SPICE MODEL of 2SK3565 (Standard+BDS) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
Unblocking The Main Thread Solving ANRs and Frozen Frames
SPICE MODEL of 2SK3565 (Standard+BDS Model) in SPICE PARK
1. Device Modeling Report
COMPONENTS: Power MOSFET (Model parameter)
PART NUMBER: 2SK3565
MANUFACTURER: TOSHIBA
Body Diode (Model parameter) / ESD Protection Diode
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
2. MOSFET MODEL
PSpice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
9. Switching Time Characteristic
Circuit Simulation result
15V
10V
5V
0V
1.9us 2.0us 2.1us 2.2us 2.3us
V(U1:G) V(U1:D)/20
Time
Evaluation circuit
L1 R2
50nH
66.7
U1
L2
V1
V1 = 0 V2 30nH
V2 = 10 200
TD = 2u R4 2SK3565
TR = 6n
TF = 7n 50
PW = 10u
PER = 30u
0
Simulation Result
ID=3 A, VDD=200V
Measurement Simulation Error(%)
VGS=0/10V
ton 70.000 ns 70.495 ns 0.707
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
10. Output Characteristic
Circuit Simulation result
6.0A
5.0A
5.25
4.0A
3.0A 5
2.0A
4.75
1.0A
VGS=4.5 V
0A
0V 10V 20V 30V
I(Vdsense)
V_Vvariable
Evaluation circuit
Vdsense
0Vdc
U1
2SK3565
Vv ariable
Vstep
20
4.5
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
11. BODY DIODE
Forward Current Characteristic
Circuit Simulation Result
10A
1.0A
100mA
0V 0.4V 0.8V 1.2V 1.6V
I(R1)
V_V1
Evaluation Circuit
R1
0.01m
2SK3565
V1
0Vdc
U1
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
12. Comparison Graph
Circuit Simulation Result
10
Measurement
Simulation
Drain reverse current IDR(A)
1
0.1
0 0.4 0.8 1.2 1.6
Source-Drain voltage VSD(V)
Simulation Result
VSD(V)
Ifwd(A) Measuremen Simulation %Error
0.1 0.63 0.628 -0.317
0.2 0.66 0.660 0
0.5 0.71 0.711 0.141
1 0.76 0.762 0.263
2 0.825 0.829 0.485
5 0.97 0.962 -0.825
10 1.12 1.123 0.268
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
13. Reverse Recovery Characteristic
Circuit Simulation Result
400mA
200mA
0A
-200mA
-400mA
10us 16us 24us 32us
I(RL)
Time
Evaluation Circuit
RL
50
V1 = -9.33 V1 2SK3565
V2 = 10.65
TD = 0
TR = 10n
TF = 10n
PW = 15u
PER = 100u U4
0
Compare Measurement vs. Simulation
Trr(ns) Measurement Simulation Error (%)
Trj+Trb (us) 5.68 5.6807 0.012
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
14. Reverse Recovery Characteristic Reference
Trj=2.4(us)
Trb=3.28(us)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
15. ESD PROTECTION DIODE
Zener Voltage Characteristic
Circuit Simulation Result
10mA
5mA
0A
0V 50V 100V
I(R1)
V_V1
Evaluation Circuit
U1
R1
0.01m
2SK3565 R2
V1
0Vdc 1G
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006