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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameter)
PART NUMBER: SSM3J15FS
MANUFACTURER: TOSHIBA
Body Diode (Model Parameter) / ESD Protection Diode




                  Bee Technologies Inc.




    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
MOSFET MODEL

Pspice model
                                      Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Modility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Transconductance Characteristic

Circuit Simulation Result


                            Measurement
             0.45           Simulation

             0.40

             0.35

             0.30
      gfs




             0.25

             0.20

             0.15

             0.10

             0.05

             0.00
                    0.0       0.0            0.0         0.1        0.1
                                         - ID : Drain Current A
Comparison table


                                          gfs
        -Id(A)                                                            Error(%)
                          Measurement              Simulation
            0.0010                  0.0082                 0.0080               -2.4390
            0.0020                  0.0173                 0.0170               -1.7341
            0.0050                  0.0280                 0.0290                3.5714
            0.0100                  0.0470                 0.0450               -4.2553
            0.0200                  0.0550                 0.0530               -3.6364
            0.0500                  0.0770                 0.0740               -3.8961
            0.1000                  0.1250                 0.1280                2.4000




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Vgs-Id Characteristic

Circuit Simulation result


        -1.0A




        -1.0mA
              0V             -1.0V          -2.0V           -3.0V   -4.0V         -5.0V
                   I(V3)
                                                     V_V1


Evaluation circuit


                                             V3


                                                    0Vdc



                                     U1
                                     SSM3J15FS                 V2


                                                              -3

                       V1


                      -2.3



                                     0




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result

                                0.10
                                              Measurement
                                              Simulation
       - ID : Drain Current A




                                0.01




                                0.00
                                       0.0         1.0            2.0           3.0           4.0       5.0
                                                           - VGS : Gate to Source Voltage V



Simulation Result


                                                                 -VGS(V)
       -ID(A)                                                                                       Error (%)
                                              Measurement                  Simulation
                                0.001                        1.650                     1.610                  -2.424
                                0.002                        1.700                     1.685                  -0.882
                                0.005                        1.880                     1.829                  -2.713
                                0.010                        2.050                     1.988                  -3.024
                                0.020                        2.220                     2.210                  -0.450
                                0.050                        2.600                     2.658                   2.231
                                0.100                        3.100                     3.170                   2.258




                                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Rds(on) Characteristic

Circuit Simulation result

         -20mA




         -15mA




         -10mA




          -5mA




            0A
              0V             -50mV                 -100mV             -150mV      -200mV
                   I(V3)
                                                     V_VDS


Evaluation circuit

                                              V3


                                              0Vdc



                                         U1                   VDS
                                         SSM3J15FS

                                                              0Vdc



                       V1


                       -4



                                     0




Simulation Result

     ID=-10mA, VGS=-4V           Measurement                         Simulation        Error (%)
         R DS (on) ()                                8.000                    7.962       -0.475



                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Gate Charge Characteristic
Circuit Simulation result

           -10V




            -8V




            -6V




            -4V




            -2V




             0V
                  0     -0.2n -0.4n -0.6n -0.8n -1.0n -1.2n -1.4n -1.6n -1.8n
                      V(W1:4)
                                               Time*-1mA


Evaluation circuit




                                                                U1
                                 ION = 0uA                      SSM3J15FS
                                 IOFF = 1mA
                                 W
                                      -
                                   +                                                  I2
                                                                             D2       100m
            I1 = 0               W1                                          Dbreak
                           I1
            I2 = 1m
            TD = 0                                                                    V1
            TR = 10n
            TF = 10n
            PW = 600u                                                                 -20
            PER = 1000u


                                                            0



Simulation Result

      VDD=-20V,ID=-100mA
                          Measurement                    Simulation             Error (%)
           ,VGS=-10V
                  Qgs(nc)        0.300                               0.303             1.000
                  Qgd(nc)        0.500                               0.497            -0.600
                   Qg(nc)        1.600                               1.569            -1.938


                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Capacitance Characteristic


                                                        Measurement
                                                        Simulation




Simulation Result


                                      Cbd(pF)
           VDS(V)                                                    Error(%)
                        Measurement            Simulation
              0.100               11.200               11.206             0.054
              0.200               10.500               10.490            -0.095
              0.500                9.100                9.070            -0.330
              1.000                7.700                7.750             0.649
              2.000                6.400                6.391            -0.141
              5.000                4.800                4.808             0.167
             10.000                3.800                3.815             0.395
             20.000                3.000                2.996            -0.133




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Switching Time Characteristic

Circuit Simulation result

          -20V




          -15V




          -10V




           -5V




             0V
             1.6us 1.7us 1.8us 1.9us 2.0us 2.1us 2.2us 2.3us 2.4us 2.5us
                 V(L1:2)*2  V(R2:2)*2
                                            Time


