The document discusses using transient electromagnetic (TEM) data to correct for static shifts in magnetotelluric (MT) data. TEM data is less sensitive to near-surface heterogeneities and topography, which can cause vertical shifts in MT apparent resistivity curves. The document proposes converting TEM time-domain data to the frequency domain using modeling or time shifting, and shifting the MT data to match the TEM-derived data to correct for static effects. This allows 1D MT modeling techniques to be applied to TEM data as well.