Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )Jikrul Sayeed
Name of the project: Logic Gate Tester for DELD EE3114
1.1Abstract:
Performing various types of logic operation we need to use logic gates and in integrated circuit there are more than one gates fabricated in a single IC. Before using gates for various purposes we need to check logic gates including all logic
combination considering in Binary (Logic 1 & 0) needs to implement. It is a time consuming task to check all the input combinations, thus the sole purpose of this project to make it automatic to check all the logic .
ECET 230 help A Guide to career/Snaptutorialpinck199
For more classes visit
www.snaptutorial.com
1. Develop the Boolean equation for the circuit shown below
2. Determine the output Y in Problem 1 for the input values shown below
3. Redraw the circuit in Problem 1 using only 2-input NAND gates
4.Develop the Boolean equation for the circuit shown below
Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )Jikrul Sayeed
Name of the project: Logic Gate Tester for DELD EE3114
1.1Abstract:
Performing various types of logic operation we need to use logic gates and in integrated circuit there are more than one gates fabricated in a single IC. Before using gates for various purposes we need to check logic gates including all logic
combination considering in Binary (Logic 1 & 0) needs to implement. It is a time consuming task to check all the input combinations, thus the sole purpose of this project to make it automatic to check all the logic .
ECET 230 help A Guide to career/Snaptutorialpinck199
For more classes visit
www.snaptutorial.com
1. Develop the Boolean equation for the circuit shown below
2. Determine the output Y in Problem 1 for the input values shown below
3. Redraw the circuit in Problem 1 using only 2-input NAND gates
4.Develop the Boolean equation for the circuit shown below
EEN 1200 L – Digital FundamentalsMerrimack CollegeLaborato.docxSALU18
EEN 1200 L – Digital Fundamentals
Merrimack College
Laboratory 2 – Introduction to 7404 Hex Inverter & Basic Gates & Timing Diagrams
NAME _____________________________
The purpose of this laboratory experiment is to:
I. Get practice in wiring integrated circuits on the trainers
II. Generate “Truth Tables” for basic gates.
III. Use these logic elements to generate a high level logic element.
IV. Generate the “Truth Table”, and identify the logic element.
V. Generate timing diagrams for the basic gates.
Part A: Introduction to 7404 Hex Inverter (IC)
Hook up the 7404 Hex Inverter integrated circuit, and look at the input and output of ONE of the inverters
(pins 1 and 2). Note: There are 6 inverters in the same package, hence the term Hex. See pin-outs of the 7404 Hex Inverter at the last page.
A
B
Z
A
B
Z
A
B
Z
A
B
C
Z
Z
A
B
Logic 1
Logic 1
A
B
Z
A-1) Using the built in signal generator (RED Trainer), place a 1 kHz and TTL input to the inverter. [Be sure to connect the IC (pin 14) to 5VDC and (pin 7) to the ground (GND)].
Look at the input and output together on the scope using 2 Volts DC per division. Draw what you see:
Output Waveform
Input Waveform
Note: Label the x-axis and y-axis
A-2) What is the period? ________________milli-seconds
A-3) Use 5.0 VDC per division on the scope, then read the following on the scope. Draw what you see below.
Voltage amplitude of input=____________
Voltage amplitude of output=____________
Frequency of input=____________
Frequency of output=____________
Period of input=____________
Period of output=____________
Note: Label the x-axis and y-axis
Part B: Basic Gates & Timing Diagrams
A
B
Z
A Truth Table consists of all possible logic inputs and the output that corresponds to each logic input.
In the following, an AND Gate with logic inputs A & B with a logic output Z is shown:
A input
B input
Z output
0
0
0
1
0
0
0
1
0
1
1
1
The timing diagram is discussed at length in Chapter 3. The basic timing diagrams for the logic gates we are using in this lab allow for a visual reading of how the logic functions. By viewing the timing diagram, the reader can see what outputs result from the different possible combinations of inputs. The truth table can easily be determined by looking at the basic timing diagram.
B-1) Follow steps of part A-1 to hook up the 7408 of Quad 2-Input AND gate, then connect input A to SW7 and input B to SW6 then generate a truth table below by measuring output Z using voltmeter. Connect a wire from the output pin to any of the 8 bits LED display located on the upper right corner of the function generator. Note: There are 4 AND gates in the same package.
