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All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: Power MOSFET (Standard Model)
PART NUMBER: TPCP8405
MANUFACTURER: TOSHIBA
REMARK: Body Diode (Standard Model)
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
2
MOSFET MODEL
PSpice model
parameter
Model description
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
3
0
5
10
15
20
25
30
0.0 5.0 10.0 15.0 20.0
Gfs(S)
Drain Current ID (-A)
Measurement
Simulation
Transconductance Characteristics P-Channel
Circuit Simulation Result
Comparison table
-Id(A)
gfs(S)
%Error
Measurement Simulation
0.5 4.750 4.651 -2.08
1 6.670 6.563 -1.60
2 9.330 9.253 -0.82
5 14.500 14.543 0.30
10 20.330 20.429 0.49
20 27.800 28.599 2.87
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
4
V2
-10
V1
0
0
V3
0Vdc
U1
TPCP8405
V_V1
0V -1.0V -2.0V -3.0V -4.0V -5.0V -6.0V
I(V3)
0A
-4A
-8A
-12A
-16A
-20A
Vgs-Id Characteristics P-Channel
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
5
0
4
8
12
16
20
0.0 1.0 2.0 3.0 4.0 5.0 6.0
DrainCurrentID(-A)
Gate - Source Voltage VGS (-V)
Measurement
Simulation
Comparison Graph
Circuit Simulation Result
Simulation Result
-ID(A)
-VGS(V)
%Error
Measurement Simulation
0.5 1.850 1.817 -1.78
1 1.940 1.906 -1.74
2 2.060 2.033 -1.33
5 2.280 2.285 0.21
10 2.575 2.571 -0.17
20 3.040 2.978 -2.03
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
6
0
U1
TPCP8405
V3
0Vdc
VDS
0Vdc
V1
-10
V_VDS
0V -12mV -24mV -36mV -48mV -60mV -72mV
I(V3)
0A
-0.5A
-1.0A
-1.5A
-2.0A
-2.5A
-3.0A
Rds(on) Characteristics P-Channel
Circuit Simulation result
Evaluation circuit
Simulation Result
ID= -3A, VGS= -10V Measurement Simulation %Error
RDS (on) mΩ 24.000 24.000 0.00
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
7
VDD
-24
I1TD = 0
TF = 5n
PW = 600u
PER = 1000u
I1 = 0
I2 = 1m
TR = 5n
-
+
W1
ION = 0uA
IOFF = 1mA
W
I2
6
0
D2
Dbreak
U1
TPCP8405
Time*1mA
0 5n 10n 15n 20n 25n 30n
V(W1:4)
0V
-3V
-6V
-9V
-12V
-15V
-18V
Gate Charge Characteristics P-Channel
Circuit Simulation result
Evaluation circuit
Simulation Result
VDD= -24V,ID=-6A
,VGS= -10V
Measurement Simulation %Error
Qgs nC 3.300 3.298 -0.06
Qgd nC 5.600 5.669 1.23
Qg nC 24.100 20.673 -14.22
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
8
Capacitance Characteristics P-Channel
Simulation Result
-VDS(V)
Cbd(pF)
%Error
Measurement Simulation
0.1 150.000 152.000 1.33
0.2 136.000 138.000 1.47
0.5 108.000 110.000 1.85
1 89.000 89.500 0.56
2 70.000 70.500 0.71
5 49.000 49.500 1.02
10 38.000 38.500 1.32
20 29.000 29.200 0.69
30 25.000 24.700 -1.20
Simulation
Measurement
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
9
Time
0.96us 1.00us 1.04us 1.08us0.94us
V(U1:4) V(U1:5)/1.5
0V
-2V
-4V
-6V
-8V
-10V
-12V
Switching Time Characteristics P-Channel
Circuit Simulation result
Evaluation circuit
Simulation Result
ID= -3A, VDD= -15V
VGS=0/-10V
Measurement Simulation %Error
ton ns 13.600 13.542 -0.43
0
VDD
-15Vdc
V2
TD = 1u
TF = 5n
PW = 10u
PER = 20u
V1 = 0
TR = 5n
V2 = 20
U1
TPCP8405
L2
50nH
R2
4.7
R1 4.7
L1 30nH
RL
5
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
10
V2
-10
V1
0
0
V3
0Vdc
