Atomic Force Microscopy
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Atomic force microscopy (AFM) was invented by Gerd Binning and Calvin Quate in 1985. AFM uses a micro- or nanoscale cantilever with a sharp tip to scan specimen surfaces at the nanoscale level, achieving over 1000 times higher resolution than optical microscopes. There are three main AFM modes - contact mode, non-contact mode, and tapping mode - which differ in how close the tip is to the sample surface during scanning. AFM operates by using a laser to detect bending of the cantilever as its tip interacts with and is deflected by the sample surface, allowing for imaging with angstrom-level resolution.
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AFM
Atomic force microscopy (AFM) uses a sharp tip attached to a flexible cantilever beam to scan the surface of a sample. As the tip is raster scanned over the sample surface, interactions between tip and surface are measured by detecting deflections of the cantilever. There are two main modes of operation: contact mode, where the tip is in constant contact with the surface; and tapping mode, where the tip vibrates close to the surface and only intermittently makes contact. By measuring cantilever deflections during scanning, AFM can produce highly resolved 3D topographic images of surfaces with nanoscale resolution.
Atomic Force Microscopy
This document is a PowerPoint presentation about atomic force microscopy (AFM). AFM was invented in 1981 and provides very high-resolution imaging, with the ability to resolve features on the order of fractions of a nanometer. It works by scanning a sharp probe across a surface to detect interatomic forces. In contact mode, the probe is less than 0.5 nm from the surface, while in tapping mode it oscillates 0.5-2 nm above. Noncontact mode uses an oscillating probe without touching. AFM finds wide application from materials science to biology due to its ability to image nonconductive samples without coating in liquid or air.
Afm steps to be followed while surface analysis
Atomic force microscopy (AFM) is a technique for imaging surfaces at the nanoscale. It works by measuring the force between a sharp probe and the sample surface. The key parts of an AFM include a laser, photodetector, cantilever with a probe tip, amplifier and scanner. There are three main imaging modes - contact mode, non-contact mode, and tapping mode. AFM can provide three-dimensional topographic information about a sample and operates in air, liquid or vacuum. Proper sample preparation and calibration of the AFM are required to obtain high resolution images.
Atomic force microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy that uses a sharp probe to scan over a sample surface. It operates by measuring the forces between the probe and sample using a laser beam and photodetector to measure the probe's deflection. There are three main imaging modes: contact mode, non-contact mode, and tapping mode. AFM provides topographic, mechanical, and other property information with nanoscale resolution and is widely used in materials science and biology.
Atomic Force Microscopy (AFM)
Atomic force microscopy (AFM) is a scanning probe microscopy technique capable of producing high-resolution topographical images of a sample surface. AFM works by scanning a sharp tip over a surface and measuring the force between the tip and sample using a laser beam and photodetector. This force is characterized by Hooke's law and depends on the tip deflection and spring constant. AFM can operate in contact, non-contact, or tapping mode and is used across many fields due to its ability to image both hard and soft materials with nanoscale resolution.
Atomic Force Microscope: Fundamental Principles
A first principle study of the atomic force microscope focussing on the forces being measured and their implication in experimentation.
Introduction to AFM
Atomic force microscopy (AFM) uses a cantilever with a sharp tip to scan sample surfaces and measure surface topography with high resolution. It can image in contact mode, non-contact mode, or tapping mode. AFM can image a wide range of materials from angstrom to micron scales, including biological samples like proteins, lipids, cells, and viruses. Sample preparation requires substrates like mica or graphite and optimization of parameters like pH and salt concentration. AFM provides 3D topographic and friction force images of samples and can interpret surface features at the nanoscale.
afm by anam rana
The document describes the atomic force microscope (AFM), a type of scanning probe microscope invented in 1986. The AFM uses a sharp probe or tip to scan over a sample surface and measure interatomic forces, allowing it to image features on the nanoscale. The key components of an AFM are a cantilever with a sharp tip, a scanner, and a detection system to measure cantilever deflection. Different imaging modes like contact mode, non-contact mode, and tapping mode are used to generate 3D topographic images of surfaces with high resolution down to fractions of a nanometer. The AFM has applications in data storage, biomolecular imaging, and nanotechnology.
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AFM
Atomic force microscopy (AFM) uses a sharp tip attached to a flexible cantilever beam to scan the surface of a sample. As the tip is raster scanned over the sample surface, interactions between tip and surface are measured by detecting deflections of the cantilever. There are two main modes of operation: contact mode, where the tip is in constant contact with the surface; and tapping mode, where the tip vibrates close to the surface and only intermittently makes contact. By measuring cantilever deflections during scanning, AFM can produce highly resolved 3D topographic images of surfaces with nanoscale resolution.
Atomic Force Microscopy
This document is a PowerPoint presentation about atomic force microscopy (AFM). AFM was invented in 1981 and provides very high-resolution imaging, with the ability to resolve features on the order of fractions of a nanometer. It works by scanning a sharp probe across a surface to detect interatomic forces. In contact mode, the probe is less than 0.5 nm from the surface, while in tapping mode it oscillates 0.5-2 nm above. Noncontact mode uses an oscillating probe without touching. AFM finds wide application from materials science to biology due to its ability to image nonconductive samples without coating in liquid or air.
