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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: 2SK3797
MANUFACTURER: TOSHIBA
Body Diode (Model Parameters ) / ESD Protection Diode




                  Bee Technologies Inc.


    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Circuit Configuration




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
     N         Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result

        10


         9


         8


         7
  gfs




         6


         5


         4

                                                                       Measurement
         3
                                                                       Simulation

         2
             1      2         3       4         5         6       7        8    9      10
                                          ID - Drain Current - A

Comparison table



                                                    gfs
                 Id(A)                                                         Error(%)
                                  Measurement                 Simulation
                          1                   3.000                    3.03          1.000
                          2                   4.200                   4.255          1.310
                          5                   6.400                   6.494          1.469
                         10                   9.000                   9.174          1.933




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result

   30A




   20A




   10A




    0A
         0V               2V                  4V            6V          8V           10V
              I(V3)
                                                    V_V2

Evaluation circuit


                                              V3


                                                   0Vdc




                                        U29                Vv ariable

              10Vdc                     2SK3797
                                                           20Vdc


              V2




                                    0




                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result
                          10.00

                                              Measurement
                           9.00
                                              Simulation


                           8.00


                           7.00
 ID - Drain Current - A




                           6.00


                           5.00


                           4.00


                           3.00


                           2.00


                           1.00
                                  0               2            4            6             8           10
                                                       VGS - Gate to Source Voltage - V
Simulation Result


                                                               VGS(V)
                                  ID(A)                                                   Error (%)
                                                Measurement             Simulation
                                          1                 4.400               4.431          0.705
                                          2                 4.650               4.713          1.355
                                          5                 5.200               5.291          1.750
                                      10                    5.800               5.958          2.724




                                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result
    8.0A



    7.0A



    6.0A



    5.0A



    4.0A



    3.0A



    2.0A



    1.0A



      0A
           0V                1.0V            2.0V                  3.0V         4.0V       5.0V
                I(V3)
                                                       V_VDS
Evaluation circuit

                                                  V3


                                                       0Vdc



                                            U29                VDS

                10Vdc                       2SK3797
                                                               0Vdc


                VGS




                                        0



Simulation Result

      ID=6.5A, VGS=10V                  Measurement                       Simulation       Error (%)
                R DS (on)                          0.320                   0.315            -1.563



                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result
   20V




   16V




   12V




    8V




    4V




    0V
         0                       20n                 40n                   60n                 80n       100n
             V(W1:3)
                                                           Time*1mS
Evaluation circuit

                                                              V2


                                                                  0Vdc


                                                                         Dbreak
              PER = 1000u                                   U29
              PW = 600u                W1
              TF = 10n                   +                  2SK3797         D1
              TR = 10n                                                             I2
                                         -
              TD = 0                                                               13Adc
              I2 = 1m                  W
                            I1     IOFF = 1mA
              I1 = 0               ION = 0uA

                                                                                   V1
                                                                                   400Vdc



                                                0



Simulation Result

             VDD=400V,ID=13A
                                                    Measurement                   Simulation         Error (%)
                ,VGS=10V
                 Qgs(nC)                                     18.000                         17.959      -0.228
                 Qgd(nC)                                     22.000                         22.105       0.477
                   Qg                                        62.000                         53.895     -13.073



                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic


                                                           Measurement
                                                           Simulation




Simulation Result


                                    Cbd(pF)
           VDS(V)                                              Error(%)
                          Measurement        Simulation
                    0.1            2900               2904          0.138
                    0.2            2800               2801          0.036
                    0.5            2500               2510          0.400
                      1            2200               2196         -0.182
                      2            1700               1706          0.353
                      5            1080               1082          0.185




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result

   16V


   14V



   12V



   10V


    8V



    6V


    4V



    2V


    0V
    0.8us       0.9us        1.0us               1.1us             1.2us            1.3us
        V(L2:1)/20   V(L1:2)
                                              Time
Evaluation circuit

                                                                 L2        R2


                                                               50nH
                                                                           30


                                   L1
                                                         U32
                                   30nH
          V1 = 0                                         2SK3797              V1
          V2 = 10      V2                                                  200Vdc
          TD = 1u                 R3
          TR = 1n
          TF = 1n                  50
          PW = 10u
          PER = 200u

