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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: 2SK3662
MANUFACTURER: TOSHIBA
Body Diode (Model Parameters) / ESD Protection Diode




                    Bee Technologies Inc.


      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Circuit Configuration




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
     N         Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result

         60

         55

         50

         45

         40

         35
   gfs




         30

         25

         20

         15

         10                                                          Measurement

          5                                                          Simulation

          0
              1      3         5      7       9      11     13     15       17      19
                                          ID - Drain Current - A

Comparison table



                                                   gfs
                  Id(A)                                                          Error(%)
                                   Measurement            Simulation
                           1                14.000                 14.286            2.043
                           2                18.000                 18.182            1.011
                           5                29.000                 29.412            1.421
                          10                39.000                 40.000            2.564
                          20                53.000                 54.054            1.989




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result

   100A




    80A




    60A




    40A




    20A




     0A
          0V           1.0V          2.0V             3.0V          4.0V    5.0V
               I(V3)
                                               V_V2
Evaluation circuit


                                      V3


                                               0Vdc



                                     U26
                                                       Vv ariable
                                     2SK3662
           10Vdc
                                                       10Vdc


           V2




                                 0




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result


                            19.00
                                                Measurement
                                                Simulation
                            17.00


                            15.00


                            13.00
   ID - Drain Current - A




                            11.00


                             9.00


                             7.00


                             5.00


                             3.00


                             1.00
                                    1                  2                  3                   4                5
                                                           VGS - Gate to Source Voltage - V
Simulation Result


                                                                VGS(V)
                                    ID(A)                                                         Error (%)
                                                Measurement              Simulation
                                            1                 2.600               2.623                0.885
                                            2                 2.650               2.686                1.358
                                            5                 2.780               2.814                1.223
                                        10                    2.900               2.959                2.034
                                        20                    3.100               3.166                2.129




                                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result

     20A


     18A


     16A


     14A


     12A


     10A


      8A


      6A


      4A


      2A


      0A
           0V               100mV           200mV             300mV       400mV    500mV
                I(V3)
                                                    V_VDS
Evaluation circuit

                                              V3


                                                       0Vdc


                                             U26
                                                              VDS
                                             2SK3662
                10Vdc
                                                              0Vdc


                VGS




                                        0



Simulation Result

      ID=18A, VGS=10V                   Measurement                   Simulation       Error (%)
                R DS (on)                       9.400 m                9.388 m           -0.128



                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result
   20V




   10V




    0V
         0                      40n                  80n                        120n            160n
             V(W1:3)
                                                   Time*1mS

Evaluation circuit

                                                           V2


                                                            0Vdc


                                                           U26       Dbreak
             PER = 1000u
             PW = 600u             W1                      2SK3662
             TF = 10n                 +                                 D1
             TR = 10n                                                          I2
                                      -
             TD = 0                                                            35Adc
             I2 = 1m                W
                           I1   IOFF = 1mA
             I1 = 0             ION = 0uA

                                                                               V1
                                                                               48Vdc



                                             0



Simulation Result

             VDD=48V,ID=35A
                                                 Measurement                  Simulation        Error (%)
                ,VGS=10V
                 Qgs(nC)                               17.000                          17.094        0.553
                Qgd(nC)                                21.000                          21.261        1.243
                   Qg                                  91.000                          74.606      -18.015



                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic


                                                           Measurement
                                                           Simulation




Simulation Result


                                    Cbd(pF)
           VDS(V)                                              Error(%)
                          Measurement        Simulation
                    0.1         900.000           903.452           0.384
                    0.2         850.000           848.737          -0.149
                    0.5         700.000           701.000           0.143
                      1         570.000           570.681           0.119
                      2         430.000           430.000           0.000
                      5         280.000           280.000           0.000
                    10          200.000           199.242          -0.379
                    20          125.000           126.553           1.242
                    50           65.000            67.108           3.243




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result
    12V




    10V




     8V




     6V




     4V




     2V




     0V
    0.921us      1.000us                  1.100us         1.200us        1.299us
         V(L2:1)/3   V(L1:2)
                                              Time

Evaluation circuit


                                                                    L2   R2


                                                               5nH
                                                                         1.67


