AFM

1. Uncovering
Nanoscale Surfaces:
An Introduction to
Atomic Force
Microscopy
A PPT BY
G.AKASH
(AIDS-’A’)

2. Introduction
Atomic Force Microscopy (AFM)is
a powerful tool for imaging
surfaces at the nanoscale. This
technique uses a sharp tip to scan
the surface and create a 3D map
of the sample. AFM provides high-
resolution images and can be used
in a variety of fields, from materials
science to biology.

3. AFM Basics
AFM works by measuring the interaction
between the tip and the sample surface.
The tip is attached to a cantilever, which
is used to scan the surface. The tip-
sample interaction can be measured by
detecting changes in the cantilever's
deflection or resonance frequency.
These measurements are used to
create a topographical map of the
sample surface.

4. Modes of AFM
There are several modes of AFM,
including contact mode,tapping
mode,and non-contact mode.In
contact mode,the tip is in
constant contact with the
sample surface. In tapping
mode, the tip oscillates near the
surface, which reduces damage
to the sample. In non-contact
mode,the tip does not touch
the surface at all.

5. Applications of AFM
AFM can be used in a variety of
fields, including nanotechnology,
materials science, biology, and
medicine. It can be used to image
biological molecules, study the
mechanical properties of
materials, and measure surface
roughness. AFM can also be used
to study DNA,proteins, and cell
membranes.

6. Advantages of AFM
AFM has several advantages over other
imaging techniques, such as electron
microscopy. It can be used to image
samples in air or liquid environments,
which is important for studying biological
samples. AFM can also provide high-
resolution images of soft materials, which
can be difficult to image using other
techniques.