The document discusses operational amplifiers and their applications. It begins with an overview of amplifiers and operational amplifiers, describing how op amps can be configured with feedback networks to perform various "operations" on input signals. It then covers key op amp performance features such as bandwidth, slew rate, offset voltage, input impedance, and noise. Specific op amp configurations and their transfer functions are shown. The document discusses op amp error sources and how to calculate total output noise. It also examines dominant noise sources and 1/f noise considerations. An example amplifier, the ADA4528, is highlighted for its extremely low noise performance.
Amplifiers: Capture Signals and Drive Precision Systems (Design Conference 2013)Analog Devices, Inc.
Amplifiers are the workhorses of data acquisition and transmission systems. They capture and amplify the low level signals from sensors and transmitters, and can pull these signals from high noise and high common-mode voltage levels. Amplifiers can also change the signal range and switch from single-ended to differential (or the reverse) to match exactly the input range of an ADC. This session covers the versatility and power of amplifiers in precision systems.
Data conversion for data acquisition is a two-part process that involves sampling and then converting signals into digital venues. These processes inherently remove part of the complete analog signal in exchange for the power and robustness of digital signal handling. This becomes especially difficult when trying to capture signals at the limits of the resolution and speed of our systems. In this session, learn how to design a data conversion system that minimizes the signal loss to match the signal handling requirements … even on the hard ones.
Instrumentation: Test and Measurement Methods and Solutions (Design Conferenc...Analog Devices, Inc.
Tilt Measurement:
Tilt measurement is fast becoming a fundamental analysis tool in many fields including automotive, industrial, and healthcare. Navigation, vehicle dynamic control, building sway indication and motion detection systems all rely on this simple, cheap, and precise way of angle monitoring. MEMs accelerometers are ideally suited to inclination measurement than other methodologies. This session will address the challenges encountered when designing a dual-axis tilt sensor using a MEMs accelerometer including measurement resolution, signal conditioning, single- vs.
dual-axis, angle computation, and calibration.
Impedance Measurement: The measurement of complex impedance is widely used across industrial, commercial, automotive, healthcare, and consumer markets, and can include applications such as proximity sensing, inductive transducers, metallurgy and corrosion detection, loudspeaker impedance, biomedical, virus detection, blood coagulation factor, and network impedance analysis. This session will cover the concepts, approaches, and challenges of performing complex impedance measurements, and will present a system-level solution for impedance conversion.
Weigh Scale Measurement: Most common industrial weigh scale applications use a bridge-type load-cell sensor, with a voltage output that is directly proportional to the load weight placed on it. This session examines the basic parameters of a bridge-type load-cell sensor, such as the number of varying elements, impedance, excitation, sensitivity (mV/V), errors, and drift. It will also discuss the various components of the signal conditioning chain and present solutions with high dynamic range.
Sensors are the eyes, ears, and hands of electronic systems and allow them to capture the state of the environment. The capture and processing of sensor inputs is a delicate process that requires understanding of the signal details. Integration of sensor functions onto silicon has brought about improved performance, better signal handling, and lower total system cost. MEMS (microelectromechanical systems) sensors have opened up entire new areas and applications. In this session, the fundamental MEMS sensor concept of moving fingers that form a variable capacitor is covered, along with how it is turned into a usable motion signal. Adaptations for multiaccess sensing, rotational sensing, and even sound sensing, along with concepts of how these devices are tested and calibrated, are covered.
Instrumentation: Test and Measurement Methods and Solutions - VE2013Analog Devices, Inc.
Tilt Measurement: Tilt measurement is fast becoming a fundamental analysis tool in many fields including automotive, industrial, and healthcare. Navigation, vehicle dynamic control, building sway indication, and motion detection systems all rely on this simple, cheap, and precise way of angle monitoring. MEMS accelerometers are better suited to inclination measurement than other methodologies. This session will address the challenges encountered when designing a dual-axis tilt sensor using a MEMS accelerometer including measurement resolution, signal conditioning, single- vs. dual-axis, angle computation, and calibration.
Impedance Measurement: The measurement of complex impedance is widely used across industrial, commercial, automotive, healthcare, and consumer markets, and can include applications such as proximity sensing, inductive transducers, metallurgy and corrosion detection, loudspeaker impedance, biomedical, virus detection, blood coagulation factor, and network impedance analysis. This session will cover the concepts, approaches, and challenges of performing complex impedance measurements and will present a system-level solution for impedance conversion.
Weigh Scale Measurement: Most common industrial weigh scale applications use a bridge-type load-cell sensor, with a voltage output that is directly proportional to the load weight placed on it. This session examines the basic parameters of a bridge-type load-cell sensor, such as the number of varying elements, impedance, excitation, sensitivity (mV/V), errors, and drift. It will also discuss the various components of the signal conditioning chain and present solutions with high dynamic range.
This session combines the high speed analog signal chain from RF to baseband with FPGA-based digital signal processing for wireless communications. Topics include the high speed analog signal chain, direct conversion radio architecture, the high speed data converter interface, and FPGA-based digital signal processing for software-defined radio. The demo board uses the latest generation of Analog Devices’ high speed data converters, RF, and clocking devices, along with the Xilinx Zynq-7000 SoC. Other topics of discussion include the imperfections introduced by the modulator/demodulator with particular focus on the effect of temperature and frequency changes. In-factory and in-field algorithms that reduce the effect of these imperfections, with particular emphasis on the efficacy of in-factory set-and-forget algorithms, are examined.
Amplifiers: Capture Signals and Drive Precision Systems (Design Conference 2013)Analog Devices, Inc.
Amplifiers are the workhorses of data acquisition and transmission systems. They capture and amplify the low level signals from sensors and transmitters, and can pull these signals from high noise and high common-mode voltage levels. Amplifiers can also change the signal range and switch from single-ended to differential (or the reverse) to match exactly the input range of an ADC. This session covers the versatility and power of amplifiers in precision systems.
Data conversion for data acquisition is a two-part process that involves sampling and then converting signals into digital venues. These processes inherently remove part of the complete analog signal in exchange for the power and robustness of digital signal handling. This becomes especially difficult when trying to capture signals at the limits of the resolution and speed of our systems. In this session, learn how to design a data conversion system that minimizes the signal loss to match the signal handling requirements … even on the hard ones.
Instrumentation: Test and Measurement Methods and Solutions (Design Conferenc...Analog Devices, Inc.
Tilt Measurement:
Tilt measurement is fast becoming a fundamental analysis tool in many fields including automotive, industrial, and healthcare. Navigation, vehicle dynamic control, building sway indication and motion detection systems all rely on this simple, cheap, and precise way of angle monitoring. MEMs accelerometers are ideally suited to inclination measurement than other methodologies. This session will address the challenges encountered when designing a dual-axis tilt sensor using a MEMs accelerometer including measurement resolution, signal conditioning, single- vs.
dual-axis, angle computation, and calibration.
Impedance Measurement: The measurement of complex impedance is widely used across industrial, commercial, automotive, healthcare, and consumer markets, and can include applications such as proximity sensing, inductive transducers, metallurgy and corrosion detection, loudspeaker impedance, biomedical, virus detection, blood coagulation factor, and network impedance analysis. This session will cover the concepts, approaches, and challenges of performing complex impedance measurements, and will present a system-level solution for impedance conversion.
Weigh Scale Measurement: Most common industrial weigh scale applications use a bridge-type load-cell sensor, with a voltage output that is directly proportional to the load weight placed on it. This session examines the basic parameters of a bridge-type load-cell sensor, such as the number of varying elements, impedance, excitation, sensitivity (mV/V), errors, and drift. It will also discuss the various components of the signal conditioning chain and present solutions with high dynamic range.