                            R1         L1                    U29

                                                             2SK3662
                                       30nH
          V1 = 0                                                            V1
          V2 = 20      V2   4.7                                          30Vdc
          TD = 1u                    R3
          TR = 1n
          TF = 1n                     4.7
          PW = 10u
          PER = 200u


                       0



Simulation Result

          ID=18 A, VDD=30V
                                   Measurement           Simulation             Error(%)
             VGS=0/10V
               Ton(ns)                          19.000          19.274              1.442



                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

   100A




    80A

                                                                                  3.8V


    60A

                                                                                  3.6.V



    40A                                                                           3.4V




    20A
                                                                              VGS=3V



     0A
          0V            1.0V              2.0V              3.0V           4.0V           5.0V
               I(Vdsense)
                                            V_Vvariable




Evaluation circuit

                                                Vdsense


                                                     0Vdc



                                          U28

                                          2SK3662             Vv ariable
               10Vdc

                                                              10Vdc

               Vstep




                                      0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result
   100A




    10A




   1.0A
          0V                0.4V       0.8V          1.2V         1.6V      2.0V
               I(R1)
                                              V_V1

Evaluation Circuit


                               R1


                               0.01m


                        V1                              2SK3662
                0Vdc
                                                        U26




                        0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result



                                                  Measurement
                                                  Simulation

                                 41.00
  Drain reverse current IDR(A)




                                 31.00




                                 21.00




                                 11.00




                                  1.00
                                         0         0.2         0.4       0.6        0.8         1           1.2

                                                           Source-Drain voltage VSD(V)

Simulation Result


                                                                   VSD(V)
                                         IDR(A)          Measuremen       Simulation                  %Error
                                                 1               0.670            0.671                 0.149
                                                 2               0.700            0.699                -0.143
                                                 5               0.750            0.747                -0.400
                                                10               0.800            0.802                 0.250
                                                20               0.890            0.891                 0.112
                                                50               1.120            1.117                -0.268




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result
    400mA



    300mA



    200mA



    100mA



     -0mA



   -100mA



   -200mA



   -300mA



   -400mA
       5.16us             5.24us         5.32us          5.40us      5.48us   5.56us
            I(R1)
                                                  Time
Evaluation Circuit

                                    R1


                                         50

            V1 = -9.4v    V1
            V2 = 10.7v                                     2SK3662
            TD = 245n
            TR = 10ns                                      U27
            TF = 19ns
            PW = 5us
            PER = 100us




                          0




Compare Measurement vs. Simulation

               Trr(ns)             Measurement              Simulation        Error (%)
               Trj+Trb                    94.500                94.950              0.476




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                         Reference




Trj=14.500(ns)
Trb=80.000(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
ESD PROTECTION DIODE SPICE MODEL

Zener Voltage Characteristic
Circuit Simulation Result

   10mA


    9mA


    8mA


    7mA


    6mA


    5mA


    4mA


    3mA


    2mA


    1mA


     0A
          0V       5V      10V     15V        20V    25V    30V   35V   40V   45V   50V
                I(R1)
                                                     V_V1

Evaluation Circuit


                                    R1



                                 0.01m




                      V1
               0Vdc
                                         R2
                                               2SK3662
                                 100MEG
                                               U27

