This document discusses various x-ray spectroscopy techniques for characterizing nanoparticles, focusing on x-ray diffraction (XRD) spectroscopy. It provides an overview of XRD principles and applications, including Bragg's law, instrumentation, peak analysis to determine structure and composition, and limitations when analyzing nanomaterials due to lack of long-range order. The document also discusses other x-ray techniques like XPS and XRF spectroscopy before concluding that XRD is a powerful tool for determining properties like phase, orientation, stress, and crystallite size in nanoparticle samples.