Afm steps to be followed while surface analysis
Atomic force microscopy (AFM) is a technique for imaging surfaces at the nanoscale. It works by measuring the force between a sharp probe and the sample surface. The key parts of an AFM include a laser, photodetector, cantilever with a probe tip, amplifier and scanner. There are three main imaging modes - contact mode, non-contact mode, and tapping mode. AFM can provide three-dimensional topographic information about a sample and operates in air, liquid or vacuum. Proper sample preparation and calibration of the AFM are required to obtain high resolution images.
Atomic force microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy that uses a sharp probe to scan over a sample surface. It operates by measuring the forces between the probe and sample using a laser beam and photodetector to measure the probe's deflection. There are three main imaging modes: contact mode, non-contact mode, and tapping mode. AFM provides topographic, mechanical, and other property information with nanoscale resolution and is widely used in materials science and biology.
Atomic Force Microscopy (AFM)
Atomic force microscopy (AFM) is a scanning probe microscopy technique capable of producing high-resolution topographical images of a sample surface. AFM works by scanning a sharp tip over a surface and measuring the force between the tip and sample using a laser beam and photodetector. This force is characterized by Hooke's law and depends on the tip deflection and spring constant. AFM can operate in contact, non-contact, or tapping mode and is used across many fields due to its ability to image both hard and soft materials with nanoscale resolution.
Atomic Force Microscope: Fundamental Principles
A first principle study of the atomic force microscope focussing on the forces being measured and their implication in experimentation.
Introduction to AFM
Atomic force microscopy (AFM) uses a cantilever with a sharp tip to scan sample surfaces and measure surface topography with high resolution. It can image in contact mode, non-contact mode, or tapping mode. AFM can image a wide range of materials from angstrom to micron scales, including biological samples like proteins, lipids, cells, and viruses. Sample preparation requires substrates like mica or graphite and optimization of parameters like pH and salt concentration. AFM provides 3D topographic and friction force images of samples and can interpret surface features at the nanoscale.
afm by anam rana
The document describes the atomic force microscope (AFM), a type of scanning probe microscope invented in 1986. The AFM uses a sharp probe or tip to scan over a sample surface and measure interatomic forces, allowing it to image features on the nanoscale. The key components of an AFM are a cantilever with a sharp tip, a scanner, and a detection system to measure cantilever deflection. Different imaging modes like contact mode, non-contact mode, and tapping mode are used to generate 3D topographic images of surfaces with high resolution down to fractions of a nanometer. The AFM has applications in data storage, biomolecular imaging, and nanotechnology.
Atomic force microscope
Atomic force microscopy (AFM) uses a sharp tip attached to a flexible cantilever to scan the surface of a sample and map its topography with nanoscale resolution. As the tip is scanned across the surface, interactions between the tip and sample cause the cantilever to deflect, and these deflections are used to construct a 3D image of the surface. AFM can operate in contact, non-contact, or tapping mode and is capable of measuring properties like roughness, elasticity, and adhesion in addition to topography. It provides magnification from 100X to over 100 million X with nanometer scale resolution and does not require complex sample preparation, making AFM a versatile high-resolution imaging tool.
Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy used to image surfaces at the nanoscale. It was developed in the 1980s by modifying the scanning tunneling microscope to be able to image non-conducting samples in various environments including air, liquid, and vacuum. An AFM works by scanning a probe with a very sharp tip over a sample surface, measuring the force between the tip and sample. This force is measured by reflecting a laser off the back of the flexible cantilever the tip is attached to. AFM can image surfaces with sub-nanometer resolution and is used in various applications including biology to image things like proteins and DNA.
Atomic Force Microscope and its potential use in biology
- The atomic force microscope (AFM) is a type of scanning probe microscope used to image surfaces at the nanoscale. It measures forces between a sharp probe and the sample surface.
- In contact mode, the AFM tip is in contact with the sample surface and repulsive forces are measured. In tapping mode, the tip lightly taps the surface to reduce lateral forces and damage.
- The AFM has many applications in biology like imaging living cells, studying protein unfolding, measuring molecular interactions like DNA binding, and more. It can be used to map molecular recognition with single molecule resolution.
Non contact mode (AFM)
- Atomic force microscopy (AFM) uses a sharp tip to scan over a sample surface and measure forces between the tip and sample. Gerd Binning invented the AFM in 1986.
- There are three main imaging modes: contact mode, tapping mode, and non-contact mode. Non-contact mode operates with the tip oscillating above the surface without touching.
- Advantages of non-contact AFM include that it exerts low forces and avoids damaging soft samples or contaminating the tip. Disadvantages include lower resolution and slower scanning speeds. Applications include analyzing surface roughness, thin film growth, and material properties like stiffness.
Microscopic examination using Atomic force microscopy and Confocal scanning ...
