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Produce consistently high-grade quality with
the modular roughness and contour measuring
systems W800. SHARING EXCELLENCE
2
Roughness and contour measurement
Modern system concept
for maximum flexibility
The Waveline W800 series has been designed to cover the
maximum spectrum of customer demands. All measuring
station configurations are designed on a modular basis and
can therefore be easily extended at a later stage.
Industrial production processes are very varied, as are the
requirements of metrology.
W800 measuring systems have been developed for rough-
ness and contour measuring tasks associated with typically
manual or semi-automatic measuring processes.
The systems are easy to operate and offer a great variety of
analyses thanks to the performant measuring and evalua-
tion software Evovis. The result is the highest standard of
measuring accuracy in the shortest time.
Wide range of accessories
for workpiece support
Tabletop, instrument
table or measuring cabin
Probing systems for roughness and/or contour measurement with quick-change
adapter for fast changing of the probing systems without tools
TKU400
Roughness measurement
Digiscan
Contour measurement
3
Modular in the equipment,
consistent in quality
Roughness and contour measurement
Granite plate with T groove
700 x 520 or
1000 x 520 mm
Traverse unit 120 or 200 mm with
display for status and position indication
Tilt unit ±45°
Measuring column 500 or 800 mm
Control panel for easy opera-
tion of the measuring station
Roughness or contour probe arms
with magnetic coupling
4
Waveline W800
W800. For reliable results in
the minimum amount of time
The measuring devices of the W800 series have been developed for complex professional roughness and contour
measuring tasks in an industrial manufacturing process setting.
Waveline W812C Digiscan with 500 mm measuring column, 120 mm traverse unit, control panel and accessories
The quick-change adapter enables probing systems to
be swapped over without having to use any tools. Probe
arms and probing system are equipped with magnetic
coupling making the exchange of probe arms easy and
fast. This means you can take a flexible approach towards
all of your measuring requirements.
The system automatically detects the intelligent contour
probe arms with RFID identification and adjusts the opti-
mal measurement conditions. This means that operating
errors and incorrect measurements can be practically
eliminated.
W800
Individually configurable
Versatile application
Quick-change adapter for probing systems
Probe arms easy to change
Excellent measuring accuracy
5
Waveline W800
Dual-tip probe arms (optional) for automated
top/bottom measurements
New calibration procedure with
improved accuracy specification
Control panel Movecontrol for comfortable
operation of the measuring systems
Depending on the intended purpose, our measuring
systems are optionally available with either an instrument
table or measuring cabin.
The instrument table, which has an innovative vibration
damping system combined with a robust base frame,
guarantees a reliable measurement operation regardless
of the environment.
The measuring cabin (not shown) is suitable for direct
connection to your production line and protects the
measuring system from negative environmental influence.
Waveline W820R with instrument table, 800 mm measuring column,
200 mm traverse unit, control panel and accessories
Contour measurement with Digiscan probing system Operation
Instrument table
Roughness measurement with TKU400 probing system
Easiest change of the probing systems
thanks to the quick-change adapter
Swiveling of the roughness probe for
transverse measurements
Probe arms TKU400 with magnetic coupling
for fast and secure probe arm swapping
6
Software and accessories
Evovis. Software for easy and precise evaluation
Measuring station control Wizard for selection of measuring conditions
Evovis measuring and evaluation software is easy to use
and offers a standardized interface for roughness and
contour measurement, regardless of the configuration of
the device.
Simple icons, supported by comprehensive help functions,
allow the operator to use the efficient measurement and
evaluation tools according to their own requirements.