Sensors are the eyes, ears, and hands of electronic systems and allow them to capture the state of the environment. The capture and processing of sensor inputs is a delicate process that requires understanding of the signal details. Integration of sensor functions onto silicon has brought about improved performance, better signal handling, and lower total system cost. MEMS (microelectromechanical systems) sensors have opened up entire new areas and applications. In this session, the fundamental MEMS sensor concept of moving fingers that form a variable capacitor is covered, along with how it is turned into a usable motion signal. Adaptations for multiaccess sensing, rotational sensing, and even sound sensing, along with concepts of how these devices are tested and calibrated, are covered.
Instrumentation: Test and Measurement Methods and Solutions - VE2013Analog Devices, Inc.
Tilt Measurement: Tilt measurement is fast becoming a fundamental analysis tool in many fields including automotive, industrial, and healthcare. Navigation, vehicle dynamic control, building sway indication, and motion detection systems all rely on this simple, cheap, and precise way of angle monitoring. MEMS accelerometers are better suited to inclination measurement than other methodologies. This session will address the challenges encountered when designing a dual-axis tilt sensor using a MEMS accelerometer including measurement resolution, signal conditioning, single- vs. dual-axis, angle computation, and calibration.
Impedance Measurement: The measurement of complex impedance is widely used across industrial, commercial, automotive, healthcare, and consumer markets, and can include applications such as proximity sensing, inductive transducers, metallurgy and corrosion detection, loudspeaker impedance, biomedical, virus detection, blood coagulation factor, and network impedance analysis. This session will cover the concepts, approaches, and challenges of performing complex impedance measurements and will present a system-level solution for impedance conversion.
Weigh Scale Measurement: Most common industrial weigh scale applications use a bridge-type load-cell sensor, with a voltage output that is directly proportional to the load weight placed on it. This session examines the basic parameters of a bridge-type load-cell sensor, such as the number of varying elements, impedance, excitation, sensitivity (mV/V), errors, and drift. It will also discuss the various components of the signal conditioning chain and present solutions with high dynamic range.
This session combines the high speed analog signal chain from RF to baseband with FPGA-based digital signal processing for wireless communications. Topics include the high speed analog signal chain, direct conversion radio architecture, the high speed data converter interface, and FPGA-based digital signal processing for software-defined radio. The demo board uses the latest generation of Analog Devices’ high speed data converters, RF, and clocking devices, along with the Xilinx Zynq-7000 SoC. Other topics of discussion include the imperfections introduced by the modulator/demodulator with particular focus on the effect of temperature and frequency changes. In-factory and in-field algorithms that reduce the effect of these imperfections, with particular emphasis on the efficacy of in-factory set-and-forget algorithms, are examined.
Sensors for Low Level Signal Acquisition (Design Conference 2013)Analog Devices, Inc.
Sensors are the eyes, ears, and hands of electronic systems and allow them to capture the state of the environment. The capture and processing of sensor inputs is a delicate process that requires understanding of the signal details.Integration of sensor functions onto silicon has brought about improved performance, better signal handling, and lower total system cost. MEMS (microelectromechanical systems) sensors have opened up entire new areas and applications. In this session, the fundamental MEMS sensor concept of moving fingers that form a variable capacitor is covered, along with how it is turned into a usable motion signal. Adaptations for multiaccess sensing, rotational sensing, and even sound sensing, along with concepts of how these devices are tested and calibrated are covered.
When it comes to high performance signal chains, you need high performance power solutions. Noise sensitive
circuits such as analog-to-digital converters (ADCs), digital-to-analog converters (DACs), amplifiers, and phase
lock loops (PLLs)—as well as FPGAs—demand low noise power supplies that require specialized design
techniques. Engineers spend hours trying to figure out how to power these circuits without adding noise.
This presentation will focus on understanding various methods for not only approaching but meeting system
requirements. The session will introduce tested solutions and layout considerations that must be taken into
account when designing with switching regulators and low drop out (LDO) regulators.
Digital isolation plays a key role in designing industrial motor control systems. This presentation takes you through why, where and how for isolation designs that optimize system performance while meeting the ever stringent safety and efficient standards. Analog Devices, Nicola O'Byrne at PCIM 2015
IBIS is a standard for describing the analog behavior of digital device buffers using plain ASCII text.
Go through the slides and find out more on this.
This session combines the high speed analog signal chain from RF to baseband with FPGA-based digital signal processing for wireless communications. Topics include the high speed analog signal chain, direct conversion radio architecture, the high speed data converter interface, and FPGA-based digital signal processing for software-defined radio. Demonstrations use the latest generation Analog Devices’ high speed data converters, RF, and clocking devices, along with the Xilinx Zynq-7000 SoC. Other topics of discussion include the imperfections introduced by the modulator/ demodulator with particular focus on the effect of temperature and frequency changes. In-factory and in-field algorithms that reduce the effect of these imperfections, with particular emphasis on the efficacy of in-factory set-and-forget algorithms, are examined.
Frequency Synthesis and Clock Generation for High Speed Systems - VE2013Analog Devices, Inc.
Frequency synthesis and clock generation are now key elements in all aspects of high speed data acquisition and RF design. In this session, the primary types of frequency synthesizers—phase-locked loops (PLL) and direct digital synthesizers (DDS)—are discussed, along with the applications for when each is appropriate. Also covered are detailed aspects of synthesizer design. Other applications, such as clock distribution and translation are addressed, and problems associated with poor clocking are identified. Examples of poor clocking are shown, along with the results of doing it properly.
This presentation covers the various levels of sensors (high tech, intelligent and commodity) and the challenges associated with getting these communicating both ways in/out of the IoT. At this level the challenges are about balancing communications IO functionality with device cost. It also addresses the future and how the IoT is reaching farther down into the commodity sensor layer and the concepts for ‘next generation’ low end connected devices and what value can be added.
ProfiBus/Net is our most supported interface method in P-F’s high tech sensors solutions.
BIOGRAPHY
Simon has been with P+F (Factory Automation) for 8.5 years and worked predominantly on integrated sensor solutions for machinery OEM’s and systems integrators as well as new sensor technology development.
Sensor Technology for Smart Nation and Industry 4.0 by colin kohColin Koh (許国仁)
Sensors play a critical role as they provide contextual data to the emerging IoT and Big Data application. The challenges remain in term of cost, reliability, accuracy and standardisation. Collaboration of all stakeholders is the key to ensure the sensors technology can meet and overcome the issues facing the users.
Sensors for Low Level Signal Acquisition (Design Conference 2013)Analog Devices, Inc.
Sensors are the eyes, ears, and hands of electronic systems and allow them to capture the state of the environment. The capture and processing of sensor inputs is a delicate process that requires understanding of the signal details.Integration of sensor functions onto silicon has brought about improved performance, better signal handling, and lower total system cost. MEMS (microelectromechanical systems) sensors have opened up entire new areas and applications. In this session, the fundamental MEMS sensor concept of moving fingers that form a variable capacitor is covered, along with how it is turned into a usable motion signal. Adaptations for multiaccess sensing, rotational sensing, and even sound sensing, along with concepts of how these devices are tested and calibrated are covered.
When it comes to high performance signal chains, you need high performance power solutions. Noise sensitive
circuits such as analog-to-digital converters (ADCs), digital-to-analog converters (DACs), amplifiers, and phase
lock loops (PLLs)—as well as FPGAs—demand low noise power supplies that require specialized design
techniques. Engineers spend hours trying to figure out how to power these circuits without adding noise.
This presentation will focus on understanding various methods for not only approaching but meeting system
requirements. The session will introduce tested solutions and layout considerations that must be taken into
account when designing with switching regulators and low drop out (LDO) regulators.
Digital isolation plays a key role in designing industrial motor control systems. This presentation takes you through why, where and how for isolation designs that optimize system performance while meeting the ever stringent safety and efficient standards. Analog Devices, Nicola O'Byrne at PCIM 2015
IBIS is a standard for describing the analog behavior of digital device buffers using plain ASCII text.
