(Slides from Live webinar on September 25, 2014, presented by Mike Schnecker. Watch the webinar On-Demand here: http://goo.gl/LkjUUg)
Attendees Will Learn:
An overview of switched mode power supplies
Common measurements (ie, what to measure and why)
Circuit loading and probing considerations
How instrument specifications impact measurement accuracy
Switched mode power supplies have become ubiquitous in electronics as they provide precise voltages including high power with very high efficiency. The efficiency of these power supplies requires low loss power transistors and the design requires measurement of highly dynamic voltages. Voltage levels can vary from millivolts to hundreds of volts in some applications.
In this webinar, the proper use of a digital oscilloscope to accurately measure these voltages will be discussed along with key aspects of instrument performance such as noise and overdrive recovery that affect the accuracy of the measurement.
This document contains all the necessary basic information to understand Antenna Basics with simple and to the point non mathematical description.
This document is suitable for those who wants to understand only basics of antenna wireless communication.
For any queries or suggestions please contact on : mansithakur0304@gmail.com
Contents:
Electromagnetic Spectrum and RF basics.
Antenna introduction and its parameters.
Some other important factors like radiation pattern and polarization
Types of antennas and mobile antenna designs
How radio wave propagates
Access the video from this presentation for free from
http://www.rohde-schwarz-usa.com/DebuggingEMISS_On-Demand.html
Overview:
Electromagnetic interference is increasingly becoming a problem in complex systems that must interoperate in both digital and RF domains. When failures due to EMI occur it is often difficult to track down the sources of such failures using standard test receivers and spectrum analyzers. The unique ability of real-time spectrum analysis and synchronous time domain signal acquisition to capture transient events can quickly reveals details about the sources of EMI.
What You Will Learn:
How to isolate and analyze sources of EMI using an oscilloscope
Measurement considerations for correlating time and frequency domains
Near field probing basics
Presented By:
Dave Rishavy, Product Manager Oscilloscopes, Rohde & Schwarz
Dave Rishavy has a BS in Electrical Engineering from Florida State University and an MBA from the University of Colorado. Prior to joining Rohde and Schwarz, Mr. Rishavy gained over 15 years of experience in the test and measurement field at Agilent Technologies. This included positions in a wide range of technical marketing areas such as application engineering, product marketing, marketing management and strategic product planning. While at Agilent, Dave led the marketing and industry segment teams for the Infiniium line of oscilloscopes as well as high end logic analysis.
This document contains all the necessary basic information to understand Antenna Basics with simple and to the point non mathematical description.
This document is suitable for those who wants to understand only basics of antenna wireless communication.
For any queries or suggestions please contact on : mansithakur0304@gmail.com
Contents:
Electromagnetic Spectrum and RF basics.
Antenna introduction and its parameters.
Some other important factors like radiation pattern and polarization
Types of antennas and mobile antenna designs
How radio wave propagates
Access the video from this presentation for free from
http://www.rohde-schwarz-usa.com/DebuggingEMISS_On-Demand.html
Overview:
Electromagnetic interference is increasingly becoming a problem in complex systems that must interoperate in both digital and RF domains. When failures due to EMI occur it is often difficult to track down the sources of such failures using standard test receivers and spectrum analyzers. The unique ability of real-time spectrum analysis and synchronous time domain signal acquisition to capture transient events can quickly reveals details about the sources of EMI.
What You Will Learn:
How to isolate and analyze sources of EMI using an oscilloscope
Measurement considerations for correlating time and frequency domains
Near field probing basics
Presented By:
Dave Rishavy, Product Manager Oscilloscopes, Rohde & Schwarz
Dave Rishavy has a BS in Electrical Engineering from Florida State University and an MBA from the University of Colorado. Prior to joining Rohde and Schwarz, Mr. Rishavy gained over 15 years of experience in the test and measurement field at Agilent Technologies. This included positions in a wide range of technical marketing areas such as application engineering, product marketing, marketing management and strategic product planning. While at Agilent, Dave led the marketing and industry segment teams for the Infiniium line of oscilloscopes as well as high end logic analysis.
True or false: 30 dBm + 30 dBm = 60 dBm?
