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Device Modeling Report



COMPONENTS: MOSFET (Model Parameters)
PART NUMBER: 2SK3058
MANUFACTURER: NEC Corporation
REMARK: Body Diode (Model Parameters) /
ESD Protection Diode




                  Bee Technologies Inc.




     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Circuit Configuration
          Drain




Gate
                   U?



          Source



MOSFET MODEL
 PSpice model
                                              Model description
   parameter
LEVEL
L                  Channel Length
W                  Channel Width
KP                 Transconductance
RS                 Source Ohmic Resistance
RD                 Ohmic Drain Resistance
VTO                Zero-bias Threshold Voltage
RDS                Drain-Source Shunt Resistance
TOX                Gate Oxide Thickness
CGSO               Zero-bias Gate-Source Capacitance
CGDO               Zero-bias Gate-Drain Capacitance
CBD                Zero-bias Bulk-Drain Junction Capacitance
MJ                 Bulk Junction Grading Coefficient
PB                 Bulk Junction Potential
FC                 Bulk Junction Forward-bias Capacitance Coefficient
RG                 Gate Ohmic Resistance
IS                 Bulk Junction Saturation Current
N                  Bulk Junction Emission Coefficient
RB                 Bulk Series Resistance
PHI                Surface Inversion Potential
GAMMA              Body-effect Parameter
DELTA              Width effect on Threshold Voltage
ETA                Static Feedback on Threshold Voltage
THETA              Modility Modulation
KAPPA              Saturation Field Factor
VMAX               Maximum Drift Velocity of Carriers
XJ                 Metallurgical Junction Depth
UO                 Surface Mobility




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic s

Circuit Simulation Result

                           100
                                                 Measurement
                                                 Simulation
 TRANSCONDUCTANCE Gfs(s)




                           10




                            1
                                 0                 4               8             12             16            20

                                                               DRIAN CURRENT ID (A)


Comparison table

                                                                        gfs(s)
                                     Id(A)                                                              Error(%)
                                                       Measurement               Simulation
                                      1                        13.6986                    13.7800           0.5940
                                      2                        17.1253                    17.0000           -0.7317
                                      5                        25.0000                    25.1235           0.4942
                                      10                       36.0101                    36.2158           0.5712
                                      20                       60.0000                    59.8892           -0.1847




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristics

Circuit Simulation Result

   100A




    10A




   1.0A
          0V     0.5V       1.0V   1.5V       2.0V   2.5V    3.0V       3.5V     4.0V   4.5V
               I(V2)
                                                     V_VGS


Evaluation circuit

                                                      V2




                                                U1 2SK3058




                                                                        VDD
                                                                         10Vdc

                     VGS
                     0Vdc


                 0                                                  0
                                          0




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                             100
                                                 Measurement
                                                 Simulation
     ID - Drain Current -A




                              10




                               1
                                     1                      2                      3                       4
                                                        VGS - Gate to Source Voltage - V

Comparison table


                                                                  VGS(V)
                             ID(A)              Measurement                 Simulation                  Error (%)
                              1                              2.1700                    2.1786                  0.3963
                              2                              2.2800                    2.2633               -0.7325
                              5                              2.4500                    2.4426               -0.3020
                              10                             2.6500                    2.6609                  0.4113
                              20                             2.9600                    2.9900                  1.0135




                                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
*Rds(on) Characteristic

Circuit Simulation result
   28.0A


   25.2A


   22.4A


   19.6A


   16.8A


   14.0A


   11.2A


    8.4A


    5.6A


    2.8A


      0A
           0V     0.1V         0.2V    0.3V        0.4V   0.5V          0.6V   0.7V   0.8V   0.9V
                I(V2)
                                                          V_VDD

Evaluation circuit

                                              V2




                                      U1   2SK3058




                                                               VDD
                                                                10Vdc
                       VGS
                       10Vdc



                   0                                       0
                                 0



Simulation Result

      ID=28A, VGS=10V                         Measurement                       Simulation          Error (%)
                R DS (on)                            12.000 m                    12.017 m            0.1416




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic

Circuit Simulation result
  16V



  14V



  12V



  10V



   8V



   6V



   4V



   2V



   0V
        0        10n        20n         30n      40n          50n          60n    70n      80n
            V(W1:3)
                                               Time*1mA

Evaluation circuit

                                                                     Vsense




                                                              U1 2SK3058
                                                                                           I1
                                                                                   D1
                                                                                  Dbreak   55Adc

                               W1
                                  +
                                  -
            I2                 W                                                           VD
                         ION = 0A                                                          48Vdc
                         IOFF = 1.1mA


                                                          0



Simulation Result

        VDD=48V,ID=55A
                                        Measurement                 Simulation             Error (%)
           ,VGS=10V
                 Qgs                          7.00 nC                         7.30 nC              4.2857
                 Qgd                          18.00 nC                     17.79 nC                -1.1610

                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic




                                                            Measurement
                                                            Simulation




