This document discusses software reliability growth models, which use system test data to predict the number of defects remaining in software and determine if the software is ready to ship. Most models have a parameter related to the total number of defects. Knowing the number of residual defects helps decide how much more testing is needed. Examples of models include the Goel-Okumoto model, which models the failure rate as approaching a total number of defects over time. The assumptions of the Goel-Okumoto model include that failure times are exponentially distributed and the number of failures follows a non-homogeneous Poisson process.

1. Software Reliability Growth Models
Dr. Himanshu Hora
SRMS College of Engineering & Technology
Bareilly (INDIA)

2. Introduction
“Software reliability growth models can be used as an
indication of the number of failures that may be
encountered after the software has shipped and thus as an
indication of whether the software is ready to ship;
These models use system test data to predict the number
of defects remaining in the software”
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3. • Most software reliability growth models have a parameter
that relates to the total number of defects contained in a set
of code. If we know this parameter and the current number
of defects discovered, we know how many defects remain
in the code (see Figure 1).
•
Architecture Business Cycle (ABC)
Figure1-Residual Defects
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4. • Knowing the number of residual defects helps us decide
whether or not the code is ready to ship and how much
more testing is required if we decide the code is not ready
to ship. It gives us an estimate of the number of failures
that our customers will encounter when operating the
software.
“Software reliability growth models are a statistical
interpolation of defect detection data by mathematical
functions. The functions are used to predict future failure
rates or the number of residual defects in the code.”
[Alan Wood ,Tandem Software Reliability Growth Models]
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5. Software Reliability Growth Model
Data
1. Test Time Data-For a software reliability growth
model developed during QA test, the appropriate measure
of time must relate to the testing effort. There are three
possible candidates for measuring test time:
- calendar time
- number of tests run
- execution (CPU) time.
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6. 2. Defect DataMajor: Can tolerate the situation, but not for long.
Solution needed.
Critical: Intolerable situation. Solution urgently needed.
3. Grouped Datathe amount of failures and test time that occurred during a
week.
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7. Software Reliability Growth Model
Types
Software reliability growth models have been grouped
into two classes of models concave and S-shaped
(figure 2)
The most important thing about both models is that they
have the same asymptotic behavior, i.e., the defect
detection rate decreases as the number of defects detected
(and repaired) increases, and the total number of defects
detected asymptotically approaches a finite value.
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8. Figure 2-Concave and S-Shaped Models
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9. Software Reliability Growth Model
Examples
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10. Table 1- Software Reliability Growth Model examples
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11. Goel - Okumoto(G-O) Model
μ(t) = a(l-e ^(-bt)), where
• a = expected total number of defects in the code and
b = shape factor = the rate at which the failure rate
decreases, i.e., the rate at which we approach the total
number of defects.
• The Goel-Okumoto model is a concave model, and the
parameter "a" would be plotted as the total number of
defects in Figure 2
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12. Basic Assumptions of Goel-Okumoto Model
• The execution times between the failures are
exponentially distributed.
• The cumulative number of failures follows a Non
Homogeneous Poisson process (NHPP) by its expected
value function μ(t).
• For a period over which the software is observed the
quantities of the resources that are available are constant.
• The number of faults detected in each of the respective
intervals is independent of each other.
[Pankaj Nagar , Blessy Thankachan , “Applications of Goel Okumoto in
Software Reliability Measurement” International Journal of Computer
Applications (0975 – 8887) , November 2012]
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13. Thank You
Dr. Himanshu Hora
SRMS College of Engineering & Technology
Bareilly (INDIA)
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