Why does 1% work out to be -40 dB one time but then 0.1 dB or 0.05 dB the next time? These questions sometimes leave even experienced engineers scratching their heads. Decibels are found everywhere, including power levels, voltages, reflection coefficients, noise figures, field strengths and more. What is a decibel and how should we use it in our calculations? This Application Note is intended as a refresher on the subject of decibels.
Frequency Independent Antennas:
Wide band antennas
Frequency independent bandwidth in octave range
Broadband antennas
Frequency independent bandwidth in the range 40:1
Multiband antennas
Antenna resonate at different frequencies.
desence,sensitivity calculation with and without external LNA, Noise figure calculation with and without external LNA and IIP3 calculation with and without external LNA
Switched mode power supplies have become ubiquitous in electronics as they provide precise voltages including high power with very high efficiency. The efficiency of these power supplies requires low loss power transistors and the design requires measurement of highly dynamic voltages. Voltage levels can vary from millivolts to hundreds of volts in some applications. In this seminar, the proper use of a digital oscilloscope to accurately measure these voltages will be discussed along with key aspects of instrument performance such as noise and overdrive recovery that affect the accuracy of the measurement.
Webinar Slides: Measurements and Analysis for Switched-mode Power Designsteledynelecroy
This webinar covers the measurements of interest for designers of switched-mode power conversion circuits and devices. With the goal of high efficient and reliable designs, we review the acquisition of voltage and current, their relationship in switched-mode power conversion circuits.
We review specific power circuit performance areas including the analysis of power device switching losses, conduction losses, dynamic on-resistance, control loop response, power quality, conducted emissions, best practices for probing power circuits, and power rail integrity measurements.
True or false: 30 dBm + 30 dBm = 60 dBm?
Why does 1% work out to be -40 dB one time but then 0.1 dB or 0.05 dB the next time? These questions sometimes leave even experienced engineers scratching their heads. Decibels are found everywhere, including power levels, voltages, reflection coefficients, noise figures, field strengths and more. What is a decibel and how should we use it in our calculations? This Application Note is intended as a refresher on the subject of decibels.
Frequency Independent Antennas:
Wide band antennas
Frequency independent bandwidth in octave range
Broadband antennas
Frequency independent bandwidth in the range 40:1
Multiband antennas
Antenna resonate at different frequencies.
desence,sensitivity calculation with and without external LNA, Noise figure calculation with and without external LNA and IIP3 calculation with and without external LNA
Switched mode power supplies have become ubiquitous in electronics as they provide precise voltages including high power with very high efficiency. The efficiency of these power supplies requires low loss power transistors and the design requires measurement of highly dynamic voltages. Voltage levels can vary from millivolts to hundreds of volts in some applications. In this seminar, the proper use of a digital oscilloscope to accurately measure these voltages will be discussed along with key aspects of instrument performance such as noise and overdrive recovery that affect the accuracy of the measurement.
Webinar Slides: Measurements and Analysis for Switched-mode Power Designsteledynelecroy
This webinar covers the measurements of interest for designers of switched-mode power conversion circuits and devices. With the goal of high efficient and reliable designs, we review the acquisition of voltage and current, their relationship in switched-mode power conversion circuits.
We review specific power circuit performance areas including the analysis of power device switching losses, conduction losses, dynamic on-resistance, control loop response, power quality, conducted emissions, best practices for probing power circuits, and power rail integrity measurements.
Webinar Slides: Probing in Power Electronics - What to use and whyteledynelecroy
Join Teledyne LeCroy for this webinar as we provide an overview of the different HV rated probe specifications and topologies, explain what measurement each probe topology is ideally suited for, and provide real-word examples and comparisons between a variety of different probes and amplifiers.
Webinar Slides: Probing in Power Electronics - What to use and whyHilary Lustig
Join Teledyne LeCroy for this webinar as we provide an overview of the different HV rated probe specifications and topologies, explain what measurement each probe topology is ideally suited for, and provide real-word examples and comparisons between a variety of different probes and amplifiers.
The USB 2.0 standard is widely deployed in both computer and embedded systems. Compliance testing for this standard includes signal integrity as well as a number of low-level protocol tests.