ATOMIC FORCE MICROSCOPE
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning force microscopy, invented in 1986 by Binning, quate and Gerber.
AFMs can be operated in air, vacuum, and in liquids. Biological measurements in particular, are often carried out in vitro in biological fluids, friction and chemical functionality.
Ability of an AFM to achieve near atomic level resolution depends on three essential components:
1). Cantilever with sharp tip
2). Scanner that controls the x-y-z position
3). Feedback control and loop
Confocal Scanning Laser Microscopy (SLCM) is a valuable tool for obtaining high resolution images and 3-D
reconstructions.
Atomic force microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy with very high resolution. It uses a sharp tip at the end of a flexible cantilever to scan the surface of a sample and measure forces. As the tip scans the surface, a laser detects how the cantilever bends from surface forces. This allows creating 3D images of surfaces with resolutions down to fractions of a nanometer. AFM can image in various modes including contact, non-contact, and tapping and has applications in biology, materials science, and nanotechnology.
Atomic force microscopy
The document summarizes atomic force microscopy (AFM). AFM was invented in 1985 and works by scanning a probe tip across a sample surface while monitoring interatomic forces. AFM can be used to create high-resolution topographic images of samples without extensive preparation. It has advantages over other techniques as it can image samples in liquid, at varying temperatures, and allow repeated studies without damage. AFM is commonly used to image biological samples like DNA, proteins, and cells.
Atomic Force Microscope
The atomic force microscope (AFM) was invented in 1985 by Gerd Binnig and Cristoph Gerber. It uses a sharp tip mounted on a flexible cantilever to scan the topography of a sample at an extremely high resolution down to the atomic level. The AFM works by measuring the interaction forces between the tip and sample surface. It consists of a probe with a sharp tip, a scanner that controls the tip's movement in the x, y, and z directions, and an optical lever system using a laser and photodetector to measure the cantilever's deflection. The AFM can image a variety of samples at the nanoscale and provide 3D topographic information.
Stm
This document discusses the scanning tunneling microscope (STM). It begins by introducing STM and its ability to image surfaces with atomic resolution. It then explains the principle of STM, which uses a voltage applied between a metal tip and sample surface to create a tunneling current that is exponentially dependent on tip-sample separation. The document outlines the tip positioning system, describes the constant current and variable current imaging modes, and notes STM's advantages of high resolution and ability to study various environments and its disadvantage of requiring precise tip positioning and stable/clean surfaces.
AFM (Atomic Force Microscopy)
Atomic force microscopy (AFM) was developed in 1986 as an extension of scanning tunneling microscopy to image non-conductive surfaces. AFM uses a sharp probe at the end of a flexible cantilever to measure the tiny forces between the probe and sample surface. As the probe scans the surface, these interatomic forces cause the cantilever to deflect, and a laser detects these deflections to create a 3D topographic image of the surface with angstrom-scale resolution. AFM provides topographic and force measurements and can image surfaces in open air or liquid with minimal sample preparation. It has applications in fields including solid state physics, molecular biology, and materials science.
Spm And Sicm Lecture
Scanning probe microscopy uses a probe that senses physical changes as it approaches a sample surface. Scanning tunneling microscopy uses a metallic tip to detect tunneling current from a conducting sample. Atomic force microscopy detects attractive or repulsive forces between a tip on a cantilever and the sample surface. Scanning ion conductance microscopy uses a micropipette probe to measure ion currents in a conductive liquid, allowing contact-free imaging of cells and other isolating samples at high resolution.
ATOMIC FORCE MICROSCOPE MITHILESH CHOUDHARY
Atomic Force Microscopy is an instrument that gives a complete informatition about topology of specimen.
113_ICAFMlab_group2
- The document describes an atomic force microscopy (AFM) lab experiment using a Veeco Digital Instruments CP-II AFM to image gold nanoparticles and a cicada wing in contact (C-AFM) and intermittent contact (IC-AFM) modes.
- Scans were taken of both samples in each mode and measurements were made of particle diameters and center-to-center distances.
- The IC-AFM mode did not function properly, only allowing imaging in C-AFM mode which produced higher resolution images as expected.
Scanning Tunneling Microscope
The document discusses the scanning tunneling microscope (STM), which uses quantum tunneling to produce atomic-scale images of surfaces. Key points:
- The STM was invented in 1981 and won the Nobel Prize in Physics in 1986. It allows visualization of individual atoms and manipulation of single atoms.
- The STM works by scanning a sharp conductive tip very close to a sample surface. A bias voltage causes electrons to tunnel between tip and surface, producing a current that varies with atomic topography.
- STM can image in various environments, with resolutions down to 0.1 nm laterally and 0.01 nm vertically. It has found many uses including atomic manipulation and etching.
Atomic force microscopy
The document discusses atomic force microscopy (AFM) and its use to characterize crystalline cellulose distributions on natural and pretreated plant cell wall surfaces. AFM uses a sharp tip to scan surfaces with nanoscale resolution. The document finds that dilute acid pretreatment increases the percentage of plant cell wall surfaces covered by crystalline cellulose from 17-20% naturally to 23-38% after pretreatment. Optimized pretreatment with 0.5% sulfuric acid at 135°C resulted in 23% coverage on poplar, 28% on switchgrass, and 38% on corn stover. AFM provides detailed surface information that can improve understanding of pretreatment effects and lead to biomass processing enhancements.
