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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: TPCA8011-H
MANUFACTURER: TOSHIBA
Body Diode (Model Parameters) / ESD Protection Diode




                  Bee Technologies Inc.


    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result


      150
      140
      130
      120
      110
      100
      90
      80
gfs




      70
      60
      50
      40
      30
      20
                                                                 Measurement
      10
                                                                 Simulation
       0
            0            10         20             30          40             50
                                         ID(A)
Comparison table


                                             gfs
                Id(A)                                                   Error(%)
                              Measurement           Simulation

                        1             28.500                 28.000           -1.754
                        2             33.000                 33.333            1.010
                        5             50.000                 50.000           0.000
                        10            68.000                 68.667           0.980
                        20            95.000                95.238            0.251
                        50           141.000               142.857            1.317




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result

   100A




    80A




    60A




    40A




    20A




     0A
          0V           1.0V         2.0V      3.0V           4.0V    5.0V      6.0V
               I(V3)
                                             V_V2
Evaluation circuit


                              U23




                                                      V3

                                                     0Vdc


                            TPCA8011-H               V1
                          V2
                          0Vdc                       10Vdc




                0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                           50
                                        Measurement
                                        Simulation


                           40
  ID - Drain Current - A




                           30




                           20




                           10




                           0
                                0               1         2           3         4           5          6
                                                      VGS - Gate to Source Voltage - V
Simulation Result

                                                                 VGS(V)
                                    ID(A)                                                       Error (%)
                                                    Measurement           Simulation
                                       0.1                    1.350                 1.384            2.519
                                       0.2                    1.400                 1.397           -0.214
                                       0.5                    1.420                 1.420            0.000
                                            1                 1.450                 1.446           -0.276
                                            2                 1.490                 1.484           -0.403
                                         5                    1.550                 1.560            0.645
                                        10                    1.650                 1.647           -0.182
                                        20                    1.770                 1.774            0.226
                                        50                    2.000                 2.036            1.800



                                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result

    24A




    20A




    16A




    12A




     8A




     4A




     0A
          0V                  50mV              100mV             150mV          200mV
               I(V3)
                                                V_VDS
Evaluation circuit

                                U23




                                                          V3

                                                         0Vdc
                              VGS
                                TPCA8011-H               VDS

                              4.5Vdc                     0Vdc




                  0



Simulation Result

      ID=20A, VGS=10V                  Measurement              Simulation            Error (%)
                R DS (on)                    2.700 m              2.698 m              -0.074



                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result
   10V




    8V




    6V




    4V




    2V




    0V
         0                  10n                20n                30n                40n       50n
             V(W1:3)
                                                       Time*1mS

Evaluation circuit

                                                 U23               V2


                                                                  0Vdc
                                                                         Dbreak


                                                                            D1
              PER = 1000u
              PW = 600u           W1                                               I2
              TF = 10n              +            TPCA8011-H                        40Adc
              TR = 10n
              TD = 0
                                    -
              I2 = 1m             W
                            I1    IOFF = 100uA                                      V1
              I1 = 0              ION = 0uA                                       16Vdc




                                           0



Simulation Result

              VDD=16V,ID=40A
                                           Measurement                     Simulation         Error (%)
                 ,VGS=5V
                 Qgs(nC)                                       7.700                  7.684      -0.208
                 Qgd(nC)                                      11.000                 11.053       0.482
                   Qg                                         32.000                 29.676      -7.263



                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic


                                                       Measurement
                                                       Simulation




Simulation Result


                                    Cbd(pF)
           VDS(V)                                              Error(%)
                          Measurement        Simulation
                    0.2            2440               2445          0.205
                    0.5            2130               2150           0.939
                      1            1820               1850           1.648
                      2            1480               1500           1.351
                      5            1050               1050           0.000
                     10             750                750           0.000
                     20             550                540          -1.818




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result
 14V



 12V



 10V



  8V



  6V



  4V



  2V



  0V


  0.97us     1.00us                    1.05us                  1.10us           1.15us
       V(L1:2)*2   V(L2:1)
                                           Time

Evaluation circuit


                                                 U23                    L2      RL

                                                                        50nH    0.5


                            R1     L1

            V1 = 0
                                   30nH
            V2 = 10      V2 4.7                                                   V1
            TD = 1u               R2             TPCA8011-H                    10Vdc
            TR = 10n
            TF = 10n              4.7
            PW = 10u
            PER = 200u