U1
TPCP8405
V_V2
0V -1.0V -2.0V -3.0V -4.0V -5.0V
I(V3)
0A
-4A
-8A
-12A
-16A
-20A
Output Characteristics P-Channel
Circuit Simulation result
Evaluation circuit
VGS= -2.3
-2.4
-3
-2.5
-2.6
-2.7
-2.8
-2.9
-10 -3.2
-3.5
-4.5
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
11
VDS
0
U1
TPCP8405
Vsense
0Vdc
V_VDS
0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V
I(Vsense)
100mA
1.0A
10A
100A
BODY DIODE SPICE MODEL
Forward Current Characteristics P-Channel
Circuit Simulation Result
Evaluation Circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
12
0.1
1.0
10.0
100.0
0 0.2 0.4 0.6 0.8 1 1.2 1.4
DrainreversecurrentIDR(A)
Drain - Source voltage VDS (V)
Measurement
Simulation
Comparison Graph
Circuit Simulation Result
Simulation Result
IDR(A)
VDS (V)
%Error
Measurement Simulation
0.1 0.665 0.660 -0.71
0.2 0.680 0.679 -0.16
0.5 0.708 0.708 0.02
1 0.735 0.737 0.33
2 0.780 0.778 -0.28
5 0.860 0.860 -0.02
10 0.965 0.962 -0.28
20 1.135 1.136 0.11
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
13
V1
TD = 36ns
TF = 21.5ns
PW = 10us
PER = 100us
V1 = -9.5v
TR = 10ns
V2 = 10.7v
R1
50
0
U1
TPCP8405
Time
9.6us 9.8us 10.0us 10.2us 10.4us 10.6us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
Reverse Recovery Characteristics P-Channel
Circuit Simulation Result
Evaluation Circuit
Compare Measurement vs. Simulation
Measurement Simulation %Error
trj ns 11.000 10.821 -1.63
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
14
P-Channel
Reverse Recovery Characteristics Reference
Trj= 11 (ns)
Trb= 30.4 (ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Relation between trj and trb
Example
Measurement
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
15
0
8
16
24
32
40
0.0 4.0 8.0 12.0 16.0 20.0
gfs(S)
Drain Current ID (A)
Measurement
Simulation
Transconductance Characteristics N-Channel
Circuit Simulation Result
Comparison table
Id(A)
gfs(S)
%Error
Measurement Simulation
1 10.700 10.327 -3.49
2 14.500 13.990 -3.52
5 21.000 20.405 -2.83
10 27.500 26.535 -3.51
20 34.500 33.690 -2.35
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
16
V1
0Vdc
V2
10
0
U1
TPCP8405
V3
0Vdc
V_V1
0V 1.0V 2.0V 3.0V 4.0V 5.0V
I(V3)
0A
4A
8A
12A
16A
20A
Vgs-Id Characteristics N-Channel
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
17
0
4
8
12
16
20
0 1 2 3 4 5
DrainCurrentID(A)
Gate - Source Voltage VGS (V)
Measurement
Simulation
Comparison Graph
Circuit Simulation Result
Simulation Result
ID(A)
VGS(V)
%Error
Measurement Simulation
1 2.750 2.787 1.36
2 2.870 2.869 -0.02
5 3.030 3.043 0.41
10 3.200 3.254 1.70
20 3.500 3.584 2.41
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
18
0
VDS
0Vdc
V1
10Vdc
U1
TPCP8405
V3
0Vdc
V_VDS
0V 20mV 40mV 60mV
I(V3)
0A
0.5A
1.0A
1.5A
2.0A
2.5A
3.0A
Rds(on) Characteristics N-Channel
Circuit Simulation result
Evaluation circuit
Simulation Result
ID= 3.3A, VGS= 10V Measurement Simulation %Error
RDS (on) mΩ 20.000 20.000 0.00
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
19
I1TD = 0
TF = 5n
PW = 600u
PER = 1000u
I1 = 0
I2 = 1m
TR = 5n VDD
24
-
+
W1
ION = 0uA
IOFF = 1mA
W
I2
6.5
0
D2
DbreakU1
TPCP8405
Time*1mA
