1) Analog behavioral models are abstracted using SystemVerilog real numbers to allow simulation in digital emulation environments with higher throughput.
2) Key challenges to emulating analog models include converting floating-point implementations to fixed-point and handling high sampling rates in filters.
3) The document describes techniques used by Broadcom to synthesize analog behavioral models for emulation, including pragmas for sensitivity analysis and parallelizing filters.
PAM4 Analysis and Measurement Considerations WebinarHilary Lustig
This webinar explores the acquisition and analysis of PAM4 waveforms. We will show PAM4 Test Configurations, Compliance Measurements and Debug Techniques.
Nov 12 Webcast: Eliminate Pitfalls of DDR Memory Testing
Join Teledyne LeCroy's, Mike Hertz, for this free webinar on using an oscilloscope for validation and debug of DDR2/3/4 physical layer measurements.
Topics covered will include: probing, connectivity, recommended device patterns, de-embedding, examples of good and bad waveforms, and debugging steps and techniques.
Mike Hertz has been a Field Applications Engineer with Teledyne LeCroy in Michigan for 14 years.
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...teledynelecroy
Join Teledyne LeCroy for this webinar as we provide an overview of the differences between a conventional high-attenuation HV differential probe, a HV isolated oscilloscope input, and the HVFO, along with some real-world measurement examples.
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Whyteledynelecroy
Engineers must commonly probe low and high frequency signals with high signal fidelity. Typical passive probes with high input impedance and capacitance provide good response at lower frequencies, but inappropriately load the circuit and distort signals at higher frequencies.
Join Teledyne LeCroy for this webinar as we discuss:
- Selecting the right probing techniques to maximize the accuracy of your measurements
- Probe specifications and their implications on the measured signal
- Variety of probes and accessories available for measurement
- Virtual probing software tools that allow the user to probe the signal when direct access is physically impossible
Re usable continuous-time analog sva assertionsRégis SANTONJA
This paper shows how SystemVerilog Assertions (SVA) modules can be bound to analog IP blocks, shall they be at behavioral or transistor-level, enabling the assertions to become a true IP deliverable that can be reused at SoC level. It also highlights how DPIs can fix analog assertions specificities, such as getting rid of hierarchical paths, especially when probing currents. This paper also demonstrates how to flawlessly switch models between digital (wreal) and analog models without breaking the assertions. Finally, it demonstrates how one can generate an adaptive clock to continuously assert analog properties whose stability over time is critical, such as current or voltage references or supplies.
PAM4 Analysis and Measurement Considerations WebinarHilary Lustig
This webinar explores the acquisition and analysis of PAM4 waveforms. We will show PAM4 Test Configurations, Compliance Measurements and Debug Techniques.
Nov 12 Webcast: Eliminate Pitfalls of DDR Memory Testing
Join Teledyne LeCroy's, Mike Hertz, for this free webinar on using an oscilloscope for validation and debug of DDR2/3/4 physical layer measurements.
Topics covered will include: probing, connectivity, recommended device patterns, de-embedding, examples of good and bad waveforms, and debugging steps and techniques.
Mike Hertz has been a Field Applications Engineer with Teledyne LeCroy in Michigan for 14 years.
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...teledynelecroy
Join Teledyne LeCroy for this webinar as we provide an overview of the differences between a conventional high-attenuation HV differential probe, a HV isolated oscilloscope input, and the HVFO, along with some real-world measurement examples.
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Whyteledynelecroy
Engineers must commonly probe low and high frequency signals with high signal fidelity. Typical passive probes with high input impedance and capacitance provide good response at lower frequencies, but inappropriately load the circuit and distort signals at higher frequencies.
Join Teledyne LeCroy for this webinar as we discuss:
- Selecting the right probing techniques to maximize the accuracy of your measurements
- Probe specifications and their implications on the measured signal
- Variety of probes and accessories available for measurement
- Virtual probing software tools that allow the user to probe the signal when direct access is physically impossible
Re usable continuous-time analog sva assertionsRégis SANTONJA
This paper shows how SystemVerilog Assertions (SVA) modules can be bound to analog IP blocks, shall they be at behavioral or transistor-level, enabling the assertions to become a true IP deliverable that can be reused at SoC level. It also highlights how DPIs can fix analog assertions specificities, such as getting rid of hierarchical paths, especially when probing currents. This paper also demonstrates how to flawlessly switch models between digital (wreal) and analog models without breaking the assertions. Finally, it demonstrates how one can generate an adaptive clock to continuously assert analog properties whose stability over time is critical, such as current or voltage references or supplies.