ETE444-lec2-atomic_scale_characterization_techniques.pptx
1. The document discusses atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which allow visualization of surfaces at the atomic scale. AFM works by measuring the deflection of a cantilever with a sharp tip as it is moved over a sample surface, detecting atomic-scale surface features.
2. The history of AFM and STM is summarized, including their invention in the 1980s. AFM can image both conducting and insulating surfaces, while STM requires a conductive surface. Contact and non-contact AFM modes are described.
3. Fabrication of AFM tips is discussed, including the use of carbon nanotubes which can achieve higher resolution. Specific applications of A
ATOMIC FORCE MICROSCOPY
AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the Nanoscale. It Is a very high-resolution, type of Scanning Probe Microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Charecterization techniques
The document provides information about atomic force microscopy (AFM). It describes the key components of an AFM, including a laser, photodetector, cantilever with a sharp tip, and piezoelectric crystals that control tip movement. The document explains that in AFM, the tip is brought close to the sample surface and interactions between tip and sample result in cantilever bending that is measured by reflecting a laser off the cantilever into a photodetector. Different AFM modes are also summarized, such as contact mode, non-contact mode, and tapping mode.
Introduction to Atomic Force Microscopy
The document summarizes the fundamentals of atomic force microscopy (AFM). It describes that AFM has very high resolution on the order of fractions of nanometers. It operates by measuring the force between a probe tip and the sample surface. The document outlines the basic theory of AFM, including that it consists of a cantilever with a sharp tip used to scan the sample surface. Forces between the tip and sample lead to deflection of the cantilever. It also describes the different operating modes of AFM including contact, non-contact, and tapping modes.
Scanning tunneling microscope (STM)
This document provides information about a scanning tunneling microscope (STM) including its basic operating principles, design, modes of operation, applications, and related imaging techniques. The STM works by using the quantum tunneling effect to measure electric currents between a sharp tip and conductive sample surface. This allows it to image surfaces at the atomic level with high resolution. The document outlines the key components of an STM including the sample, scanning tip, piezoelectric scanner, and control electronics. It also describes the two main imaging modes of constant current and constant height. Common applications and examples of STM images showing atomic structures are also presented. Finally, related microscopy techniques developed from STM principles are briefly discussed.
AFM.pdf
Atomic force microscopy (AFM) is a type of scanning probe microscopy with very high resolution, over 1000 times better than optical microscopy. AFM uses a sharp tip on a flexible cantilever to image surfaces. As the tip scans across the surface, the bending of the cantilever is detected by laser and provides information about surface features with nanoscale resolution. AFM can operate in different modes, such as contact mode where the tip touches the surface, or tapping mode where the tip taps the surface to reduce contact and potential damage.
AFMppt.ppt
The atomic force microscope (AFM) uses a sharp probe to raster scan over a sample surface, measuring the force between the probe and sample to construct a 3D topographic image. The AFM consists of a cantilever with a sharp tip that is deflected by interacting forces, which are measured to generate height data as the tip is scanned in x and y. AFM can operate in contact, tapping, or non-contact mode and is useful for imaging samples with sub-nanometer resolution without requiring special sample preparation.
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Atomic force microscope
Atomic force microscopy (AFM) uses a sharp tip attached to a flexible cantilever to scan the surface of a sample and map its topography with nanoscale resolution. As the tip is scanned across the surface, interactions between the tip and sample cause the cantilever to deflect, and these deflections are used to construct a 3D image of the surface. AFM can operate in contact, non-contact, or tapping mode and is capable of measuring properties like roughness, elasticity, and adhesion in addition to topography. It provides magnification from 100X to over 100 million X with nanometer scale resolution and does not require complex sample preparation, making AFM a versatile high-resolution imaging tool.
Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy used to image surfaces at the nanoscale. It was developed in the 1980s by modifying the scanning tunneling microscope to be able to image non-conducting samples in various environments including air, liquid, and vacuum. An AFM works by scanning a probe with a very sharp tip over a sample surface, measuring the force between the tip and sample. This force is measured by reflecting a laser off the back of the flexible cantilever the tip is attached to. AFM can image surfaces with sub-nanometer resolution and is used in various applications including biology to image things like proteins and DNA.
Atomic Force Microscope and its potential use in biology
- The atomic force microscope (AFM) is a type of scanning probe microscope used to image surfaces at the nanoscale. It measures forces between a sharp probe and the sample surface.
- In contact mode, the AFM tip is in contact with the sample surface and repulsive forces are measured. In tapping mode, the tip lightly taps the surface to reduce lateral forces and damage.
- The AFM has many applications in biology like imaging living cells, studying protein unfolding, measuring molecular interactions like DNA binding, and more. It can be used to map molecular recognition with single molecule resolution.