A
B
C
Z
Input A
Input B
output Z
0
0
1
0
0
1
1
1
B ...
Microcontroller based Integrated Circuit TesterIJERA Editor
The digital integrated circuit (IC) tester is implemented by using the ATmega32 microcontroller . The microcontroller processes the inputs and outputs and displays the results on a Liquid Crystal Display (LCD). The basic function of the digital IC tester is to test a digital IC for correct logical functioning as described in the truth table and/or function table. The designed model can test digital ICs having 14 pins. Since it is programmable, any number of ICs can be tested . This model applies the necessary signals to the inputs of the IC, monitoring the outputs at each stage and comparing them with the outputs in the truth table. Any discrepancy in the functioning of the IC results in a fail indication, displays the faulty and good gates on the LCD. The testing procedure is accomplished with the help of keypad keys present on the main board design. The test has been accomplished with most commonly used digital IC's, mainly belonging to the 74 series. Digital IC tester tests three samples of IC's ( NAND, NOT, NOR). The design is flexible . We can add extra IC bases and subroutines to test any other IC in the 74 series.
EEN 1200 L – Digital FundamentalsMerrimack CollegeLaborato.docxSALU18
EEN 1200 L – Digital Fundamentals
Merrimack College
Laboratory 2 – Introduction to 7404 Hex Inverter & Basic Gates & Timing Diagrams
NAME _____________________________
The purpose of this laboratory experiment is to:
I. Get practice in wiring integrated circuits on the trainers
II. Generate “Truth Tables” for basic gates.
III. Use these logic elements to generate a high level logic element.
IV. Generate the “Truth Table”, and identify the logic element.
V. Generate timing diagrams for the basic gates.
Part A: Introduction to 7404 Hex Inverter (IC)
Hook up the 7404 Hex Inverter integrated circuit, and look at the input and output of ONE of the inverters
(pins 1 and 2). Note: There are 6 inverters in the same package, hence the term Hex. See pin-outs of the 7404 Hex Inverter at the last page.
A
B
Z
A
B
Z
A
B
Z
A
B
C
Z
Z
A
B
Logic 1
Logic 1
A
B
Z
A-1) Using the built in signal generator (RED Trainer), place a 1 kHz and TTL input to the inverter. [Be sure to connect the IC (pin 14) to 5VDC and (pin 7) to the ground (GND)].
Look at the input and output together on the scope using 2 Volts DC per division. Draw what you see:
Output Waveform
Input Waveform
Note: Label the x-axis and y-axis
A-2) What is the period? ________________milli-seconds
A-3) Use 5.0 VDC per division on the scope, then read the following on the scope. Draw what you see below.
Voltage amplitude of input=____________
Voltage amplitude of output=____________
Frequency of input=____________
Frequency of output=____________
Period of input=____________
Period of output=____________
Note: Label the x-axis and y-axis
Part B: Basic Gates & Timing Diagrams
A
B
Z
A Truth Table consists of all possible logic inputs and the output that corresponds to each logic input.
In the following, an AND Gate with logic inputs A & B with a logic output Z is shown:
A input
B input
Z output
0
0
0
1
0
0
0
1
0
1
1
1
The timing diagram is discussed at length in Chapter 3. The basic timing diagrams for the logic gates we are using in this lab allow for a visual reading of how the logic functions. By viewing the timing diagram, the reader can see what outputs result from the different possible combinations of inputs. The truth table can easily be determined by looking at the basic timing diagram.
B-1) Follow steps of part A-1 to hook up the 7408 of Quad 2-Input AND gate, then connect input A to SW7 and input B to SW6 then generate a truth table below by measuring output Z using voltmeter. Connect a wire from the output pin to any of the 8 bits LED display located on the upper right corner of the function generator. Note: There are 4 AND gates in the same package.
A
B
C
Z
Input A
Input B
output Z
0
0
1
0
0
1
1
1
B ...
