Equipo de medicion de contornos con software para evaluacion del perfil, se pueden medir radios, angulos, distancias, cuerdas etc. Jenoptik Industrial Metrology

1. OPTICAL SYSTEMS LASER & MATERIAL PROCESSING INDUSTRIAL METROLOGY TRAFFIC SOLUTIONS DEFENCE & CIVIL SYSTEMS
HOMMEL-ETAMIC C8000 digiscan
Innovative contour measurement system for the measuring room and
the production environment
Highlights
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Digital measuring systems
Wide measuring range
Easy to replace probe arms
Automatic probe arm recognition
Automatic probe force setting
New efficient EVOVIS evaluation software
Optional top/bottom measurement
Technical data
• Measurement range/resolution: 60 mm/50 nm
or 90 mm/75 nm(1)
• Horizontal measuring range: 120 mm
• Measuring column trace width: 400 mm
• Granite plate: 780 x 500 mm
• Probe arm coupling: magnetic
• Probe arm recognition: electronic, RFID
• Probe force: electronic ±5 mN to ±50 mN
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Options
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top/bottom measurement
Certified QS-STAT interface
Control panel wavecontrol
GTR instrument table
1.5-times probe arm length
Precision is our business.

2. HOMMEL-ETAMIC EVOVISTM
The innovative evaluation software for roughness and contour
measuring systems.
Many measuring tasks – one evaluation software.
EVOVIS™ offers a single user interface for all mobile and
stationary roughness and contour measuring systems from
Hommel-Etamic. The characteristic-oriented user interface offers
a comfortable and clear measuring programme design enables
the evaluation of anything from simple roughness parameters
to complex roughness and contours with several profiles in one
evaluation.
Contour evaluation
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Quick and easy user control
Characteristic-orientated measuring programme structure
Manual and CNC-controlled measurement
Efficient print log-editor
Supports all scanning systems from Hommel-Etamic
Integrated measuring station control
Option of efficient qs-STAT statistics interface
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Contour evaluation
Several profiles in one evaluation
Extensive evaluation functions
Intuitive navigation and zoom functions
Work on profile with pin-point accuracy
Roughness evaluation on contour profile
Clear object list
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Print form
Roughness evaluation
• Wizard for measuring conditions
• Extensive profile analysis functions
• Over 90 roughness and waviness parameters in accordance
with DIN EN ISO 4287 as well as additional ISO and
national standards (ASME, DIN, JIS, Motif)
• ISO/TS 16610-31 robust Gauss filter
• Can be extended with function-orientated dominant
waviness parameters (VDA2007)
JENOPTIK I Industrial Metrology
HOMMEL-ETAMIC GmbH I Alte Tuttlinger Straße 20 I 78056 VS-Schwenningen
Germany I Phone +49 7720 602-0 I Fax +49 7720 602-123
E-mail: info.de@hommel-etamic.com I www.hommel-etamic.com
DB_EVOVIS_EN 02.2011
Subject to change without notice.
Wizard for measuring conditions (roughness)