Non contact mode (AFM)
- Atomic force microscopy (AFM) uses a sharp tip to scan over a sample surface and measure forces between the tip and sample. Gerd Binning invented the AFM in 1986.
- There are three main imaging modes: contact mode, tapping mode, and non-contact mode. Non-contact mode operates with the tip oscillating above the surface without touching.
- Advantages of non-contact AFM include that it exerts low forces and avoids damaging soft samples or contaminating the tip. Disadvantages include lower resolution and slower scanning speeds. Applications include analyzing surface roughness, thin film growth, and material properties like stiffness.
Microscopic examination using Atomic force microscopy and Confocal scanning ...
ATOMIC FORCE MICROSCOPE
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning force microscopy, invented in 1986 by Binning, quate and Gerber.
AFMs can be operated in air, vacuum, and in liquids. Biological measurements in particular, are often carried out in vitro in biological fluids, friction and chemical functionality.
Ability of an AFM to achieve near atomic level resolution depends on three essential components:
1). Cantilever with sharp tip
2). Scanner that controls the x-y-z position
3). Feedback control and loop
Confocal Scanning Laser Microscopy (SLCM) is a valuable tool for obtaining high resolution images and 3-D
reconstructions.
Atomic force microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy with very high resolution. It uses a sharp tip at the end of a flexible cantilever to scan the surface of a sample and measure forces. As the tip scans the surface, a laser detects how the cantilever bends from surface forces. This allows creating 3D images of surfaces with resolutions down to fractions of a nanometer. AFM can image in various modes including contact, non-contact, and tapping and has applications in biology, materials science, and nanotechnology.
Atomic force microscopy
The document summarizes atomic force microscopy (AFM). AFM was invented in 1985 and works by scanning a probe tip across a sample surface while monitoring interatomic forces. AFM can be used to create high-resolution topographic images of samples without extensive preparation. It has advantages over other techniques as it can image samples in liquid, at varying temperatures, and allow repeated studies without damage. AFM is commonly used to image biological samples like DNA, proteins, and cells.
Atomic Force Microscope
The atomic force microscope (AFM) was invented in 1985 by Gerd Binnig and Cristoph Gerber. It uses a sharp tip mounted on a flexible cantilever to scan the topography of a sample at an extremely high resolution down to the atomic level. The AFM works by measuring the interaction forces between the tip and sample surface. It consists of a probe with a sharp tip, a scanner that controls the tip's movement in the x, y, and z directions, and an optical lever system using a laser and photodetector to measure the cantilever's deflection. The AFM can image a variety of samples at the nanoscale and provide 3D topographic information.
Stm
This document discusses the scanning tunneling microscope (STM). It begins by introducing STM and its ability to image surfaces with atomic resolution. It then explains the principle of STM, which uses a voltage applied between a metal tip and sample surface to create a tunneling current that is exponentially dependent on tip-sample separation. The document outlines the tip positioning system, describes the constant current and variable current imaging modes, and notes STM's advantages of high resolution and ability to study various environments and its disadvantage of requiring precise tip positioning and stable/clean surfaces.
AFM (Atomic Force Microscopy)
Atomic force microscopy (AFM) was developed in 1986 as an extension of scanning tunneling microscopy to image non-conductive surfaces. AFM uses a sharp probe at the end of a flexible cantilever to measure the tiny forces between the probe and sample surface. As the probe scans the surface, these interatomic forces cause the cantilever to deflect, and a laser detects these deflections to create a 3D topographic image of the surface with angstrom-scale resolution. AFM provides topographic and force measurements and can image surfaces in open air or liquid with minimal sample preparation. It has applications in fields including solid state physics, molecular biology, and materials science.
Spm And Sicm Lecture
Scanning probe microscopy uses a probe that senses physical changes as it approaches a sample surface. Scanning tunneling microscopy uses a metallic tip to detect tunneling current from a conducting sample. Atomic force microscopy detects attractive or repulsive forces between a tip on a cantilever and the sample surface. Scanning ion conductance microscopy uses a micropipette probe to measure ion currents in a conductive liquid, allowing contact-free imaging of cells and other isolating samples at high resolution.
ATOMIC FORCE MICROSCOPE MITHILESH CHOUDHARY
Atomic Force Microscopy is an instrument that gives a complete informatition about topology of specimen.
113_ICAFMlab_group2
- The document describes an atomic force microscopy (AFM) lab experiment using a Veeco Digital Instruments CP-II AFM to image gold nanoparticles and a cicada wing in contact (C-AFM) and intermittent contact (IC-AFM) modes.
- Scans were taken of both samples in each mode and measurements were made of particle diameters and center-to-center distances.
- The IC-AFM mode did not function properly, only allowing imaging in C-AFM mode which produced higher resolution images as expected.
Scanning Tunneling Microscope
The document discusses the scanning tunneling microscope (STM), which uses quantum tunneling to produce atomic-scale images of surfaces. Key points:
- The STM was invented in 1981 and won the Nobel Prize in Physics in 1986. It allows visualization of individual atoms and manipulation of single atoms.