This presentation provides an overview of the test requirements for USB 2.0 compliance and provide background on each test case. Details of fixtures and signal integrity requirements are highlighted in detail.
For more information visit http://rohde-schwarz-scopes.com or call (888) 837-8772 to speak to a local Rohde & Schwarz expert.
Similar to Troubleshooting Switched Mode Power Supplies With A Digital Oscilloscope (20)
This White Paper provides a general overview of various military and commercial radar systems. It also covers some typical measurements on such systems and their components.
Learn more about Radar Component Testing here: https://www.rohde-schwarz.com/solutions/test-and-measurement/aerospace-defense/radar-ew-test/radar-component-testing/radar-component-testing_250800.html
Much of the success or failure of #5G will come down to securing the right amount of spectrum, at the right cost, under the right conditions. Here's where specific regions are placing their bets.
*As of April 26, 2019.
Learn more about 5G solutions from Rohde & Schwarz:
http://bit.ly/2ILV7cA
Technology Manager Andreas Roessler covers 5G basics in this keynote presentation at the RF Lumination 2019 conference in February 2019.
RF Lumination 2019
"Meet 158+ years of RF design & test expertise at one event. If they can't answer your question, it must be a really good question!"
Watch all the presentations here:
https://www.rohde-schwarz-usa.com/RFLuminationContent.html
Andreas Roessler is the Rohde & Schwarz Technology Manager focused on UMTS Long Term Evolution (LTE) and LTE-Advanced. With responsibility for the strategic marketing and product portfolio development for LTE/LTE-Advanced, Andreas follows the standardization process in 3GPP very closely, particularly on core specifications as well as protocol conformance, RRM and RF conformance specifications for device and base stations testing. He graduated from Otto-von-Guericke University in Magdeburg, Germany, and received a Master's Degree in communication engineering.
Embedded systems increasingly employ digital, analog and RF signals all of which are tightly synchronized in time. Debugging these systems is challenging in that one needs to measure a number of different signals in one or more domains (time, digital, frequency) and with tight time synchronization. This session will discuss how a digital oscilloscope can be used to effectively debug these systems, and some of the instrumentation considerations that go along with this.
Wireless communications is a hot topic in technology today, driven by technologies like Wireless Networking, Cellular Telephony, Wireless Connectivity and Satellite Communications among others. Traditionally, wireless and RF communications has been one of the last bastions of analog engineering. With the advent of low cost digital, high speed integrated circuits, this too has become part of the digital domain. Although information transmitted today is largely digital high frequency signals whether digital or analog always behave like analog signals so having fundamental knowledge of this high frequency behavior is key.
Jitter measurements are commonly done taking small snapshots in time, yet systems often experience jitter from sources that occur over relatively long time intervals, which may not be accounted for using short time interval measurements methods.
In this webinar we will present the application of a real time, digital clock recovery and trigger system to the measurement of jitter on clock and data signals. Details of the measurement methodology will be provided along with measurement examples on both clock and data signals.
You Will Learn:
- What is Jitter
- Different types of Jitter
- Jitter measurement techniques
- Benefits of Jitter analysis using real-time DDC techniques
Differential structures such as backplanes and cables are the primary means for transmitting high speed serial data signals. Signal integrity of these systems is determined by the characteristics of the media such as insertion loss, crosstalk, and differential to common mode conversion.
Complete measurement of the mixed mode s-parameters is often performed by transforming single-ended s-parameters and assuming that the system is linear. In some cases, linearity cannot be assumed such as where active components are used.
This presentation describes how to measure true differential s-parameters which can be measured even in the presence of non-linear elements.
Originally presented at DesignCon 2013.
Jitter is a very important topic in signal integrity for high speed serial data links. The jitter performance of clock signals used in generating the serial data signal is critical to the overall performance of these signals.
Phase noise is the most sensitive and accurate measurement of the performance of precision clocks.
This presentation covers the theory and practice for making phase noise measurements on clock signals as well as the relationship between phase noise and total jitter, random jitter and deterministic jitter. Measurements on a typical clock signal is also included.
