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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: SSM3K16FV
MANUFACTURER: TOSHIBA
Body Diode (Model Parameters) / ESD Protection Diode




                   Bee Technologies Inc.


     All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Circuit Configuration




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
     N         Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Transconductance Characteristic

Circuit Simulation Result
       0.25




        0.2
 gfs




       0.15




        0.1

                                                                   Measurement
                                                                   Simulation


       0.05
           0.01             0.03        0.05          0.07           0.09          0.11
                                      ID - Drain Current - A
Comparison table


                                               gfs
                  Id(A)                                                     Error(%)
                               Measurement            Simulation
                   0.010                 0.080                  0.083           3.750
                   0.020                 0.100                  0.105           5.000
                   0.050                 0.175                  0.179           2.286
                      0.1                0.245                   0.25           2.041




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Vgs-Id Characteristic

Circuit Simulation result

       1.0A




      100mA




       10mA




      1.0mA
        0.1V                   1.0V                           2.0V                3.0V
               I(V3)
                                            V_V2

Evaluation circuit



                                              V3


                                                       0Vdc

                                                       U28


                                                       SSM3K16FV
                                                                     Vv ariable

                       3Vdc
                                                                     3Vdc


                       V2




                                                   0




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Comparison Graph

Circuit Simulation Result


                                              Measurement
                                              Simulation



                           0.081
  ID - Drain Current - A




                           0.061




                           0.041




                           0.021




                           0.001
                                   0          0.5          1         1.5         2          2.5           3
                                                      VGS - Gate to Source Voltage - V

Simulation Result

                                                               VGS(V)
                                   ID(A)                                                  Error (%)
                                               Measurement              Simulation
                                   0.001                    1.040               1.043             0.288
                                   0.002                    1.070               1.074             0.374
                                   0.005                    1.120                1.13             0.893
                                       0.01                 1.200               1.202             0.167
                                       0.02                 1.270               1.295             1.969
                                       0.05                 1.450                1.49             2.759
                                        0.1                 1.700               1.705             0.294




                                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Rds(on) Characteristic

Circuit Simulation result
    10mA




     8mA




     6mA




     4mA




     2mA




      0A
           0V                  5mV              10mV                   15mV        20mV
                I(V3)
                                              V_VDS

Evaluation circuit

                                                       V3


                                                              0Vdc
                                                        U28


                                                        SSM3K16FV
                                                                        VDS

                        4Vdc
                                                                        0Vdc


                        VGS




                                                       0


Simulation Result

     ID=10mA, VGS=10V                Measurement                     Simulation    Error (%)
            R DS (on)                    1.5                           1.5                0



                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Gate Charge Characteristic
Circuit Simulation result

      10V




       8V




       6V




       4V




       2V




       0V
            0      0.2n     0.4n      0.6n        0.8n     1.0n     1.2n      1.4n      1.6n     1.8n 2.0n
                V(W1:3)
                                                         Time*1mS
Evaluation circuit
                                                                        V2


                                                                           0Vdc

                                                                           U32       Dbreak


                                                                           SSM3K16FV    D1
                  PER = 1000u                                                                  I2
                  PW = 600u             W1                                                     0.6Adc
                  TF = 10n                 +
                  TR = 10n
                  TD = 0
                                           -
                  I2 = 1m                W
                                I1   IOFF = 1mA                                                V1
                  I1 = 0             ION = 0uA                                                 17Vdc




                                                  0



Simulation Result

            VDD=17V,ID=0.6A
                                               Measurement                   Simulation                 Error (%)
               ,VGS=10V
                Qgs(nC)                                           0.1                     0.106             6.000
               Qgd(nC)                                            0.3                     0.299            -0.333
                  Qg                                              1.9                     0.756           -60.211



                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Capacitance Characteristic



                                                           Measurement
                                                           Simulation




Simulation Result


                                    Cbd(pF)
           VDS(V)                                              Error(%)
                          Measurement        Simulation
                    0.1              7.5             7.520          0.267
                    0.2              7.1             7.170          0.986
                    0.5              6.5             6.740          3.692
                      1                6             6.040          0.667
                      2              5.3             5.340          0.755
                      5              4.5             4.470         -0.667
                    10               3.8             3.870          1.842
                    20               3.4             3.350         -1.471




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Switching Time Characteristic

Circuit Simulation result

        12V




        10V




         8V




         6V




         4V




         2V




         0V
                1.000us    1.050us 1.100us        1.150us   1.200us   1.250us       1.300us
              V(L1:2)*4     V(L2:1)*3.333
                                                    Time

Evaluation circuit

                                                                         L2          R2


                                                                       50nH
                                                                                     1k

