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Device Modeling Report



COMPONENTS: Power MOSFET (Professional)
PART NUMBER: 2SK2417
MANUFACTURER: TOSHIBA
Body Diode (Professional) / ESD Protection Diode




                Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result


       20

       18

       16

       14

       12
 gfs




       10

       8

       6

       4

       2                                                           Measurement
                                                                   Simulation
       0
            0     1          2     3    4       5     6    7       8     9       10
                                              ID(A)
Comparison table


                                                gfs
                Id(A)                                                   Error(%)
                                 Measurement          Simulation
                      0.1                   1.400              1.428            2.000
                      0.2                   1.600              1.667            4.188
                      0.5                   2.700              2.778            2.889
                        1                   4.000              4.000            0.000
                        2                   5.500              5.405         -1.727
                        5                   8.400              8.333         -0.798
                        10              11.300                 11.236        -0.566




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result

  12A




  10A




   8A




   6A




   4A




   2A




   0A
        0V           1.0V       2.0V          3.0V                4.0V   5.0V   6.0V
             I(V3)
                                              V_V2


Evaluation circuit


                                        V3


                                             0Vdc



                                       U23           Vv ariable
             10Vdc

                                  2SK2417            10Vdc

             V2




                                 0




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result
                          10
                                      Measurement
                                      Simulation
                          9


                          8


                          7
 ID - Drain Current - A




                          6


                          5


                          4


                          3


                          2


                          1


                          0
                               0           1        2          3          4           5          6
                                                VGS - Gate to Source Voltage - V
Simulation Result

                                                            VGS(V)
                                   ID(A)                                                  Error (%)
                                               Measurement           Simulation
                                      0.1                3.000                2.968           -1.067
                                      0.2                3.050                3.035           -0.492
                                      0.5                3.150                3.171            0.667
                                           1             3.300                3.326            0.788
                                        2                3.550                3.547           -0.085
                                        5                4.000                3.997           -0.075
                                       10                4.500                4.519            0.422




                                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result
   4.0A




   3.0A




   2.0A




   1.0A




     0A
          0V                        1.0V                           2.0V                3.0V
               I(V3)
                                                 V_VDS
Evaluation circuit

                                            V3


                                                     0Vdc



                                           U23              VDS

               10Vdc
                                           2SK2417          0Vdc


               VGS




                                       0



Simulation Result

      ID=3.5A, VGS=10V                 Measurement                    Simulation        Error (%)
               R DS (on)                      0.420                      0.420                0



                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result
    20V




    15V




    10V




     5V




     0V
          0                      10n                  20n               30n                 40n       50n
              V(W1:3)
                                                            Time*1mS

Evaluation circuit

                                                                V2


                                                                 0Vdc


                                                                        Dbreak
              PER = 1000u                                       U23
              PW = 600u                W1
              TF = 10n                   +                    2SK2417      D1
              TR = 10n                                                            I2
              TD = 0
                                         -                                        7.5Adc
              I2 = 1m                  W
                            I1     IOFF = 100uA
              I1 = 0               ION = 0uA

                                                                                  V1
                                                                                  200Vdc



                                                  0



Simulation Result

              VDD=200V,ID=7.5A
                                                      Measurement                Simulation         Error (%)
                  ,VGS=10V
                   Qgs(nC)                                     13.000                      13.109       0.838
                  Qgd(nC)                                       7.000                       6.891      -1.557
                     Qg                                        40.000                      39.783      -0.542



                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic


                                                       Measurement
                                                       Simulation




Simulation Result


                                    Cbd(pF)
           VDS(V)                                              Error(%)
                          Measurement        Simulation
                    0.1         503.000           500.000           -0.596
                    0.2         487.000           485.000           -0.411
                    0.5         460.000           460.000            0.000
                      1         420.000           420.000            0.000
                      2         351.000           350.000           -0.285
                      5         248.000           245.000           -1.210
                     10         151.000           150.000           -0.662
                     20          83.000            80.000           -3.614
                     50          39.000            40.000            2.564




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result
  12V




   8V




   4V




   0V
   0.92us        1.00us                  1.10us          1.20us                1.30us
        V(R2:1)/10   V(L1:2)
                                             Time
Evaluation circuit