- The STM works by scanning a sharp conductive tip very close to a sample surface. A bias voltage causes electrons to tunnel between tip and surface, producing a current that varies with atomic topography.
- STM can image in various environments, with resolutions down to 0.1 nm laterally and 0.01 nm vertically. It has found many uses including atomic manipulation and etching.
Atomic force microscopy
The document discusses atomic force microscopy (AFM) and its use to characterize crystalline cellulose distributions on natural and pretreated plant cell wall surfaces. AFM uses a sharp tip to scan surfaces with nanoscale resolution. The document finds that dilute acid pretreatment increases the percentage of plant cell wall surfaces covered by crystalline cellulose from 17-20% naturally to 23-38% after pretreatment. Optimized pretreatment with 0.5% sulfuric acid at 135°C resulted in 23% coverage on poplar, 28% on switchgrass, and 38% on corn stover. AFM provides detailed surface information that can improve understanding of pretreatment effects and lead to biomass processing enhancements.
ETE444-lec2-atomic_scale_characterization_techniques.pptx
1. The document discusses atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which allow visualization of surfaces at the atomic scale. AFM works by measuring the deflection of a cantilever with a sharp tip as it is moved over a sample surface, detecting atomic-scale surface features.
2. The history of AFM and STM is summarized, including their invention in the 1980s. AFM can image both conducting and insulating surfaces, while STM requires a conductive surface. Contact and non-contact AFM modes are described.
3. Fabrication of AFM tips is discussed, including the use of carbon nanotubes which can achieve higher resolution. Specific applications of A
ATOMIC FORCE MICROSCOPY
AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the Nanoscale. It Is a very high-resolution, type of Scanning Probe Microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Charecterization techniques
The document provides information about atomic force microscopy (AFM). It describes the key components of an AFM, including a laser, photodetector, cantilever with a sharp tip, and piezoelectric crystals that control tip movement. The document explains that in AFM, the tip is brought close to the sample surface and interactions between tip and sample result in cantilever bending that is measured by reflecting a laser off the cantilever into a photodetector. Different AFM modes are also summarized, such as contact mode, non-contact mode, and tapping mode.
Introduction to Atomic Force Microscopy
The document summarizes the fundamentals of atomic force microscopy (AFM). It describes that AFM has very high resolution on the order of fractions of nanometers. It operates by measuring the force between a probe tip and the sample surface. The document outlines the basic theory of AFM, including that it consists of a cantilever with a sharp tip used to scan the sample surface. Forces between the tip and sample lead to deflection of the cantilever. It also describes the different operating modes of AFM including contact, non-contact, and tapping modes.
Scanning tunneling microscope (STM)
This document provides information about a scanning tunneling microscope (STM) including its basic operating principles, design, modes of operation, applications, and related imaging techniques. The STM works by using the quantum tunneling effect to measure electric currents between a sharp tip and conductive sample surface. This allows it to image surfaces at the atomic level with high resolution. The document outlines the key components of an STM including the sample, scanning tip, piezoelectric scanner, and control electronics. It also describes the two main imaging modes of constant current and constant height. Common applications and examples of STM images showing atomic structures are also presented. Finally, related microscopy techniques developed from STM principles are briefly discussed.
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Atomic Force Microscope and its potential use in biology
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ETE444-lec2-atomic_scale_characterization_techniques.pptx
ETE444-lec2-atomic_scale_characterization_techniques.pptx
Similar to Atomic Force Microscopy
AFM.pdf
Atomic force microscopy (AFM) is a type of scanning probe microscopy with very high resolution, over 1000 times better than optical microscopy. AFM uses a sharp tip on a flexible cantilever to image surfaces. As the tip scans across the surface, the bending of the cantilever is detected by laser and provides information about surface features with nanoscale resolution. AFM can operate in different modes, such as contact mode where the tip touches the surface, or tapping mode where the tip taps the surface to reduce contact and potential damage.
AFMppt.ppt
The atomic force microscope (AFM) uses a sharp probe to raster scan over a sample surface, measuring the force between the probe and sample to construct a 3D topographic image. The AFM consists of a cantilever with a sharp tip that is deflected by interacting forces, which are measured to generate height data as the tip is scanned in x and y. AFM can operate in contact, tapping, or non-contact mode and is useful for imaging samples with sub-nanometer resolution without requiring special sample preparation.
Microscopy
The document discusses different types of microscopy techniques. It describes three main branches of microscopy - optical, electron, and scanning probe microscopy. Optical and electron microscopy use light and electron beams respectively to image samples, while scanning probe microscopy uses a physical probe that interacts with the sample surface. The document then focuses on atomic force microscopy (AFM), providing details on its working principle, modes, image generation process, and applications in measuring surface roughness and thickness. Other scanning probe techniques are also briefly mentioned.