Go through the slides and find out more on this.
This session combines the high speed analog signal chain from RF to baseband with FPGA-based digital signal processing for wireless communications. Topics include the high speed analog signal chain, direct conversion radio architecture, the high speed data converter interface, and FPGA-based digital signal processing for software-defined radio. Demonstrations use the latest generation Analog Devices’ high speed data converters, RF, and clocking devices, along with the Xilinx Zynq-7000 SoC. Other topics of discussion include the imperfections introduced by the modulator/ demodulator with particular focus on the effect of temperature and frequency changes. In-factory and in-field algorithms that reduce the effect of these imperfections, with particular emphasis on the efficacy of in-factory set-and-forget algorithms, are examined.
Frequency Synthesis and Clock Generation for High Speed Systems - VE2013Analog Devices, Inc.
Frequency synthesis and clock generation are now key elements in all aspects of high speed data acquisition and RF design. In this session, the primary types of frequency synthesizers—phase-locked loops (PLL) and direct digital synthesizers (DDS)—are discussed, along with the applications for when each is appropriate. Also covered are detailed aspects of synthesizer design. Other applications, such as clock distribution and translation are addressed, and problems associated with poor clocking are identified. Examples of poor clocking are shown, along with the results of doing it properly.
This presentation covers the various levels of sensors (high tech, intelligent and commodity) and the challenges associated with getting these communicating both ways in/out of the IoT. At this level the challenges are about balancing communications IO functionality with device cost. It also addresses the future and how the IoT is reaching farther down into the commodity sensor layer and the concepts for ‘next generation’ low end connected devices and what value can be added.
ProfiBus/Net is our most supported interface method in P-F’s high tech sensors solutions.
BIOGRAPHY
Simon has been with P+F (Factory Automation) for 8.5 years and worked predominantly on integrated sensor solutions for machinery OEM’s and systems integrators as well as new sensor technology development.
Sensor Technology for Smart Nation and Industry 4.0 by colin kohColin Koh (許国仁)
Sensors play a critical role as they provide contextual data to the emerging IoT and Big Data application. The challenges remain in term of cost, reliability, accuracy and standardisation. Collaboration of all stakeholders is the key to ensure the sensors technology can meet and overcome the issues facing the users.
Sensitivity or selectivity - How does eLNA impact the receriver performancecriterion123
it describes
1. Why need external LNA ?
2. Why does poor linearity lead to poor sensitivity ?
3. For the eLNA gain, the more the better ?
4. Why can SAW filter improve linearity ?
Data conversion for data acquisition is a two-part process that involves sampling and then converting signals into digital venues. These processes inherently remove part of the complete analog signal in exchange for the power and robustness of digital signal handling. This becomes especially difficult when trying to capture signals at the limits of the resolution and speed of our systems. In this session, learn how to design a data conversion system that minimizes the signal loss to match the signal handling requirements … even on the hard ones.
Producers of almost any kind of machinery or devices are required by regulations, e.g. the Noise and machinery directive of EU (2006/42/EC), to measure and declare the sound power of their products - anything from toys, printers and white goods to industrial tools and construction machinery. Sound Power is also used in engineering tasks such as product sound design.
This is an overview of the Analog Devices’ JESD204 Interface Framework, a system-level software package targeted at simplifying development by providing a performance optimized IP framework.
An Introduction to ADI’s Power components used in RF signal chains, with special treatment of high performance data converters, transceivers and PLL/VCOs.
An Introduction to ADI’s RF Switches and RF Attenuators including their key characteristics and how and where they should be used in the RF signal chain.
Isolation in gate drive is one critical area for designing efficient, safe and highly productive motor control systems. Learn how the latest ADI isolated gate drives can help you solve the design challenges. Analog Devices, Dara O'Sullivan PCIM 2015
This session provides insight into the operation of electric motor drive systems. Topics include electric motor operation and construction, motor control strategies, feedback sensors and circuits, power and isolation, and challenges of designing highly efficient motor control systems. A new high performance servo control FMC board will be introduced in the presentation, which provides an efficient motor control solution for different types of electric motors, addresses power and isolation challenges, and provides accurate measurement of motor feedback signals and increased control flexibility due to FPGA interfacing capabilities. The motor control hardware platform will be used to demonstrate rapid prototyping of motor control algorithms using Xilinx base platforms and the MathWorks development and simulation tools.
Finding the right combination of parts to create a signal chain can be a complex and daunting task, due to time demands, unfamiliarity with various technology areas, and the enormous amount of unproven solutions scattered across the Web. Signal Chain Designer is an intelligent selection and design tool that accesses verified product combinations and applications circuits, which can be customized or newly created according to user specifications. The Signal Chain Designer experience is supported by direct access to online EE design tools, evaluation hardware, software, documentation, and ADI Circuits from the Lab® reference circuits.
The industrial control market involves the monitoring and control aspects of both complex and simple processes. Common trends within the industry, notably the drive for increased efficiencies, better robustness, higher channel densities, and faster monitoring and control speeds, subsequently drive new technology advancements for semiconductor manufacturers. This session aims to give a broad overview of the system requirements for both field instruments (sensors/actuators) and control room (analog input/output) modules, and demonstrates a typical I/O module configuration with HART® (highway addressable remote transducer) connectivity.
Liquid Sensing: Visible light absorption spectroscopy and colorimetry are two fundamental tools used in chemical analysis. Most of these light-based systems use photodiodes as the light sensor, and require similar high input impedance signal chains. This session examines the different components of a photodiode amplifier signal chain, including a programmable gain transimpedance amplifier, a hardware lock-in amplifier, and a Σ-Δ ADC that can measure a sample and reference channel to greatly reduce any measurement error due to variations in intensity of the light source.
Gas Sensing: Many industrial processes involve toxic compounds, and it is important to know when dangerous concentrations exist. Electrochemical sensors offer several advantages for instruments that detect or measure the concentration of toxic gases. This session will describe a portable toxic gas detector using an electrochemical sensor. The system presented here includes a potentiostat circuit to drive the sensor, as well as a transimpedance amplifier to take the very small output current from the sensor and translate it to a voltage that can take advantage of the full-scale input of an ADC.
In wireless communications and data acquisition systems, there is more to consider when designing and implementing a complete solution beyond simply physically connecting a high speed analog module to an FPGA platform. Available hardware description language (HDL) components and software are critical to establishing an interface, which is necessary for practical system integration. This session starts with a top-level overview of various physical interfaces that are typically used and provides an in-depth focus on high speed serial JESD204B. Prototype HDL used for these types of boards is covered, along with the specific board components and how they are used to interface to high speed ADCs and DACs. Linux device drivers for the HDL components, as well as for the ADI components, are presented. This includes a short introduction into the Industrial I/O (IIO) framework, the benefits it offers, and how it can be used in end designs.
At very high frequencies, every trace and pin is an RF emitter and receiver. If careful design practices are not followed, the unwanted signals can easily mask those a designer is trying to handle. The design choices begin at the architecture level and extend down to submillimeter placement of traces. There are tried and proven techniques for managing this process. The practical issues of real system design are covered in this session, along with ways to minimize signal degradation in the RF environment.
Acquired analog signals can be manipulated and processed by either the analog or digital portions of a system, for example, through filtering, multiplexing, and gain control. The analog portions of a system can typically provide reasonably simple processing at fairly low cost, power, and overhead. Digital processing can provide far greater analysis power and can alter the nature of the analysis without changing hardware. Sampling theory, however, must be taken into account. This session covers the signal chain basics from signal to sensor to amplifier to converter to digital processor and back out again.
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
Transcript: Selling digital books in 2024: Insights from industry leaders - T...BookNet Canada
The publishing industry has been selling digital audiobooks and ebooks for over a decade and has found its groove. What’s changed? What has stayed the same? Where do we go from here? Join a group of leading sales peers from across the industry for a conversation about the lessons learned since the popularization of digital books, best practices, digital book supply chain management, and more.