For more information, visit http://rohde-schwarz-scopes.com or call (888) 837-8772 to speak to a local Rohde & Schwarz expert.
This seminar will provide the basics of this fascinating technology. After attending this seminar you will understand OFDM-principles,
including SC-FDMA as the transmission scheme of choice for the LTE uplink. Multiple antenna technology (MIMO) is a fundamental
part of LTE and its impact on the design of device and network architecture will be explained. Further LTE-related physical layer
aspects such as channel structure and cell search will be presented with an overview of the LTE protocol structure.
The second part of the seminar provides an overview of the evolution in LTE towards 3GPP specification Release 9 and 10. This
includes features and methods for location based services like GNSS support or time delay measurements and the concept of
multimedia broadcast. Finally, we’ll introduce the main features of LTE-Advanced (3GPP Release-10) including carrier aggregation for
a larger bandwidth and backbone network aspects like self-organizing networks and relaying concepts.
UMTS Long Term Evolution, LTE, is the technology of choice for the majority of network operators worldwide for providing mobile
broadband data and high-speed internet access to their subscriber base. Due to the high commitment LTE is the innovation platform
for the wireless industry for the next decade.
This class will provide the basics of this fascinating technology. After attending this course you will have an understanding of
OFDM-principles including SC-FDMA as the transmission scheme of choice for the LTE uplink. Multiple antenna technology (MIMO),
a fundamental part of LTE, will be explained as well as its impact on the design of device and network architecture. We’ll give a quick
introduction into the evolution of this technology including future upgrades of LTE features like multimedia broadcast, location based
services and increasing bandwidth through carrier aggregation.
The second part of the course will provide an overview including practical examples and exercises on how to test a LTE-capable device
while performing standardized RF measurements such as power, signal quality, spectrum and receiver sensitivity. We’ll address how
to automate these measurements in a simple and cost-effective way. We will introduce application based testing by demonstrating
end-to-end (E2E), throughput and application testing using the Rohde & Schwarz R&S®CMW500 Wideband Radio Communication
Tester. Examples of application tests are voice over LTE, VoLTE or Video over LTE.
LTE Measurement: How to test a device
This course provides an overview with practical examples and exercises on how to test a LTE-capable device while performing standardized RF measurements such as power, signal quality, spectrum and receier sensitivity, and how to automate these measurements in a simple and cost-effective way. We will present testing of LTE handsets in terms of protocol signaling scenarios and handover to other radio technologies for interoperability. This course will demonstrate end-to-end (E2E), throughput and application testing using the Rohde & Schwarz R&S®CMW500 Wideband Radio Communication Tester. Examles of application tests are voice over LTE, (VoLTE) or Video over LTE.
This white paper provides a brief technology introduction on the 802.11ac amendment to the successful 802.11- 2007 standard. 802.11ac provides mechanisms to increase throughput and user experience of existing WLAN and will build on 802.11n-2009.
For more information on wireless connectivity test solutions, visit http://wireless-connectivity-test.com
As with all electronic test equipment, digital oscilloscopes have an array of key specifications. Some are basic and easy to understand. Other specifications (which may have a greater impact on the accuracy of your measurements) are not as clear and are often dependent on the manufacturer.
This primer gives insight into the most important specifications to consider when using an oscilloscope — beyond the banner specs.
Main topics include:
- Types of digital oscilloscopes
- Basic elements of digital oscilloscopes
- The display system and user interface
- Probes
- Oscilloscope benchmark specifications
- Typical oscilloscope measurements
For more information on digital oscilloscopes, visit http://rohde-schwarz-scopes.com
Overview:
Embedded systems increasingly employ a combination of low speed serial, analog voltages and RF communications which are tightly synchronized in time. This session will discuss the background of performing time and frequency domain analysis on these systems with example measurements on a digitally controlled RF transmitter.
What will you learn?
The challenges of debugging embedded systems
Frequency domain analysis and FFT basics
Time gating, Dynamic range and Triggering considerations
PLL locking measurement example
Join us for a LIVE WEBINAR on this topic! Wednesday, November 14, 2:00pm ET
http://bit.ly/XPgjO7
Wide bandwidth modulation is becoming more common in communications. The emergence of the 802.11ac wireless Ethernet standard has extended the modulation bandwidth to 160 MHz which requires very wide band measurement equipment to measure. This presentation illustrates the details of a measurement method that uses a real time digital down converter and post processing software that measures the performance of this signal.
