Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: TPCF8103
MANUFACTURER: TOSHIBA
Body Diode (Model Parameters) / ESD Protection Diode




                  Bee Technologies Inc.


    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Circuit Configuration




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
     N         Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result

        10

        9

        8

        7

        6
  gfs




        5

        4

        3

        2                                                            Measurement
                                                                     Simulation
        1
             0              1            2             3             4             5
                                    - ID - Drain Current - A

Comparison table


                                               gfs
                 - Id(A)                                                  Error(%)
                                Measurement           Simulation
                      0.1                1.300                  1.333          2.538
                      0.2                2.000                  2.000          0.000
                      0.5                3.100                  3.125          0.806
                        1                4.300                  4.333          0.767
                        2                5.800                  5.882          1.414
                        5                9.200                  9.434          2.543




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result
   -5.0A




   -4.0A




   -3.0A




   -2.0A




   -1.0A




      0A
           0V                 -0.5V   -1.0V           -1.5V     -2.0V     -2.5V
                I(V3)
                                               V_V1



Evaluation circuit



                        U10
                                        V3



                                        0Vdc


                                                       V2


                V1                                    -10
                        TPCF8103

                0



                0




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                              5
                                                  Measurement
                                                  BeeTech


                              4
   - ID - Drain Current - A




                              3




                              2




                              1




                              0
                                  0.0               0.5           1.0            1.5           2.0            2.5
                                                          - VGS - Gate to Source Voltage - V

Simulation Result

                                                                   - VGS(V)
                                        - ID(A)                                                Error (%)
                                                     Measurement              Simulation
                                            0.1                  1.000                 1.048         4.800
                                            0.2                  1.120                 1.113         -0.625
                                            0.5                  1.250                 1.230         -1.600
                                              1                  1.400                 1.362         -2.714
                                              2                  1.600                 1.564         -2.250
                                              5                  2.000                 1.959         -2.050




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result
  -2.0A




  -1.5A




  -1.0A




  -0.5A




     0A
          0V                         -50mV        -100mV            -150mV      -200mV
               I(V2)
                                                      V_VDS
Evaluation circuit

                               U10              V2




                                               0Vdc

                                                  0Vdc
                                                          VDS

                         VGS
               -4.5Vdc
                               TPCF8103




                         0



Simulation Result

     ID=-1.4A, VGS=-4.5V                     Measurement             Simulation          Error (%)
                R DS (on)                             0.072            0.072                   0



                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result
     10V




      8V




      6V




      4V




      2V




      0V
           0                      2n              4n                6n                    8n       10n
               -V(W1:4)
                                                       Time*1mA
Evaluation circuit



                                   ION = 0uA
                                   IOFF = 1mA
                                   W                          U10         D2       I2
                                        -
               I1 = 0                  +                                          2.7
                             I1                                          Dbreak
               I2 = 1m             W1
               TD = 0                           TPCF8103
               TR = 10n                                                             V1
               TF = 10n
               PW = 600u
               PER = 1000u                                                          -16




                                            0



Simulation Result

           VDD=-16V,ID=-2.7A
                                                Measurement              Simulation              Error (%)
               ,VGS=-5V
               Qgs(nC)                                     -0.800                       -0.799      -0.125
               Qgd(nC)                                     -2.000                       -2.015       0.750
                  Qg                                       -6.000                       -4.479     -25.350



                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic


                                                     Measurement
                                                     Simulation




Simulation Result


                                     Cbd(pF)
           VDS(V)                                                 Error(%)
                          Measurement         Simulation
                    0.1          40.000               40.746            1.865
                    0.2          38.000               38.545            1.434
                    0.5          33.000               33.000            0.000
                      1          27.000               27.600            2.222
                      2          20.000               20.400            2.000
                      5          12.000               12.000            0.000
                    10            7.000                7.300            4.286




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result

  -14V



  -12V



  -10V



   -8V



   -6V



   -4V



   -2V



    0V
    1.98us  2.00us                           2.05us                       2.10us          2.13us
         V(L1:2)*2             V(L2:1)
                                                Time

Evaluation circuit

                                                U10
                                                                   L2              R2

                                                                                   7.14
                                                                   50nH

                                                                                               -10Vdc
                               RG    L1
          PER = 2000u                                                                          V1
          PW = 10u
          TF = 1n                    30nH
          TR = 1n            4.7
                                    R1          TPCF8103
          TD = 2u
          V2 = 10       V2           4.7