Abstract— During the past year Xilinx, for the first time ever, set out to quantify the soft error rate of a multi-core microprocessor. This work extends on Xilinx’s 10+ years of heritage in FPGA radiation testing. Built on the 28 nanometer technology node, Xilinx’s ZynqTM family of devices integrate a processor subsystem with programmable logic. The processor subsystem includes two 32 bit ARM CortexTM-A9 CPU’s, two NEONTM floating point units, two SIMD processing units, an L1 and L2 cache, on chip SRAM memory and various peripherals. The programmable logic is directly connected with the processing subsystem via ARM’s AMBATM 4 AXI interface. This programmable logic is based on the 7 Series FPGA fabric, consisting of 6-input LUTs and DFFs along with Block RAM, DSP slices, multi-gigabit transceivers, and other blocks. Tests were performed using a proton beam to analyze the soft error susceptibility of the new device. Proton beam testing was deemed acceptable since previous neutron beam and proton beam testing had shown virtually identical cross-sections for 7 Series programmable logic. The results are promising and yield a solid baseline for a typical embedded application targeting any of the Zynq SoC devices. As a foray into processor testing, this Zynq work has laid a solid foundation for future Xilinx SoC test campaigns.
Austin Lesea, Wojciech Koszek, Glenn Steiner, Gary Swift, and Dagan White Xilinx, Inc.
Paper: SELSE 2014 @ Stanford University (PDF, 456KB), 2014
Slides: (PDF, 933KB), 2014
Challenges in Assessing Single Event Upset Impact on Processor SystemsWojciech Koszek
Abstract—This paper presents a test methodology developed at Xilinx for real-time soft-error rate testing as well as the software framework in which Device-Under-Test (DUT) and controlling computer are both synchronized with the proton beam controls and run experiments automatically in a predictable manner. The method presented has been successfully used for Zynq®-7000 All Programmable SoC testing at the UC Davis Crocker Nuclear Lab. Presented are the issues and challenges encountered during design and implementation of the framework, as well as lessons learned from the in-house experiments and bootstrapping tests performed with Thorium Foil. The method presented has helped Xilinx to deliver high-quality experimental data and to optimize time spent in the testing facility.
Keywords—Error detection, soft error, architectural vulnerability, statistical error, confidence level, beam facility control
vlsi projects using verilog code 2014-2015E2MATRIX
E2MATRIX Research Lab
Are you scratching your head to write your M Tech thesis?
Don’t know where to start and where to find the relevant matter on the topic?
We Provide Complete Thesis Help For M.Tech / Phd Studnets.
E2MATRIX deals with Thesis guidance and research work for M.Tech, PhD Students.
If you are looking for professional thesis guidance then of course you are at the right place. We have a best team of Technical Developers and professionals who specialize in developing and delivering best and authenticated work with an assurance of on time delivery.
Contact : +91 9041262727, 9779363902.
Email : support@e2matrix.com
Web : www.e2matrix.com
The components and basic properties of the 100BASE-TX physical layer for industrial wired ethernet, the “invisible” signal coding (4B/5B, scrambling, MLT3), the actual voltage signals on the copper wires, and some signal and packet measurement methods are discussed. Actual measurements in PROFINET networks illustrate signal properties, bits, bytes and messages.
A fast acquisition all-digital delay-locked loop using a starting-bit predict...LeMeniz Infotech
A Fast-Acquisition All-Digital Delay-Locked Loop Using a Starting-Bit Prediction Algorithm for the Successive-Approximation Register
This brief presents a fast-acquisition 11-bit all-digital delay-locked loop (ADDLL) using a novel starting-bit prediction algorithm for the successive-approximation register (SBP-SAR). It can effectively eliminate the harmonic lock and the false lock. The achievable acquisition time is within 17.5-23.5 or 17.5-32.5 clock cycles when the ADDLL works at the low or high clock rate, respectively. The digital-controlled delay line and the SBP-SAR of the ADDLL chip are synthesized using Taiwan Semiconductor Manufacturing Company's (TSMC's) 0.18-μm CMOS cell library. The proposed ADDLL can operate at a clock frequency from 60 MHz to 1.1 GHz.