Evaluation circuit

                                                              L2           R2


                                                                   1uH        500



                                                                    U1
                                                                    SSM3J15FS
                                      L1
                                                                                         V1
        PER = 200u                                                                       -5Vdc
        PW = 10u                      30nH
        TF = 5n
        TR = 5n                      R1
        TD = 2u
        V2 = 5         V2             50

        V1 = 0



                                                               0


Simulation Result

        ID=-10mA, VDD=-5V             Measurement          Simulation               Error(%)
             VGS=-5V
              Ton(ns)                          65.000                65.368             0.566


                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Output Characteristic

Circuit Simulation result


      -250mA




      -200mA

                                                                              -4.0V


      -150mA



                                                                               -3.3V
      -100mA

                                                                              -3.0V

                                                                               -2.7V
       -50mA
                                                                               -2.5V

                                                                           VGS=-2.3V
          0A
            0V                  -0.5V            -1.0V             -1.5V           -2.0V
                 I(V3)
                                                  V_V2


Evaluation circuit


                                                V3


                                                     0Vdc



                                             U1
                                             SSM3J15FS
                                                              V2


                                                             -2

                          V1


                         -2.3



                                         0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result

        100mA




        80mA




        60mA




        40mA




        20mA




          0A
            0V         0.2V     0.4V        0.6V           0.8V         1.0V   1.2V   1.4V
                 I(VD_Sense)
                                                   V_VDS


Evaluation Circuit


                                 VD_Sense


                                 0Vdc




                                                            U1
                    VDS                                     SSM3J15FS
                   10Vdc




                                            0




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result

                                                   Measurement
                                                   Simulation


                                     0.08
      Drain reverse current IDR(A)




                                     0.06




                                     0.04




                                     0.02




                                     0.00
                                            0      0.2      0.4      0.6       0.8       1       1.2       1.4

                                                           Drain-Source voltage VDS(V)


Simulation Result


                                                       VDS(V)                     VDS(V)
                        IDR(A)                                                                         %Error
                                                     Measurement                Simulation
                                       0.001                  0.642                      0.643                0.156
                                       0.002                  0.665                      0.666                0.150
                                       0.005                  0.690                      0.692                0.290
                                       0.010                  0.715                      0.716                0.140
                                       0.020                  0.736                      0.737                0.136
                                       0.050                  0.768                      0.767               -0.130
                                       0.100                  0.794                      0.794                0.000




                                            All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic

Circuit Simulation Result

          400mA




          200mA




             0A




         -200mA




         -400mA
             0.88us          0.96us    1.04us           1.12us        1.20us   1.28us
                  I(R1)
                                                 Time



Evaluation Circuit


                                       R1


                                            50


                                                                 U1
                    V1 = -9.4v    V1                             SSM3J15FS
                    V2 = 10.8v
                    TD = 35n
                    TR = 5ns
                    TF = 5ns
                    PW = 1us
                    PER = 100us



                                                 0




Compare Measurement vs. Simulation

                             Measurement                  Simulation             Error (%)
        Trr(ns)                      34.400                      34.312               -0.256




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic                                        Reference




Trj=10.4(ns)
Trb=24(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic

Circuit Simulation Result

           10uA




           8uA




           6uA




           4uA




           2uA




            0A
              0V       5V    10V      15V       20V     25V    30V    35V   40V   45V   50V
                   I(R1)
                                                        V_V1