                       0


Simulation Result

         ID=6.5 A, VDD=200V
                                   Measurement           Simulation                 Error(%)
             VGS=0/10V
               Ton(ns)                      110.000                113.320                  3.018



                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

   30A




   25A




   20A


                                                                             6.6V
   15A

                                                                             6.2V


   10A
                                                                             5.8.V


                                                                            5.4V
    5A



                                                                           VGS=5V
    0A
         0V           5V           10V              15V              20V       25V   30V
              I(Vdsense)
                                               V_Vvariable



Evaluation circuit

                                               Vdsense


                                                    0Vdc




                                         U32
                                                             Vv ariable
              10Vdc                      2SK3797

                                                             20Vdc

              Vstep




                                     0




                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result

    100A




     10A




    1.0A




   100mA
           0V               0.2V       0.4V       0.6V             0.8V   1.0V        1.2V
                I(R1)
                                                  V_V1


Evaluation Circuit


                               R1


                               0.01m

                                                         2SK3797
                        V1
                0Vdc                                     U29




                        0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                                100.00
                                                  Measurement
                                                  Simulation
 Drain reverse current IDR(A)




                                 10.00




                                  1.00




                                  0.10
                                         0              0.4             0.8             1.2                 1.6

                                                          Source-Drain voltage VSD(V)


Simulation Result


                                                                  VSD(V)
                                         IDR(A)        Measuremen        Simulation                   %Error
                                              0.1              0.590              0.590                  0.000
                                              0.2              0.620              0.620                  0.000
                                              0.5              0.660              0.661                  0.152
                                                1              0.700              0.694                 -0.857
                                                2              0.730              0.729                 -0.137
                                                5              0.780              0.788                  1.026
                                               10              0.850              0.846                 -0.471
                                               20              0.930              0.929                 -0.108




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result
    400mA


    300mA



    200mA



    100mA


     -0mA



   -100mA


   -200mA



   -300mA


   -400mA
        2us      4us          6us    8us        10us   12us    14us   16us   18us   20us 22us
              I(R1)
                                                       Time
Evaluation Circuit

                                      R1


                                           50

            V1 = -9.4v    V1                                  D3797
            V2 = 10.7v
            TD = 0.8u                                         U33
            TR = 10ns
            TF = 19ns
            PW = 8us
            PER = 100us




                          0


Compare Measurement vs. Simulation

               Trr(us)              Measurement               Simulation      Error (%)
               Trj+Trb                      3.200                   3.209           0.281




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                         Reference




Trj=1.600(us)
Trb=1.600(us)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic
Circuit Simulation Result

   10mA


    9mA


    8mA


    7mA


    6mA


    5mA


    4mA


    3mA


    2mA


    1mA


     0A
          0V       10V     20V        30V   40V    50V   60V   70V    80V    90V 100V
                I(R1)
                                                  V_V1

Evaluation Circuit


                                 R1



                             0.01m




                      V1
               0Vdc
                                     R2
                                                  U30