0 5n 10n 15n 20n 25n 30n
V(W1:3)
0V
3V
6V
9V
12V
15V
18V
Gate Charge Characteristics N-Channel
Circuit Simulation result
Evaluation circuit
Simulation Result
VDD= 24V, ID=6.5A
,VGS= 10V
Measurement Simulation %Error
Qgs nC 3.000 2.969 -1.04
Qgd nC 2.300 2.292 -0.36
Qg nC 13.800 12.488 -9.51
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
20
Capacitance Characteristics N-Channel
Simulation Result
VDS (V)
Cbd (pF)
%Error
Measurement Simulation
0.100 395.000 396.810 0.46
0.200 380.000 377.960 -0.54
0.500 335.000 334.180 -0.24
1.000 285.000 286.000 0.35
2.000 230.000 230.500 0.22
5.000 160.000 160.400 0.25
10.000 118.000 117.270 -0.62
20.000 86.000 84.130 -2.17
30.000 67.000 68.920 2.87
Simulation
Measurement
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
21
Time
0.94us 0.96us 0.98us 1.00us 1.02us 1.04us 1.06us
V(U1:2) V(U1:7)/1.5
0V
2V
4V
6V
8V
10V
12V
14V
Switching Time Characteristics N-Channel
Circuit Simulation result
Evaluation circuit
Simulation Result
ID= 3.3A, VDD= 15V
VGS=0/10V
Measurement Simulation %Error
ton ns 10.800 10.816 0.15
0
VDD
15Vdc
V2
TD = 1u
TF = 5n
PW = 10u
PER = 20u
V1 = 0
TR = 5n
V2 = 20
L2
50nH
R2
4.7
R1
4.7
L1
30nH
U1
TPCP8405
RL
4.5
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
22
0
V2
10
V1
0Vdc
U1
TPCP8405
V3
0Vdc
V_V2
0V 1.0V 2.0V 3.0V 4.0V 5.0V
I(V3)
0A
4A
8A
12A
16A
20A
Output Characteristics N-Channel
Circuit Simulation result
Evaluation circuit
VGS=3V
3.3
3.2
3.5
3.4
3.6
3.1
3.73.8
4
4.5
10
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
23
VSD
0
Vsense
0Vdc
U1
TPCP8405
V_VSD
0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V
I(Vsense)
100mA
1.0A
10A
100A
BODY DIODE SPICE MODEL
Forward Current Characteristics N-Channel
Circuit Simulation Result
Evaluation Circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
24
0.1
1.0
10.0
100.0
0 0.2 0.4 0.6 0.8 1 1.2 1.4
DrainreversecurrentIDR(A)
Source - Drain voltage VSD (V)
Measurement
Simulation
Comparison Graph
Circuit Simulation Result
Simulation Result
IDR(A)
VSD (V)
%Error
Measurement Simulation
0.1 0.6500 0.6505 0.08
0.2 0.6750 0.6745 -0.07
0.5 0.7100 0.7093 -0.10
1 0.7400 0.7404 0.06
2 0.7800 0.7804 0.05
5 0.8600 0.8604 0.05
10 0.9600 0.9593 -0.07
20 1.1200 1.1202 0.02
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
25
V1
TD = 35ns
TF = 10ns
PW = 20us
PER = 50us
V1 = -9.40v
TR = 10ns
V2 = 10.60v
R1
50
0
U1
TPCP8405
Time
19.88us 19.96us 20.04us 20.12us 20.20us 20.28us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
Reverse Recovery Characteristics N-Channel
Circuit Simulation Result
Evaluation Circuit
Compare Measurement vs. Simulation
Measurement Simulation %Error
trj ns 14.400 14.244 -1.08
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
26
N-Channel
Reverse Recovery Characteristics Reference
Trj= 14.4 (ns)
Trb= 20.00 (ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Relation between trj and trb
Example
Measurement

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SPICE MODEL of TPCP8405 (Standard+BDS Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: Power MOSFET (Standard Model) PART NUMBER: TPCP8405 MANUFACTURER: TOSHIBA REMARK: Body Diode (Standard Model)