Microcontroller based Integrated Circuit TesterIJERA Editor
The digital integrated circuit (IC) tester is implemented by using the ATmega32 microcontroller . The microcontroller processes the inputs and outputs and displays the results on a Liquid Crystal Display (LCD). The basic function of the digital IC tester is to test a digital IC for correct logical functioning as described in the truth table and/or function table. The designed model can test digital ICs having 14 pins. Since it is programmable, any number of ICs can be tested . This model applies the necessary signals to the inputs of the IC, monitoring the outputs at each stage and comparing them with the outputs in the truth table. Any discrepancy in the functioning of the IC results in a fail indication, displays the faulty and good gates on the LCD. The testing procedure is accomplished with the help of keypad keys present on the main board design. The test has been accomplished with most commonly used digital IC's, mainly belonging to the 74 series. Digital IC tester tests three samples of IC's ( NAND, NOT, NOR). The design is flexible . We can add extra IC bases and subroutines to test any other IC in the 74 series.
Implementation of a digital multimeter using basic stamp2 on a professional development board. It also includes R2R ladder network for digital to analog conversion
ECET 230 help A Guide to career/Snaptutorialpinck243
For more classes visit
www.snaptutorial.com
1. Develop the Boolean equation for the circuit shown below
2. Determine the output Y in Problem 1 for the input values shown below
3. Redraw the circuit in Problem 1 using only 2-input NAND gates
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Francesca Gottschalk - How can education support child empowerment.pptxEduSkills OECD
Francesca Gottschalk from the OECD’s Centre for Educational Research and Innovation presents at the Ask an Expert Webinar: How can education support child empowerment?
A Strategic Approach: GenAI in EducationPeter Windle
Artificial Intelligence (AI) technologies such as Generative AI, Image Generators and Large Language Models have had a dramatic impact on teaching, learning and assessment over the past 18 months. The most immediate threat AI posed was to Academic Integrity with Higher Education Institutes (HEIs) focusing their efforts on combating the use of GenAI in assessment. Guidelines were developed for staff and students, policies put in place too. Innovative educators have forged paths in the use of Generative AI for teaching, learning and assessments leading to pockets of transformation springing up across HEIs, often with little or no top-down guidance, support or direction.
This Gasta posits a strategic approach to integrating AI into HEIs to prepare staff, students and the curriculum for an evolving world and workplace. We will highlight the advantages of working with these technologies beyond the realm of teaching, learning and assessment by considering prompt engineering skills, industry impact, curriculum changes, and the need for staff upskilling. In contrast, not engaging strategically with Generative AI poses risks, including falling behind peers, missed opportunities and failing to ensure our graduates remain employable. The rapid evolution of AI technologies necessitates a proactive and strategic approach if we are to remain relevant.
June 3, 2024 Anti-Semitism Letter Sent to MIT President Kornbluth and MIT Cor...Levi Shapiro
Letter from the Congress of the United States regarding Anti-Semitism sent June 3rd to MIT President Sally Kornbluth, MIT Corp Chair, Mark Gorenberg
Dear Dr. Kornbluth and Mr. Gorenberg,
The US House of Representatives is deeply concerned by ongoing and pervasive acts of antisemitic
harassment and intimidation at the Massachusetts Institute of Technology (MIT). Failing to act decisively to ensure a safe learning environment for all students would be a grave dereliction of your responsibilities as President of MIT and Chair of the MIT Corporation.
This Congress will not stand idly by and allow an environment hostile to Jewish students to persist. The House believes that your institution is in violation of Title VI of the Civil Rights Act, and the inability or
unwillingness to rectify this violation through action requires accountability.
Postsecondary education is a unique opportunity for students to learn and have their ideas and beliefs challenged. However, universities receiving hundreds of millions of federal funds annually have denied
students that opportunity and have been hijacked to become venues for the promotion of terrorism, antisemitic harassment and intimidation, unlawful encampments, and in some cases, assaults and riots.
The House of Representatives will not countenance the use of federal funds to indoctrinate students into hateful, antisemitic, anti-American supporters of terrorism. Investigations into campus antisemitism by the Committee on Education and the Workforce and the Committee on Ways and Means have been expanded into a Congress-wide probe across all relevant jurisdictions to address this national crisis. The undersigned Committees will conduct oversight into the use of federal funds at MIT and its learning environment under authorities granted to each Committee.
• The Committee on Education and the Workforce has been investigating your institution since December 7, 2023. The Committee has broad jurisdiction over postsecondary education, including its compliance with Title VI of the Civil Rights Act, campus safety concerns over disruptions to the learning environment, and the awarding of federal student aid under the Higher Education Act.