Evaluation Circuit


                                                R1


                                                0.01m



                                                               U1

                            V1                                 SSM3J15FS
                    0Vdc
                                      R2


                                   100MEG



                                            0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

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SPICE MODEL of SSM3J15FS (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameter) PART NUMBER: SSM3J15FS MANUFACTURER: TOSHIBA Body Diode (Model Parameter) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 2. MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 3. Transconductance Characteristic Circuit Simulation Result Measurement 0.45 Simulation 0.40 0.35 0.30 gfs 0.25 0.20 0.15 0.10 0.05 0.00 0.0 0.0 0.0 0.1 0.1 - ID : Drain Current A Comparison table gfs -Id(A) Error(%) Measurement Simulation 0.0010 0.0082 0.0080 -2.4390 0.0020 0.0173 0.0170 -1.7341 0.0050 0.0280 0.0290 3.5714 0.0100 0.0470 0.0450 -4.2553 0.0200 0.0550 0.0530 -3.6364 0.0500 0.0770 0.0740 -3.8961 0.1000 0.1250 0.1280 2.4000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 4. Vgs-Id Characteristic Circuit Simulation result -1.0A -1.0mA 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) V_V1 Evaluation circuit V3 0Vdc U1 SSM3J15FS V2 -3 V1 -2.3 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 5. Comparison Graph Circuit Simulation Result 0.10 Measurement Simulation - ID : Drain Current A 0.01 0.00 0.0 1.0 2.0 3.0 4.0 5.0 - VGS : Gate to Source Voltage V Simulation Result -VGS(V) -ID(A) Error (%) Measurement Simulation 0.001 1.650 1.610 -2.424 0.002 1.700 1.685 -0.882 0.005 1.880 1.829 -2.713 0.010 2.050 1.988 -3.024 0.020 2.220 2.210 -0.450 0.050 2.600 2.658 2.231 0.100 3.100 3.170 2.258 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 6. Rds(on) Characteristic Circuit Simulation result -20mA -15mA -10mA -5mA 0A 0V -50mV -100mV -150mV -200mV I(V3) V_VDS Evaluation circuit V3 0Vdc U1 VDS SSM3J15FS 0Vdc V1 -4 0 Simulation Result ID=-10mA, VGS=-4V Measurement Simulation Error (%) R DS (on) () 8.000 7.962 -0.475 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 7. Gate Charge Characteristic Circuit Simulation result -10V -8V -6V -4V -2V 0V 0 -0.2n -0.4n -0.6n -0.8n -1.0n -1.2n -1.4n -1.6n -1.8n V(W1:4) Time*-1mA Evaluation circuit U1 ION = 0uA SSM3J15FS IOFF = 1mA W - + I2 D2 100m I1 = 0 W1 Dbreak I1 I2 = 1m TD = 0 V1 TR = 10n TF = 10n PW = 600u -20 PER = 1000u 0 Simulation Result VDD=-20V,ID=-100mA Measurement Simulation Error (%) ,VGS=-10V Qgs(nc) 0.300 0.303 1.000 Qgd(nc) 0.500 0.497 -0.600 Qg(nc) 1.600 1.569 -1.938 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.100 11.200 11.206 0.054 0.200 10.500 10.490 -0.095 0.500 9.100 9.070 -0.330 1.000 7.700 7.750 0.649 2.000 6.400 6.391 -0.141 5.000 4.800 4.808 0.167 10.000 3.800 3.815 0.395 20.000 3.000 2.996 -0.133 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 9. Switching Time Characteristic Circuit Simulation result -20V -15V -10V -5V 0V 1.6us 1.7us 1.8us 1.9us 2.0us 2.1us 2.2us 2.3us 2.4us 2.5us V(L1:2)*2 V(R2:2)*2 Time Evaluation circuit L2 R2 1uH 500 U1 SSM3J15FS L1 V1 PER = 200u -5Vdc PW = 10u 30nH TF = 5n TR = 5n R1 TD = 2u V2 = 5 V2 50 V1 = 0 0 Simulation Result ID=-10mA, VDD=-5V Measurement Simulation Error(%) VGS=-5V Ton(ns) 65.000 65.368 0.566 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 10. Output Characteristic Circuit Simulation result -250mA -200mA -4.0V -150mA -3.3V -100mA -3.0V -2.7V -50mA -2.5V VGS=-2.3V 0A 0V -0.5V -1.0V -1.5V -2.0V I(V3) V_V2 Evaluation circuit V3 0Vdc U1 SSM3J15FS V2 -2 V1 -2.3 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100mA 80mA 60mA 40mA 20mA 0A 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V I(VD_Sense) V_VDS Evaluation Circuit VD_Sense 0Vdc U1 VDS SSM3J15FS 10Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 12. Comparison Graph Circuit Simulation Result Measurement Simulation 0.08 Drain reverse current IDR(A) 0.06 0.04 0.02 0.00 0 0.2 0.4 0.6 0.8 1 1.2 1.4 Drain-Source voltage VDS(V) Simulation Result VDS(V) VDS(V) IDR(A) %Error Measurement Simulation 0.001 0.642 0.643 0.156 0.002 0.665 0.666 0.150 0.005 0.690 0.692 0.290 0.010 0.715 0.716 0.140 0.020 0.736 0.737 0.136 0.050 0.768 0.767 -0.130 0.100 0.794 0.794 0.000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 200mA 0A -200mA -400mA 0.88us 0.96us 1.04us 1.12us 1.20us 1.28us I(R1) Time Evaluation Circuit R1 50 U1 V1 = -9.4v V1 SSM3J15FS V2 = 10.8v TD = 35n TR = 5ns TF = 5ns PW = 1us PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) Trr(ns) 34.400 34.312 -0.256 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 14. Reverse Recovery Characteristic Reference Trj=10.4(ns) Trb=24(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 15. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10uA 8uA 6uA 4uA 2uA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit R1 0.01m U1 V1 SSM3J15FS 0Vdc R2 100MEG 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2008