Simulation Result


                                        Cbd(pF)
          VDS(V)                                                         Error(%)
                          Measurement             Simulation
             1                     780.000                779.625               -0.048
             2                     610.000                615.899                0.967
             5                     420.000                430.794                2.570
            10                     330.000                321.183               -2.672
            20                     245.000                237.566               -3.034
            50                     150.000                158.466                5.644




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result
 12V

 11V

 10V

  9V

  8V

  7V

  6V

  5V

  4V

  3V

  2V

  1V

  0V
  0.8us                            1.0us                         1.2us                   1.4us
      V(L3:2)        V(3)/3
                                                      Time

Evaluation circuit

                                                                           Vsense          RL
                                                                   3

                                                                                            10

       V1 = 0                                                              U1 2SK3058
                           R1                   L3
       V2 = 20                                               2
                                                5nH
       TD = 1u                10                                                                          VD
                                                                                                            30Vdc
       TR = 10n    V1
                                       R2
       TF = 10n
                                           10
       PW = 5u

       PER = 10u

                                                                       0



Simulation Result

       ID=28A, VDD=30V
                                       Measurement                 Simulation            Error(%)
          VGS=0/10V
            td (on)                              36.000 ns        35.941            ns           -1.413


                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

   100A


    90A
                                             VGS=10V
    80A


    70A


    60A


    50A                                                                      VGS= 4.0V

    40A


    30A


    20A


    10A


     0A
          0V       0.5V        1.0V     1.5V     2.0V          2.5V   3.0V      3.5V   4.0V
               I(V2)
                                                 V_VDS

Evaluation circuit

                                       V2




                                U1 2SK3058



                                                      VDS
                                                       10Vdc

                   VGS
                   10Vdc




                           0                      0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result



     100A




      10A




     1.0A




    100mA




     10mA
            0V                          0.5V       1.0V              1.5V           2.0V
                 I(R1)
                                                   V_V1


Evaluation Circuit

                                   V2



                                                            VGS

                                                            0Vdc

                         VDS

                     0Vdc


                                               U1 2SK3058




                               0




                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                                  1000
                                                 Measurement
                                                 Simulation

                                   100
      Diode Forward Current - A




                                    10



                                     1



                                   0.1



                                  0.01
                                         0            0.5                1                   1.5        2
                                                               Source to Drain Voltage - V

Simulation Result

                                                              VDS(V)
                                    IDR(A)         Measurement       Simulation                    %Error
                                      0.1                 0.5950           0.5967                    0.2857
                                      0.2                 0.6220           0.6211                   -0.1447
                                      0.5                 0.6550           0.6546                   -0.0611
                                       1                  0.6810           0.6804                   -0.0881
                                       2                  0.7100           0.7084                   -0.2254
                                       5                  0.7540           0.7515                   -0.3316
                                       10                 0.7920           0.7936                    0.2020
                                       20                 0.8600           0.8570                   -0.3488
                                       50                 1.0100           1.0000                   -0.9901
                                      100                 1.2000           1.2144                    1.2000
                                      200                 1.6200           1.6144                   -0.3457




                                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result

    400mA


    300mA


    200mA


    100mA


     -0mA


   -100mA


   -200mA


   -300mA


   -400mA
      19.96us    20.04us          20.12us                20.20us     20.28us 20.36us
           I(R1)
                                                  Time

Evaluation Circuit

                                        R1


              V1 = -9.5V                     50
                                                                           VGS
              V2 = 10.5V
                                                                           0Vdc
              TD = 50n
                           V1
              TR = 10ns

              TF = 5.7n

              PW = 20us                                       U1 2SK3058

              PER = 50us



                                    0



Compare Measurement vs. Simulation

                           Measurement                       Simulation                Error (%)
            trj                    32.000 ns                         31.988 ns            -0.0375




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                               Reference




Trj=32(ns)
Trb=51(ns)
Conditions:Ifwd=0.2,lrev=0.2(A),Rl=50




                                                       Example




                                 Relation between trj and trb




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic
Circuit Simulation Result

   10mA

    9mA

    8mA

    7mA

    6mA

    5mA

    4mA

    3mA

    2mA

    1mA

     0A
          0V      5V        10V   15V       20V    25V    30V    35V   40V   45V 50V
               I(V2)
                                                  V_VGS