• The Committee on Oversight and Accountability is investigating the sources of funding and other support flowing to groups espousing pro-Hamas propaganda and engaged in antisemitic harassment and intimidation of students. The Committee on Oversight and Accountability is the principal oversight committee of the US House of Representatives and has broad authority to investigate “any matter” at “any time” under House Rule X.
• The Committee on Ways and Means has been investigating several universities since November 15, 2023, when the Committee held a hearing entitled From Ivory Towers to Dark Corners: Investigating the Nexus Between Antisemitism, Tax-Exempt Universities, and Terror Financing. The Committee followed the hearing with letters to those institutions on January 10, 202
Embracing GenAI - A Strategic ImperativePeter Windle
Artificial Intelligence (AI) technologies such as Generative AI, Image Generators and Large Language Models have had a dramatic impact on teaching, learning and assessment over the past 18 months. The most immediate threat AI posed was to Academic Integrity with Higher Education Institutes (HEIs) focusing their efforts on combating the use of GenAI in assessment. Guidelines were developed for staff and students, policies put in place too. Innovative educators have forged paths in the use of Generative AI for teaching, learning and assessments leading to pockets of transformation springing up across HEIs, often with little or no top-down guidance, support or direction.
This Gasta posits a strategic approach to integrating AI into HEIs to prepare staff, students and the curriculum for an evolving world and workplace. We will highlight the advantages of working with these technologies beyond the realm of teaching, learning and assessment by considering prompt engineering skills, industry impact, curriculum changes, and the need for staff upskilling. In contrast, not engaging strategically with Generative AI poses risks, including falling behind peers, missed opportunities and failing to ensure our graduates remain employable. The rapid evolution of AI technologies necessitates a proactive and strategic approach if we are to remain relevant.
Read| The latest issue of The Challenger is here! We are thrilled to announce that our school paper has qualified for the NATIONAL SCHOOLS PRESS CONFERENCE (NSPC) 2024. Thank you for your unwavering support and trust. Dive into the stories that made us stand out!
Synthetic Fiber Construction in lab .pptxPavel ( NSTU)
Synthetic fiber production is a fascinating and complex field that blends chemistry, engineering, and environmental science. By understanding these aspects, students can gain a comprehensive view of synthetic fiber production, its impact on society and the environment, and the potential for future innovations. Synthetic fibers play a crucial role in modern society, impacting various aspects of daily life, industry, and the environment. ynthetic fibers are integral to modern life, offering a range of benefits from cost-effectiveness and versatility to innovative applications and performance characteristics. While they pose environmental challenges, ongoing research and development aim to create more sustainable and eco-friendly alternatives. Understanding the importance of synthetic fibers helps in appreciating their role in the economy, industry, and daily life, while also emphasizing the need for sustainable practices and innovation.
The French Revolution, which began in 1789, was a period of radical social and political upheaval in France. It marked the decline of absolute monarchies, the rise of secular and democratic republics, and the eventual rise of Napoleon Bonaparte. This revolutionary period is crucial in understanding the transition from feudalism to modernity in Europe.
For more information, visit-www.vavaclasses.com
Model Attribute Check Company Auto PropertyCeline George
In Odoo, the multi-company feature allows you to manage multiple companies within a single Odoo database instance. Each company can have its own configurations while still sharing common resources such as products, customers, and suppliers.
Devry ecet 105 week 3 i lab introduction to digital logic gates new
1. DEVRY ECET 105 Week 3 iLab Introduction to Digital Logic
Gates NEW
Check this A+ tutorial guideline at
http://www.assignmentcloud.com/ecet-105-devry/ecet-
105-week-3-ilab-introduction-to-digital-logic-gates-new
For more classes visit
http://www.assignmentcloud.com
I. OBJECTIVES
To understand basic logic functions (AND, OR, and NOT) and
their complement used in Boolean algebra and digital logic
design.
To test simple logic small-scale integration (SSI) integrated
circuit (IC) devices.