  • 2. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 2 MOSFET MODEL PSpice model parameter Model description LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility
  • 3. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 3 0 5 10 15 20 25 30 0.0 5.0 10.0 15.0 20.0 Gfs(S) Drain Current ID (-A) Measurement Simulation Transconductance Characteristics P-Channel Circuit Simulation Result Comparison table -Id(A) gfs(S) %Error Measurement Simulation 0.5 4.750 4.651 -2.08 1 6.670 6.563 -1.60 2 9.330 9.253 -0.82 5 14.500 14.543 0.30 10 20.330 20.429 0.49 20 27.800 28.599 2.87
  • 4. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 4 V2 -10 V1 0 0 V3 0Vdc U1 TPCP8405 V_V1 0V -1.0V -2.0V -3.0V -4.0V -5.0V -6.0V I(V3) 0A -4A -8A -12A -16A -20A Vgs-Id Characteristics P-Channel Circuit Simulation result Evaluation circuit
  • 5. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 5 0 4 8 12 16 20 0.0 1.0 2.0 3.0 4.0 5.0 6.0 DrainCurrentID(-A) Gate - Source Voltage VGS (-V) Measurement Simulation Comparison Graph Circuit Simulation Result Simulation Result -ID(A) -VGS(V) %Error Measurement Simulation 0.5 1.850 1.817 -1.78 1 1.940 1.906 -1.74 2 2.060 2.033 -1.33 5 2.280 2.285 0.21 10 2.575 2.571 -0.17 20 3.040 2.978 -2.03
  • 6. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 6 0 U1 TPCP8405 V3 0Vdc VDS 0Vdc V1 -10 V_VDS 0V -12mV -24mV -36mV -48mV -60mV -72mV I(V3) 0A -0.5A -1.0A -1.5A -2.0A -2.5A -3.0A Rds(on) Characteristics P-Channel Circuit Simulation result Evaluation circuit Simulation Result ID= -3A, VGS= -10V Measurement Simulation %Error RDS (on) mΩ 24.000 24.000 0.00
  • 7. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 7 VDD -24 I1TD = 0 TF = 5n PW = 600u PER = 1000u I1 = 0 I2 = 1m TR = 5n - + W1 ION = 0uA IOFF = 1mA W I2 6 0 D2 Dbreak U1 TPCP8405 Time*1mA 0 5n 10n 15n 20n 25n 30n V(W1:4) 0V -3V -6V -9V -12V -15V -18V Gate Charge Characteristics P-Channel Circuit Simulation result Evaluation circuit Simulation Result VDD= -24V,ID=-6A ,VGS= -10V Measurement Simulation %Error Qgs nC 3.300 3.298 -0.06 Qgd nC 5.600 5.669 1.23 Qg nC 24.100 20.673 -14.22
  • 8. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 8 Capacitance Characteristics P-Channel Simulation Result -VDS(V) Cbd(pF) %Error Measurement Simulation 0.1 150.000 152.000 1.33 0.2 136.000 138.000 1.47 0.5 108.000 110.000 1.85 1 89.000 89.500 0.56 2 70.000 70.500 0.71 5 49.000 49.500 1.02 10 38.000 38.500 1.32 20 29.000 29.200 0.69 30 25.000 24.700 -1.20 Simulation Measurement
  • 9. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 9 Time 0.96us 1.00us 1.04us 1.08us0.94us V(U1:4) V(U1:5)/1.5 0V -2V -4V -6V -8V -10V -12V Switching Time Characteristics P-Channel Circuit Simulation result Evaluation circuit Simulation Result ID= -3A, VDD= -15V VGS=0/-10V Measurement Simulation %Error ton ns 13.600 13.542 -0.43 0 VDD -15Vdc V2 TD = 1u TF = 5n PW = 10u PER = 20u V1 = 0 TR = 5n V2 = 20 U1 TPCP8405 L2 50nH R2 4.7 R1 4.7 L1 30nH RL 5