Evaluation Circuit



                                            U1 2SK3058
                       V2



                                                          ID

                                                          0Adc
                 VGS
                 0Vdc




                                        0




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                               Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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SPICE MODEL of 2SK3058 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: MOSFET (Model Parameters) PART NUMBER: 2SK3058 MANUFACTURER: NEC Corporation REMARK: Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. Circuit Configuration Drain Gate U? Source MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. Transconductance Characteristic s Circuit Simulation Result 100 Measurement Simulation TRANSCONDUCTANCE Gfs(s) 10 1 0 4 8 12 16 20 DRIAN CURRENT ID (A) Comparison table gfs(s) Id(A) Error(%) Measurement Simulation 1 13.6986 13.7800 0.5940 2 17.1253 17.0000 -0.7317 5 25.0000 25.1235 0.4942 10 36.0101 36.2158 0.5712 20 60.0000 59.8892 -0.1847 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Vgs-Id Characteristics Circuit Simulation Result 100A 10A 1.0A 0V 0.5V 1.0V 1.5V 2.0V 2.5V 3.0V 3.5V 4.0V 4.5V I(V2) V_VGS Evaluation circuit V2 U1 2SK3058 VDD 10Vdc VGS 0Vdc 0 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Comparison Graph Circuit Simulation Result 100 Measurement Simulation ID - Drain Current -A 10 1 1 2 3 4 VGS - Gate to Source Voltage - V Comparison table VGS(V) ID(A) Measurement Simulation Error (%) 1 2.1700 2.1786 0.3963 2 2.2800 2.2633 -0.7325 5 2.4500 2.4426 -0.3020 10 2.6500 2.6609 0.4113 20 2.9600 2.9900 1.0135 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. *Rds(on) Characteristic Circuit Simulation result 28.0A 25.2A 22.4A 19.6A 16.8A 14.0A 11.2A 8.4A 5.6A 2.8A 0A 0V 0.1V 0.2V 0.3V 0.4V 0.5V 0.6V 0.7V 0.8V 0.9V I(V2) V_VDD Evaluation circuit V2 U1 2SK3058 VDD 10Vdc VGS 10Vdc 0 0 0 Simulation Result ID=28A, VGS=10V Measurement Simulation Error (%) R DS (on) 12.000 m 12.017 m 0.1416 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Gate Charge Characteristic Circuit Simulation result 16V 14V 12V 10V 8V 6V 4V 2V 0V 0 10n 20n 30n 40n 50n 60n 70n 80n V(W1:3) Time*1mA Evaluation circuit Vsense U1 2SK3058 I1 D1 Dbreak 55Adc W1 + - I2 W VD ION = 0A 48Vdc IOFF = 1.1mA 0 Simulation Result VDD=48V,ID=55A Measurement Simulation Error (%) ,VGS=10V Qgs 7.00 nC 7.30 nC 4.2857 Qgd 18.00 nC 17.79 nC -1.1610 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 1 780.000 779.625 -0.048 2 610.000 615.899 0.967 5 420.000 430.794 2.570 10 330.000 321.183 -2.672 20 245.000 237.566 -3.034 50 150.000 158.466 5.644 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Switching Time Characteristic Circuit Simulation result 12V 11V 10V 9V 8V 7V 6V 5V 4V 3V 2V 1V 0V 0.8us 1.0us 1.2us 1.4us V(L3:2) V(3)/3 Time Evaluation circuit Vsense RL 3 10 V1 = 0 U1 2SK3058 R1 L3 V2 = 20 2 5nH TD = 1u 10 VD 30Vdc TR = 10n V1 R2 TF = 10n 10 PW = 5u PER = 10u 0 Simulation Result ID=28A, VDD=30V Measurement Simulation Error(%) VGS=0/10V td (on) 36.000 ns 35.941 ns -1.413 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Output Characteristic Circuit Simulation result 100A 90A VGS=10V 80A 70A 60A 50A VGS= 4.0V 40A 30A 20A 10A 0A 0V 0.5V 1.0V 1.5V 2.0V 2.5V 3.0V 3.5V 4.0V I(V2) V_VDS Evaluation circuit V2 U1 2SK3058 VDS 10Vdc VGS 10Vdc 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 10mA 0V 0.5V 1.0V 1.5V 2.0V I(R1) V_V1 Evaluation Circuit V2 VGS 0Vdc VDS 0Vdc U1 2SK3058 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. Comparison Graph Circuit Simulation Result 1000 Measurement Simulation 100 Diode Forward Current - A 10 1 0.1 0.01 0 0.5 1 1.5 2 Source to Drain Voltage - V Simulation Result VDS(V) IDR(A) Measurement Simulation %Error 0.1 0.5950 0.5967 0.2857 0.2 0.6220 0.6211 -0.1447 0.5 0.6550 0.6546 -0.0611 1 0.6810 0.6804 -0.0881 2 0.7100 0.7084 -0.2254 5 0.7540 0.7515 -0.3316 10 0.7920 0.7936 0.2020 20 0.8600 0.8570 -0.3488 50 1.0100 1.0000 -0.9901 100 1.2000 1.2144 1.2000 200 1.6200 1.6144 -0.3457 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 19.96us 20.04us 20.12us 20.20us 20.28us 20.36us I(R1) Time Evaluation Circuit R1 V1 = -9.5V 50 VGS V2 = 10.5V 0Vdc TD = 50n V1 TR = 10ns TF = 5.7n PW = 20us U1 2SK3058 PER = 50us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) trj 32.000 ns 31.988 ns -0.0375 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic Reference Trj=32(ns) Trb=51(ns) Conditions:Ifwd=0.2,lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(V2) V_VGS Evaluation Circuit U1 2SK3058 V2 ID 0Adc VGS 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006