                                                          L2          R2


                                                          50nH
                                                                      28.6

                           R1       L1
                                                         U26
                                    30nH
         V1 = 0                                                          V1
         V2 = 20      V2   15                           2SK2417       100Vdc
         TD = 1u                  R3
         TR = 10n
         TF = 10n                  15
         PW = 10u
         PER = 200u

                      0


Simulation Result

        ID=3.5 A, VDD=100V
                                  Measurement           Simulation             Error(%)
            VGS=0/10V
              Ton(ns)                         20.000              20.529            2.645



                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

   20A




   16A

                                                                                5


   12A                                                                         4.8

                                                                               4.6

    8A                                                                          4.4

                                                                               4. 2

    4A
                                                                                4

                                                                           VGS=3.8
                                                                          V

    0A
         0V             10V              20V               30V           40V          50V
              I(Vdsense)
                                           V_Vvariable




Evaluation circuit

                                               Vdsense


                                                    0Vdc




                                         U24
                                                            Vv ariable
              10Vdc
                                         2SK2417
                                                            10Vdc

              Vstep




                                     0




                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Forward Current Characteristic

Circuit Simulation Result
    30A




    10A




   1.0A




  100mA
          0V      0.2V        0.4V    0.6V   0.8V   1.0V   1.2V    1.4V     1.6V   1.8V
               I(R1)
                                                    V_V1
Evaluation Circuit


                                 R1


                                 0.01m
                                                                  2SK2417
                         V1
                0Vdc                                              U23




                         0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result


                        10
                                           Measurement
                                           Simulation
  Drain reverse current IDR(A)




                                 1
                                     0   0.2      0.4    0.6    0.8     1     1.2    1.4   1.6    1.8     2

                                                         Source-Drain voltage VSD(V)

Simulation Result


                                                                    VSD(V)
                                         IDR(A)           Measuremen       Simulation                   %Error
                                              0.1                 0.700            0.681                 -2.714
                                              0.2                 0.720            0.721                  0.139
                                              0.5                 0.760            0.786                  3.421
                                                1                 0.850            0.853                  0.353
                                                2                 0.940            0.945                  0.532
                                                5                 1.150            1.135                 -1.304
                                               10                 1.370            1.377                  0.511




                                               All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result
   400mA



   300mA



   200mA



   100mA



    -0mA



  -100mA



  -200mA



  -300mA



  -400mA
      1.2us 1.6us 2.0us 2.4us      2.8us   3.2us 3.6us 4.0us   4.4us 4.8us
          I(R1)
                                           Time
Evaluation Circuit

                                 R1


                                      50
                                            D2417


           V1 = -9.4v    V1
           V2 = 10.7v
           TD = 380n
           TR = 10ns
           TF = 13ns
           PW = 2us                         U24
           PER = 100us




                         0



Compare Measurement vs. Simulation

                              Measurement           Simulation       Error (%)
              Trj(ns)               484.000            484.723             0.149
              Trb(ns)               280.000            283.217             1.149
              Trr(ns)               764.000            767.940             0.516



                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                        Reference




Trj=484(ns)
Trb=28(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic
Circuit Simulation Result


  10mA


   9mA


   8mA


   7mA


   6mA


   5mA


   4mA


   3mA


   2mA


   1mA


    0A
         0V       5V        10V      15V       20V    25V      30V   35V   40V   45V   50V
              I(R1)
                                                     V_V1



Evaluation Circuit


                                     R1



                                  0.01m




                       V1
              0Vdc
                                          R2
                                                         U24
                                                     2SK2417
                                  100MEG