  • 10. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 10 V2 -10 V1 0 0 V3 0Vdc U1 TPCP8405 V_V2 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) 0A -4A -8A -12A -16A -20A Output Characteristics P-Channel Circuit Simulation result Evaluation circuit VGS= -2.3 -2.4 -3 -2.5 -2.6 -2.7 -2.8 -2.9 -10 -3.2 -3.5 -4.5
  • 11. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 11 VDS 0 U1 TPCP8405 Vsense 0Vdc V_VDS 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V I(Vsense) 100mA 1.0A 10A 100A BODY DIODE SPICE MODEL Forward Current Characteristics P-Channel Circuit Simulation Result Evaluation Circuit
  • 12. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 12 0.1 1.0 10.0 100.0 0 0.2 0.4 0.6 0.8 1 1.2 1.4 DrainreversecurrentIDR(A) Drain - Source voltage VDS (V) Measurement Simulation Comparison Graph Circuit Simulation Result Simulation Result IDR(A) VDS (V) %Error Measurement Simulation 0.1 0.665 0.660 -0.71 0.2 0.680 0.679 -0.16 0.5 0.708 0.708 0.02 1 0.735 0.737 0.33 2 0.780 0.778 -0.28 5 0.860 0.860 -0.02 10 0.965 0.962 -0.28 20 1.135 1.136 0.11
  • 13. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 13 V1 TD = 36ns TF = 21.5ns PW = 10us PER = 100us V1 = -9.5v TR = 10ns V2 = 10.7v R1 50 0 U1 TPCP8405 Time 9.6us 9.8us 10.0us 10.2us 10.4us 10.6us I(R1) -400mA -300mA -200mA -100mA -0mA 100mA 200mA 300mA 400mA Reverse Recovery Characteristics P-Channel Circuit Simulation Result Evaluation Circuit Compare Measurement vs. Simulation Measurement Simulation %Error trj ns 11.000 10.821 -1.63
  • 14. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 14 P-Channel Reverse Recovery Characteristics Reference Trj= 11 (ns) Trb= 30.4 (ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Relation between trj and trb Example Measurement
  • 15. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 15 0 8 16 24 32 40 0.0 4.0 8.0 12.0 16.0 20.0 gfs(S) Drain Current ID (A) Measurement Simulation Transconductance Characteristics N-Channel Circuit Simulation Result Comparison table Id(A) gfs(S) %Error Measurement Simulation 1 10.700 10.327 -3.49 2 14.500 13.990 -3.52 5 21.000 20.405 -2.83 10 27.500 26.535 -3.51 20 34.500 33.690 -2.35
  • 16. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 16 V1 0Vdc V2 10 0 U1 TPCP8405 V3 0Vdc V_V1 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(V3) 0A 4A 8A 12A 16A 20A Vgs-Id Characteristics N-Channel Circuit Simulation result Evaluation circuit
  • 17. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 17 0 4 8 12 16 20 0 1 2 3 4 5 DrainCurrentID(A) Gate - Source Voltage VGS (V) Measurement Simulation Comparison Graph Circuit Simulation Result Simulation Result ID(A) VGS(V) %Error Measurement Simulation 1 2.750 2.787 1.36 2 2.870 2.869 -0.02 5 3.030 3.043 0.41 10 3.200 3.254 1.70 20 3.500 3.584 2.41
  • 18. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 18 0 VDS 0Vdc V1 10Vdc U1 TPCP8405 V3 0Vdc V_VDS 0V 20mV 40mV 60mV I(V3) 0A 0.5A 1.0A 1.5A 2.0A 2.5A 3.0A Rds(on) Characteristics N-Channel Circuit Simulation result Evaluation circuit Simulation Result ID= 3.3A, VGS= 10V Measurement Simulation %Error RDS (on) mΩ 20.000 20.000 0.00