Near Field Communications (NFC) is an evolution of contactless data exchange which is being employed in mobile phone applications for data exchange and payment processing, among other applications. This presentation covers the evolution and technical details of this communications protocol along with compliance testing requirements.
Learn more: http://wireless-connectivity-test.com
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...Dr.Costas Sachpazis
Terzaghi's soil bearing capacity theory, developed by Karl Terzaghi, is a fundamental principle in geotechnical engineering used to determine the bearing capacity of shallow foundations. This theory provides a method to calculate the ultimate bearing capacity of soil, which is the maximum load per unit area that the soil can support without undergoing shear failure. The Calculation HTML Code included.
Overview of the fundamental roles in Hydropower generation and the components involved in wider Electrical Engineering.
This paper presents the design and construction of hydroelectric dams from the hydrologist’s survey of the valley before construction, all aspects and involved disciplines, fluid dynamics, structural engineering, generation and mains frequency regulation to the very transmission of power through the network in the United Kingdom.
Author: Robbie Edward Sayers
Collaborators and co editors: Charlie Sims and Connor Healey.
(C) 2024 Robbie E. Sayers
Immunizing Image Classifiers Against Localized Adversary Attacksgerogepatton
This paper addresses the vulnerability of deep learning models, particularly convolutional neural networks
(CNN)s, to adversarial attacks and presents a proactive training technique designed to counter them. We
introduce a novel volumization algorithm, which transforms 2D images into 3D volumetric representations.
When combined with 3D convolution and deep curriculum learning optimization (CLO), itsignificantly improves
the immunity of models against localized universal attacks by up to 40%. We evaluate our proposed approach
using contemporary CNN architectures and the modified Canadian Institute for Advanced Research (CIFAR-10
and CIFAR-100) and ImageNet Large Scale Visual Recognition Challenge (ILSVRC12) datasets, showcasing
accuracy improvements over previous techniques. The results indicate that the combination of the volumetric
input and curriculum learning holds significant promise for mitigating adversarial attacks without necessitating
adversary training.
About
Indigenized remote control interface card suitable for MAFI system CCR equipment. Compatible for IDM8000 CCR. Backplane mounted serial and TCP/Ethernet communication module for CCR remote access. IDM 8000 CCR remote control on serial and TCP protocol.
• Remote control: Parallel or serial interface.
• Compatible with MAFI CCR system.
• Compatible with IDM8000 CCR.
• Compatible with Backplane mount serial communication.
• Compatible with commercial and Defence aviation CCR system.
• Remote control system for accessing CCR and allied system over serial or TCP.
• Indigenized local Support/presence in India.
• Easy in configuration using DIP switches.
Technical Specifications
Indigenized remote control interface card suitable for MAFI system CCR equipment. Compatible for IDM8000 CCR. Backplane mounted serial and TCP/Ethernet communication module for CCR remote access. IDM 8000 CCR remote control on serial and TCP protocol.
Key Features
Indigenized remote control interface card suitable for MAFI system CCR equipment. Compatible for IDM8000 CCR. Backplane mounted serial and TCP/Ethernet communication module for CCR remote access. IDM 8000 CCR remote control on serial and TCP protocol.
• Remote control: Parallel or serial interface
• Compatible with MAFI CCR system
• Copatiable with IDM8000 CCR
• Compatible with Backplane mount serial communication.
• Compatible with commercial and Defence aviation CCR system.
• Remote control system for accessing CCR and allied system over serial or TCP.
• Indigenized local Support/presence in India.
Application
• Remote control: Parallel or serial interface.
• Compatible with MAFI CCR system.
• Compatible with IDM8000 CCR.
• Compatible with Backplane mount serial communication.
• Compatible with commercial and Defence aviation CCR system.
• Remote control system for accessing CCR and allied system over serial or TCP.
• Indigenized local Support/presence in India.
• Easy in configuration using DIP switches.