Link to video recording: https://bnctechforum.ca/sessions/selling-digital-books-in-2024-insights-from-industry-leaders/
Presented by BookNet Canada on May 28, 2024, with support from the Department of Canadian Heritage.
Dev Dives: Train smarter, not harder – active learning and UiPath LLMs for do...UiPathCommunity
💥 Speed, accuracy, and scaling – discover the superpowers of GenAI in action with UiPath Document Understanding and Communications Mining™:
See how to accelerate model training and optimize model performance with active learning
Learn about the latest enhancements to out-of-the-box document processing – with little to no training required
Get an exclusive demo of the new family of UiPath LLMs – GenAI models specialized for processing different types of documents and messages
This is a hands-on session specifically designed for automation developers and AI enthusiasts seeking to enhance their knowledge in leveraging the latest intelligent document processing capabilities offered by UiPath.
Speakers:
👨🏫 Andras Palfi, Senior Product Manager, UiPath
👩🏫 Lenka Dulovicova, Product Program Manager, UiPath
Epistemic Interaction - tuning interfaces to provide information for AI supportAlan Dix
Paper presented at SYNERGY workshop at AVI 2024, Genoa, Italy. 3rd June 2024
https://alandix.com/academic/papers/synergy2024-epistemic/
As machine learning integrates deeper into human-computer interactions, the concept of epistemic interaction emerges, aiming to refine these interactions to enhance system adaptability. This approach encourages minor, intentional adjustments in user behaviour to enrich the data available for system learning. This paper introduces epistemic interaction within the context of human-system communication, illustrating how deliberate interaction design can improve system understanding and adaptation. Through concrete examples, we demonstrate the potential of epistemic interaction to significantly advance human-computer interaction by leveraging intuitive human communication strategies to inform system design and functionality, offering a novel pathway for enriching user-system engagements.
LF Energy Webinar: Electrical Grid Modelling and Simulation Through PowSyBl -...DanBrown980551
Do you want to learn how to model and simulate an electrical network from scratch in under an hour?
Then welcome to this PowSyBl workshop, hosted by Rte, the French Transmission System Operator (TSO)!
During the webinar, you will discover the PowSyBl ecosystem as well as handle and study an electrical network through an interactive Python notebook.
PowSyBl is an open source project hosted by LF Energy, which offers a comprehensive set of features for electrical grid modelling and simulation. Among other advanced features, PowSyBl provides:
- A fully editable and extendable library for grid component modelling;
- Visualization tools to display your network;
- Grid simulation tools, such as power flows, security analyses (with or without remedial actions) and sensitivity analyses;
The framework is mostly written in Java, with a Python binding so that Python developers can access PowSyBl functionalities as well.
What you will learn during the webinar:
- For beginners: discover PowSyBl's functionalities through a quick general presentation and the notebook, without needing any expert coding skills;
- For advanced developers: master the skills to efficiently apply PowSyBl functionalities to your real-world scenarios.
DevOps and Testing slides at DASA ConnectKari Kakkonen
My and Rik Marselis slides at 30.5.2024 DASA Connect conference. We discuss about what is testing, then what is agile testing and finally what is Testing in DevOps. Finally we had lovely workshop with the participants trying to find out different ways to think about quality and testing in different parts of the DevOps infinity loop.
Let's dive deeper into the world of ODC! Ricardo Alves (OutSystems) will join us to tell all about the new Data Fabric. After that, Sezen de Bruijn (OutSystems) will get into the details on how to best design a sturdy architecture within ODC.
Search and Society: Reimagining Information Access for Radical FuturesBhaskar Mitra
The field of Information retrieval (IR) is currently undergoing a transformative shift, at least partly due to the emerging applications of generative AI to information access. In this talk, we will deliberate on the sociotechnical implications of generative AI for information access. We will argue that there is both a critical necessity and an exciting opportunity for the IR community to re-center our research agendas on societal needs while dismantling the artificial separation between the work on fairness, accountability, transparency, and ethics in IR and the rest of IR research. Instead of adopting a reactionary strategy of trying to mitigate potential social harms from emerging technologies, the community should aim to proactively set the research agenda for the kinds of systems we should build inspired by diverse explicitly stated sociotechnical imaginaries. The sociotechnical imaginaries that underpin the design and development of information access technologies needs to be explicitly articulated, and we need to develop theories of change in context of these diverse perspectives. Our guiding future imaginaries must be informed by other academic fields, such as democratic theory and critical theory, and should be co-developed with social science scholars, legal scholars, civil rights and social justice activists, and artists, among others.
UiPath Test Automation using UiPath Test Suite series, part 3DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 3. In this session, we will cover desktop automation along with UI automation.
Topics covered:
UI automation Introduction,
UI automation Sample
Desktop automation flow
Pradeep Chinnala, Senior Consultant Automation Developer @WonderBotz and UiPath MVP
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
Builder.ai Founder Sachin Dev Duggal's Strategic Approach to Create an Innova...Ramesh Iyer
In today's fast-changing business world, Companies that adapt and embrace new ideas often need help to keep up with the competition. However, fostering a culture of innovation takes much work. It takes vision, leadership and willingness to take risks in the right proportion. Sachin Dev Duggal, co-founder of Builder.ai, has perfected the art of this balance, creating a company culture where creativity and growth are nurtured at each stage.
"Impact of front-end architecture on development cost", Viktor TurskyiFwdays
I have heard many times that architecture is not important for the front-end. Also, many times I have seen how developers implement features on the front-end just following the standard rules for a framework and think that this is enough to successfully launch the project, and then the project fails. How to prevent this and what approach to choose? I have launched dozens of complex projects and during the talk we will analyze which approaches have worked for me and which have not.
GDG Cloud Southlake #33: Boule & Rebala: Effective AppSec in SDLC using Deplo...James Anderson
Effective Application Security in Software Delivery lifecycle using Deployment Firewall and DBOM
The modern software delivery process (or the CI/CD process) includes many tools, distributed teams, open-source code, and cloud platforms. Constant focus on speed to release software to market, along with the traditional slow and manual security checks has caused gaps in continuous security as an important piece in the software supply chain. Today organizations feel more susceptible to external and internal cyber threats due to the vast attack surface in their applications supply chain and the lack of end-to-end governance and risk management.
The software team must secure its software delivery process to avoid vulnerability and security breaches. This needs to be achieved with existing tool chains and without extensive rework of the delivery processes. This talk will present strategies and techniques for providing visibility into the true risk of the existing vulnerabilities, preventing the introduction of security issues in the software, resolving vulnerabilities in production environments quickly, and capturing the deployment bill of materials (DBOM).
Speakers:
Bob Boule
Robert Boule is a technology enthusiast with PASSION for technology and making things work along with a knack for helping others understand how things work. He comes with around 20 years of solution engineering experience in application security, software continuous delivery, and SaaS platforms. He is known for his dynamic presentations in CI/CD and application security integrated in software delivery lifecycle.
Gopinath Rebala
Gopinath Rebala is the CTO of OpsMx, where he has overall responsibility for the machine learning and data processing architectures for Secure Software Delivery. Gopi also has a strong connection with our customers, leading design and architecture for strategic implementations. Gopi is a frequent speaker and well-known leader in continuous delivery and integrating security into software delivery.
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Amplify, Level Shift, and Drive Precision Systems - VE2013
1. Amplifiers: Capture Signals and
Drive Precision Systems
Advanced Techniques of Higher Performance Signal Processing
Gustavo Castro, Senior Applications Engineer, Wilmington, MA
2. Legal Disclaimer
Notice of proprietary information, Disclaimers and Exclusions Of Warranties
The ADI Presentation is the property of ADI. All copyright, trademark, and other intellectual property and
proprietary rights in the ADI Presentation and in the software, text, graphics, design elements, audio and all
other materials originated or used by ADI herein (the "ADI Information") are reserved to ADI and its licensors.