                      0




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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SPICE MODEL of 2SK3662 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameters) PART NUMBER: 2SK3662 MANUFACTURER: TOSHIBA Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. Circuit Configuration All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Transconductance Characteristic Circuit Simulation Result 60 55 50 45 40 35 gfs 30 25 20 15 10 Measurement 5 Simulation 0 1 3 5 7 9 11 13 15 17 19 ID - Drain Current - A Comparison table gfs Id(A) Error(%) Measurement Simulation 1 14.000 14.286 2.043 2 18.000 18.182 1.011 5 29.000 29.412 1.421 10 39.000 40.000 2.564 20 53.000 54.054 1.989 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Vgs-Id Characteristic Circuit Simulation result 100A 80A 60A 40A 20A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(V3) V_V2 Evaluation circuit V3 0Vdc U26 Vv ariable 2SK3662 10Vdc 10Vdc V2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. Comparison Graph Circuit Simulation Result 19.00 Measurement Simulation 17.00 15.00 13.00 ID - Drain Current - A 11.00 9.00 7.00 5.00 3.00 1.00 1 2 3 4 5 VGS - Gate to Source Voltage - V Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 1 2.600 2.623 0.885 2 2.650 2.686 1.358 5 2.780 2.814 1.223 10 2.900 2.959 2.034 20 3.100 3.166 2.129 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Rds(on) Characteristic Circuit Simulation result 20A 18A 16A 14A 12A 10A 8A 6A 4A 2A 0A 0V 100mV 200mV 300mV 400mV 500mV I(V3) V_VDS Evaluation circuit V3 0Vdc U26 VDS 2SK3662 10Vdc 0Vdc VGS 0 Simulation Result ID=18A, VGS=10V Measurement Simulation Error (%) R DS (on) 9.400 m 9.388 m -0.128 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Gate Charge Characteristic Circuit Simulation result 20V 10V 0V 0 40n 80n 120n 160n V(W1:3) Time*1mS Evaluation circuit V2 0Vdc U26 Dbreak PER = 1000u PW = 600u W1 2SK3662 TF = 10n + D1 TR = 10n I2 - TD = 0 35Adc I2 = 1m W I1 IOFF = 1mA I1 = 0 ION = 0uA V1 48Vdc 0 Simulation Result VDD=48V,ID=35A Measurement Simulation Error (%) ,VGS=10V Qgs(nC) 17.000 17.094 0.553 Qgd(nC) 21.000 21.261 1.243 Qg 91.000 74.606 -18.015 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.1 900.000 903.452 0.384 0.2 850.000 848.737 -0.149 0.5 700.000 701.000 0.143 1 570.000 570.681 0.119 2 430.000 430.000 0.000 5 280.000 280.000 0.000 10 200.000 199.242 -0.379 20 125.000 126.553 1.242 50 65.000 67.108 3.243 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Switching Time Characteristic Circuit Simulation result 12V 10V 8V 6V 4V 2V 0V 0.921us 1.000us 1.100us 1.200us 1.299us V(L2:1)/3 V(L1:2) Time Evaluation circuit L2 R2 5nH 1.67 R1 L1 U29 2SK3662 30nH V1 = 0 V1 V2 = 20 V2 4.7 30Vdc TD = 1u R3 TR = 1n TF = 1n 4.7 PW = 10u PER = 200u 0 Simulation Result ID=18 A, VDD=30V Measurement Simulation Error(%) VGS=0/10V Ton(ns) 19.000 19.274 1.442 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. Output Characteristic Circuit Simulation result 100A 80A 3.8V 60A 3.6.V 40A 3.4V 20A VGS=3V 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(Vdsense) V_Vvariable Evaluation circuit Vdsense 0Vdc U28 2SK3662 Vv ariable 10Vdc 10Vdc Vstep 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 0V 0.4V 0.8V 1.2V 1.6V 2.0V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 2SK3662 0Vdc U26 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Comparison Graph Circuit Simulation Result Measurement Simulation 41.00 Drain reverse current IDR(A) 31.00 21.00 11.00 1.00 0 0.2 0.4 0.6 0.8 1 1.2 Source-Drain voltage VSD(V) Simulation Result VSD(V) IDR(A) Measuremen Simulation %Error 1 0.670 0.671 0.149 2 0.700 0.699 -0.143 5 0.750 0.747 -0.400 10 0.800 0.802 0.250 20 0.890 0.891 0.112 50 1.120 1.117 -0.268 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 5.16us 5.24us 5.32us 5.40us 5.48us 5.56us I(R1) Time Evaluation Circuit R1 50 V1 = -9.4v V1 V2 = 10.7v 2SK3662 TD = 245n TR = 10ns U27 TF = 19ns PW = 5us PER = 100us 0 Compare Measurement vs. Simulation Trr(ns) Measurement Simulation Error (%) Trj+Trb 94.500 94.950 0.476 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. Reverse Recovery Characteristic Reference Trj=14.500(ns) Trb=80.000(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc R2 2SK3662 100MEG U27 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 17. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006