Welcome to WIPAC Monthly the magazine brought to you by the LinkedIn Group Water Industry Process Automation & Control.
In this month's edition, along with this month's industry news to celebrate the 13 years since the group was created we have articles including
A case study of the used of Advanced Process Control at the Wastewater Treatment works at Lleida in Spain
A look back on an article on smart wastewater networks in order to see how the industry has measured up in the interim around the adoption of Digital Transformation in the Water Industry.
NO1 Uk best vashikaran specialist in delhi vashikaran baba near me online vas...Amil Baba Dawood bangali
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Cosmetic shop management system project report.pdfKamal Acharya
Buying new cosmetic products is difficult. It can even be scary for those who have sensitive skin and are prone to skin trouble. The information needed to alleviate this problem is on the back of each product, but it's thought to interpret those ingredient lists unless you have a background in chemistry.
Instead of buying and hoping for the best, we can use data science to help us predict which products may be good fits for us. It includes various function programs to do the above mentioned tasks.
Data file handling has been effectively used in the program.
The automated cosmetic shop management system should deal with the automation of general workflow and administration process of the shop. The main processes of the system focus on customer's request where the system is able to search the most appropriate products and deliver it to the customers. It should help the employees to quickly identify the list of cosmetic product that have reached the minimum quantity and also keep a track of expired date for each cosmetic product. It should help the employees to find the rack number in which the product is placed.It is also Faster and more efficient way.
Industrial Training at Shahjalal Fertilizer Company Limited (SFCL)MdTanvirMahtab2
This presentation is about the working procedure of Shahjalal Fertilizer Company Limited (SFCL). A Govt. owned Company of Bangladesh Chemical Industries Corporation under Ministry of Industries.
Using recycled concrete aggregates (RCA) for pavements is crucial to achieving sustainability. Implementing RCA for new pavement can minimize carbon footprint, conserve natural resources, reduce harmful emissions, and lower life cycle costs. Compared to natural aggregate (NA), RCA pavement has fewer comprehensive studies and sustainability assessments.
2. Agenda
In this workshop we’ll be learning
ı SMPS background and basics
ı Measurement setup
ı Oscilloscope measurements
FAST: Advanced Triggering
Averaging, filtering, grids
Probing and bandwidth
Current measurements and deskew
ı Measurement Example:
startup waveforms
output voltage ripple
transient behavior
switch node voltage and current
9/10/2014 2
3. Switched mode power supply basics
l Basic DC-DC converter
l Switches A and B alternately charge and discharge inductor through
load
l Switches are realized using power MOSFET, IGBT and diodes
SMPS | 3
Vs(t)
4. Voltage regulation in SMPS
Vs(t) Vg
DTs (1-D)Ts
l Average voltage at the load is controlled by the duty cycle D
l Waveform assumes an ideal switch
SMPS | 4
0
Vs = DVg
7. Measurement Setup
Oscilloscope: 500 MHz or more
9/10/2014 FAST: Advanced Triggering
7
SMPS
Passive voltage probes Single ended and
differential active
probes
De-skew fixture
Current probes
Programmable power supply
variable current and voltage
remote sensing
8. Maximizing measurement accuracy
ı Large dynamic range required for accurately measuring switching loss
On state is tens to hundreds (even thousands) of volts
Off state is often only several mV to a few volts
Typical A/D converters provide only 6 to 8 effective bits (50 dB S/N)
This is equivalent to 20 mV out of 5 V
ı Maximizing signal to noise
Waveform averaging
High resolution and filtering filtering (trade off sample rate and bandwidth for
S/N)
Multiple grids
ı Probing and bandwidth
SMPS contain high slew rate signals and high frequency content
Probing is critical for accurate measurements – bandwidth and connection
Oscilloscope bandwidth and sample rate must be high enough to measure
fast edges and high frequency interference
9. Waveform averaging
ı Increases resolution by averaging samples
Effective in reducing thermal (random) noise
Will distort time varying waveforms
Can also reduce displayed rise time
Can not reduce deterministic noise sources such as interleaving artifacts