The ADI Information may not be reproduced, published, adapted, modified, displayed, distributed or sold in any
manner, in any form or media, without the prior written permission of ADI.
THE ADI INFORMATION AND THE ADI PRESENTATION ARE PROVIDED "AS IS". WHILE ADI INTENDS THE ADI
INFORMATION AND THE ADI PRESENTATION TO BE ACCURATE, NO WARRANTIES OF ANY KIND ARE MADE
WITH RESPECT TO THE ADI PRESENTATION AND THE ADI INFORMATION, INCLUDING WITHOUT LIMITATION
ANY WARRANTIES OF ACCURACY OR COMPLETENESS. TYPOGRAPHICAL ERRORS AND OTHER
INACCURACIES OR MISTAKES ARE POSSIBLE. ADI DOES NOT WARRANT THAT THE ADI INFORMATION AND
THE ADI PRESENTATION WILL MEET YOUR REQUIREMENTS, WILL BE ACCURATE, OR WILL BE
UNINTERRUPTED OR ERROR FREE. ADI EXPRESSLY EXCLUDES AND DISCLAIMS ALL EXPRESS AND
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NON-
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USE OF ANY THIRD-PARTY SOFTWARE REFERENCED WILL BE GOVERNED BY THE APPLICABLE LICENSE
AGREEMENT, IF ANY, WITH SUCH THIRD PARTY.
2
3. Today’s Agenda
Operational amplifier design and applications
Op amp noise considerations
Instrumentation amplifiers and applications
ADC driver amplifiers
High common mode voltage applications
Amplifier design tools
3
4. Analog to Electronic Signal Processing
SENSOR
(INPUT)
DIGITAL
PROCESSOR
AMP CONVERTER
ACTUATOR
(OUTPUT)
AMP CONVERTER
4
5. Analog to Electronic Signal Processing
SENSOR
(INPUT)
DIGITAL
PROCESSOR
AMP CONVERTER
ACTUATOR
(OUTPUT)
AMP CONVERTER
5
6. Amplifiers and Operational Amplifiers
Amplifiers
Make a low-level, high-source impedance signal into a high-level, low-source
impedance signal
Op amps, power amps, RF amps, instrumentation amps, etc.
Most complex amplifiers built up from combinations of op amps
Operational amplifiers
Three-terminal device (plus power supplies)
Amplify a small signal at the input terminals to a very, very large one at the
output terminal
6
7. Operational Amplifiers
Operational
Op amps can be configured with feedback networks in multiple ways to perform
“operations” on input signals
“Operations” include positive or negative gain, filtering, nonlinear transfer
functions, comparison, summation, subtraction, reference buffering, differential
amplification, integration, differentiation, etc.
Applications
Fundamental building block for analog design
Sensor input amplifier
Simple and complex filters – antialiasing
ADC driver
7
8. Key Op Amp Performance Features
Bandwidth and Slew Rate
The speed of the op amp
Bandwidth is the highest operating frequency of the op amp
Slew rate is the maximum rate of change of the output
Determined by the frequency of the signal and the gain needed
Offset Voltage and Current
The errors of the op amp
Determines measurement accuracy
Noise
Op amp noise limits how small a signal can be amplified with good fidelity
10
10. Op Amp Error Sources
12
IDEAL
OFFSET VOLTAGE (Vos)
INPUT IMPEDANCE (ZIN)
INPUT BIAS CURRENT (Ib)
INPUT OFFSET CURRENT
(Ios)
A
+
-
- +
OUTPUT IMPEDANCE
(ZOUT)
IB – The Current into the Inputs
[~pA to mA]
Vos – The Difference in Voltage
Between the Inputs [µV to mV]
IOS – The Difference Between the
+ IB and – IB [~IB /10]
ZIN – Input Impedance [MW to GW]
ZOUT – Output Impedance [<1 W]
Avo – Open Loop Gain [V/mV]
BW – Finite Bandwidth [ kHz to GHz)
11. AN “IDEAL” NON-INVERTING AMPLIFIER
13
+
-
Vin
Vout
I1
R1
R2
V1
Vid
1VVV idin =−
outV
RR
R
V *
21
1
1
+
=
))(1(
1
2
idinout VV
R
R
V −+=
12. DC + AC Errors of a Circuit
PSRR
Vs
CMRR
V
en
A
V
RIVV
icm
vo
out
sBosid
δ
++Σ+++= *
14
)(
1
idinout VVV −=
β
))*((
1
PSRR
Vs
CMRR
V
en
A
V
RIVVV
cm
vo
out
sBos
in
out
δ
β
++Σ+++−=
0_ vGAINLOOP Aβ=
Since en gets multiplied by β
1
we get the name “noise gain”
+
-
R
2
Rs
Vout
Vid
Vin
13. Noise Gain: The noise gain of an op amp can
never be less than the signal gain
+
-
IN +
-
+
-
A B C
R1
R2 IN
R1
R2
R2
R1
IN
Signal Gain = 1 + R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =- R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =- R2/R1
Noise Gain = 1 +
R2
R1 R3
n Voltage Noise and Offset Voltage of the op amp are reflected to the
output by the Noise Gain.
n Noise Gain, not Signal Gain, is relevant in assessing stability.
n Circuit C has unchanged Signal Gain, but higher Noise Gain, thus
better stability, worse noise, and higher output offset voltage.
IN
A B C
R1
R2 IN
R1
R2
R2
R1
IN
Signal Gain = 1 + R2/R1
Noise Gain = 1 + R2/R1
Signal Gain = R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =
Noise Gain = 1 +
R2
n
n
n
+
-
IN +
-
+
-
A B C
R1
R2 IN
R1
R2
R2
R1
IN
Signal Gain = 1 + R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =- R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =- R2/R1
Noise Gain = 1 +
R2
R1 R3
n
n
n
IN
A B C
R1
R2 IN
R1
R2
R2
R1
IN
Signal Gain = 1 + R2/R1
Noise Gain = 1 + R2/R1
Signal Gain = R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =
Noise Gain = 1 +
R2
n
n
n
+
-
IN +
-
+
-
A B C
R1
R2 IN
R1
R2
R2
R1
IN
Signal Gain = 1 + R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =- R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =- R2/R1
Noise Gain = 1 +
R2
R1 R3
n Voltage Noise and Offset Voltage of the op amp are reflected to the
output by the Noise Gain.
n Noise Gain, not Signal Gain, is relevant in assessing stability.
n Circuit C has unchanged Signal Gain, but higher Noise Gain, thus
better stability, worse noise, and higher output offset voltage.