                                                                              U31

                                                                          SSM3K16FV
                                R1           L1
                                                                                          V1
                                             30nH
              V1 = 0            50
              V2 = 5       V2                                                       3Vdc
              TD = 1u                  R3
              TR = 4n
              TF = 4n                   50
              PW = 10u
              PER = 200u


                           0



Simulation Result

       ID=10m A, VDD=3V
                                     Measurement               Simulation                      Error(%)
          VGS=0/2.5V
            Ton(ns)                               70.000               69.688                      -0.446



                All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Output Characteristic

Circuit Simulation result

   250mA
                   10V              2.5V                              2.1V



   200mA



                                                                                 1.9V

   150mA




                                                                                  1.7.V
   100mA




                                                                                1.5V
    50mA

                                                                             VGS=1.3V



      0A
           0V                0.5V             1.0V                    1.5V                2.0V
                I(Vdsense)
                                           V_Vvariable

Evaluation circuit


                                                     Vdsense


                                                           0Vdc

                                                          U30


                                                          SSM3K16FV

                                                                             Vv ariable

                     10Vdc
                                                                             10Vdc


                     Vstep




                                                      0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
BODY DIODE
Forward Current Characteristic

Circuit Simulation Result
      100mA




       10mA




      1.0mA
              0V                  0.5V                    1.0V    1.5V             2.0V
                   I(R1)
                                                          V_V1

Evaluation Circuit



                                         R1


                                         0.01m

                                                    U27
                                  V1
                           0Vdc               SSM3K16FV




                                  0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Comparison Graph

Circuit Simulation Result


                                     0.1
                                                                                                  Measurement
                                                                                                  Simulation
    Drain reverse current IDR(A)




                                    0.01




                                   0.001
                                           0               0.5               1              1.5                 2

                                                              Source-Drain voltage -VSD(V)

Simulation Result


                                                                    VSD(V)
                                       IDR(A)             Measuremen       Simulation                    %Error
                                          0.001                    0.58            0.578                  -0.345
                                          0.025                      0.7           0.709                   1.286
                                          0.050                    0.76            0.753                  -0.921
                                          0.075                      0.8           0.788                  -1.500
                                          0.100                    0.82            0.819                  -0.122




                                               All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Reverse Recovery Characteristic

Circuit Simulation Result
       400mA



       300mA



       200mA



       100mA



        -0mA



      -100mA



      -200mA



      -300mA



      -400mA
          5.12us          5.20us          5.28us             5.36us   5.44us     5.52us
               I(R1)
                                                      Time

Evaluation Circuit

                                            R1


                                                 50

                       V1 = -9.4v    V1
                       V2 = 10.85v                     U31
                       TD = 245n
                       TR = 10ns             SSM3K16FV
                       TF = 19ns
                       PW = 5us
                       PER = 100us




                                     0



Compare Measurement vs. Simulation

                                     Measurement              Simulation       Error (%)
               Trj(ns)                       23.2                 23.167            -0.142




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Reverse Recovery Characteristic                                        Reference




Trj=23.200(ns)
Trb=31.200(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
ESD PROTECTION DIODE
Zener Voltage Characteristic
Circuit Simulation Result

   10mA


    9mA


    8mA


    7mA


    6mA


    5mA


    4mA


    3mA


    2mA


    1mA


     0A
          0V       5V   10V      15V   20V      25V        30V     35V   40V   45V   50V
               I(R1)
                                                V_V1



Evaluation Circuit


                                               R1



                                             0.01m               U28




                                  V1
                          0Vdc
                                                      R2


                                              100MEG

                                                             SSM3K16FV
                                   0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2007