Web : http://www.lemenizinfotech.com
web : http://www.lemenizinfotech.com/vlsi-ieee-projects-2016-2017/
Web : http://ieeemaster.com
Web : http://ieeemaster.com/vlsi-ieee-projects-2016-2017/
Address: 36, 100 Feet Road Near Indira Gandhi Statue, Natesan Nagar, Pondicherry-605 005
Contact numbers: +91 95663 55386, 99625 88976 0413 420 5444
Mail : projects@lemenizinfotech.com
Mobile : 9566355386 / 9962588976
Resume of Gaurang Rathod, Embedded Software DeveloperGaurang Rathod
o 2.5+ years of experience in the embedded system domain
o Expertise in C language, OS concepts and ARM cortex M3/M4 architecture
o Strong Electronics engineering and research background
Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Co...iosrjce
Now a day’s highly integrated multi layer board with IC’s is virtually impossible to be accessed
physically for testing. The major problem detected during testing a circuit includes test generation and gate to
I/O pin problems. In design of any circuit, consuming low power and less hardware utilization is an important
design parameter. Therefore reliable testing methods are introduced which reduces the cost of the hardware
required and also power consumed by the device. In this project a new fault coverage test pattern generator is
generated using a linear feedback shift register called FC-LFSR which can perform fault analysis and reduces
the total power of the circuit. In this test, it generates three intermediate patterns between the random patterns
which reduces the transitional activities of primary inputs so that the switching activities inside the circuit under
test will be reduced. The test patterns generated are applied to c17 benchmark circuit, whose results with fault
coverage of the circuit being tested. The simulation for this design is performed using Xilinx ISE software using
Verilog hardware description language
Detailed large-scale real-time HYPERSIM EMT simulation for transient stabilit...OPAL-RT TECHNOLOGIES
Towards cloud-based real-time HIL for wide-area special control and protection system testing
Presented by: Jean Belanger, President and CTO of OPAL-RT TECHNOLOGIES
Abstract: High penetration of inverter-based Distributed Energy Resources (DERs), widespread installation of FACTS and HVDC interconnection systems, and the decommissioning of thermal and nuclear plants are significantly reducing inertia in large-scale power systems. Fast power-electronics based control and protection schemes act to stabilize these systems, but they are sensitive to harmonics, transients, and system imbalances. It has been shown that simplified positive-sequence RMS models alone are insufficient for Transient Stability Assessment (TSA) of large-scale, low-inertia power grids. Therefore, utilities and regulators such as NERC, as well as professional associations such as CIGRE and IEEE, have begun investigating detailed EMT simulation to assess the transient stability of large-scale, low-inertia power grids that include power-electronic plant controllers.
However, detailed EMT simulation of large-scale power grids for 20 to 30 second time-frames and hundreds of contingencies presents a number of computational and analytic challenges including excessive simulation time, large-scale grid data management and the unavailability of detailed and validated models of power-electronic plant controllers. Furthermore, these plant controllers, if they are provided by OEMs, are in the form of blackbox, pre-compiled DLLs, which are implemented for specific simulation tools, without any interoperability standard.
This presentation will describe OPAL-RT solutions to achieve very large-scale, detailed grid EMT simulation in real-time for Hardware-in-the-Loop (HIL) / Software-in-the-Loop (SIL) control and protection testing, as well as quasi-real-time simulation for fast TSA evaluation of large-scale, low-inertia power systems. With these solutions, blackboxcontrol and protection systems can be implemented natively in the EMT simulation tool, HYPERSIM. PSCAD DLLs can also be co-simulated with HYPERSIM using a software interface based on the CIGRE model-interoperability guidelines.
Such advances will accelerate connection studies and can be used to implement cloud-native tools to help operators assess system stability with hundreds of contingencies in 5-to 10-minute time-frames. This performance can be achieved for grids having several thousand busses with a 50-microsecond time-step using a few hundred processors.
As HYPERSIM runs under Windows or LINUX, powerful cloud-based applications can be implemented for TSA and to test wide area control and protection systems using SIL or HIL with real control and protection software and hardware. Communication system emulators, such as eXata can also be used to analyze cyber-attacks and countermeasures as well as to evaluate the effect of communication failures and delays on system performance.