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Three Modes of AFM
AFM Instrument
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Schematic Diagram
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Preeti Choudhary
Lecture_10_Atomic force microscopy(1).pdf
The document provides an overview of atomic force microscopy (AFM). It discusses the history and development of AFM from its origins in scanning tunneling microscopy. The basic components of an AFM are described including the tip, cantilever, laser, and photodiode used for detection. Different imaging modes such as contact, non-contact, and tapping are compared in terms of resolution and potential for sample damage. Advanced imaging techniques like lateral force microscopy, force modulation microscopy, and phase imaging are also summarized. Overall, the document outlines the key principles and capabilities of AFM as a high-resolution imaging and measurement tool.
ETE444-lec2-atomic_scale_characterization_techniques.pptx
1. The document discusses atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which allow visualization of surfaces at the atomic scale. AFM works by measuring the deflection of a cantilever with a sharp tip as it is moved over a sample surface, detecting atomic-scale surface features.
2. The history of AFM and STM is summarized, including their invention in the 1980s. AFM can image both conducting and insulating surfaces, while STM requires a conductive surface. Contact and non-contact AFM modes are described.
3. Fabrication of AFM tips is discussed, including the use of carbon nanotubes which can achieve higher resolution. Specific applications of A
Atomic Foce Microscopy by Syed Ahsan Bukhari.pptx
Atomic force microscopy (AFM) works by scanning a sharp probe over a sample surface to build up a topographic map with single-atom level resolution. AFM was invented in 1986 by Binning and uses a piezoelectric transducer to move the probe while a force transducer senses the force between the probe and surface. Common imaging modes include contact mode, non-contact mode, and tapping mode. AFM provides key advantages over other microscopies like not requiring illumination or having depth of field issues.
Atomic force microscopy
Atomic force microscopy (AFM) works by scanning a probe over a sample surface to build up a topographic map with single-atom level resolution without the need for sample preparation. It was invented in 1986 by Binning and first used a cantilever with a diamond tip. The main components are a microscope stage to move the tip and sample, control electronics, and a computer. A piezoelectric transducer moves the tip while a force transducer senses the force and feedback control maintains a set force. There are different imaging modes including contact, non-contact, and tapping modes that use repulsive or attractive forces between the probe and sample. AFM can image a variety of biological and material science samples with limitations
AFM.ppt
Atomic force microscopy (AFM) is a very high-resolution type of scanning probe microscopy that can image surfaces at the atomic scale. An AFM works by scanning a probe with a very sharp tip over a sample surface, measuring the forces between the tip and surface. There are three main imaging modes: contact mode, non-contact mode, and tapping mode. AFMs can be used to image topography, measure forces, and manipulate samples at the nanoscale. While providing atomic resolution, AFM also has limitations such as limited range and data dependence on the tip. Future improvements may enable even sharper tips and atomic resolution of living systems.
ATOMIC FORCE MICROSCOPY.ppt
Atomic force microscopy (AFM) is a type of scanning probe microscopy with very high resolution. It uses a sharp tip at the end of a flexible cantilever to scan the surface of a sample and measure forces. As the tip scans the surface, a laser detects how the cantilever bends from surface forces. This allows creating 3D images of surfaces with resolutions down to fractions of a nanometer. AFM can image in various modes including contact, non-contact, and tapping and has applications in biology, materials science, and nanotechnology.
atomic force microscopy AFM
Atomic force microscopy (AFM) is a technique used to image surfaces at the nanoscale. The document outlines the history, components, operating modes, applications, and limitations of AFM. It discusses how AFM works by scanning a sample with a sharp tip attached to a flexible cantilever, measuring deflections to construct 3D surface images. Three common modes are contact, non-contact, and tapping mode. AFM can image a variety of materials and is useful for measuring surface roughness, adhesion, and other nanoscale properties. While resolution is limited by tip size, continued improvements aim to develop sharper tips and less damaging probes.
ETE444-lec2-atomic_scale_characterization_techniques.pdf
The document discusses atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques for nanoscale characterization, including a history of their development, operating principles, imaging modes, commercial applications, and examples of AFM tip fabrication methods and molecular imaging. It provides technical details on topics like non-contact dynamic mode AFM, carbon nanotube tips, and single-molecule force recognition events measured with AFM.
ETE444-lec2-atomic_scale_characterization_techniques.pdf
The document discusses atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques for nanoscale characterization, including a history of their development, operating principles, imaging modes, commercial applications, and examples of AFM tip fabrication methods and molecular imaging. It provides technical details on topics like non-contact versus contact AFM modes, carbon nanotube and other tip materials, and examples of DNA, protein, and nanofabrication imaging.
YHe-MT525
This document discusses three primary modes of atomic force microscopy (AFM) and their applications in nanolithography. The three modes are contact mode, tapping mode, and non-contact mode. Contact mode allows fast scanning but can damage soft surfaces. Tapping mode provides higher resolution with minimal damage. Non-contact mode exerts very low force but can have lower resolution. Each mode has distinct uses in nanofabrication including patterning polymers, local oxidation, and controlling pattern size.
