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Device Modeling Report



COMPONENTS: Power MOSFET (Professional)
PART NUMBER: TPC8A02-H
MANUFACTURER: TOSHIBA
Zener Diode (Special) / ESD Protection Diode




                Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result

        50

        45

        40

        35

        30
  gfs




        25

        20

        15

        10

         5                                                              Measurement
                                                                        Simulation
         0
             0      1         2       3      4      5      6       7    8         9   10
                                          ID - Drain Current - A
Comparison table


                                                 gfs
                 Id(A)                                                   Error(%)
                                  Measurement           Simulation
                     0.1                   3.300          3.333               1.000
                     0.2                   6.600          6.667               1.015
                     0.5                  10.500          10.500              0.000
                         1                14.200          14.286              0.606
                         2                20.000          20.000              0.000
                         5                31.000          31.250              0.806
                         10               43.000          43.478              1.112




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result

   50A




   40A




   30A




   20A




   10A




    0A
         0V           1.0V         2.0V       3.0V        4.0V        5.0V      6.0V
              I(V3)
                                              V_V2
Evaluation circuit


                             U26




                                                  V3

                                                 0Vdc


                           TPC8A02-H             V1
                         V2
                         0Vdc                    10Vdc




                0




                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result


                                                                                                 Measurement
                            9.1                                                                  Simulation


                            8.1


                            7.1
   ID - Drain Current - A




                            6.1


                            5.1


                            4.1


                            3.1


                            2.1


                            1.1


                            0.1
                                  0            1           2            3            4               5         6
                                                       VGS - Gate to Source Voltage - V
Simulation Result

                                                           VGS(V)
                                  ID(A)                                                  Error (%)
                                              Measurement           Simulation
                                      0.1               2.700                2.704            0.148
                                      0.2               2.720                2.723            0.110
                                      0.5               2.750                2.761            0.400
                                          1             2.800                2.803            0.107
                                       2                2.850                2.863            0.456
                                       5                2.950                2.982            1.085
                                      10                3.110                3.118            0.257




                                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result
   10A


    9A


    8A


    7A


    6A


    5A


    4A


    3A


    2A


    1A


    0A
         0V      10mV   20mV        30mV   40mV   50mV      60mV   70mV    80mV   90mV
              I(V3)
                                                  V_VDS
Evaluation circuit

                             U26




                                                      V3

                                                     0Vdc
                         VGS
                           TPC8A02-H                 VDS

                            10Vdc                    0Vdc




                 0



Simulation Result

          ID=8A, VGS=10V                   Measurement              Simulation           Error (%)
                R DS (on)                          4.3                   4.302             0.047



                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result
    16V




    12V




     8V




     4V




     0V
          0                       10n                          20n                      30n         40n
              V(W1:3)
                                                          Time*1mS
Evaluation circuit

                                                  U26                  V2


                                                                     0Vdc
                                                                            Dbreak


                                                                               D1
               PER = 1000u
               PW = 600u           W1                                                I2
               TF = 10n                 +         TPC8A02-H                          16Adc
               TR = 10n
               TD = 0
                                        -
               I2 = 1m             W
                             I1    IOFF = 100uA                                      V1
               I1 = 0              ION = 0uA                                         24Vdc




                                            0



Simulation Result

              VDD=24V,ID=16A
                                            Measurement                      Simulation       Error (%)
                 ,VGS=10V
                  Qgs(nC)                                      6.000                  6.017       0.283
                  Qgd(nC)                                      9.000                  8.983      -0.189
                    Qg                                        34.000                 34.068       0.200



                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic



                                                         Measurement
                                                         Simulation




Simulation Result


                                     Cbd(nF)
          VDS(V)                                                  Error(%)
                          Measurement         Simulation
                    0.1           2.200                2.210            0.455
                    0.2           2.130                2.100           -1.408
                    0.5           1.900                1.900            0.000
                      1           1.630                1.640            0.613
                      2           1.350                1.350            0.000
                      5           0.980                0.970           -1.020
                     10           0.690                0.700            1.449
                     20           0.510                0.515            0.980




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result
   12V




   10V




    8V




    6V




    4V




    2V




    0V

           1.0000us           1.0500us                 1.1000us         1.1500us
         V(L1:2)    V(L2:1)/1.5
                                          Time

Evaluation circuit


                                                 U26               L2          RL

                                                                   50nH       1.86


                            R1     L1

            V1 = 0
                                   30nH
            V2 = 20      V2 4.7                                                 V1
            TD = 1u               R2             TPC8A02-H                   15Vdc
            TR = 10n
            TF = 10n              4.7
            PW = 10u
            PER = 200u



           0



Simulation Result

         ID=8 A, VDD=15V
                                  Measurement                Simulation       Error(%)
            VGS=0/10V
             Ton(ns)                       14.000                 14.072             0.514



                All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

    50A
                                                   3.8
      10                     4
                    6
                                                                                   3.7
    40A