IN
A B C
R1
R2 IN
R1
R2
R2
R1
IN
Signal Gain = 1 + R2/R1
Noise Gain = 1 + R2/R1
Signal Gain = R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =
Noise Gain = 1 +
R2
n
n
n
+
-
IN +
-
+
-
A B C
R1
R2 IN
R1
R2
R2
R1
IN
Signal Gain = 1 + R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =- R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =- R2/R1
Noise Gain = 1 +
R2
R1 R3
n
n
n
IN
A B C
R1
R2 IN
R1
R2
R2
R1
IN
Signal Gain = 1 + R2/R1
Noise Gain = 1 + R2/R1
Signal Gain = R2/R1
Noise Gain = 1 + R2/R1
Signal Gain =
Noise Gain = 1 +
R2
n
n
n
15
14. Total Noise Calculation
FCL = CLOSED LOOP BANDWIDTH
R1
V
ON
Rp
In-
In+
R2
V
n
V
R2J
V
R1J
V
RPJ
+
= BW [(In-2)R2
2] [NG] + [(In+2)RP
2] [NG] + VN
2 [NG] + 4kTR2 [NG-1] + 4kTR1 [NG-1] + 4kTRP [NG]VON
BW = 1.57 FCL
FCL = CLOSED LOOP BANDWIDTH
R1
V
ON
Rp
In-
In+
R2
V
n
V
R2J
V
R1J
V
RPJ
+
R1
V
ON
Rp
In-
In+
R2
V
n
V
R2J
V
R1J
V
RPJ
+
= BW [(In-2)R2
2] [NG] + [(In+2)RP
2] [NG] + VN
2 [NG] + 4kTR2 [NG-1] + 4kTR1 [NG-1] + 4kTRP [NG]VON = BW [(In-2)R2
2] [NG] + [(In+2)RP
2] [NG] + VN
2 [NG] + 4kTR2 [NG-1] + 4kTR1 [NG-1] + 4kTRP [NG]VON
BW = 1.57 FCL
16
15. Dominant Noise Source Determined
by Input Impedance
CONTRIBUTION
FROM
AMPLIFIER
VOLTAGE NOISE
AMPLIFIER
CURRENT NOISE
FLOWING IN R
JOHNSON
NOISE OF R
VALUES OF R
0 3kΩ 300kΩ
3 3 3
0
0
3
7
300
70
RTI NOISE (nV / √ Hz)
Dominant Noise Source is Highlighted
R
+
–
EXAMPLE: OP27
Voltage Noise = 3nV / √ Hz
Current Noise = 1pA / √ Hz
T = 25°C
OP27
R2
R1
Neglect R1 and R2
Noise Contribution
CONTRIBUTION
FROM
AMPLIFIER
VOLTAGE NOISE
AMPLIFIER
CURRENT NOISE
FLOWING IN R
JOHNSON
NOISE OF R
VALUES OF R
0 3kΩ 300kΩ
3 3 3
0
0
3
7
300
70
RTI NOISE (nV / √ Hz)
Dominant Noise Source is Highlighted
R
+
–
EXAMPLE: OP27
Voltage Noise = 3nV / √ Hz
Current Noise = 1pA / √ Hz
T = 25°C
OP27
R2
R1
Neglect R1 and R2
Noise Contribution
17
AD8675
AD8675
16. 1/f Noise Bandwidth
1/f Corner Frequency is a figure of merit for op amp
noise performance (the lower the better)
Typical Ranges: 2Hz to 2kHz
Voltage Noise and Current Noise do not necessarily
have the same 1/f corner frequency
3dB/Octave
WHITE NOISE
LOG f
CORNER
1
f
NOISE
nV / √Hz
or
√Hz
en, in
k
FC
k FC
1
f
en, in =
3dB/Octave
WHITE NOISE
LOG f
CORNER
1
f
NOISE
nV / √Hz
or
pA / √Hz
en, in
k
FC
k FC
1
f
en, in =
1/f Corner Frequency is a figure of merit for op amp
noise performance (the lower the better)
Typical Ranges: 2Hz to 2kHz
Voltage Noise and Current Noise do not necessarily
have the same 1/f corner frequency
3dB/Octave
WHITE NOISE
LOG f
CORNER
1
f
NOISE
nV / √Hz
or
√Hz
en, in
k
FC
k FC
1
f
en, in =
3dB/Octave
WHITE NOISE
LOG f
CORNER
1
f
NOISE
nV / √Hz
or
pA / √Hz
en, in
k
FC
k FC
1
f
en, in =
18
18. ADA4528-x World’s Most Accurate Op Amp Low
Noise Zero-Drift Amplifier
Key Features
Lowest noise zero-drift amp
5.6 nV/√Hz noise floor
No 1/f noise
High DC accuracy
Low offset voltage: 2.5 µV max
Low offset voltage drift: 0.015 µV/ºC max
Rail-to-rail input/output
Operating voltage: 2.2 V to 5.5 V
Applications
Transducer applications
Temperature measurements
Electronic scales
Medical instrumentation
Battery-powered instruments
20
Vos TCVos Isy / Amp CMRR Bandwidth Slew Rate Temp Range Op. Supply
2.5 µV max 0.015 µV/ºC max 1.8 mA max 115 dB min 4 MHz 0.4 V/µs -40°C - 125°C 2.2 V to 5.5 V
ADA4528-1 Single Released ADA4528-2 Dual In Development
Package: 8-lead MSOP, 8-lead LFCSP-8 (3 x 3)
Price: $1.15 1ku
Package: 8-lead MSOP, 8-lead LFCSP (3 x 3)
Sample Availability: Now
No 1/f Noise
5.6nV/√Hz
ADI Advantages
World’s Most Accurate Op Amp, Lowest Voltage Noise Zero-
Drift Op Amp
19. Precision Weigh Scale Design Using the AD7791
24-Bit Sigma-Delta ADC with External ADA4528-1
Zero-Drift Amplifiers (CN0216)
21
24-bit
ADC
Noise optimized for
DC measurements
20. ADI Amplifiers
Based on Process Innovations
Advanced Process Technology
Bipolar
JFET
CMOS
iCMOS® High Performance, Low Noise CMOS Process
iPolar® High Performance, Low Noise Bipolar Process
LD20 Enhanced CMOS
23
21. Precision Amplifier Enablers
•Overvoltage Protection
•Zero Crossover Distortion
•Zero-Drift Op Amp
•Bias Cancellation Circuitry
Design
Techniques
•Low Noise Processes
•High Voltage Processes
•Feature Rich Processes
Process
Technology
•DigiTrim / In Pkg Trim
•Laser Trim
Trim
Techniques
•Micro Packages
•WLCSP/ Bumped Die
•Low Stress Polyimide
Package
Technology
•Strip Testing
•TCVOS on Strip
Test
Techniques
24
•Improved Robustness
•Higher Performance Amplifiers
•Higher Precision in Small Plastic Packages
•High Precision CMOS Products
•Higher Precision in Small Plastic Packages
•Greater User Flexibility - Small Form Factors
•Greater Functionality in Small Footprint
• Higher Precision, Improves Offset and TCVOS
Performance
Resulting Benefits
•Ultralow Noise AMP/REF Designs
•Higher Voltage Amplifiers (100 V)
•Higher Integration and Added Features
22. AD8597/9
1 nV/√Hz Ultralow Noise
Key Benefits
Low Noise, High Precision
Low Voltage Noise: 1 nV/√Hz at 1 kHz, 76 nV
from 0.1 Hz to 1 Hz
Low Current Noise: 1.5 pA/√Hz
Unity Gain Stable with High 50 mA Output Drive
±5V to ±15V Operation
25
Noise THD+N Vos CMRR Bandwidth Slew Rate Temp Range Price @ 1k
1 nV/√Hz –105 dB 120 µV max 120 dB 10 MHz 16 V/µs
–40°C to
85°C
See website
8-lead SOIC and 8-lead
LFCSP (3x3)
Released
SOIC
Released
AD8597 Single AD8599 Dual
OUT A 1
- IN A 2
+ IN A 3
- V 4
+ V8
OUT B7
- IN B6
+ IN B5
AD8599
TOP VIEW
(Not to Scale)
OUT A 1
- IN A 2
+ IN A 3
- V 4
+ V8
OUT B7
- IN B6
+ IN B5
AD8599
TOP VIEW
(Not to Scale)
Applications
Professional audio preamps
ATE
Imaging systems
Medical instrumentation
Precision detectors
23. Optimizing AC Performance in an 18-bit,
250 kSPS, PulSAR Measurement Circuit
(CN0261)
26
Noise optimized for
Mid-range frequencies
24. Analog to Electronic Signal Processing
SENSOR
(INPUT)
DIGITAL
PROCESSOR
AMP CONVERTER
ACTUATOR
(OUTPUT)
AMP CONVERTER
27
25. 20-Bit, Linear, Low Noise, Precision, Bipolar
±10 V DC Voltage Source (CN0191)