AFM talk ASAS 10dec2015 Jenny to publish.pptx
AFM was invented in 1986 by Binning and colleagues and belongs to the scanning probe microscopy family. It uses a sharp tip on a flexible cantilever to scan a sample surface at an atomic scale resolution and detect short-range forces between the tip and sample. AFM can operate in various modes including contact, tapping, and dynamic contact modes and is capable of imaging in air, liquid, and other environments.
AFM by G. AKASH.pptx..this presentation is the topic about the AFM
Atomic force microscopy (AFM) is a technique that uses a sharp tip to scan surfaces at the nanoscale and create 3D topographical maps. AFM works by measuring the interaction between the tip and sample surface as the tip is attached to a cantilever that scans the surface. There are different imaging modes, including contact mode where the tip is in constant contact with the surface, tapping mode where the tip oscillates near the surface, and non-contact mode where the tip does not touch the surface. AFM has applications in fields like nanotechnology, materials science, biology, and medicine for tasks such as imaging biological molecules and studying the properties of materials.
Static force curve activity in nanofluidic channels
This document summarizes an experiment investigating how surface treatments affect the behavior of nanofluidic channels using atomic force microscopy. The experiment measured the surface roughness of plain glass, bromine-treated, and fluoride-treated nanochannel samples. Force curves were also collected in air, water, and electrolyte solutions using a silicon nitride tip to analyze adhesion and charge density distributions. The results showed the fluoride-treated sample had the roughest surface while measurements of force curves yielded information on spring constants, quality factors, and adhesion forces of the different samples.
cantilever array sensors
Cantilever array sensors use arrays of microfabricated cantilevers as sensors. Each cantilever is coated with a different receptor molecule. When molecules adsorb onto the cantilever surface, surface stress causes the cantilever to bend, which is detected by laser. Cantilever sensors have small size, fast response, and high sensitivity without labels. They can be used to detect chemicals, study biomolecular interactions, and measure physical properties.
ATOMIC FORCE MICROSCOPY.ppt
Atomic force microscopy (AFM) is a type of high-resolution scanning probe microscope used to image surfaces at the nanoscale. It uses a sharp tip that is attached to a flexible cantilever to measure deflection at a scale of fractions of a nanometer. As the tip is brought near or into contact with a sample surface, forces between the tip and sample lead to deflection of the cantilever that is measured using a laser spot and photodetector. This allows creation of 3D topographic images with high resolution without the need for a vacuum or conductive samples.
10 Scanning probe microscopy and nanomechanics
Scanning probe microscopy, atomic force microscopy, contact, non contact, tapping modes, nanomechanics, lateral force microscopy, phase imaging, electric force microscopy, magnetic force microscopy, cantiliver fabrication and characterization, tip performance, force spectroscopy, force volume, nanoindentation, macromolecule unfolding, nanomechanical properties, cytomechanics
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ETE444-lec2-atomic_scale_characterization_techniques.pptx
ETE444-lec2-atomic_scale_characterization_techniques.pptx
ETE444-lec2-atomic_scale_characterization_techniques.pdf
ETE444-lec2-atomic_scale_characterization_techniques.pdf
ETE444-lec2-atomic_scale_characterization_techniques.pdf
ETE444-lec2-atomic_scale_characterization_techniques.pdf
AFM by G. AKASH.pptx..this presentation is the topic about the AFM
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Static force curve activity in nanofluidic channels
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Atomic Force Microscopy
- 2. INVENTORS: Gerd Binning (1985) Calvin Quate
- 3. AFM: AFM is a high-resolution scanning probe microscope with a resolution of fractions of Angstrom, which has more than 1000 times higher resolution when compared to the classical optical microscope. AFM contains a micro- and nanoscale cantilever with a silicon or silicon nitrite sharp tip (probe) at its end that is used to scan the specimen surface at the nanoscale level.
- 5. Electron micrograph of a used AFM cantilever. Image width ~30 micrometers
- 6. Usually, three different AFM modes can be employed in an AFM unit, including *contact mode *noncontact mode, and *tapping mode.
- 7. CONTACT MODE: The contact mode in which the tip of the cantilever scans the sample in close contact with the surface is the most commonly used method for surface force measurements.
- 8. NONCONTACT MODE: In the noncontact mode, the tip usually hovers about 5–15 nm above the surface of the substrate. There are some difficulties with the contact mode AFM because of the higher wear rate and failure of the tips during scanning.
- 9. TAPPING MODE: On the other hand, tapping mode AFM deals with the problems associated with friction, tip tackling with the rough surfaces, electrostatic forces, adhesion, and other difficulties by the tapping process.
- 10. AFM image of electrospun Estane nanofibers
- 11. PRINCIPLE: AFM microscopes operate on the principle of surface sensing using an extremely sharp tip on a micromachined silicon probe. This tip is used to image a sample by raster scanning across the surface line by line, although the method varies dramatically between distinct operating modes.
- 12. The underlying principle of AFM is that this nanoscale tip is attached to a small cantilever which forms a spring. As the tip contacts the surface, the cantilever bends, and the bending is detected using a laser diode and a split photodetector. This bending is indicative of the tip-sample interaction force.
- 15. THANK YOU