                                                                                   3.6

    30A
                                                                                   3.5



                                                                                   3.4
    20A




                                                                            VGS= 3.2
    10A




     0A
          0V            1.0V               2.0V                  3.0V    4.0V          5.0V
               I(Vdsense)
                                               V_Vvariable


Evaluation circuit

                              U26




                                                     Vdsense


                    10Vdc                           0Vdc
                              TPC8A02-H
                                                    Vv ariable

                    Vstep
                                                    10Vdc




                0




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Characteristic

Circuit Simulation Result

   100uA




    10uA




   1.0uA
           0V      10V      20V      30V    40V        50V        60V   70V   80V   90V
                I(V1)
                                                       V_V2
Evaluation circuit


                                       V1


                              0Vdc

                                                  U7


                V2   0Vdc



                                                  D8A02




                                                              0




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result


            100.0
                                   Measurement
                                   Simulation
   IR(uA)




             10.0




              1.0
                    0    5    10     15    20    25    30     35   40    45   50   55      60

                                                      VR(V)

Simulation Result


                                                 VR(V)
                    IR(uA)                                                     Error (%)
                                Measurement                 Simulation
                      5.000                 30.350                 30.347              -0.010
                     10.000                 35.500                 35.626               0.355
                     20.000                 37.300                 37.376               0.204
                     50.000                 37.300                 37.381               0.217
                    100.000                 37.300                 37.392               0.247




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Forward Current Characteristic

Circuit Simulation Result
       100A




        10A




       1.0A




      100mA
              0V     0.2V     0.4V    0.6V   0.8V    1.0V       1.2V   1.4V   1.6V   1.8V
                   I(V1)
                                                     V_V2
Evaluation Circuit


                                 V1


                       0Vdc

                                                D8A02
           V2       0Vdc




                                                U7




                                                            0




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result
        5.000
                         Measurement
                         Simulation



        4.000




        3.000
    IDR(A)




        2.000




        1.000




        0.000
                0     0.1    0.2      0.3   0.4    0.5     0.6   0.7     0.8       0.9   1

                                                  VDS(V)
Simulation Result


                                         VSD(V)
                IDR(A)         Measuremen       Simulation                     %Error
                     0.1               0.260            0.272                    4.615
                     0.2               0.295            0.304                    3.051
                     0.5               0.355            0.357                    0.563
                       1               0.410            0.410                    0.000
                       2               0.505            0.485                   -3.960
                       5               0.650            0.665                    2.308




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result
    400mA



    300mA



    200mA



    100mA



     -0mA



   -100mA



   -200mA



   -300mA



   -400mA
       1.7us 1.8us 1.9us 2.0us 2.1us 2.2us 2.3us 2.4us 2.5us 2.6us
           I(R1)
                                      Time

Evaluation Circuit

                                   R1


                                    50
                                             D8A02
            V1 = -9.8v
                          V1
            V2 = 10.3v
            TD = 59n
            TR = 10ns
            TF = 10ns
            PW = 2us                         U11
            PER = 100us



                          0




Compare Measurement vs. Simulation

                Trr            Measurement           Simulation       Error (%)
            Trj+Trb(ns)              124.500            124.548             0.039




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                        Reference




Trj=24.5(ns)
Trb=100(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic
Circuit Simulation Result

   10mA


    9mA


    8mA


    7mA


    6mA


    5mA


    4mA


    3mA


    2mA


    1mA


     0A
          0V       5V         10V    15V   20V   25V    30V      35V   40V   45V   50V
               I(R1)
                                                 V_V1


Evaluation Circuit

                               U24




                        R1     TPC8A02-H                R2

                      0.01m                             100MEG
                              V1
                      0Vdc



