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All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: Power MOSFET (Professional Model)
PART NUMBER: TPCA8105
MANUFACTURER: TOSHIBA
Body Diode (Professional Model) / ESD Protection Diode
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
2
MOSFET MODEL
PSpice model
parameter
Model description
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
3
0
5
10
15
20
25
30
0 2 4 6 8 10
Gfs(S)
Drain Current ID (-A)
Measurement
Simulation
Transconductance Characteristics
Circuit Simulation Result
Comparison table
-Id(A)
gfs(S)
%Error
Measurement Simulation
0.2 3.900 4.016 2.98
0.5 6.067 6.205 2.27
1 8.500 8.553 0.63
2 11.800 11.680 -1.02
5 17.500 17.286 -1.22
10 23.330 22.802 -2.26
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
4
V1
0Vdc
V2
-10
0
V3
0Vdc
U1
TPCA8105
V_V1
0V -0.5V -1.0V -1.5V -2.0V -2.5V
I(V3)
0A
-2A
-4A
-6A
-8A
-10A
Vgs-Id Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
5
0
2
4
6
8
10
0.0 0.5 1.0 1.5 2.0 2.5
DrainCurrentID(-A)
Gate - Source Voltage VGS (-V)
Measurement
Simulation
Comparison Graph
Circuit Simulation Result
Simulation Result
-ID(A)
-VGS(V)
%Error
Measurement Simulation
0.2 1.212 1.242 2.43
0.5 1.275 1.300 1.97
1 1.350 1.368 1.31
2 1.450 1.466 1.12
5 1.638 1.672 2.11
10 1.875 1.920 2.42
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
6
V_VDS
0V -10mV -20mV -30mV -40mV -50mV -60mV -70mV
I(V3)
0A
-0.5A
-1.0A
-1.5A
-2.0A
-2.5A
-3.0A
0
U1
TPCA8105
V3
0Vdc
VDS
0Vdc
V1
-4.5
Rds(on) Characteristics
Circuit Simulation result
Evaluation circuit
Simulation Result
ID= -3A, VGS= -4.5V Measurement Simulation %Error
RDS (on) mΩ 23.000 23.000 0.00
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
7
VDD
-10
I1TD = 0
TF = 5n
PW = 600u
PER = 1000u
I1 = 0
I2 = 1m
TR = 5n
-
+
W1
ION = 0uA
IOFF = 1mA
W
I2
6
0
D2
Dbreak
U1
TPCA8105
Time*1mA
0 8n 16n 24n 32n 40n
V(W1:4)
0V
-4V
-8V
-12V
-16V
-20V
Gate Charge Characteristics
Circuit Simulation result
Evaluation circuit
Simulation Result
VDD= -10V ,ID=-6A
,VGS= -5V
Measurement Simulation %Error
Qgs nC 4.400 4.365 -0.80
Qgd nC 4.000 4.018 0.45
Qg nC 18.000 17.662 -1.88
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
8
Capacitance Characteristics
Simulation Result
-VDS (V)
Cbd(pF)
%Error
Measurement Simulation
0.1 240.000 239.000 -0.42
0.2 215.000 216.800 0.84
0.5 178.000 177.000 -0.56
1 140.000 141.800 1.29
2 110.000 108.750 -1.14
5 73.000 72.000 -1.37
10 52.000 52.500 0.96
Simulation
Measurement
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
9
Time
0.94us 0.98us 1.02us 1.06us 1.10us 1.14us
V(U1:4) V(U1:5)/1.2
0V
-2.0V
-4.0V
-6.0V
-8.0V
Switching Time Characteristics
Circuit Simulation result
Evaluation circuit
Simulation Result
ID= -3A, VDD= -6V
VGS=0/-5V
Measurement Simulation %Error
ton ns 13.000 12.965 -0.27
0
VDD
-6Vdc
V2
TD = 1u
TF = 5n
PW = 10u
PER = 20u
V1 = 0
TR = 5n
V2 = 10
R2
4.7
R1
4.7
L1
30nH
L2
50nH
U1
TPCA8105
RL
2
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
10
V2
-10
V1
0
0
V3
0Vdc
U1
TPCA8105
V_V2
0V -1.0V -2.0V -3.0V -4.0V -5.0V
I(V3)
0A
-2A
-4A
-6A
-8A
-10A
Output Characteristics
Circuit Simulation result
Evaluation circuit
VGS= -1.4
-2
-1.6
-2.5
-1.5
-1.7
-1.8
-1.9
-3
-4
-5
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
11
VDS
0
Vsense
0Vdc
U1
TPCA8105
V_VDS
0V 0.4V 0.8V 1.2V 1.6V 2.0V
I(Vsense)
-1.0A
-100A
BODY DIODE SPICE MODEL
Forward Current Characteristics
