ADVANCED MATERIALS ANALYSIS EDX WDX TXRF PIXE
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The document discusses several types of X-ray fluorescence spectroscopy techniques, including energy-dispersive X-ray spectroscopy (EDX), wavelength-dispersive X-ray spectroscopy (WDX), total reflection X-ray fluorescence (TXRF), proton-induced X-ray emission (PIXE), and compares their workings, components, usage areas, and experimental results. The document also provides examples of PIXE being used to analyze historical sites and medical samples.
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XRF Basic Principles
This document provides an overview of X-ray fluorescence (XRF) spectroscopy. It discusses XRF theory, instrumentation, hardware, and applications. XRF uses X-rays to excite a sample, and a detector then measures the fluorescent X-rays emitted from the sample that are characteristic of its elemental composition. The document compares wavelength dispersive XRF and energy dispersive XRF, and describes the components of XRF systems including X-ray sources, detectors, filters, and electronics. It provides examples of XRF applications in qualitative and quantitative elemental analysis across various industries.
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X-ray fluorescence (XRF) spectrometry is an elemental analysis technique that uses X-rays to identify and quantify elements in a sample. When an inner shell electron is ejected from an atom by an X-ray source, an outer shell electron fills its place and emits a fluorescent X-ray that is characteristic of that element. By measuring the intensities of emitted X-ray energies, the elements present in a sample can be determined. XRF spectrometers consist of an X-ray source, sample holder, detector, and analyzer to measure fluorescent X-rays. XRF analysis is non-destructive, rapid, and widely used in industries like petroleum, mining, metallurgy, and cer
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Energy Dispersive Spectroscopy
Energy dispersive spectrometry (EDS) is a technique used to determine the elemental composition of materials. EDS relies on detecting X-rays emitted from a sample when it is exposed to an electron beam. The X-ray energies are characteristic of elements present in the sample. EDS systems consist of a detector that converts X-ray energies to voltage pulses, a pulse processor that amplifies the signals, and a multi-channel analyzer that sorts the pulses by energy and displays the results as an X-ray spectrum or elemental maps. EDS allows elemental analysis of micrometer-scale sample volumes and provides both qualitative and quantitative chemical information.
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This document provides an overview of X-ray fluorescence spectrometry (XRF) as presented in a lecture. It discusses the basic principles of XRF, including excitation of samples using X-rays or electrons, emission of characteristic X-rays, and the use of wavelength dispersive or energy dispersive detectors to analyze emitted X-rays. It also covers instrumentation, advantages and limitations, sample preparation methods, and applications of XRF analysis.
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Energy Dispersive Spectroscopy
Energy dispersive spectrometry (EDS) is a technique used to determine the elemental composition of materials. EDS relies on detecting X-rays emitted from a sample when it is exposed to an electron beam. The X-ray energies are characteristic of elements present in the sample. EDS systems consist of a detector that converts X-ray energies to voltage pulses, a pulse processor that amplifies the signals, and a multi-channel analyzer that sorts the pulses by energy and displays the results as an X-ray spectrum or elemental maps. EDS allows elemental analysis of micrometer-scale sample volumes and provides both qualitative and quantitative chemical information.
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X-ray photoelectron spectroscopy (XPS) is a surface-sensitive technique that uses X-rays to eject electrons from a material's surface and measure their kinetic energy to determine the elemental composition and chemical states. Kai Siegbahn developed XPS in the 1950s and won the Nobel Prize for his work. A study used XPS to analyze the surface chemistry of langasite crystals before and after vacuum annealing, finding that higher-temperature annealing reduced the surface concentration of gallium. XPS provides quantitative and chemical state information from the top 10-100 Angstroms of a surface.
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Secondary ion mass spectrometry (SIMS) is an analytical technique that bombards a sample surface with a primary ion beam, causing charged secondary ions to emit. These secondary ions are then analyzed using mass spectrometry to determine their mass-to-charge ratios. SIMS has high sensitivity and can detect elements down to parts-per-million or parts-per-billion levels. It provides both elemental and molecular composition of solid surfaces with good depth resolution and lateral resolution in the 2-5 nm and 20 nm to 1 μm range, respectively. SIMS finds applications in composition analysis, depth profiling, trace detection in semiconductors, and imaging of surfaces.
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Principle and instrumentation of UV-visible spectrophotometer.
UV-visible spectrophotometry uses light in the ultraviolet and visible range to analyze substances. When light passes through a sample, some is absorbed and some is transmitted. The ratio of light entering versus exiting the sample is used to calculate absorbance, which follows Beer's Law - absorbance is directly proportional to concentration. A spectrophotometer consists of a light source, monochromator to isolate wavelengths, sample holder, and detector to measure transmitted light intensity and thus absorbance. This allows analysis of concentration for substances that absorb specific wavelengths of UV or visible light.
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