II. PARTS LIST
Equipment:
IBM PC or Compatible with Windows 2000 or
Higher
Parts:
1 – 74LS00 Quad 2-Input NAND Gate IC
1 – 74LS02 Quad 2-Input NOR Gate IC
1 – 74LS04 Hex INVERTER Gate IC
1 – 74LS08 Quad 2-Input AND Gate IC
1 – 74LS32 Quad 2-Input OR Gate IC
1 – 74LS86 Quad 2-Input XOR Gate IC
1 – Set of Four Single-Pole-Double-Throw (SPDT)
Switches, DIP Style
1 – 330 Ω resistor
1 – Light emitting diode (LED), red
2. III. PROCEDURE
OR Gate Operation
Using the Internet or the campus library, acquire a hard copy of
a data sheet for the 74LS32 quad 2-input OR gate. (HINT: Look
at ti.com for possible help.) One of the OR gates is shown below
in Figure 5.1.
Figure 5.1 – 2-Input OR Gate
Fill in the Table 5.1 for ALL possible logic conditions, based on
the information found on the data sheet.
Input (Pin 1) Input (Pin 2) Output (Pin 3)
Table 5.1 - 2-Input OR Gate Theoretical Truth Table
Write the Boolean expression below for the relationship
between the device inputs (labeled as A and B) and output
(labeled as Y).
OUTPUT Y = ____________________________
Construct the circuit shown in Figure 5.2 (a layout of the
breadboard is shown in Figure 5.3). Be sure that the flat side of
the LED (called the cathode) is connected to ground and that
the 74LS32 is connected to power and ground (Pins 14 and 7,
respectively).
Figure 5.2 – OR Gate Test Circuit
Top View
Side View
Figure 5.3 – Breadboard Layout for Figure 5.2
Connect the circuit to verify the logic gate operation recording
the input and output voltages. Fill in Table 5.2below for ALL
possible logic conditions.
Input (Pin 1) Input (Pin 2) Output (Pin 3)
Table 5.2 - 2-Input OR Gate Measured Truth Table
Do the results match the manufacturer’s truth table?
3. __________ (YES or NO)
AND Gate Operation
Acquire a hard copy of a data sheet for the 74LS08 quad 2-input
AND gate.
Figure 5.4 – 2-Input AND Gate
Fill in the truth table below for ALL possible logic conditions
based on the information found on the data sheet.
Input (Pin 1) Input (Pin 2) Output (Pin 3)
Table 5.3 - 2-Input AND Gate Theoretical Truth Table
Write the Boolean expression below for the relationship
between the device inputs (labeled as A and B) and output
(labeled as Y).
OUTPUT Y = ____________________________
Construct the circuit shown in Figure 5.5 by replacing the
74LS32 from Figure 5.2 with a 74LS08.
Figure 5.5 - 2-Input AND Gate Test Circuit
Connect the circuit to verify the logic gate operation recording
the input and output voltages. Fill in the truth table below for
ALL possible logic conditions.
Input (Pin 1) Input (Pin 2) Output (Pin 3)
Table 5.4 - 2-Input AND Gate Measured Truth Table
Do the results match the manufacturer’s truth table?
__________ (YES or NO)
NAND Gate Operation
Acquire a hard copy of a data sheet for the 74LS00 quad 2-input
NAND gate.
Figure 5.6 – 2-Input NAND Gate
Fill in Table 5.5 for ALL possible logic conditions, based on the
information found on the data sheet.
Input (Pin 1) Input (Pin 2) Output (Pin 3)
Input (Pin 1) Input (Pin 2) Output (Pin 3)
Input (Pin 1) Input (Pin 2) Output (Pin 3)
4. Table 5.5 - 2-Input NAND Gate Theoretical Truth Table
Write the Boolean expression below for the relationship
between the device inputs (labeled as A and B) and output
(labeled as Y).
OUTPUT Y = ____________________________
Construct the circuit shown in Figure 5.7 by replacing the
74LS08 from Figure 5.5 with a 74LS00.
Figure 5.7 – 2-Input NAND Gate Test Circuit
Connect the circuit to verify the logic gate operation recording
the input and output voltages. Fill in the truth table below for
ALL possible logic conditions.
Input (Pin 1) Input (Pin 2) Output (Pin 3)
Table 5.6 - 2-Input OR Gate Measured Truth Table
Do the results match the manufacturer’s truth table?