10. High Resolution Mode or Digital Filter
ı Combine consecutive
samples from A/D
converter
ı Preserves real time
sampling – no smearing
of dynamic signals
ı Reduces bandwidth
based on decimated
sampling rate
ı Should be combined with
filtering to reduce
interpolation error
Combine
samples for
each point
16. Slew Rate and Vertical Resolution
ı Both vertical and horizontal
resolution are critical
High slew rates
Measuring short, high
amplitude peaks that could
damage active components
ı 4.4 V/ns = 880 mV per
sample @ 5 Gs/s
ı 4.4 V/ns = 4.4 V sample @ 1
Gs/s
ı Compare to digitizer range
39 mV @ 8 bits
2.4 mV @ 12 bits
ı Measurement is limited by
the sampling rate
17. Slew Rate and Vertical Resolution
ı Use high bandwidth probe
Shortest lead lengths
Active probes if possible
ı Maximize sampling rate and bandwidth
Sampling rate 5 to 10 times the scope bandwidth
Oscilloscope rise time 10x faster than switch time
ı Use averaging whenever possible
High resolution mode reduces rise time, bandwidth and sampling rate
Averaging preserves sampling rate and rise time
18. FAST: Advanced Triggering
Measuring Current
ı Clamp-on current probes
Both DC and AC current measurement
Must be “de-magnetized”
Requires a loop in the circuit
Limited bandwidth
ı Shunt resistor
Measure the voltage drop across a small
resistor – usually 0.1 ohm
Resistor must have stable value over
temperature and current
Highest bandwidth
ı Indirect method using near field probe
Only AC current proportional to -d(i(t))/dt
Limited sensitivity
Measurement on very small geometry
and without disturbing the circuit
9/10/2014 18
19. Using a Near Field Probe to Measure Current
Current flow
H field
ı Probe voltage proportional to the derivative
of the current
ı Small form factor probes can reach tight
spots
ı Integrate signal to measure current
▪ Integral reduces noise on small signal
Vo
20. Positive voltage vs current pulse skew
Deskewing with reference voltage and current
pulses essential for accurate power measurements
RT-ZF20 - Power Deskew Fixture
Probe De-skew
ı Skew between voltage and current probe leads to wrong power measurement
results
Feb. 2013 20
Power measurement too low
Negative voltage vs current pulse skew
Power measurement too high
Positive voltage vs current pulse skew
Power measurement too low
Deskewed, accurate measurement
21. RT-ZF20 – How to deskew
1. Connect RT-ZF20 to USB
2. Connect current probe and voltage probe
Voltage pulse
Current pulse
Deskew
Different propagation delay between current and voltage pulse Current and voltage pulse aligned
RT-ZF20 - Power Deskew Fixture
to RT-ZF20
3. Overlay current and voltage pulse
Trigger condition rising + falling edge
Adjust vertical scale to same pulse height
4. Adjust „Deskew“ parameter of scope for current probe
Feb. 2013 21
25. Measure output voltage
ı Measured using passive probe with long ground lead
9/10/2014 FAST: Advanced Triggering
25
26. Measure output voltage
ı Measured using passive probe with short ground lead
9/10/2014 FAST: Advanced Triggering
26
27. Measure output voltage
ı Measured using passive probe with an active probe
9/10/2014 FAST: Advanced Triggering
27
28. Measure output voltage spectrum
ı Spectrum measured out to 30 MHz
ı Spurs look very similar in both cases
9/10/2014 FAST: Advanced Triggering
28
20 Ω load
5 Ω load
29. Measure output voltage spectrum
ı Spectrum measurement up to 500
MHz
ı Increased noise between 100 and
300 MHz with 5 ohm load
9/10/2014 FAST: Advanced Triggering
29
20 Ω load
5 Ω load
31. Measure The Voltage Transient Response
ıOutput voltage during load transient
9/10/2014 FAST: Advanced Triggering
31
No load
20 Ω load
5 Ω load 4 Ω load
32. Measure The Voltage Transient Response
ı Examining voltage after filtering
ı Stability is determined by analyzing overshoot and any ringing
ı Can be measured in-circuit
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34. Measure Switch Node Voltage and Current
ı 20 ohm load
ı Current measured using near field probe
ı Math waveform computes integral of near field probe voltage
ı Averaging and high resolution mode applied to signals
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35. Measure Switch Node Voltage and Current
ı 5 ohm load
ı Current measured using near field probe
ı Math waveform computes integral of near field probe voltage
ı Averaging and high resolution mode applied to signals
ı Slope of voltage increased compared to 20 ohm case and inductor current is non-linear
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36. FAST: Advanced Triggering
