This document discusses challenges in semiconductor testing and opportunities to improve test program management. It identifies issues such as lack of visibility into what is tested in production and which test program versions are used. It then proposes several solutions like enabling collaborative test development, enforcing company test methodologies, analyzing and merging test programs, and closing the loop between test program development and production to improve quality.

1. Test Insight Semiconductors test challenges

3. The control gap Company Test Programs database Rev 2.0.52 Acceptance Alignment Install – Rev 2.0.49 ? Fabless in Israel Subcon in Asia

4. The control gap Do we actually have 99.9% fault coverage in Production? Scan Test 98% coverage Func. Test 1.99% coverage On Total: 99.9% coverage DUT design Test Plan Production 99.9% Test development Test Development

5. So, we have like 99.9% coverage, but now the test engineer is alone on the tester !

6. Mask failures Remove tests The control gap The weakest point in quality chain is debug Before debug After “ debug ”

7. The bigger picture - challenges Product Start Tape Out 1st Silicon Product Ready Product Ship ProductEnd Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Test Program planning Debug TP Pre-silicon Debug Manage Program Releases to Production Get Visibility of Changes Multiple Engineers developing one Program Multiple Engineers debugging one Program Add and Remove Tests (at different locations?)

10. Meeting the Challenges Enforce company methodology Product Start Tape Out 1st Silicon Product Ready Product Ship ProductEnd Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Test Program planning (A skeleton) Analyse And extract A skeleton Mature TP Skeleton TP

12. Test Program Compliance Checker Report

13. Meeting the Challenges Managing Collaborative work ProductEnd Analyse Smart Merge Product Start Tape Out 1st Silicon Product Ready Product Ship Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Multiple Engineers developing one Program Multiple Engineers debugging one Program Add and Remove Tests (at different locations?) Split TP Merge TP

14. Meeting the Challenges Managing test usage - Releases Product Start Tape Out 1st Silicon Product Ready Product Ship ProductEnd Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Add and Remove Tests (at different locations?) Get Visibility of Changes "Golden" Program/Rules Report Analyse

19. Meeting the Challenges Pre-silicon Debug Product Start Tape Out 1st Silicon Product Ready Product Ship ProductEnd Start TP End TP Maintain TP Consolidate TP Debug TP Fill TP Debug TP Pre-silicon Debug Neutral Database (STIL) DUT Model Simulation TestBench