This document discusses process capability analysis. It introduces process capability, why it is studied, and how it is measured through graphs and calculations of metrics like Cp. Process capability determines if a process meets specifications and can help reduce variability. The principles of process capability are explained, such as predicting variability. Methods like analytical calculations and process capability ratios are covered. Advantages include process improvement, while disadvantages are that it is best for large companies. Control charts can also be used to monitor processes.

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PROCESS CAPABILITY
MAJOR ASINGNMENT

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content
 INTRODUCTION
 WHY STUDY PROCESS CAPABILITY
 ABOUT PROCESS CAPABILITY
 POCESS CAPABILITY BY GRAPH
 PRINCIPLE OF PROCESS CAPABILITY
 METHODS OF PROCESS CAPABILITY
 REFERENCES
 THANKYOU SLIDE

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Introduction
Why study process capability
Process capability studies provide a baseline for us to how to
understand the process is operating relative to the
specifications.
It is the first, thorough look at how variability is affecting the
process, and gives us Metris for quantifying that variability.
Such studies also provide information regarding what the
process could do under best conditions, and thus give a
performance target to shoot for.

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Process Capability
The main objectives of process management are to prevent the defects and
to minimize the variability in manufacturing process. To reduce the
variability it needs to establish the relationship between process variable
and product results.
Even though product meets the specification limits and the process is in
the state of control, the actions may be initiated to Quantify and further
reducing the process variability to gain marvelous advantages. The
statistical techniques can be used to quantify the variability of the
manufacturing process.
The Process capability analysis helps in quantifying the process variability
and assists Manufacturing by eliminating or greatly reducing the variability.

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Process Capability by Graph:-
Process is capable:-
20 25 30
Upper
specification
Lower
specification
Nominal
value
Process Capability
Process is capable
Process distribution

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Process is not capable:-
Process is not capable
20 25 30
Upper
specification
Lower
specification
Nominal
value
Process distribution
Process Capability

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Process capability ratio, Cp, is the tolerance width divided by 6 standard
deviations (process variability).
Process Capability Ratio, Cp
Cp =
Upper specification - Lower specification
6
Process Capability Ratio, Definition
Definition=> Process capability is inherent variation of the product turned out
by the process. Process capability provides the quantified prediction of the
process adequacy and refers to the uniformity of the process. It is a
measurement with respect to the precision of a manufacturing process.

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Principle of Process Capability:-
· Predicting the extent of variability that process will
exhibit.
· Capability information helps designers to set realistic
specifications limits.
· Planning the interrelationship of sequential process.
· Selecting between the competing vendors.
· Reducing the variability of the manufacturing process

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Methods:-
1. Analytical method of measuring process capability:
The capability of a manufacturing process is measured
through process capability ratios. These ratios are evaluated
and tested with respect to the process centering. The
process capability ratios are tested with confidence
intervals. Hypothesis about the process capability ratio is
carried out to demonstrate whether process capability ratio,
Cp meets or exceeds the target value.

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2.Process Capability Ratios (PCR) and Equations:-
The assessment of process capability analysis is done through computations
of various process capability ratios. It is frequently convenient to have a
quantitative way to express process capability. One way to do so is through
the process capability ratio. This measures the ability of process to
manufacture product that meets specification.
Process capability ratio (pcr) = Cp = (USL – LSL)/6M
Where; USL = upper specification limit
LSL= lower specification limit
M = process standard deviation..

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Advantages / Dis-advantages of process capability:-
Advantages:-
1. It is used for big companies how made product.
2. It is used for big scale map of companies.
3.It is used for product is capable or not.
4. It is uses for product service are good or not.
Dis-advantages:-
1.It is used for big companies because of big companies are made product &
by this company check product is capable or not.
2.By, this company checks service & capability.

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Control Charts
Two types of error are possible with control
charts
• A type I error occurs when a process is
thought to be out of control when in fact
it is not
• A type II error occurs when a process is
thought to be in control when it is
actually out of statistical control
These errors can be controlled by the choice
of control limits

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Conclusion
The results of process capability study of the given manufacturing process
reveal that, graphical values of parameters approaches very nearer to the
magnitude of the analytical values and hence graphical approach could be
treated as equivalent to analytical method.
Graphical approach can be used to study the variability of manufacturing
process. It is one of the tools to convey the results through which it is easy to
make inference on the data. The approach helps a worker in the shop floor
can make the assessment about the process parameters. Thus it also helps to
process management and identifies opportunities for improving quality and
operational performance.

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References
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determination of channel charge and mobility in very thin gate MOSFETs,‖
IEEE Trans. Electron Devices, vol. ED-33, no. 9, pp. 1299–1304, Sep. 1986
[2] J. Koomen, ―Investigation of the MOST channel conductance in weak
inversion,‖ Solid State Electron., vol. 16, no. 7, pp. 801–810, 1973.
[3] Z. Ji, J. F. Zhang, W. Zhang, G. Groeseneken, L. Pantisano, S. De
Gendt, and M. M. Heyns, ―An assessment of the mobility degradation
induced by remote charge scattering,‖ Appl. Phys. Lett., vol. 95, no. 26, pp.
263 502– 263 503, 2009.
[4] R. Chau, S. Datta, M. Doczy, B. Doyle, J. Kavalieros, and M. Metz,
―High-kappa/metal-gate stack and its MOSFET characteristics,‖ IEEE
Electron Device Lett., vol. 25, no. 6, pp. 408–410, Jun. 2004.