                  0




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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SPICE MODEL of TPC8A02-H (Professional+ZDSP Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Professional) PART NUMBER: TPC8A02-H MANUFACTURER: TOSHIBA Zener Diode (Special) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. Transconductance Characteristic Circuit Simulation Result 50 45 40 35 30 gfs 25 20 15 10 5 Measurement Simulation 0 0 1 2 3 4 5 6 7 8 9 10 ID - Drain Current - A Comparison table gfs Id(A) Error(%) Measurement Simulation 0.1 3.300 3.333 1.000 0.2 6.600 6.667 1.015 0.5 10.500 10.500 0.000 1 14.200 14.286 0.606 2 20.000 20.000 0.000 5 31.000 31.250 0.806 10 43.000 43.478 1.112 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Vgs-Id Characteristic Circuit Simulation result 50A 40A 30A 20A 10A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V 6.0V I(V3) V_V2 Evaluation circuit U26 V3 0Vdc TPC8A02-H V1 V2 0Vdc 10Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Comparison Graph Circuit Simulation Result Measurement 9.1 Simulation 8.1 7.1 ID - Drain Current - A 6.1 5.1 4.1 3.1 2.1 1.1 0.1 0 1 2 3 4 5 6 VGS - Gate to Source Voltage - V Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 0.1 2.700 2.704 0.148 0.2 2.720 2.723 0.110 0.5 2.750 2.761 0.400 1 2.800 2.803 0.107 2 2.850 2.863 0.456 5 2.950 2.982 1.085 10 3.110 3.118 0.257 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. Rds(on) Characteristic Circuit Simulation result 10A 9A 8A 7A 6A 5A 4A 3A 2A 1A 0A 0V 10mV 20mV 30mV 40mV 50mV 60mV 70mV 80mV 90mV I(V3) V_VDS Evaluation circuit U26 V3 0Vdc VGS TPC8A02-H VDS 10Vdc 0Vdc 0 Simulation Result ID=8A, VGS=10V Measurement Simulation Error (%) R DS (on) 4.3  4.302  0.047 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Gate Charge Characteristic Circuit Simulation result 16V 12V 8V 4V 0V 0 10n 20n 30n 40n V(W1:3) Time*1mS Evaluation circuit U26 V2 0Vdc Dbreak D1 PER = 1000u PW = 600u W1 I2 TF = 10n + TPC8A02-H 16Adc TR = 10n TD = 0 - I2 = 1m W I1 IOFF = 100uA V1 I1 = 0 ION = 0uA 24Vdc 0 Simulation Result VDD=24V,ID=16A Measurement Simulation Error (%) ,VGS=10V Qgs(nC) 6.000 6.017 0.283 Qgd(nC) 9.000 8.983 -0.189 Qg 34.000 34.068 0.200 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(nF) VDS(V) Error(%) Measurement Simulation 0.1 2.200 2.210 0.455 0.2 2.130 2.100 -1.408 0.5 1.900 1.900 0.000 1 1.630 1.640 0.613 2 1.350 1.350 0.000 5 0.980 0.970 -1.020 10 0.690 0.700 1.449 20 0.510 0.515 0.980 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Switching Time Characteristic Circuit Simulation result 12V 10V 8V 6V 4V 2V 0V 1.0000us 1.0500us 1.1000us 1.1500us V(L1:2) V(L2:1)/1.5 Time Evaluation circuit U26 L2 RL 50nH 1.86 R1 L1 V1 = 0 30nH V2 = 20 V2 4.7 V1 TD = 1u R2 TPC8A02-H 15Vdc TR = 10n TF = 10n 4.7 PW = 10u PER = 200u 0 Simulation Result ID=8 A, VDD=15V Measurement Simulation Error(%) VGS=0/10V Ton(ns) 14.000 14.072 0.514 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Output Characteristic Circuit Simulation result 50A 3.8 10 4 6 3.7 40A 3.6 30A 3.5 3.4 20A VGS= 3.2 10A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(Vdsense) V_Vvariable Evaluation circuit U26 Vdsense 10Vdc 0Vdc TPC8A02-H Vv ariable Vstep 10Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. Reverse Characteristic Circuit Simulation Result 100uA 10uA 1.0uA 0V 10V 20V 30V 40V 50V 60V 70V 80V 90V I(V1) V_V2 Evaluation circuit V1 0Vdc U7 V2 0Vdc D8A02 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. Comparison Graph Circuit Simulation Result 100.0 Measurement Simulation IR(uA) 10.0 1.0 0 5 10 15 20 25 30 35 40 45 50 55 60 VR(V) Simulation Result VR(V) IR(uA) Error (%) Measurement Simulation 5.000 30.350 30.347 -0.010 10.000 35.500 35.626 0.355 20.000 37.300 37.376 0.204 50.000 37.300 37.381 0.217 100.000 37.300 37.392 0.247 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V 1.6V 1.8V I(V1) V_V2 Evaluation Circuit V1 0Vdc D8A02 V2 0Vdc U7 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Comparison Graph Circuit Simulation Result 5.000 Measurement Simulation 4.000 3.000 IDR(A) 2.000 1.000 0.000 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 VDS(V) Simulation Result VSD(V) IDR(A) Measuremen Simulation %Error 0.1 0.260 0.272 4.615 0.2 0.295 0.304 3.051 0.5 0.355 0.357 0.563 1 0.410 0.410 0.000 2 0.505 0.485 -3.960 5 0.650 0.665 2.308 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 1.7us 1.8us 1.9us 2.0us 2.1us 2.2us 2.3us 2.4us 2.5us 2.6us I(R1) Time Evaluation Circuit R1 50 D8A02 V1 = -9.8v V1 V2 = 10.3v TD = 59n TR = 10ns TF = 10ns PW = 2us U11 PER = 100us 0 Compare Measurement vs. Simulation Trr Measurement Simulation Error (%) Trj+Trb(ns) 124.500 124.548 0.039 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. Reverse Recovery Characteristic Reference Trj=24.5(ns) Trb=100(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 17. Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit U24 R1 TPC8A02-H R2 0.01m 100MEG V1 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 18. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006