__________ (YES or NO)
Exclusive-OR Gate Operation
Acquire a hard copy of a data sheet for the 74LS86 quad 2-input
exclusive-OR (XOR) gate.
Figure 5.8 – 2-Input XOR Gate
Fill in the truth table below for ALL possible logic conditions,
based on the information found on the data sheet.
Input (Pin 1) Input (Pin 2) Output (Pin 3)
Table 5.7 - 2-Input XOR Gate Theoretical Truth Table
Write the Boolean expression below for the relationship
between the device inputs (labeled as A and B) and output
(labeled as Y).
OUTPUT Y = ____________________________
Construct the circuit shown in Figure 5.9 by replacing the
74LS00 from Figure 5.7 with a 74LS86.
Figure 5.9 – 2-Input XOR Gate Test Circuit
Connect the circuit to verify the logic gate operation recording
the input and output voltages. Fill in the truth table below for
ALL possible logic conditions.
5. Input (Pin 1) Input (Pin 2) Output (Pin 3)
Table 5.8 - 2-Input OR Gate Measured Truth Table
Do the results match the manufacturer’s truth table?
__________ (YES or NO)
NOR Gate Operation
Acquire a hard copy of a data sheet for the 74LS02 quad 2-input
NOR gate.
Figure 5.10 – 2-Input NOR Gate
Fill in the truth table below for ALL possible logic conditions,
based on the information found on the data sheet.
Input (Pin 2) Input (Pin 3) Output (Pin 1)
Table 5.9 - 2-Input NOR Gate Theoretical Truth Table
Write the Boolean expression below for the relationship
between the device inputs (labeled as A and B) and output
(labeled as Y).
OUTPUT Y = ____________________________
Construct the circuit shown in Figure 5.11. Note that the pin
numbers for inputs and outputs have changes from Figure 5.9
(output is now Pin 1, inputs are on Pins 2 and 3).
Figure 5.11 – 2-Input NOR Gate Test Circuit
Connect the circuit to verify the logic gate operation recording
the input and output voltages. Fill in the truth table below for
ALL possible logic conditions.
Input (Pin 2) Input (Pin 3) Output (Pin 1)
Table 5.10 - 2-Input NOR Gate Measured Truth Table
Do the results match the manufacturer’s truth table?
__________ (YES or NO)
NOT Gate Operation
Acquire a hard copy of a data sheet for the 74LS04 hex NOT
gate.
Figure 5.12 – NOT Gate
Fill in the truth table below for ALL possible logic conditions,
based on the information found on the data sheet.
Input (Pin 2) Input (Pin 3) Output (Pin 1)
6. Table 5.11 - NOT Gate Theoretical Truth Table
Write the Boolean expression below for the relationship
between the device input (labeled as A) and output (labeled as
Y).
OUTPUT Y = ____________________________
Construct the circuit shown in Figure 5.13. Note that the pin
numbers for inputs and outputs have changes from Figure 5.11
(output is now Pin 2, input is on Pin 1).
Figure 5.13 – 2-Input NOR Gate Test Circuit
Connect the circuit to verify the logic gate operation recording
the input and output voltages. Fill in the truth table below for
ALL possible logic conditions.
Input (Pin 1) Output (Pin 2)
Table 5.12 - NOT Gate Measured Truth Table
Do the results match the manufacturer’s truth table?
__________ (YES or NO)
TROUBLESHOOTING
Describe any problems encountered and how those problems
were solved.
7. Table 5.11 - NOT Gate Theoretical Truth Table
Write the Boolean expression below for the relationship
between the device input (labeled as A) and output (labeled as
Y).
OUTPUT Y = ____________________________
Construct the circuit shown in Figure 5.13. Note that the pin
numbers for inputs and outputs have changes from Figure 5.11
(output is now Pin 2, input is on Pin 1).
Figure 5.13 – 2-Input NOR Gate Test Circuit
Connect the circuit to verify the logic gate operation recording
the input and output voltages. Fill in the truth table below for
ALL possible logic conditions.
Input (Pin 1) Output (Pin 2)
Table 5.12 - NOT Gate Measured Truth Table
Do the results match the manufacturer’s truth table?
__________ (YES or NO)
TROUBLESHOOTING
Describe any problems encountered and how those problems
were solved.