Learn more at www.opal-rt.com
Abstract— During the past year Xilinx, for the first time ever, set out to quantify the soft error rate of a multi-core microprocessor. This work extends on Xilinx’s 10+ years of heritage in FPGA radiation testing. Built on the 28 nanometer technology node, Xilinx’s ZynqTM family of devices integrate a processor subsystem with programmable logic. The processor subsystem includes two 32 bit ARM CortexTM-A9 CPU’s, two NEONTM floating point units, two SIMD processing units, an L1 and L2 cache, on chip SRAM memory and various peripherals. The programmable logic is directly connected with the processing subsystem via ARM’s AMBATM 4 AXI interface. This programmable logic is based on the 7 Series FPGA fabric, consisting of 6-input LUTs and DFFs along with Block RAM, DSP slices, multi-gigabit transceivers, and other blocks. Tests were performed using a proton beam to analyze the soft error susceptibility of the new device. Proton beam testing was deemed acceptable since previous neutron beam and proton beam testing had shown virtually identical cross-sections for 7 Series programmable logic. The results are promising and yield a solid baseline for a typical embedded application targeting any of the Zynq SoC devices. As a foray into processor testing, this Zynq work has laid a solid foundation for future Xilinx SoC test campaigns.
Austin Lesea, Wojciech Koszek, Glenn Steiner, Gary Swift, and Dagan White Xilinx, Inc.
Paper: SELSE 2014 @ Stanford University (PDF, 456KB), 2014
Slides: (PDF, 933KB), 2014
Challenges in Assessing Single Event Upset Impact on Processor SystemsWojciech Koszek
Abstract—This paper presents a test methodology developed at Xilinx for real-time soft-error rate testing as well as the software framework in which Device-Under-Test (DUT) and controlling computer are both synchronized with the proton beam controls and run experiments automatically in a predictable manner. The method presented has been successfully used for Zynq®-7000 All Programmable SoC testing at the UC Davis Crocker Nuclear Lab. Presented are the issues and challenges encountered during design and implementation of the framework, as well as lessons learned from the in-house experiments and bootstrapping tests performed with Thorium Foil. The method presented has helped Xilinx to deliver high-quality experimental data and to optimize time spent in the testing facility.
Keywords—Error detection, soft error, architectural vulnerability, statistical error, confidence level, beam facility control
vlsi projects using verilog code 2014-2015E2MATRIX
E2MATRIX Research Lab
Are you scratching your head to write your M Tech thesis?
Don’t know where to start and where to find the relevant matter on the topic?
We Provide Complete Thesis Help For M.Tech / Phd Studnets.
E2MATRIX deals with Thesis guidance and research work for M.Tech, PhD Students.
If you are looking for professional thesis guidance then of course you are at the right place. We have a best team of Technical Developers and professionals who specialize in developing and delivering best and authenticated work with an assurance of on time delivery.
Contact : +91 9041262727, 9779363902.
Email : support@e2matrix.com
Web : www.e2matrix.com
The components and basic properties of the 100BASE-TX physical layer for industrial wired ethernet, the “invisible” signal coding (4B/5B, scrambling, MLT3), the actual voltage signals on the copper wires, and some signal and packet measurement methods are discussed. Actual measurements in PROFINET networks illustrate signal properties, bits, bytes and messages.
A fast acquisition all-digital delay-locked loop using a starting-bit predict...LeMeniz Infotech
A Fast-Acquisition All-Digital Delay-Locked Loop Using a Starting-Bit Prediction Algorithm for the Successive-Approximation Register
This brief presents a fast-acquisition 11-bit all-digital delay-locked loop (ADDLL) using a novel starting-bit prediction algorithm for the successive-approximation register (SBP-SAR). It can effectively eliminate the harmonic lock and the false lock. The achievable acquisition time is within 17.5-23.5 or 17.5-32.5 clock cycles when the ADDLL works at the low or high clock rate, respectively. The digital-controlled delay line and the SBP-SAR of the ADDLL chip are synthesized using Taiwan Semiconductor Manufacturing Company's (TSMC's) 0.18-μm CMOS cell library. The proposed ADDLL can operate at a clock frequency from 60 MHz to 1.1 GHz.
