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All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: MOSFET (Model Parameters)
PART NUMBER: TPCP8R01
MANUFACTURER: TOSHIBA
REMARK: Body Diode (Model Parameters)
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
2
U?
TPCP8R01
Circuit Configuration
MOSFET MODEL
PSpice model
parameter
Model description
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
3
Transconductance Characteristics
Circuit Simulation result
Comparison table
ID (A)
gfs (S)
%Error
Measurement Simulation
0.5 1.46 1.426 -2.33
1 1.96 1.935 -1.28
2 2.56 2.581 0.82
4 3.33 3.369 1.17
VDS=10V
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
4
V_VGS
0V 1.0V 2.0V 3.0V 4.0V 5.0V
-I(VDS)
0A
1.0A
2.0A
3.0A
4.0A
5.0A
VGS
0
U1
TPCP8R01
G
VDS
10V
Vgs-Id Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
5
Comparison Graph
Circuit Simulation result
Comparison table
ID (A)
VGS (V)
%Error
Measurement Simulation
0.1 2.000 2.015 0.75
0.2 2.140 2.138 -0.09
0.5 2.400 2.391 -0.37
1 2.700 2.688 -0.44
2 3.120 3.129 0.29
5 4.120 4.082 -0.92
VDS=10V
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
6
VGS
10V
0
U1
TPCP8R01
G
VDS
V_VDS
0V 48mV 96mV 144mV 192mV 230mV
-I(VDS)
0A
0.2A
0.4A
0.6A
0.8A
1.0A
Rds(on) Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: VGS=10(A), ID=1(A)
Parameter Unit Measurement Simulation %Error
RDS(on) mΩ 230 230.140 0.06
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
7
V_VDS
0V 2V 4V 6V 8V 10V
-I(VDS)
0A
1.0A
2.0A
3.0A
4.0A
5.0A
VGS
0
G
U1
TPCP8R01
VDS
Output Characteristics
Circuit Simulation result
Evaluation circuit
VGS=2.5V
3.0
3.5
3.75
4
10, 8
6
5
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
8
Capacitance Characteristics
Simulation result
Comparison table
VDS (V)
Cbd (pF)
%Error
Measurement Simulation
0.1 150 150 0.00
0.5 120 118.8 -1.00
1 98 100 2.04
5 60 59 -1.67
10 48 45.82 -4.54
50 24 24.8 3.33
Simulation
Measurement
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
9
Time*1m
0s 0.5ns 1.5ns 2.5ns 3.5ns 4.5ns
V(W1:3)
0V
2V
4V
6V
8V
10V
12V
U1
TPCP8R01
0
D1
DMod
ID
2A
VDD
48Vdc
-
+
W1
ION = 0
IOFF = 1mA
WIGTD = 0
TF = 10n
PW = 10m
PER = 1
I1 = 0
I2 = 1m
TR = 10n
Gate Charge Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: VDD=48(V), VGS=10(V), ID=2(A)
Parameter Unit Measurement Simulation %Error
Qgs nc 0.98 0.983 0.31
Qgd nc 1.4 1.409 0.64
Qg nc 5 4.57 -8.60
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
10
Time
1.90us 2.10us 2.30us 2.50us 2.70us
V(G) V(D)/3
0V
5V
10V
15V
20V
U1
TPCP8R01
D
RL
30
VDD
30V
V1TD = 2u
TF = 20n
PW = 5u
PER = 500u
V1 = 0
TR = 20n
V2 = 20
0
L2
50nH
1 2 D
L1
30nH
12
R2
50
G
R1
50
Switching Time Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: VDD=30(V), VGS=0/10(V), ID=1(A)
Parameter Unit Measurement Simulation %Error
ton ns 210 210 0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
11
V_VDS
0V -0.4V -0.8V -1.2V -1.6V -2.0V -2.4V
I(VDS)
100mA
1.0A
10A
VDS
0
U1
TPCP8R01
Body Diode Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
12
Comparison Graph
Simulation result
Comparison table
IDR (A)
-VDS (V)
%Error
Measurement Simulation
0.1 0.667 0.670 0.45
0.2 0.720 0.717 -0.42
0.5 0.800 0.795 -0.63
1 0.867 0.875 0.92
2 1.000 0.997 -0.30
5 1.293 1.285 -0.62
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