Circuit Simulation Result
Evaluation Circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
12
1.000
10.000
100.000
0 0.4 0.8 1.2 1.6 2
DrainreversecurrentIDR(-A)
Drain - Source voltage VDS (V)
Measurement
Simulation
Comparison Graph
Circuit Simulation Result
Simulation Result
-IDR(A)
VDS (V)
%Error
Measurement Simulation
1 0.660 0.660 -0.02
2 0.715 0.715 0.05
5 0.800 0.799 -0.10
10 0.875 0.876 0.07
20 0.975 0.975 -0.02
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
13
V1
TD = 15ns
TF = 15ns
PW = 2us
PER = 10us
V1 = -9.55V
TR = 10ns
V2 = 10.6v
R1
50
0
U1
DTPCA8105_P
Time
1.6us 1.7us 1.8us 1.9us 2.0us 2.2us 2.3us 2.4us 2.5us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
Reverse Recovery Characteristics
Circuit Simulation Result
Evaluation Circuit
Compare Measurement vs. Simulation
Measurement Simulation %Error
trj ns 13.600 13.482 -0.87
trb ns 44.800 44.579 -0.49
trr ns 58.400 58.061 -0.58
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
14
Reverse Recovery Characteristics Reference
Trj= 13.6 (ns)
Trb= 44.8 (ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Relation between trj and trb
Example
Measurement
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
15
R1
0.001m
V1
0Vdc
0
U1
TPCA8105 R2
100MEG
V_V1
0V -5V -10V -15V -20V -25V -30V -35V -40V -45V
I(R1)
0A
-2mA
-4mA
-6mA
-8mA
-10mA
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristics
Circuit Simulation Result
Evaluation Circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
16
Zener Voltage Characteristics Reference

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SPICE MODEL of TPCA8105 (Professional+BDP Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: Power MOSFET (Professional Model) PART NUMBER: TPCA8105 MANUFACTURER: TOSHIBA Body Diode (Professional Model) / ESD Protection Diode
  • 2. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 2 MOSFET MODEL PSpice model parameter Model description LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility
  • 3. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 3 0 5 10 15 20 25 30 0 2 4 6 8 10 Gfs(S) Drain Current ID (-A) Measurement Simulation Transconductance Characteristics Circuit Simulation Result Comparison table -Id(A) gfs(S) %Error Measurement Simulation 0.2 3.900 4.016 2.98 0.5 6.067 6.205 2.27 1 8.500 8.553 0.63 2 11.800 11.680 -1.02 5 17.500 17.286 -1.22 10 23.330 22.802 -2.26
  • 4. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 4 V1 0Vdc V2 -10 0 V3 0Vdc U1 TPCA8105 V_V1 0V -0.5V -1.0V -1.5V -2.0V -2.5V I(V3) 0A -2A -4A -6A -8A -10A Vgs-Id Characteristics Circuit Simulation result Evaluation circuit
  • 5. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 5 0 2 4 6 8 10 0.0 0.5 1.0 1.5 2.0 2.5 DrainCurrentID(-A) Gate - Source Voltage VGS (-V) Measurement Simulation Comparison Graph Circuit Simulation Result Simulation Result -ID(A) -VGS(V) %Error Measurement Simulation 0.2 1.212 1.242 2.43 0.5 1.275 1.300 1.97 1 1.350 1.368 1.31 2 1.450 1.466 1.12 5 1.638 1.672 2.11 10 1.875 1.920 2.42
  • 6. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 6 V_VDS 0V -10mV -20mV -30mV -40mV -50mV -60mV -70mV I(V3) 0A -0.5A -1.0A -1.5A -2.0A -2.5A -3.0A 0 U1 TPCA8105 V3 0Vdc VDS 0Vdc V1 -4.5 Rds(on) Characteristics Circuit Simulation result Evaluation circuit Simulation Result ID= -3A, VGS= -4.5V Measurement Simulation %Error RDS (on) mΩ 23.000 23.000 0.00