           0



Simulation Result

        ID=20 A, VDD=15V
                                  Measurement                 Simulation        Error(%)
           VGS=0/10V
             Ton(ns)                            24.000             24.152              0.633



                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result


  100A
      10                   2.6                                                2.4
      6                    3
                       5
    80A
                                                                               2.3



                                                                               2.2
    60A


                                                                               2.1

    40A
                                                                               2


                                                                              1.9
    20A

                                                                           VGS=1.7
                                                                          V

     0A
          0V            1.0V                  2.0V        3.0V        4.0V           5.0V
               I(Vdsense)
                                                V_Vvariable


Evaluation circuit

                                 U23




                                                          Vdsense


                      10Vdc                              0Vdc

                                 TPCA8011-H              Vv ariable

                      Vstep
                                                         5Vdc




                  0




                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
BODY DIODE
Forward Current Characteristic

Circuit Simulation Result

   1.0KA




    100A




     10A




    1.0A
           0V                    0.2V    0.4V            0.6V        0.8V        1.0V
                I(R1)
                                                V_V1
Evaluation Circuit




                            R1
                            0.01m                  TPCA8011-H
                        V1
                0Vdc                               U23




                        0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

        Circuit Simulation Result

                      1000
                                           Measurement
                                           Simulation
Drain reverse current IDR(A)




                               100




                               10




                                1
                                     0            0.2         0.4           0.6            0.8             1

                                                        Source-Drain voltage VSD(V)

        Simulation Result


                                                                  VSD(V)
                                         IDR(A)         Measuremen       Simulation                 %Error
                                                1               0.590            0.587               -0.508
                                                2               0.610            0.611                0.164
                                                5               0.650            0.652                0.308
                                               10               0.695            0.693               -0.288
                                               20               0.745            0.742               -0.403
                                               50               0.830            0.832                0.241




                                            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result
   400mA



   300mA



   200mA



   100mA



    -0mA



  -100mA



  -200mA



  -300mA



  -400mA
      0.7us 0.8us 0.9us       1.0us 1.1us   1.2us   1.3us 1.4us      1.5us 1.6us
          I(R1)
                                            Time
Evaluation Circuit

                                  R1


                                       50



                                                        TPCA8011-H
           V1 = -9.4v    V1
           V2 = 10.6v
           TD = 7n                                      U23
           TR = 10ns
           TF = 13ns
           PW = 1us
           PER = 100us




                         0



Compare Measurement vs. Simulation

               Trr              Measurement            Simulation             Error (%)
           Trj+Trb(ns)                156.500             156.592                   0.059




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                        Reference




Trj=16.5(ns)
Trb=140ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
ESD PROTECTION DIODE
Zener Voltage Characteristic
Circuit Simulation Result


  10mA


   9mA


   8mA


   7mA


   6mA


   5mA


   4mA


   3mA


   2mA


   1mA


    0A
         0V       5V        10V      15V   20V   25V    30V      35V   40V   45V   50V
              I(R1)
                                                 V_V1


Evaluation Circuit

                             U23




                             R1
                              TPCA8011-H
                                                        R2
                             0.01m
                                                        100MEG
                            V1
                     0Vdc



                 0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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Modeling of Power MOSFET Device Parameters