13
Time
8.4us 9.2us 10.0us 10.8us 11.6us 12.4us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
0
U1
TPCP8R01
V1TD = 100ns
TF = 15ns
PW = 10us
PER = 1ms
V1 = -9.2V
TR = 15ns
V2 = 10.7V
R1
50
Reverse Recovery Characteristics
Circuit Simulation result
Evaluation circuit
Comparison Measurement vs. Simulation
Parameter Unit Measurement Simulation %Error
trj ns 18 17.94 -0.33
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
14
Reverse Recovery Characteristics Reference
Trj = 18(ns)
Trb = 272(ns)
Conditions: Ifwd = lrev = 0.2(A), Rl = 50
Relation between trj and trb
Example
Measurement
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
15
V_VGS
0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V
-I(VGS)
0A
1mA
2mA
3mA
4mA
5mA
6mA
7mA
8mA
9mA
10mA
VGS
0
U1
TPCP8R01
R1
1G
ESD PROTECTION DIODE
Zener Voltage Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
16
Zener Voltage Characteristics Reference
IZ = 1(mA)
VZ = 24.75(V) at IZ=1mA
Measurement
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
17
ZENER DIODE MODEL
PSpice model
parameter
Model description
IS Saturation Current
N Emission Coefficient
RS Series Resistance
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
TT Transit Time
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
18
V_Vz
0V 10V 20V 30V 40V 50V
-I(Vz)
1.0uA
10uA
100uA
1.0mA
10mA
100mA
Vz
0
U1
TPCP8R01
Reverse Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
19
0.001
0.01
0.1
1
10
0 10 20 30 40 50
ZENERCURRENTIZ(mA)
ZENER VOLTAGE VZ (V)
Measurement
Simulation
Comparison Graph
Circuit Simulation result
Comparison table
IZ (mA)
VZ (V)
%Error
Measurement Simulation
0.001 41.910 41.808 -0.24
0.01 42.059 41.900 -0.38
0.1 42.088 41.904 -0.44
1 42.118 41.945 -0.41
2 42.147 41.989 -0.37
5 42.176 42.046 -0.31
10 42.209 42.127 -0.19
20 42.294 42.277 -0.04
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
20
V(F)
0.5V 0.6V 0.7V 0.8V 0.9V 1.0V
I_IF
1.0uA
10uA
100uA
1.0mA
10mA
100mA
0
F
IF
U1
TPCP8R01
Forward Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
21
0.001
0.01
0.1
1
10
0.5 0.6 0.7 0.8 0.9 1.0
FORWARDCURRENTIF(mA)
FORWARD VOLTAGE VF (V)
Measurement
Simulation
Comparison Graph
Simulation result
Comparison table
IF (mA)
VF (V)
%Error
Measurement Simulation
0.001 0.528 0.525 -0.57
0.01 0.589 0.589 0.00
0.1 0.651 0.654 0.46
1 0.714 0.718 0.56
10 0.787 0.786 -0.13
20 0.812 0.809 -0.37
50 0.849 0.847 -0.24
100 0.885 0.887 0.23
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
22
V(z)
1.0V 10V 100V
-I(Vz)/(40V/1us)
0
4p
8p
12p
16p
20p
24p
z
Vz
TD = 0
TF = 10ns
PW = 10us
PER = 50us
V1 = 0
TR = 1us
V2 = 40
0
U1
TPCP8R01
Capacitance Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
23
0
4
8
12
16
20
24
1 10 100
CapacitanceCj(pF)
ZENER VOLTAGE VZ (V)
Measurement
Simulation
Comparison Graph
Simulation result
Comparison table
VZ (V)
Cj (pF)
%Error
Measurement Simulation
1 18.900 18.936 0.19
2 16.120 16.102 -0.11
5 12.500 12.472 -0.22
10 10.070 10.073 0.03
20 8.040 8.067 0.34
40 6.375 6.435 0.94

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SPICE MODEL of TPCP8R01 (Standard+BDS Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: MOSFET (Model Parameters) PART NUMBER: TPCP8R01 MANUFACTURER: TOSHIBA REMARK: Body Diode (Model Parameters)