  • 19. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 19 I1TD = 0 TF = 5n PW = 600u PER = 1000u I1 = 0 I2 = 1m TR = 5n VDD 24 - + W1 ION = 0uA IOFF = 1mA W I2 6.5 0 D2 DbreakU1 TPCP8405 Time*1mA 0 5n 10n 15n 20n 25n 30n V(W1:3) 0V 3V 6V 9V 12V 15V 18V Gate Charge Characteristics N-Channel Circuit Simulation result Evaluation circuit Simulation Result VDD= 24V, ID=6.5A ,VGS= 10V Measurement Simulation %Error Qgs nC 3.000 2.969 -1.04 Qgd nC 2.300 2.292 -0.36 Qg nC 13.800 12.488 -9.51
  • 20. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 20 Capacitance Characteristics N-Channel Simulation Result VDS (V) Cbd (pF) %Error Measurement Simulation 0.100 395.000 396.810 0.46 0.200 380.000 377.960 -0.54 0.500 335.000 334.180 -0.24 1.000 285.000 286.000 0.35 2.000 230.000 230.500 0.22 5.000 160.000 160.400 0.25 10.000 118.000 117.270 -0.62 20.000 86.000 84.130 -2.17 30.000 67.000 68.920 2.87 Simulation Measurement
  • 21. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 21 Time 0.94us 0.96us 0.98us 1.00us 1.02us 1.04us 1.06us V(U1:2) V(U1:7)/1.5 0V 2V 4V 6V 8V 10V 12V 14V Switching Time Characteristics N-Channel Circuit Simulation result Evaluation circuit Simulation Result ID= 3.3A, VDD= 15V VGS=0/10V Measurement Simulation %Error ton ns 10.800 10.816 0.15 0 VDD 15Vdc V2 TD = 1u TF = 5n PW = 10u PER = 20u V1 = 0 TR = 5n V2 = 20 L2 50nH R2 4.7 R1 4.7 L1 30nH U1 TPCP8405 RL 4.5
  • 22. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 22 0 V2 10 V1 0Vdc U1 TPCP8405 V3 0Vdc V_V2 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(V3) 0A 4A 8A 12A 16A 20A Output Characteristics N-Channel Circuit Simulation result Evaluation circuit VGS=3V 3.3 3.2 3.5 3.4 3.6 3.1 3.73.8 4 4.5 10
  • 23. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 23 VSD 0 Vsense 0Vdc U1 TPCP8405 V_VSD 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V I(Vsense) 100mA 1.0A 10A 100A BODY DIODE SPICE MODEL Forward Current Characteristics N-Channel Circuit Simulation Result Evaluation Circuit
  • 24. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 24 0.1 1.0 10.0 100.0 0 0.2 0.4 0.6 0.8 1 1.2 1.4 DrainreversecurrentIDR(A) Source - Drain voltage VSD (V) Measurement Simulation Comparison Graph Circuit Simulation Result Simulation Result IDR(A) VSD (V) %Error Measurement Simulation 0.1 0.6500 0.6505 0.08 0.2 0.6750 0.6745 -0.07 0.5 0.7100 0.7093 -0.10 1 0.7400 0.7404 0.06 2 0.7800 0.7804 0.05 5 0.8600 0.8604 0.05 10 0.9600 0.9593 -0.07 20 1.1200 1.1202 0.02
  • 25. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 25 V1 TD = 35ns TF = 10ns PW = 20us PER = 50us V1 = -9.40v TR = 10ns V2 = 10.60v R1 50 0 U1 TPCP8405 Time 19.88us 19.96us 20.04us 20.12us 20.20us 20.28us I(R1) -400mA -300mA -200mA -100mA -0mA 100mA 200mA 300mA 400mA Reverse Recovery Characteristics N-Channel Circuit Simulation Result Evaluation Circuit Compare Measurement vs. Simulation Measurement Simulation %Error trj ns 14.400 14.244 -1.08
  • 26. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 26 N-Channel Reverse Recovery Characteristics Reference Trj= 14.4 (ns) Trb= 20.00 (ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Relation between trj and trb Example Measurement