                       0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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SPICE MODEL of 2SK2417 (Professional+BDP Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Professional) PART NUMBER: 2SK2417 MANUFACTURER: TOSHIBA Body Diode (Professional) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. Transconductance Characteristic Circuit Simulation Result 20 18 16 14 12 gfs 10 8 6 4 2 Measurement Simulation 0 0 1 2 3 4 5 6 7 8 9 10 ID(A) Comparison table gfs Id(A) Error(%) Measurement Simulation 0.1 1.400 1.428 2.000 0.2 1.600 1.667 4.188 0.5 2.700 2.778 2.889 1 4.000 4.000 0.000 2 5.500 5.405 -1.727 5 8.400 8.333 -0.798 10 11.300 11.236 -0.566 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Vgs-Id Characteristic Circuit Simulation result 12A 10A 8A 6A 4A 2A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V 6.0V I(V3) V_V2 Evaluation circuit V3 0Vdc U23 Vv ariable 10Vdc 2SK2417 10Vdc V2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Comparison Graph Circuit Simulation Result 10 Measurement Simulation 9 8 7 ID - Drain Current - A 6 5 4 3 2 1 0 0 1 2 3 4 5 6 VGS - Gate to Source Voltage - V Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 0.1 3.000 2.968 -1.067 0.2 3.050 3.035 -0.492 0.5 3.150 3.171 0.667 1 3.300 3.326 0.788 2 3.550 3.547 -0.085 5 4.000 3.997 -0.075 10 4.500 4.519 0.422 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. Rds(on) Characteristic Circuit Simulation result 4.0A 3.0A 2.0A 1.0A 0A 0V 1.0V 2.0V 3.0V I(V3) V_VDS Evaluation circuit V3 0Vdc U23 VDS 10Vdc 2SK2417 0Vdc VGS 0 Simulation Result ID=3.5A, VGS=10V Measurement Simulation Error (%) R DS (on) 0.420  0.420  0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Gate Charge Characteristic Circuit Simulation result 20V 15V 10V 5V 0V 0 10n 20n 30n 40n 50n V(W1:3) Time*1mS Evaluation circuit V2 0Vdc Dbreak PER = 1000u U23 PW = 600u W1 TF = 10n + 2SK2417 D1 TR = 10n I2 TD = 0 - 7.5Adc I2 = 1m W I1 IOFF = 100uA I1 = 0 ION = 0uA V1 200Vdc 0 Simulation Result VDD=200V,ID=7.5A Measurement Simulation Error (%) ,VGS=10V Qgs(nC) 13.000 13.109 0.838 Qgd(nC) 7.000 6.891 -1.557 Qg 40.000 39.783 -0.542 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.1 503.000 500.000 -0.596 0.2 487.000 485.000 -0.411 0.5 460.000 460.000 0.000 1 420.000 420.000 0.000 2 351.000 350.000 -0.285 5 248.000 245.000 -1.210 10 151.000 150.000 -0.662 20 83.000 80.000 -3.614 50 39.000 40.000 2.564 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Switching Time Characteristic Circuit Simulation result 12V 8V 4V 0V 0.92us 1.00us 1.10us 1.20us 1.30us V(R2:1)/10 V(L1:2) Time Evaluation circuit L2 R2 50nH 28.6 R1 L1 U26 30nH V1 = 0 V1 V2 = 20 V2 15 2SK2417 100Vdc TD = 1u R3 TR = 10n TF = 10n 15 PW = 10u PER = 200u 0 Simulation Result ID=3.5 A, VDD=100V Measurement Simulation Error(%) VGS=0/10V Ton(ns) 20.000 20.529 2.645 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Output Characteristic Circuit Simulation result 20A 16A 5 12A 4.8 4.6 8A 4.4 4. 2 4A 4 VGS=3.8 V 0A 0V 10V 20V 30V 40V 50V I(Vdsense) V_Vvariable Evaluation circuit Vdsense 0Vdc U24 Vv ariable 10Vdc 2SK2417 10Vdc Vstep 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. Forward Current Characteristic Circuit Simulation Result 30A 10A 1.0A 100mA 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V 1.6V 1.8V I(R1) V_V1 Evaluation Circuit R1 0.01m 2SK2417 V1 0Vdc U23 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. Comparison Graph Circuit Simulation Result 10 Measurement Simulation Drain reverse current IDR(A) 1 0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 Source-Drain voltage VSD(V) Simulation Result VSD(V) IDR(A) Measuremen Simulation %Error 0.1 0.700 0.681 -2.714 0.2 0.720 0.721 0.139 0.5 0.760 0.786 3.421 1 0.850 0.853 0.353 2 0.940 0.945 0.532 5 1.150 1.135 -1.304 10 1.370 1.377 0.511 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 1.2us 1.6us 2.0us 2.4us 2.8us 3.2us 3.6us 4.0us 4.4us 4.8us I(R1) Time Evaluation Circuit R1 50 D2417 V1 = -9.4v V1 V2 = 10.7v TD = 380n TR = 10ns TF = 13ns PW = 2us U24 PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) Trj(ns) 484.000 484.723 0.149 Trb(ns) 280.000 283.217 1.149 Trr(ns) 764.000 767.940 0.516 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic Reference Trj=484(ns) Trb=28(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc R2 U24 2SK2417 100MEG 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006