This document provides an overview of scanning tunneling microscopy (STM) principles and applications. It begins with a general introduction and outlines the basic theoretical framework of STM operation. Specifically, it discusses how STM works by bringing a tip within atomic reach of a surface and measuring tunneling current. The document then covers various STM capabilities such as surface characterization, probing oxides and high-temperature superconductors, and atomic resolution imaging. It concludes by discussing advanced STM techniques including spectroscopy, momentum-space imaging, spin-polarized measurements, and time-resolved applications with picosecond resolution.