          V1 = 0



                                                               0


Simulation Result

         ID=-1.4A, VDD=-10V
                                            Measurement            Simulation                 Error(%)
              VGS=-0/5V
               Ton(ns)                                 9.000                  9.014                     0.156



                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

-10A
                                 -2.8
                -3


 -8A




 -6A
                                                                           -2



 -4A                                                                      -1.8




 -2A


                                                                  VGS=-1.5 V

  0A
       0V                -1.0V          -2.0V           -3.0V     -4.0V          -5.0V
            I(V3)
                                                 V_V2




Evaluation circuit


                         U10
                                                V3



                                                0Vdc


                                                             V2

                    V1
                                                         0
                         TPCF8103
                    0




                    0




                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL

Forward Current Characteristic

Circuit Simulation Result
   100A




    10A




   1.0A
          0V                 0.4V       0.8V          1.2V         1.6V       2.0V
               I(R1)
                                               V_V1
Evaluation Circuit



                           R1
                           0.01m


                        V1
               0Vdc
                                                       U25

                                                       TPCF8103




                       0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result
                                    10.00
                                                       Measurement
                                                       Simulation
     Drain reverse current IDR(A)




                                     1.00




                                     0.10
                                            0          0.2          0.4           0.6   0.8     1           1.2

                                                                Source-Drain voltage VSD(V)


Simulation Result

                                                                     - VSD(V)
                                            - IDR(A)                                            %Error
                                                             Measurement   Simulation
                                                    1                     0.760         0.761        0.132
                                                    2                     0.820         0.818       -0.244
                                                    5                     0.930         0.930        0.000
                                                   10                     1.070         1.069       -0.093




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result
   400mA



   300mA



   200mA



   100mA



    -0mA



  -100mA



  -200mA



  -300mA



  -400mA
      1.00us             1.04us             1.08us          1.12us       1.16us    1.20us
           I(R1)
                                                     Time

Evaluation Circuit

                                  R1


                                       50




           V1 = -9.4v    V1
           V2 = 10.6v
           TD = 66n                                           U25
           TR = 10ns
           TF = 9ns                                           TPCF8103
           PW = 1us
           PER = 100us




                         0




Compare Measurement vs. Simulation

               Trr(ns)            Measurement                 Simulation          Error (%)
               Trr(ns)                   19.500                   19.538                0.195




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                        Reference




Trj=7.000ns)
Trb=12.000(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
ESD PROTECTION DIODE SPICE MODEL

Zener Voltage Characteristic
Circuit Simulation Result

   10mA


    9mA


    8mA


    7mA


    6mA


    5mA


    4mA


    3mA


    2mA


    1mA


     0A
          0V      5V      10V         15V   20V   25V     30V     35V   40V   45V   50V
               I(R1)
                                                  V_V1


Evaluation Circuit

                                U25




                 0.01m     R1                            R2
                                 TPCF8103
                                                         100MEG
                          V1
                  0Vdc



                          0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                          Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