Web : http://www.lemenizinfotech.com
web : http://www.lemenizinfotech.com/vlsi-ieee-projects-2016-2017/
Web : http://ieeemaster.com
Web : http://ieeemaster.com/vlsi-ieee-projects-2016-2017/
Address: 36, 100 Feet Road Near Indira Gandhi Statue, Natesan Nagar, Pondicherry-605 005
Contact numbers: +91 95663 55386, 99625 88976 0413 420 5444
Mail : projects@lemenizinfotech.com
Mobile : 9566355386 / 9962588976
Resume of Gaurang Rathod, Embedded Software DeveloperGaurang Rathod
o 2.5+ years of experience in the embedded system domain
o Expertise in C language, OS concepts and ARM cortex M3/M4 architecture
o Strong Electronics engineering and research background
Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Co...iosrjce
Now a day’s highly integrated multi layer board with IC’s is virtually impossible to be accessed
physically for testing. The major problem detected during testing a circuit includes test generation and gate to
I/O pin problems. In design of any circuit, consuming low power and less hardware utilization is an important
design parameter. Therefore reliable testing methods are introduced which reduces the cost of the hardware
required and also power consumed by the device. In this project a new fault coverage test pattern generator is
generated using a linear feedback shift register called FC-LFSR which can perform fault analysis and reduces
the total power of the circuit. In this test, it generates three intermediate patterns between the random patterns
which reduces the transitional activities of primary inputs so that the switching activities inside the circuit under
test will be reduced. The test patterns generated are applied to c17 benchmark circuit, whose results with fault
coverage of the circuit being tested. The simulation for this design is performed using Xilinx ISE software using
Verilog hardware description language
Detailed large-scale real-time HYPERSIM EMT simulation for transient stabilit...OPAL-RT TECHNOLOGIES
Towards cloud-based real-time HIL for wide-area special control and protection system testing
Presented by: Jean Belanger, President and CTO of OPAL-RT TECHNOLOGIES
Abstract: High penetration of inverter-based Distributed Energy Resources (DERs), widespread installation of FACTS and HVDC interconnection systems, and the decommissioning of thermal and nuclear plants are significantly reducing inertia in large-scale power systems. Fast power-electronics based control and protection schemes act to stabilize these systems, but they are sensitive to harmonics, transients, and system imbalances. It has been shown that simplified positive-sequence RMS models alone are insufficient for Transient Stability Assessment (TSA) of large-scale, low-inertia power grids. Therefore, utilities and regulators such as NERC, as well as professional associations such as CIGRE and IEEE, have begun investigating detailed EMT simulation to assess the transient stability of large-scale, low-inertia power grids that include power-electronic plant controllers.
However, detailed EMT simulation of large-scale power grids for 20 to 30 second time-frames and hundreds of contingencies presents a number of computational and analytic challenges including excessive simulation time, large-scale grid data management and the unavailability of detailed and validated models of power-electronic plant controllers. Furthermore, these plant controllers, if they are provided by OEMs, are in the form of blackbox, pre-compiled DLLs, which are implemented for specific simulation tools, without any interoperability standard.
This presentation will describe OPAL-RT solutions to achieve very large-scale, detailed grid EMT simulation in real-time for Hardware-in-the-Loop (HIL) / Software-in-the-Loop (SIL) control and protection testing, as well as quasi-real-time simulation for fast TSA evaluation of large-scale, low-inertia power systems. With these solutions, blackboxcontrol and protection systems can be implemented natively in the EMT simulation tool, HYPERSIM. PSCAD DLLs can also be co-simulated with HYPERSIM using a software interface based on the CIGRE model-interoperability guidelines.
Such advances will accelerate connection studies and can be used to implement cloud-native tools to help operators assess system stability with hundreds of contingencies in 5-to 10-minute time-frames. This performance can be achieved for grids having several thousand busses with a 50-microsecond time-step using a few hundred processors.
As HYPERSIM runs under Windows or LINUX, powerful cloud-based applications can be implemented for TSA and to test wide area control and protection systems using SIL or HIL with real control and protection software and hardware. Communication system emulators, such as eXata can also be used to analyze cyber-attacks and countermeasures as well as to evaluate the effect of communication failures and delays on system performance.
Learn more at www.opal-rt.com
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We develop custom Image Recognition systems for Aerospace and defence applications. Using algorithms like Deep Convolutional Neural Networks and Regional Convolutional Neural Networks.
Our algorithms for Target Recognition and Tracking are designed from the beginning to be run on embedded systems. We target both GPU and FPGA devices.
To Train and Validate our algorithms we developed a process to generate photorealistic 3D environments.
Those 3D Environments are used to produce realistic video streams of the targets in different environmental conditions (lighting, adverse meteorological conditions, camouflage, point-of-view).
The same technology can be used to Train and Test Automotive Vision Systems.