28
1 – ppm resolution
Needs low noise
In all components
29. What Can Op Amps Do?
Op amps can do anything
Amplify
Filter
Level shift
Compare
Drive
The circuit design becomes difficult
Matching multiple amplifiers
Circuit complexity
Precision passive components
32
30. Specialty Amplifiers
Specialty Amplifiers
Designed for a specific signal type
Extract and amplify only the signal of interest
Pick off a small differential signal from a large common-mode voltage
Capture and demodulate a low-level AC signal
Compress a high-dynamic range signal
Provide automatic or controlled gain-changing
Send and receive precision signals
Provide high-speed low-impedance power output
Use the analog domain to its best advantage to prepare a clean signal for the
data converter
33
32. Single-Ended vs. Differential Signals
Single-ended signals
Signal is measured referred to ground
When signals are bipolar (+ and –), negative supplies needed
AC signals are typically bipolar or need special “floating,” or capacitive coupling
Ground often carries high noise from other signals or power, compromising the
signal
Differential signals
Both sides of the signal float “off ground”
Signals are separated from ground and other signals
High frequency and accuracy usually need differential handling
Common mode (average) can be set for single supply
Specialized differential/difference amplifiers are needed
35
33. Instrumentation, Difference, and Differential
Amplifiers
Instrumentation Amplifiers
Amplify differential inputs to a single-ended output
Normally both amplifier inputs are high impedance
Provide high gain (up to 10,000) and low noise
Normally handle low-level signals from sensors
Difference Amplifiers
Amplify differential inputs from high common-mode voltage levels
Often include input attenuator to allow operation outside supplies
High common-mode rejection even at high frequencies
Differential Amplifiers
High frequency amplifiers with differential input and output
Handle higher-level signals at lower gains
Typically used for line driving/receiving and ADC driving
36
34. Op Amp Subtractor or Difference Amplifier
37
VOUT = (V2 – V1)
R2
R1
R1 R2
_
+
V1
V2
VOUT
R1' R2'
R2
R1
=
R2'
R1'
R2'
R1'
CRITICAL FOR HIGH CMR
0.1% TOTAL MISMATCH YIELDS ≈ 66dB CMR FOR R1 = R2
CMR = 20 log10
1 +
R2
R1
Kr
Where Kr = Total Fractional
Mismatch of R1/ R2 TO
R1'/R2'
EXTREMELY SENSITIVE TO SOURCE IMPEDANCE IMBALANCE
REF
35. AD8271 : Precision Difference Amplifier with
Programmable Gain
38
KEY SPECIFICATIONS
Difference Amplifier: G = ½, 1, 2
Single-ended Amplifier: G = -2 to +3
Low Distortion: 110 dB THD + N
Typical (G=1)
15 MHz Bandwidth
80 dB Min CMRR (G=1)
0.08% Max Gain Error
2 ppm/°C Max Gain Drift
2.6 mA Max Supply Current
Wide Power Supply Range: ±2.5 V to
±18 V
Key Benefits
Low Distortion Higher Performance
Versatile Gain Configurations Easy to Use
Target Applications
High Performance Audio/Video
In-Amp Building Block
ADC Driver
1
7
6
10kΩ
AD8271
10kΩ
10kΩ
10kΩ
20kΩ
20kΩ
10kΩ
–VS
P4
P3
P2
P1
+VS
OUT
N1
N2
N310
9
8
2
3
4
5
37. AD8271 Application Example: Building High
Speed In-Amp
CN0122: High Speed Instrumentation Amplifier Using the AD8271
Difference Amplifier and the ADA4627-1 JFET Input Op Amp
Gain-bandwidth product of 20MHz at gain of 200
www.analog.com/CN0122
Uses monolithic difference amplifier for the output amplifier, thereby providing
good dc/ac accuracy with fewer components
40
38. AD8277 Application Example – Precision
Absolute Value Circuit
Benefits
One single component
Cost competitive
Simple single-supply operation
Wide input and supply range
Low supply current
Higher performance
Fast 0 V crossover response
Gain accuracy
Offset voltage, temp drifts
Low noise gain
41
AD8277
A1
–
+
AD8277
A2
–
+
VIN
VOUT = | VIN |
R
R
R
R
R
R
R
R
A1
–
+
A2
–
+
VIN
VOUT = | VIN |
R1
R2
R4
R3 R5
D1
D2
R1, R2, R3 = 10kΩ
R4, R5 = 20kΩ
Conventional precision absolute value circuit requires
many fast, high precision (i.e., expensive) components,
and has performance issues.
42. Generalized Bridge Amplifier Using an In-Amp
+VB
+
−
IN AMP
REF VOUT
RG
+VS
-VSR+∆R
VB
∆R
R
VOUT = GAIN
R+∆R
R–∆R
R–∆R
45
43. 1 MΩ
10 nF
10 kΩ
10 kΩ
1 nF
1 nF
100 kΩ
1 µF
AD8495
PCB
Traces
Thermocouple
RFI
Filter
Thermocouple
Amplifier
Filter for
50/60 Hz
Reference
Junction
Measurement
Junction
Common Mode
fc = 16 kHz
Differential
fc = 1.3 kHz
Includes
Reference
Junction
Compensation
fc = 1.6 Hz
5 mV/°C
Ground
Connection
5V
REF
Typical In-Amp Applications
Sensor Interface
Pressure
Strain
Temperature
Vibration
Current sensing
Measurement of Biopotentials
EEG
ECG
Market Segments
INI, H/C, PCTL, MIL/AERO,
ATE, AUTO…
46
44. Different Circuit Topologies to build an In amp
3-Op Amp 2-Op Amp
47
Indirect-Current Feedback Current-Mode Correction
+IN
–IN
OUT
REF
+IN
–IN
OUT
REF
OUT
REF
GM1 GM2
(G-1)R
R
+IN
–IN
+IN
–IN
OUT
REF
2IE
IE
IE = (V – V )/R1
R1
R2
–IN+IN
45. Input Common Mode Range in Instrumentation
Amplifiers
Input common-mode voltage
range is limited in
instrumentation amplifiers
This is not the same as the input
voltage range of each input
Internal amplifiers may get
saturated in the presence of large
common-mode voltages
This behavior usually limits single
supply operation at low voltage
levels
The “diamond” plots are a
graphical representation of
these operational limits
The amplifier will only operate
inside the plot
Sometimes is necessary to change
the gain, reference voltage or power
supply levels
49
46. 50
Key Features
Low Power
115μA
Industry Leading Gain Accuracy and Drift
Gain Error: < 50ppm
Gain Drift: < 0.5ppm/°C
High CMRR
CMRR: 110dB @ all gains (DC to 60Hz)
Wide Input Common Mode Range
GND – 0.3V to Vs + 0.3V
Excellent DC Performance
Input Offset: 60μV
Offset Drift: 0.2μV/°C
Other Key Specifications
Single supply: 1.8V to 5.0V
Noise RTI: 1.5μVpp (0.1 to10Hz)
70nV/RtHz @ 1kHz
Bandwidth: 10kHz @ G=100
Gain Range: 1-1000
Input RFI Protection
Package: 8L MSOP
Applications
Medical Instrumentation
Remote Sensing and Hand Held Instrumentation
Precision Bridge and Current Sense Measurements
Consumer Peripherals – Gaming, Distributed Computing
Setting the
Gain
–IN
+IN
VREF
R2
R1
G = 1+
R2
R1
AD8237 VOUT
REF
FB
AD8237 - Micro Power, Zero-Drift In Amp
47. 51
300mV operation above and below the supply rails with output swing completely independent of input common-
mode voltage
Industry Leading Input Voltage Range
51. ADC Driver Amplifiers
Driving ADC inputs
ADC switching feeds transient back to input pins
ADC driver amp must reject transients to provide accurate signal
High Performance ADCs
Recent high performance ADCs have 16 bits and more at 200 MSPS and
higher
Such performance requires a differential input signal
Differential Amplifiers
Differential or single-ended input converted to differential output
Low impedance output stage rejects ADC switching spikes
Common-mode level set and gain setting allow optimum match to ADC range
Voltage Reference Buffer
ADC transients can reflect back to reference output
Op amp buffer with low output impedance at high frequency may be needed
56
52. Typical Unbuffered Single-Ended Input Transients of
CMOS Switched Capacitor ADC
2.57
Note: Data Taken with 50Ω Source Resistances
SAMPLING CLOCK
53. AD8475:
Differential Funnel Amp and ADC Driver
Key Features
Active precision attenuation
(0.4x or 0.8x)
Level-translating
VOCM pin sets output common
mode
Single-ended to differential conversion
Differential rail-to-rail output
Input range beyond the rail
Key Specifications
150 MHz bandwidth
10 nV/√Hz output noise
50 V/μS slew rate
–112 dB THD + N
1 ppm/°C max gain drift
500 μV max output offset
3 mA supply current
58
Benefits
Connect industrial sensors to high
precision differential ADCs
Simplify design
Enable quick development
Reduce PCB size
Reduce cost
Applications
Process control modules
Data acquisition systems
Medical monitoring devices
ADC driver
Low Voltage
ADC Inputs
Large
Input
Signal
54. Precision, Low Power, Single-Supply, Fully
Integrated Differential ADC Driver for Industrial-Level
Signals (CN0180)
60
Interface ±10 V or ±5 V signal on a
single-supply amplifier
Integrate 4 Steps in 1
Attenuate
Single-ended-to-differential conversion
Level-shift
Drive ADC
Drive differential 18-bit SAR ADC
up to 4 MSPS with few external
components
56. ADR45xx – Ultrahigh Precision, Low Noise,
Voltage Reference Product Overview
Key Features
Ultrahigh accuracy
Voltage drift: 2 ppm/°C max., B grade
• 5 ppm/°C max., A grade
Low initial output voltage error: ±0.02% max.