Probe arms, quick-change adapter and accessories
TKU400 probe arms for roughness measurement Quick-change adapter for skidless probes Quick-change adapter for skid probes
Digiscan contour probe arms with RFID identification Measuring table PT120 (X, Y) 120 x 120 mm Measuring table PT200 (X, Y, C) 200 x 200 mm
7
Technical data
Waveline W800
Traverse unit XM120 and XM200
Straightness / 120 mm
Straightness / 200 mm
Positioning repeatability
Resolution X axis
Max. positioning speed
Max. basic disturbance Rz (0.2 mm/s)
0.4 µm
0.6 µm
<50 µm
0.1 µm
20 mm/s
<50 nm
Measuring column ZM500 and ZM800
Positioning repeatability
Max. positioning speed
<50 µm
20 mm/s
Tilt unit
Tilting range
Fine adjustment (optional)
± 45°
± 5°
Technical data
Probing system TKU400 Digiscan
Measurement of Roughness Contour
Measuring range/resolution (standard probe arm length) ± 400 µm/1 nm1)
60 mm/10 nm1)
Measuring range/resolution (2-fold probe arm length) ± 800 µm/2 nm1)
90 mm/15 nm1)
Top/bottom measurement No Optional
Measuring principle Analog Digital
Probe identification Yes Yes
Probe force setting Fixed -0.8 mN Electronic
Probe arm identification No Yes
Probe arm coupling Magnetic Magnetic
System configurations
System configuration Description
W800R Roughness measuring station with TKU400 probing system
W800C Digiscan Contour measuring station with Digiscan probing system
W800RC Digiscan Roughness and contour measuring station with TKU400 and Digiscan probing systems
Options Traverse unit 120 mm or 200 mm
Measuring column 500 mm or 800 mm
Granite plate 700 x 520 mm or 1000 x 520 mm
Control panel
Tabletop, instrument table, measuring cabin
1) Resolution over the entire measuring range
JENOPTIK Industrial Metrology Germany GmbH | Alte Tuttlinger Strasse 20 | 78056 Villingen-Schwenningen | Germany
Phone +49 7720 602-0 | Fax +49 7720 602-444 | metrology@jenoptik.com | www.jenoptik.com/metrology
Our qualified employees are available to assist you across the globe. We have subsidiaries and distribution partners in key
industrial nations, meaning that we are always close by to offer you optimum support as a reliable partner.
62267204/2018Copyright©JENOPTIKIndustrialMetrologyGermanyGmbH.Allrightsreserved.Subjecttochangewithoutnotice.Photosmayshowoptionsandarenotelegallybinding.

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Consistently high-grade quality with modular W800 systems

  • 1. Produce consistently high-grade quality with the modular roughness and contour measuring systems W800. SHARING EXCELLENCE
  • 2. 2 Roughness and contour measurement Modern system concept for maximum flexibility The Waveline W800 series has been designed to cover the maximum spectrum of customer demands. All measuring station configurations are designed on a modular basis and can therefore be easily extended at a later stage. Industrial production processes are very varied, as are the requirements of metrology. W800 measuring systems have been developed for rough- ness and contour measuring tasks associated with typically manual or semi-automatic measuring processes. The systems are easy to operate and offer a great variety of analyses thanks to the performant measuring and evalua- tion software Evovis. The result is the highest standard of measuring accuracy in the shortest time. Wide range of accessories for workpiece support Tabletop, instrument table or measuring cabin Probing systems for roughness and/or contour measurement with quick-change adapter for fast changing of the probing systems without tools TKU400 Roughness measurement Digiscan Contour measurement
  • 3. 3 Modular in the equipment, consistent in quality Roughness and contour measurement Granite plate with T groove 700 x 520 or 1000 x 520 mm Traverse unit 120 or 200 mm with display for status and position indication Tilt unit ±45° Measuring column 500 or 800 mm Control panel for easy opera- tion of the measuring station Roughness or contour probe arms with magnetic coupling