SPICE MODEL of TPCF8103 (Standard+BDS Model) in SPICE PARK

  • 1.
    Device Modeling Report COMPONENTS:Power MOSFET (Model Parameters) PART NUMBER: TPCF8103 MANUFACTURER: TOSHIBA Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2.
    Circuit Configuration All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3.
    MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4.
    Transconductance Characteristic Circuit SimulationResult 10 9 8 7 6 gfs 5 4 3 2 Measurement Simulation 1 0 1 2 3 4 5 - ID - Drain Current - A Comparison table gfs - Id(A) Error(%) Measurement Simulation 0.1 1.300 1.333 2.538 0.2 2.000 2.000 0.000 0.5 3.100 3.125 0.806 1 4.300 4.333 0.767 2 5.800 5.882 1.414 5 9.200 9.434 2.543 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5.
    Vgs-Id Characteristic Circuit Simulationresult -5.0A -4.0A -3.0A -2.0A -1.0A 0A 0V -0.5V -1.0V -1.5V -2.0V -2.5V I(V3) V_V1 Evaluation circuit U10 V3 0Vdc V2 V1 -10 TPCF8103 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6.
    Comparison Graph Circuit SimulationResult 5 Measurement BeeTech 4 - ID - Drain Current - A 3 2 1 0 0.0 0.5 1.0 1.5 2.0 2.5 - VGS - Gate to Source Voltage - V Simulation Result - VGS(V) - ID(A) Error (%) Measurement Simulation 0.1 1.000 1.048 4.800 0.2 1.120 1.113 -0.625 0.5 1.250 1.230 -1.600 1 1.400 1.362 -2.714 2 1.600 1.564 -2.250 5 2.000 1.959 -2.050 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7.
    Rds(on) Characteristic Circuit Simulationresult -2.0A -1.5A -1.0A -0.5A 0A 0V -50mV -100mV -150mV -200mV I(V2) V_VDS Evaluation circuit U10 V2 0Vdc 0Vdc VDS VGS -4.5Vdc TPCF8103 0 Simulation Result ID=-1.4A, VGS=-4.5V Measurement Simulation Error (%) R DS (on) 0.072  0.072  0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8.
    Gate Charge Characteristic CircuitSimulation result 10V 8V 6V 4V 2V 0V 0 2n 4n 6n 8n 10n -V(W1:4) Time*1mA Evaluation circuit ION = 0uA IOFF = 1mA W U10 D2 I2 - I1 = 0 + 2.7 I1 Dbreak I2 = 1m W1 TD = 0 TPCF8103 TR = 10n V1 TF = 10n PW = 600u PER = 1000u -16 0 Simulation Result VDD=-16V,ID=-2.7A Measurement Simulation Error (%) ,VGS=-5V Qgs(nC) -0.800 -0.799 -0.125 Qgd(nC) -2.000 -2.015 0.750 Qg -6.000 -4.479 -25.350 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9.
    Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.1 40.000 40.746 1.865 0.2 38.000 38.545 1.434 0.5 33.000 33.000 0.000 1 27.000 27.600 2.222 2 20.000 20.400 2.000 5 12.000 12.000 0.000 10 7.000 7.300 4.286 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10.
    Switching Time Characteristic CircuitSimulation result -14V -12V -10V -8V -6V -4V -2V 0V 1.98us 2.00us 2.05us 2.10us 2.13us V(L1:2)*2 V(L2:1) Time Evaluation circuit U10 L2 R2 7.14 50nH -10Vdc RG L1 PER = 2000u V1 PW = 10u TF = 1n 30nH TR = 1n 4.7 R1 TPCF8103 TD = 2u V2 = 10 V2 4.7 V1 = 0 0 Simulation Result ID=-1.4A, VDD=-10V Measurement Simulation Error(%) VGS=-0/5V Ton(ns) 9.000 9.014 0.156 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11.
    Output Characteristic Circuit Simulationresult -10A -2.8 -3 -8A -6A -2 -4A -1.8 -2A VGS=-1.5 V 0A 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) V_V2 Evaluation circuit U10 V3 0Vdc V2 V1 0 TPCF8103 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12.
    BODY DIODE SPICEMODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 0V 0.4V 0.8V 1.2V 1.6V 2.0V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc U25 TPCF8103 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13.
    Comparison Graph Circuit SimulationResult 10.00 Measurement Simulation Drain reverse current IDR(A) 1.00 0.10 0 0.2 0.4 0.6 0.8 1 1.2 Source-Drain voltage VSD(V) Simulation Result - VSD(V) - IDR(A) %Error Measurement Simulation 1 0.760 0.761 0.132 2 0.820 0.818 -0.244 5 0.930 0.930 0.000 10 1.070 1.069 -0.093 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14.
    Reverse Recovery Characteristic CircuitSimulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 1.00us 1.04us 1.08us 1.12us 1.16us 1.20us I(R1) Time Evaluation Circuit R1 50 V1 = -9.4v V1 V2 = 10.6v TD = 66n U25 TR = 10ns TF = 9ns TPCF8103 PW = 1us PER = 100us 0 Compare Measurement vs. Simulation Trr(ns) Measurement Simulation Error (%) Trr(ns) 19.500 19.538 0.195 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15.
    Reverse Recovery Characteristic Reference Trj=7.000ns) Trb=12.000(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16.
    ESD PROTECTION DIODESPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit U25 0.01m R1 R2 TPCF8103 100MEG V1 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 17.
    Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006