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SPICE MODEL of SSM3K16FV (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameters) PART NUMBER: SSM3K16FV MANUFACTURER: TOSHIBA Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 2. Circuit Configuration All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 3. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 4. Transconductance Characteristic Circuit Simulation Result 0.25 0.2 gfs 0.15 0.1 Measurement Simulation 0.05 0.01 0.03 0.05 0.07 0.09 0.11 ID - Drain Current - A Comparison table gfs Id(A) Error(%) Measurement Simulation 0.010 0.080 0.083 3.750 0.020 0.100 0.105 5.000 0.050 0.175 0.179 2.286 0.1 0.245 0.25 2.041 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 5. Vgs-Id Characteristic Circuit Simulation result 1.0A 100mA 10mA 1.0mA 0.1V 1.0V 2.0V 3.0V I(V3) V_V2 Evaluation circuit V3 0Vdc U28 SSM3K16FV Vv ariable 3Vdc 3Vdc V2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 6. Comparison Graph Circuit Simulation Result Measurement Simulation 0.081 ID - Drain Current - A 0.061 0.041 0.021 0.001 0 0.5 1 1.5 2 2.5 3 VGS - Gate to Source Voltage - V Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 0.001 1.040 1.043 0.288 0.002 1.070 1.074 0.374 0.005 1.120 1.13 0.893 0.01 1.200 1.202 0.167 0.02 1.270 1.295 1.969 0.05 1.450 1.49 2.759 0.1 1.700 1.705 0.294 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 7. Rds(on) Characteristic Circuit Simulation result 10mA 8mA 6mA 4mA 2mA 0A 0V 5mV 10mV 15mV 20mV I(V3) V_VDS Evaluation circuit V3 0Vdc U28 SSM3K16FV VDS 4Vdc 0Vdc VGS 0 Simulation Result ID=10mA, VGS=10V Measurement Simulation Error (%) R DS (on)  1.5 1.5 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 8. Gate Charge Characteristic Circuit Simulation result 10V 8V 6V 4V 2V 0V 0 0.2n 0.4n 0.6n 0.8n 1.0n 1.2n 1.4n 1.6n 1.8n 2.0n V(W1:3) Time*1mS Evaluation circuit V2 0Vdc U32 Dbreak SSM3K16FV D1 PER = 1000u I2 PW = 600u W1 0.6Adc TF = 10n + TR = 10n TD = 0 - I2 = 1m W I1 IOFF = 1mA V1 I1 = 0 ION = 0uA 17Vdc 0 Simulation Result VDD=17V,ID=0.6A Measurement Simulation Error (%) ,VGS=10V Qgs(nC) 0.1 0.106 6.000 Qgd(nC) 0.3 0.299 -0.333 Qg 1.9 0.756 -60.211 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 9. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.1 7.5 7.520 0.267 0.2 7.1 7.170 0.986 0.5 6.5 6.740 3.692 1 6 6.040 0.667 2 5.3 5.340 0.755 5 4.5 4.470 -0.667 10 3.8 3.870 1.842 20 3.4 3.350 -1.471 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 10. Switching Time Characteristic Circuit Simulation result 12V 10V 8V 6V 4V 2V 0V 1.000us 1.050us 1.100us 1.150us 1.200us 1.250us 1.300us V(L1:2)*4 V(L2:1)*3.333 Time Evaluation circuit L2 R2 50nH 1k U31 SSM3K16FV R1 L1 V1 30nH V1 = 0 50 V2 = 5 V2 3Vdc TD = 1u R3 TR = 4n TF = 4n 50 PW = 10u PER = 200u 0 Simulation Result ID=10m A, VDD=3V Measurement Simulation Error(%) VGS=0/2.5V Ton(ns) 70.000 69.688 -0.446 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 11. Output Characteristic Circuit Simulation result 250mA 10V 2.5V 2.1V 200mA 1.9V 150mA 1.7.V 100mA 1.5V 50mA VGS=1.3V 0A 0V 0.5V 1.0V 1.5V 2.0V I(Vdsense) V_Vvariable Evaluation circuit Vdsense 0Vdc U30 SSM3K16FV Vv ariable 10Vdc 10Vdc Vstep 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 12. BODY DIODE Forward Current Characteristic Circuit Simulation Result 100mA 10mA 1.0mA 0V 0.5V 1.0V 1.5V 2.0V I(R1) V_V1 Evaluation Circuit R1 0.01m U27 V1 0Vdc SSM3K16FV 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 13. Comparison Graph Circuit Simulation Result 0.1 Measurement Simulation Drain reverse current IDR(A) 0.01 0.001 0 0.5 1 1.5 2 Source-Drain voltage -VSD(V) Simulation Result VSD(V) IDR(A) Measuremen Simulation %Error 0.001 0.58 0.578 -0.345 0.025 0.7 0.709 1.286 0.050 0.76 0.753 -0.921 0.075 0.8 0.788 -1.500 0.100 0.82 0.819 -0.122 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 14. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 5.12us 5.20us 5.28us 5.36us 5.44us 5.52us I(R1) Time Evaluation Circuit R1 50 V1 = -9.4v V1 V2 = 10.85v U31 TD = 245n TR = 10ns SSM3K16FV TF = 19ns PW = 5us PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) Trj(ns) 23.2 23.167 -0.142 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 15. Reverse Recovery Characteristic Reference Trj=23.200(ns) Trb=31.200(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 16. ESD PROTECTION DIODE Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit R1 0.01m U28 V1 0Vdc R2 100MEG SSM3K16FV 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 17. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2007