDR(A) Measurement Simulation %Error -0.1 -0.625 -0.613 -1.920 -0.2 -0.640 -0.637 -0.469 -0.5 -0.670 -0.674 0.597 -1 -0.700 -0.711 1.571 -2 -0.750 -0.760 1.333 -5 -0.850 -0.851 0.118 -10 -0.950 -0.953 0.316 -20 -1.125 -1.127 0.178 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 14. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 0.4us 0.6us 0.8us 1.0us 1.2us 1.4us 1.6us 1.8us 2.0us 2.2us I(R1) Time Evaluation Circuit R1 50 U15 V1 = -9.4v V1 V2 = 10.6v 2SJ494 TD = 92n TR = 10ns TF = 15ns PW = 1us PER = 100us 0 Compare Measurement vs. Simulation Trr(ns) Measurement Simulation Error (%) Trj+Trb 291.000 291.914 0.314 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 15. Reverse Recovery Characteristic Reference Trj=22.000(ns) Trb=269.000(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 16. ESD PROTECTION DIODE Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc R2 U29 100MEG 2SJ494 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 17. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2007