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 2 U? TPCP8R01 Circuit Configuration MOSFET MODEL PSpice model parameter Model description LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 3 Transconductance Characteristics Circuit Simulation result Comparison table ID (A) gfs (S) %Error Measurement Simulation 0.5 1.46 1.426 -2.33 1 1.96 1.935 -1.28 2 2.56 2.581 0.82 4 3.33 3.369 1.17 VDS=10V
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 4 V_VGS 0V 1.0V 2.0V 3.0V 4.0V 5.0V -I(VDS) 0A 1.0A 2.0A 3.0A 4.0A 5.0A VGS 0 U1 TPCP8R01 G VDS 10V Vgs-Id Characteristics Circuit Simulation result Evaluation circuit
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 5 Comparison Graph Circuit Simulation result Comparison table ID (A) VGS (V) %Error Measurement Simulation 0.1 2.000 2.015 0.75 0.2 2.140 2.138 -0.09 0.5 2.400 2.391 -0.37 1 2.700 2.688 -0.44 2 3.120 3.129 0.29 5 4.120 4.082 -0.92 VDS=10V
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 6 VGS 10V 0 U1 TPCP8R01 G VDS V_VDS 0V 48mV 96mV 144mV 192mV 230mV -I(VDS) 0A 0.2A 0.4A 0.6A 0.8A 1.0A Rds(on) Characteristics Circuit Simulation result Evaluation circuit Test condition: VGS=10(A), ID=1(A) Parameter Unit Measurement Simulation %Error RDS(on) mΩ 230 230.140 0.06
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 7 V_VDS 0V 2V 4V 6V 8V 10V -I(VDS) 0A 1.0A 2.0A 3.0A 4.0A 5.0A VGS 0 G U1 TPCP8R01 VDS Output Characteristics Circuit Simulation result Evaluation circuit VGS=2.5V 3.0 3.5 3.75 4 10, 8 6 5
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 8 Capacitance Characteristics Simulation result Comparison table VDS (V) Cbd (pF) %Error Measurement Simulation 0.1 150 150 0.00 0.5 120 118.8 -1.00 1 98 100 2.04 5 60 59 -1.67 10 48 45.82 -4.54 50 24 24.8 3.33 Simulation Measurement
  • 9. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 9 Time*1m 0s 0.5ns 1.5ns 2.5ns 3.5ns 4.5ns V(W1:3) 0V 2V 4V 6V 8V 10V 12V U1 TPCP8R01 0 D1 DMod ID 2A VDD 48Vdc - + W1 ION = 0 IOFF = 1mA WIGTD = 0 TF = 10n PW = 10m PER = 1 I1 = 0 I2 = 1m TR = 10n Gate Charge Characteristics Circuit Simulation result Evaluation circuit Test condition: VDD=48(V), VGS=10(V), ID=2(A) Parameter Unit Measurement Simulation %Error Qgs nc 0.98 0.983 0.31 Qgd nc 1.4 1.409 0.64 Qg nc 5 4.57 -8.60
  • 10. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 10 Time 1.90us 2.10us 2.30us 2.50us 2.70us V(G) V(D)/3 0V 5V 10V 15V 20V U1 TPCP8R01 D RL 30 VDD 30V V1TD = 2u TF = 20n PW = 5u PER = 500u V1 = 0 TR = 20n V2 = 20 0 L2 50nH 1 2 D L1 30nH 12 R2 50 G R1 50 Switching Time Characteristics Circuit Simulation result Evaluation circuit Test condition: VDD=30(V), VGS=0/10(V), ID=1(A) Parameter Unit Measurement Simulation %Error ton ns 210 210 0
  • 11. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 11 V_VDS 0V -0.4V -0.8V -1.2V -1.6V -2.0V -2.4V I(VDS) 100mA 1.0A 10A VDS 0 U1 TPCP8R01 Body Diode Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 12. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 12 Comparison Graph Simulation result Comparison table IDR (A) -VDS (V) %Error Measurement Simulation 0.1 0.667 0.670 0.45 0.2 0.720 0.717 -0.42 0.5 0.800 0.795 -0.63 1 0.867 0.875 0.92 2 1.000 0.997 -0.30 5 1.293 1.285 -0.62