Long-term drift: 25 ppm/1,000 hours typ.
Excellent noise performance
1/f noise: <0.5 ppm,pp (0.1 Hz to 10 Hz)
Wideband noise: <5 μV rms (10 Hz to 10 kHz)
Versatility
Input voltage range: 3 V to 15 V
Low dropout: 200 mV for +2 mA at +125°C
• 1 V for ADR4520, 0.5 V for ADR4525
Output drive: ±10 mA – no buffer amp needed
Quiescent current: 800 µA max
Wide temperature range
-40oC to +125oC operation
Applications
Medical/industrial/test instrumentation
Automotive hybrid battery monitoring
63
Package Temp Price
8-lead SOIC
–40°C to
+125°C
$2.45 @ 1k (A)
$3.45 @ 1k (B)
All Options of the ADR45xx Family
ADR4520 2.048 V Samples
ADR4525 2.5 V Now
ADR4530 3.0 V
ADR4533 3.3 V RTS
ADR4540 4.096 V Mar 2012
ADR4550 5.0 V
57. Benefits of Precision Current Sensing
Precision Current Sensing allows for finer/more adjustments in
Automotive Control applications
Automatic Transmission: Larger number of gear options and smoother shifting
Diesel Injection: Better mileage, lower emissions, reduced noise
Electric Power Steering: Facilitates transition from Hydraulic to Electro-
Hydraulic
Electric Motor: enables higher performance systems
Brake-by-wire and Electric Parking Brake
Adaptive Suspension
Advanced Wiper / Memory Seat / One-Touch Down Window
In General, High-side current sensing allows for:
• Lower cost wiring
• Improved diagnostics capabilities
• Precise current sensing
• Improved system efficiencies
64
60. 67
Typical
Applications
DC-DC CONVERTERS
BANDWIDTH
CMRR over frequency
Response time
POWER SUPPLY
MONITORING
Common Mode Range
Gain value
Response time
VALVE/SOLENOID CONTROL
TEMPERATURE DRIFT
Common mode rejection
Averaging function
MOTOR CONTROL
BIDIRECTIONAL SENSE
TEMPERATURE DRIFT
Common mode rejection
Output linearity to 0V input
Response time
SOLAR PANEL MONITORING
Inverter / Power Maximizing
Common Mode Range
Gain value
Response time
POWER AMPLIFERS
TEMPERATURE DRIFT
Common mode rejection
61. AD8210 – Application Examples
14V
To
control
circuitry
DC Motor Control DC/DC Converter42V
Shunt
ECU
V Out
G=20
Vs
AD8210
V Ref 2
V Ref 1
- IN+ IN
GND
Reference
5V
V Out
G=20
Vs
AD8210
V Ref 2
V Ref 1
- IN+ IN
GND
V Battery
Motor Control Applications
Industrial DC Motor Control
Medical Imaging Machine Motor Control
Automotive DC Motor and Solenoid Control
DC/DC Converter Applications
Power Supply
Base Station
Battery Charging
Automotive Battery Charging
68
62. High Common-Mode Current Sensing
Using the AD629 Difference Amplifier
69
Next generation AD8479 with 600V common mode range coming soon
63. [Circuit board pic here]
Current Monitor with 500 V Common-Mode
Voltage (CN0218)
Circuit Features
500 V common mode
0.2% accuracy
Circuit Benefits
Minimal loading
Fast response
Inputs
Power shunt resistor
70
Target Applications Key Parts Used Interface/Connectivity
Metering and Energy
Monitoring
Motor and Power
Control
Power Supplies
AD8212
AD8605
AD7171
ADuM5402
Isolated
SPI
67. Tweet it out! @ADI_News #ADIDC13
What We Covered
Op amps are very versatile devices that can be set up for many
applications
Op amps cannot amplify an input signal with a higher gain than their
own noise – pick low noise op amps
Specialty amplifiers are built-up combinations of op amps with
performance tailored to applications
High performance ADCs need high performance driver amplifiers to
obtain full accuracy
Differential amplifiers can pick off small signals from very high
common-mode voltages
New software and online design tools greatly simplify product
selection and system design
76
68. Design Resources Covered in this Session
Design Tools & Resources:
Ask technical questions and exchange ideas online in our
EngineerZone™ Support Community
Choose a technology area from the homepage:
ez.analog.com
Access the Design Conference community here:
www.analog.com/DC13community
77
Name Description URL
ADIsimOpamp On-line tool to select and configure op amps http://designtools.analog.
com/dtAPETWeb/dtAPET
Main.aspx
Diff Amp Calculator On-line tool to design differential amp circuits http://www.analog.com/en
/amplifier-linear-tools/adi-
diff-amp-calc/topic.html
Multisim SPICE Downloadable general purpose SPICE simulator http://www.analog.com/en
/amplifier-linear-
tools/multisim/topic.html
69. Tweet it out! @ADI_News #ADIDC13
[Circuit board pic here]
Visit the Current Monitor with 500 V Common-
Mode Voltage in the Exhibition Room
Circuit Features
500 V common mode
0.2% accuracy
Circuit Benefits
Minimal loading
Fast response
Inputs
Power shunt resistor
78
Target Applications Key Parts Used Interface/Connectivity
Metering and Energy
Monitoring
Motor and Power Control
AD8212
AD8605
AD7171
ADuM5402
Isolated
SPI
This demo board is available for purchase:
www.analog.com/DC13-hardware
70. Tweet it out! @ADI_News #ADIDC13
Visit the Weigh Scale Demo in the Exhibition
Room
79
Measure weights from
0.1 g to 2000 g
This demo board is available for purchase:
www.analog.com/DC13-hardware
SOFTWARE OUTPUT DISPLAY
EVAL-CN0216-SDPZ
SDP BOARD