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameters) PART NUMBER: TPCA8011-H MANUFACTURER: TOSHIBA Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. Transconductance Characteristic Circuit Simulation Result 150 140 130 120 110 100 90 80 gfs 70 60 50 40 30 20 Measurement 10 Simulation 0 0 10 20 30 40 50 ID(A) Comparison table gfs Id(A) Error(%) Measurement Simulation 1 28.500 28.000 -1.754 2 33.000 33.333 1.010 5 50.000 50.000 0.000 10 68.000 68.667 0.980 20 95.000 95.238 0.251 50 141.000 142.857 1.317 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Vgs-Id Characteristic Circuit Simulation result 100A 80A 60A 40A 20A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V 6.0V I(V3) V_V2 Evaluation circuit U23 V3 0Vdc TPCA8011-H V1 V2 0Vdc 10Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Comparison Graph Circuit Simulation Result 50 Measurement Simulation 40 ID - Drain Current - A 30 20 10 0 0 1 2 3 4 5 6 VGS - Gate to Source Voltage - V Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 0.1 1.350 1.384 2.519 0.2 1.400 1.397 -0.214 0.5 1.420 1.420 0.000 1 1.450 1.446 -0.276 2 1.490 1.484 -0.403 5 1.550 1.560 0.645 10 1.650 1.647 -0.182 20 1.770 1.774 0.226 50 2.000 2.036 1.800 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. Rds(on) Characteristic Circuit Simulation result 24A 20A 16A 12A 8A 4A 0A 0V 50mV 100mV 150mV 200mV I(V3) V_VDS Evaluation circuit U23 V3 0Vdc VGS TPCA8011-H VDS 4.5Vdc 0Vdc 0 Simulation Result ID=20A, VGS=10V Measurement Simulation Error (%) R DS (on) 2.700 m 2.698 m -0.074 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Gate Charge Characteristic Circuit Simulation result 10V 8V 6V 4V 2V 0V 0 10n 20n 30n 40n 50n V(W1:3) Time*1mS Evaluation circuit U23 V2 0Vdc Dbreak D1 PER = 1000u PW = 600u W1 I2 TF = 10n + TPCA8011-H 40Adc TR = 10n TD = 0 - I2 = 1m W I1 IOFF = 100uA V1 I1 = 0 ION = 0uA 16Vdc 0 Simulation Result VDD=16V,ID=40A Measurement Simulation Error (%) ,VGS=5V Qgs(nC) 7.700 7.684 -0.208 Qgd(nC) 11.000 11.053 0.482 Qg 32.000 29.676 -7.263 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.2 2440 2445 0.205 0.5 2130 2150 0.939 1 1820 1850 1.648 2 1480 1500 1.351 5 1050 1050 0.000 10 750 750 0.000 20 550 540 -1.818 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Switching Time Characteristic Circuit Simulation result 14V 12V 10V 8V 6V 4V 2V 0V 0.97us 1.00us 1.05us 1.10us 1.15us V(L1:2)*2 V(L2:1) Time Evaluation circuit U23 L2 RL 50nH 0.5 R1 L1 V1 = 0 30nH V2 = 10 V2 4.7 V1 TD = 1u R2 TPCA8011-H 10Vdc TR = 10n TF = 10n 4.7 PW = 10u PER = 200u 0 Simulation Result ID=20 A, VDD=15V Measurement Simulation Error(%) VGS=0/10V Ton(ns) 24.000 24.152 0.633 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Output Characteristic Circuit Simulation result 100A 10 2.6 2.4 6 3 5 80A 2.3 2.2 60A 2.1 40A 2 1.9 20A VGS=1.7 V 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(Vdsense) V_Vvariable Evaluation circuit U23 Vdsense 10Vdc 0Vdc TPCA8011-H Vv ariable Vstep 5Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. BODY DIODE Forward Current Characteristic Circuit Simulation Result 1.0KA 100A 10A 1.0A 0V 0.2V 0.4V 0.6V 0.8V 1.0V I(R1) V_V1 Evaluation Circuit R1 0.01m TPCA8011-H V1 0Vdc U23 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. Comparison Graph Circuit Simulation Result 1000 Measurement Simulation Drain reverse current IDR(A) 100 10 1 0 0.2 0.4 0.6 0.8 1 Source-Drain voltage VSD(V) Simulation Result VSD(V) IDR(A) Measuremen Simulation %Error 1 0.590 0.587 -0.508 2 0.610 0.611 0.164 5 0.650 0.652 0.308 10 0.695 0.693 -0.288 20 0.745 0.742 -0.403 50 0.830 0.832 0.241 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 0.7us 0.8us 0.9us 1.0us 1.1us 1.2us 1.3us 1.4us 1.5us 1.6us I(R1) Time Evaluation Circuit R1 50 TPCA8011-H V1 = -9.4v V1 V2 = 10.6v TD = 7n U23 TR = 10ns TF = 13ns PW = 1us PER = 100us 0 Compare Measurement vs. Simulation Trr Measurement Simulation Error (%) Trj+Trb(ns) 156.500 156.592 0.059 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic Reference Trj=16.5(ns) Trb=140ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. ESD PROTECTION DIODE Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit U23 R1 TPCA8011-H R2 0.01m 100MEG V1 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006