  • 4. 4 Waveline W800 W800. For reliable results in the minimum amount of time The measuring devices of the W800 series have been developed for complex professional roughness and contour measuring tasks in an industrial manufacturing process setting. Waveline W812C Digiscan with 500 mm measuring column, 120 mm traverse unit, control panel and accessories The quick-change adapter enables probing systems to be swapped over without having to use any tools. Probe arms and probing system are equipped with magnetic coupling making the exchange of probe arms easy and fast. This means you can take a flexible approach towards all of your measuring requirements. The system automatically detects the intelligent contour probe arms with RFID identification and adjusts the opti- mal measurement conditions. This means that operating errors and incorrect measurements can be practically eliminated. W800 Individually configurable Versatile application Quick-change adapter for probing systems Probe arms easy to change Excellent measuring accuracy
  • 5. 5 Waveline W800 Dual-tip probe arms (optional) for automated top/bottom measurements New calibration procedure with improved accuracy specification Control panel Movecontrol for comfortable operation of the measuring systems Depending on the intended purpose, our measuring systems are optionally available with either an instrument table or measuring cabin. The instrument table, which has an innovative vibration damping system combined with a robust base frame, guarantees a reliable measurement operation regardless of the environment. The measuring cabin (not shown) is suitable for direct connection to your production line and protects the measuring system from negative environmental influence. Waveline W820R with instrument table, 800 mm measuring column, 200 mm traverse unit, control panel and accessories Contour measurement with Digiscan probing system Operation Instrument table Roughness measurement with TKU400 probing system Easiest change of the probing systems thanks to the quick-change adapter Swiveling of the roughness probe for transverse measurements Probe arms TKU400 with magnetic coupling for fast and secure probe arm swapping
  • 6. 6 Software and accessories Evovis. Software for easy and precise evaluation Measuring station control Wizard for selection of measuring conditions Evovis measuring and evaluation software is easy to use and offers a standardized interface for roughness and contour measurement, regardless of the configuration of the device. Simple icons, supported by comprehensive help functions, allow the operator to use the efficient measurement and evaluation tools according to their own requirements. Probe arms, quick-change adapter and accessories TKU400 probe arms for roughness measurement Quick-change adapter for skidless probes Quick-change adapter for skid probes Digiscan contour probe arms with RFID identification Measuring table PT120 (X, Y) 120 x 120 mm Measuring table PT200 (X, Y, C) 200 x 200 mm
  • 7. 7 Technical data Waveline W800 Traverse unit XM120 and XM200 Straightness / 120 mm Straightness / 200 mm Positioning repeatability Resolution X axis Max. positioning speed Max. basic disturbance Rz (0.2 mm/s) 0.4 µm 0.6 µm <50 µm 0.1 µm 20 mm/s <50 nm Measuring column ZM500 and ZM800 Positioning repeatability Max. positioning speed <50 µm 20 mm/s Tilt unit Tilting range Fine adjustment (optional) ± 45° ± 5° Technical data Probing system TKU400 Digiscan Measurement of Roughness Contour Measuring range/resolution (standard probe arm length) ± 400 µm/1 nm1) 60 mm/10 nm1) Measuring range/resolution (2-fold probe arm length) ± 800 µm/2 nm1) 90 mm/15 nm1) Top/bottom measurement No Optional Measuring principle Analog Digital Probe identification Yes Yes Probe force setting Fixed -0.8 mN Electronic Probe arm identification No Yes Probe arm coupling Magnetic Magnetic System configurations System configuration Description W800R Roughness measuring station with TKU400 probing system W800C Digiscan Contour measuring station with Digiscan probing system W800RC Digiscan Roughness and contour measuring station with TKU400 and Digiscan probing systems Options Traverse unit 120 mm or 200 mm Measuring column 500 mm or 800 mm Granite plate 700 x 520 mm or 1000 x 520 mm Control panel Tabletop, instrument table, measuring cabin 1) Resolution over the entire measuring range
  • 8. JENOPTIK Industrial Metrology Germany GmbH | Alte Tuttlinger Strasse 20 | 78056 Villingen-Schwenningen | Germany Phone +49 7720 602-0 | Fax +49 7720 602-444 | metrology@jenoptik.com | www.jenoptik.com/metrology Our qualified employees are available to assist you across the globe. We have subsidiaries and distribution partners in key industrial nations, meaning that we are always close by to offer you optimum support as a reliable partner. 62267204/2018Copyright©JENOPTIKIndustrialMetrologyGermanyGmbH.Allrightsreserved.Subjecttochangewithoutnotice.Photosmayshowoptionsandarenotelegallybinding.