  • 13. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 13 Time 8.4us 9.2us 10.0us 10.8us 11.6us 12.4us I(R1) -400mA -300mA -200mA -100mA -0mA 100mA 200mA 300mA 400mA 0 U1 TPCP8R01 V1TD = 100ns TF = 15ns PW = 10us PER = 1ms V1 = -9.2V TR = 15ns V2 = 10.7V R1 50 Reverse Recovery Characteristics Circuit Simulation result Evaluation circuit Comparison Measurement vs. Simulation Parameter Unit Measurement Simulation %Error trj ns 18 17.94 -0.33
  • 14. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 14 Reverse Recovery Characteristics Reference Trj = 18(ns) Trb = 272(ns) Conditions: Ifwd = lrev = 0.2(A), Rl = 50 Relation between trj and trb Example Measurement
  • 15. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 15 V_VGS 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V -I(VGS) 0A 1mA 2mA 3mA 4mA 5mA 6mA 7mA 8mA 9mA 10mA VGS 0 U1 TPCP8R01 R1 1G ESD PROTECTION DIODE Zener Voltage Characteristics Circuit Simulation result Evaluation circuit
  • 16. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 16 Zener Voltage Characteristics Reference IZ = 1(mA) VZ = 24.75(V) at IZ=1mA Measurement
  • 17. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 17 ZENER DIODE MODEL PSpice model parameter Model description IS Saturation Current N Emission Coefficient RS Series Resistance CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value TT Transit Time
  • 18. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 18 V_Vz 0V 10V 20V 30V 40V 50V -I(Vz) 1.0uA 10uA 100uA 1.0mA 10mA 100mA Vz 0 U1 TPCP8R01 Reverse Characteristics Circuit Simulation result Evaluation circuit
  • 19. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 19 0.001 0.01 0.1 1 10 0 10 20 30 40 50 ZENERCURRENTIZ(mA) ZENER VOLTAGE VZ (V) Measurement Simulation Comparison Graph Circuit Simulation result Comparison table IZ (mA) VZ (V) %Error Measurement Simulation 0.001 41.910 41.808 -0.24 0.01 42.059 41.900 -0.38 0.1 42.088 41.904 -0.44 1 42.118 41.945 -0.41 2 42.147 41.989 -0.37 5 42.176 42.046 -0.31 10 42.209 42.127 -0.19 20 42.294 42.277 -0.04
  • 20. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 20 V(F) 0.5V 0.6V 0.7V 0.8V 0.9V 1.0V I_IF 1.0uA 10uA 100uA 1.0mA 10mA 100mA 0 F IF U1 TPCP8R01 Forward Characteristics Circuit Simulation result Evaluation circuit
  • 21. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 21 0.001 0.01 0.1 1 10 0.5 0.6 0.7 0.8 0.9 1.0 FORWARDCURRENTIF(mA) FORWARD VOLTAGE VF (V) Measurement Simulation Comparison Graph Simulation result Comparison table IF (mA) VF (V) %Error Measurement Simulation 0.001 0.528 0.525 -0.57 0.01 0.589 0.589 0.00 0.1 0.651 0.654 0.46 1 0.714 0.718 0.56 10 0.787 0.786 -0.13 20 0.812 0.809 -0.37 50 0.849 0.847 -0.24 100 0.885 0.887 0.23
  • 22. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 22 V(z) 1.0V 10V 100V -I(Vz)/(40V/1us) 0 4p 8p 12p 16p 20p 24p z Vz TD = 0 TF = 10ns PW = 10us PER = 50us V1 = 0 TR = 1us V2 = 40 0 U1 TPCP8R01 Capacitance Characteristics Circuit Simulation result Evaluation circuit
  • 23. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 23 0 4 8 12 16 20 24 1 10 100 CapacitanceCj(pF) ZENER VOLTAGE VZ (V) Measurement Simulation Comparison Graph Simulation result Comparison table VZ (V) Cj (pF) %Error Measurement Simulation 1 18.900 18.936 0.19 2 16.120 16.102 -0.11 5 12.500 12.472 -0.22 10 10.070 10.073 0.03 20 8.040 8.067 0.34 40 6.375 6.435 0.94