How To Develop True Distributed Real Time SimulationsSimware
This presentation at ITEC 2011, explain how to cohabitate in a single architecture the DDS and HLA standards in order to provide real time distributed simulation in Net-Centric applications.
As the complexity of the scan algorithm is dependent on the number of design registers, large SoC scan
designs can no longer be verified in RTL simulation unless partitioned into smaller sub-blocks. This paper
proposes a methodology to decrease scan-chain verification time utilizing SCE-MI, a widely used
communication protocol for emulation, and an FPGA-based emulation platform. A high-level (SystemC)
testbench and FPGA synthesizable hardware transactor models are developed for the scan-chain ISCAS89
S400 benchmark circuit for high-speed communication between the host CPU workstation and the FPGA
emulator. The emulation results are compared to other verification methodologies (RTL Simulation,
Simulation Acceleration, and Transaction-based emulation), and found to be 82% faster than regular RTL
simulation. In addition, the emulation runs in the MHz speed range, allowing the incorporation of software
applications, drivers, and operating systems, as opposed to the Hz range in RTL simulation or submegahertz
range as accomplished in transaction-based emulation. In addition, the integration of scan
testing and acceleration/emulation platforms allows more complex DFT methods to be developed and
tested on a large scale system, decreasing the time to market for products.
Rethinking Data-Intensive Science Using Scalable Analytics Systems fnothaft
Presentation from SIGMOD 2015. With Matt Massie, Timothy Danford, Zhao Zhang, Uri Laserson, Carl Yeksigian, Jey Kottalam, Arun Ahuja, Jeff Hammerbacher, Michael Linderman, Michael J. Franklin, Anthony D. Joseph, David A. Patterson. Paper at http://dl.acm.org/citation.cfm?id=2742787.
Student information management system project report ii.pdfKamal Acharya
Our project explains about the student management. This project mainly explains the various actions related to student details. This project shows some ease in adding, editing and deleting the student details. It also provides a less time consuming process for viewing, adding, editing and deleting the marks of the students.
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...Dr.Costas Sachpazis
Terzaghi's soil bearing capacity theory, developed by Karl Terzaghi, is a fundamental principle in geotechnical engineering used to determine the bearing capacity of shallow foundations. This theory provides a method to calculate the ultimate bearing capacity of soil, which is the maximum load per unit area that the soil can support without undergoing shear failure. The Calculation HTML Code included.
Explore the innovative world of trenchless pipe repair with our comprehensive guide, "The Benefits and Techniques of Trenchless Pipe Repair." This document delves into the modern methods of repairing underground pipes without the need for extensive excavation, highlighting the numerous advantages and the latest techniques used in the industry.
Learn about the cost savings, reduced environmental impact, and minimal disruption associated with trenchless technology. Discover detailed explanations of popular techniques such as pipe bursting, cured-in-place pipe (CIPP) lining, and directional drilling. Understand how these methods can be applied to various types of infrastructure, from residential plumbing to large-scale municipal systems.
Ideal for homeowners, contractors, engineers, and anyone interested in modern plumbing solutions, this guide provides valuable insights into why trenchless pipe repair is becoming the preferred choice for pipe rehabilitation. Stay informed about the latest advancements and best practices in the field.
Immunizing Image Classifiers Against Localized Adversary Attacksgerogepatton
This paper addresses the vulnerability of deep learning models, particularly convolutional neural networks
(CNN)s, to adversarial attacks and presents a proactive training technique designed to counter them. We
introduce a novel volumization algorithm, which transforms 2D images into 3D volumetric representations.
When combined with 3D convolution and deep curriculum learning optimization (CLO), itsignificantly improves
the immunity of models against localized universal attacks by up to 40%. We evaluate our proposed approach
using contemporary CNN architectures and the modified Canadian Institute for Advanced Research (CIFAR-10
and CIFAR-100) and ImageNet Large Scale Visual Recognition Challenge (ILSVRC12) datasets, showcasing
accuracy improvements over previous techniques. The results indicate that the combination of the volumetric
input and curriculum learning holds significant promise for mitigating adversarial attacks without necessitating
adversary training.
Industrial Training at Shahjalal Fertilizer Company Limited (SFCL)MdTanvirMahtab2
This presentation is about the working procedure of Shahjalal Fertilizer Company Limited (SFCL). A Govt. owned Company of Bangladesh Chemical Industries Corporation under Ministry of Industries.
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