                             100MEG          2SK3797


                      0




                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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SPICE MODEL of 2SK3797 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameters) PART NUMBER: 2SK3797 MANUFACTURER: TOSHIBA Body Diode (Model Parameters ) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. Circuit Configuration All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Transconductance Characteristic Circuit Simulation Result 10 9 8 7 gfs 6 5 4 Measurement 3 Simulation 2 1 2 3 4 5 6 7 8 9 10 ID - Drain Current - A Comparison table gfs Id(A) Error(%) Measurement Simulation 1 3.000 3.03 1.000 2 4.200 4.255 1.310 5 6.400 6.494 1.469 10 9.000 9.174 1.933 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Vgs-Id Characteristic Circuit Simulation result 30A 20A 10A 0A 0V 2V 4V 6V 8V 10V I(V3) V_V2 Evaluation circuit V3 0Vdc U29 Vv ariable 10Vdc 2SK3797 20Vdc V2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. Comparison Graph Circuit Simulation Result 10.00 Measurement 9.00 Simulation 8.00 7.00 ID - Drain Current - A 6.00 5.00 4.00 3.00 2.00 1.00 0 2 4 6 8 10 VGS - Gate to Source Voltage - V Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 1 4.400 4.431 0.705 2 4.650 4.713 1.355 5 5.200 5.291 1.750 10 5.800 5.958 2.724 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Rds(on) Characteristic Circuit Simulation result 8.0A 7.0A 6.0A 5.0A 4.0A 3.0A 2.0A 1.0A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(V3) V_VDS Evaluation circuit V3 0Vdc U29 VDS 10Vdc 2SK3797 0Vdc VGS 0 Simulation Result ID=6.5A, VGS=10V Measurement Simulation Error (%) R DS (on) 0.320  0.315  -1.563 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Gate Charge Characteristic Circuit Simulation result 20V 16V 12V 8V 4V 0V 0 20n 40n 60n 80n 100n V(W1:3) Time*1mS Evaluation circuit V2 0Vdc Dbreak PER = 1000u U29 PW = 600u W1 TF = 10n + 2SK3797 D1 TR = 10n I2 - TD = 0 13Adc I2 = 1m W I1 IOFF = 1mA I1 = 0 ION = 0uA V1 400Vdc 0 Simulation Result VDD=400V,ID=13A Measurement Simulation Error (%) ,VGS=10V Qgs(nC) 18.000 17.959 -0.228 Qgd(nC) 22.000 22.105 0.477 Qg 62.000 53.895 -13.073 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.1 2900 2904 0.138 0.2 2800 2801 0.036 0.5 2500 2510 0.400 1 2200 2196 -0.182 2 1700 1706 0.353 5 1080 1082 0.185 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Switching Time Characteristic Circuit Simulation result 16V 14V 12V 10V 8V 6V 4V 2V 0V 0.8us 0.9us 1.0us 1.1us 1.2us 1.3us V(L2:1)/20 V(L1:2) Time Evaluation circuit L2 R2 50nH 30 L1 U32 30nH V1 = 0 2SK3797 V1 V2 = 10 V2 200Vdc TD = 1u R3 TR = 1n TF = 1n 50 PW = 10u PER = 200u 0 Simulation Result ID=6.5 A, VDD=200V Measurement Simulation Error(%) VGS=0/10V Ton(ns) 110.000 113.320 3.018 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. Output Characteristic Circuit Simulation result 30A 25A 20A 6.6V 15A 6.2V 10A 5.8.V 5.4V 5A VGS=5V 0A 0V 5V 10V 15V 20V 25V 30V I(Vdsense) V_Vvariable Evaluation circuit Vdsense 0Vdc U32 Vv ariable 10Vdc 2SK3797 20Vdc Vstep 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V I(R1) V_V1 Evaluation Circuit R1 0.01m 2SK3797 V1 0Vdc U29 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Comparison Graph Circuit Simulation Result 100.00 Measurement Simulation Drain reverse current IDR(A) 10.00 1.00 0.10 0 0.4 0.8 1.2 1.6 Source-Drain voltage VSD(V) Simulation Result VSD(V) IDR(A) Measuremen Simulation %Error 0.1 0.590 0.590 0.000 0.2 0.620 0.620 0.000 0.5 0.660 0.661 0.152 1 0.700 0.694 -0.857 2 0.730 0.729 -0.137 5 0.780 0.788 1.026 10 0.850 0.846 -0.471 20 0.930 0.929 -0.108 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 2us 4us 6us 8us 10us 12us 14us 16us 18us 20us 22us I(R1) Time Evaluation Circuit R1 50 V1 = -9.4v V1 D3797 V2 = 10.7v TD = 0.8u U33 TR = 10ns TF = 19ns PW = 8us PER = 100us 0 Compare Measurement vs. Simulation Trr(us) Measurement Simulation Error (%) Trj+Trb 3.200 3.209 0.281 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. Reverse Recovery Characteristic Reference Trj=1.600(us) Trb=1.600(us) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 10V 20V 30V 40V 50V 60V 70V 80V 90V 100V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc R2 U30 100MEG 2SK3797 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 17. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006