This document discusses software reliability growth models, which use system test data to predict the number of defects remaining in software and determine if the software is ready to ship. It describes some common software reliability growth models, including the Goel-Okumoto model, which models the failure rate as approaching a total expected number of defects over time. The document outlines the assumptions and parameters of the Goel-Okumoto model and references materials on applying it to measure software reliability.