  • 7. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 7 VDD -10 I1TD = 0 TF = 5n PW = 600u PER = 1000u I1 = 0 I2 = 1m TR = 5n - + W1 ION = 0uA IOFF = 1mA W I2 6 0 D2 Dbreak U1 TPCA8105 Time*1mA 0 8n 16n 24n 32n 40n V(W1:4) 0V -4V -8V -12V -16V -20V Gate Charge Characteristics Circuit Simulation result Evaluation circuit Simulation Result VDD= -10V ,ID=-6A ,VGS= -5V Measurement Simulation %Error Qgs nC 4.400 4.365 -0.80 Qgd nC 4.000 4.018 0.45 Qg nC 18.000 17.662 -1.88
  • 8. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 8 Capacitance Characteristics Simulation Result -VDS (V) Cbd(pF) %Error Measurement Simulation 0.1 240.000 239.000 -0.42 0.2 215.000 216.800 0.84 0.5 178.000 177.000 -0.56 1 140.000 141.800 1.29 2 110.000 108.750 -1.14 5 73.000 72.000 -1.37 10 52.000 52.500 0.96 Simulation Measurement
  • 9. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 9 Time 0.94us 0.98us 1.02us 1.06us 1.10us 1.14us V(U1:4) V(U1:5)/1.2 0V -2.0V -4.0V -6.0V -8.0V Switching Time Characteristics Circuit Simulation result Evaluation circuit Simulation Result ID= -3A, VDD= -6V VGS=0/-5V Measurement Simulation %Error ton ns 13.000 12.965 -0.27 0 VDD -6Vdc V2 TD = 1u TF = 5n PW = 10u PER = 20u V1 = 0 TR = 5n V2 = 10 R2 4.7 R1 4.7 L1 30nH L2 50nH U1 TPCA8105 RL 2
  • 10. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 10 V2 -10 V1 0 0 V3 0Vdc U1 TPCA8105 V_V2 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) 0A -2A -4A -6A -8A -10A Output Characteristics Circuit Simulation result Evaluation circuit VGS= -1.4 -2 -1.6 -2.5 -1.5 -1.7 -1.8 -1.9 -3 -4 -5
  • 11. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 11 VDS 0 Vsense 0Vdc U1 TPCA8105 V_VDS 0V 0.4V 0.8V 1.2V 1.6V 2.0V I(Vsense) -1.0A -100A BODY DIODE SPICE MODEL Forward Current Characteristics Circuit Simulation Result Evaluation Circuit
  • 12. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 12 1.000 10.000 100.000 0 0.4 0.8 1.2 1.6 2 DrainreversecurrentIDR(-A) Drain - Source voltage VDS (V) Measurement Simulation Comparison Graph Circuit Simulation Result Simulation Result -IDR(A) VDS (V) %Error Measurement Simulation 1 0.660 0.660 -0.02 2 0.715 0.715 0.05 5 0.800 0.799 -0.10 10 0.875 0.876 0.07 20 0.975 0.975 -0.02
  • 13. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 13 V1 TD = 15ns TF = 15ns PW = 2us PER = 10us V1 = -9.55V TR = 10ns V2 = 10.6v R1 50 0 U1 DTPCA8105_P Time 1.6us 1.7us 1.8us 1.9us 2.0us 2.2us 2.3us 2.4us 2.5us I(R1) -400mA -300mA -200mA -100mA -0mA 100mA 200mA 300mA 400mA Reverse Recovery Characteristics Circuit Simulation Result Evaluation Circuit Compare Measurement vs. Simulation Measurement Simulation %Error trj ns 13.600 13.482 -0.87 trb ns 44.800 44.579 -0.49 trr ns 58.400 58.061 -0.58
  • 14. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 14 Reverse Recovery Characteristics Reference Trj= 13.6 (ns) Trb= 44.8 (ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Relation between trj and trb Example Measurement
  • 15. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 15 R1 0.001m V1 0Vdc 0 U1 TPCA8105 R2 100MEG V_V1 0V -5V -10V -15V -20V -25V -30V -35V -40V -45V I(R1) 0A -2mA -4mA -6mA -8mA -10mA ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristics Circuit Simulation Result Evaluation Circuit
  • 16. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 16 Zener Voltage Characteristics Reference