Conclusion
ı Increasing the load to 5 Ω results in reduced voltage (by approximately 200 mV)
and increased voltage ripple
Increased spectral power above 100 MHz
3% ripple voltage
ı Examining the switching node revealed that the inductor appears to be the root
cause
Non-linear IL with 5 Ω load
Decreased rise time of Vsw with increased load
Higher slope on Vsw at higher load
ı The problem is traced to an undersized inductor
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Editor's Notes
The circuit shown here is a basic DC-DC converter also known as a buck converter because the output voltage Vs is lower than the input voltage Vg. The two switches operate synchronously so that switch a is open when switch b is closed and vice-versa. The inductor and capacitor form a low pass filter that removes all of the switching frequencies leaving only the DC component at the load resistor R. The inductor can also be viewed as an energy storage element charging up when switch a is closed and discharging through the load when switch a is open.
The switches are realized using semiconductor devices such as FET’s, IBGT’s or diodes.
Voltage regulation is determined by the duty cycle of the switches The trace shown here is that of the voltage at the load without the inductor or capacitor present. The voltage switches between Vg and zero with the average being determined by the duty cycle D. This waveform is assumes that the switches are ideal in that they switch instantly and there is no loss in the “on” state.
This screen shot from an RTM oscilloscope shows a few key measurements on a buck converter. The blue shaded areas correspond with the switch grounding the inductor while the tan areas correspond with the switch applying the source voltage to the inductor. The switch voltage alternates between Vs and 0 V while the inductor current varies linearly as the inductor charges and discharges. The ouput voltage ripple folliws the switching and is minimized via the filtering of the LC network. Note the scale of the output voltage (on channel 4 in this case) is 20 mV/div
The overall inductor current is then a triangle wave with slope alternateing between (Vg-V)/L and –V/L.
The large switching voltages require a high bandwidth oscilloscope typically in the range of 1 GHz to measure. Oscilloscopes in this range typically use an 8 bit A/D converter with 6 to 7 effective bits of resolution. Effective bits is a way of expressing the effect of noise and distortion on the dynamic range of the instrument. For example, a 43 dB signal to noise ratio corresponding to a 6.8 effective bit A/D results in approximately 70 mV of RMS noise on a 10 V full scale signal.
This level of uncertainty is generally too high to measure the drain to source voltage which is usually in this range. There are three methods employed to improve the resolution of oscilloscopes for this measurement. Waveform averaging can be used to reduce trace noise or high resolution mode decimation can be used to trade off bandwidth for signal to noise. In some cases, the instrument can be overdriven to increase the accuracy of measurement of small signal levels.
Each of these methods has drawbacks which will be discussed.
Waveform averaging can be used to decrease the trace noise significantly. This type of averaging works on consecutive waveform updates. Random variations in the waveform from update to update are reduced by finding the mean at each time sample across the waveform. This type of averaging is dependent on the waveform being perfectly repetitive. Any variation in the waveform over time will result in distortion. This is the waveform of the switching voltage (drain to source voltage) of a power FET. Because the duty cycle is being continuously adjusted to regulate the voltage, only the pulse in the center at the trigger point is not distorted. The other two pulses are severely distorted by the averaging.
Trigger jitter in the oscilloscope can also cause the signal to move at the trigger point which can induce distortions which limit the amount of averaging that can be employed.
Another method that can be employed by oversampling A/D converters is referred to as enhanced resolution or high resolution mode. This mode combines consecutive samples from the A/D converter into one sample. For example, 100 consecutive samples the 10 Gs/s A/D in the R&S RTO oscilloscope can be combined (averaged) to provide an increased signal to noise by lowering the effective sampling rate to 100 Ms/s. The lower sampling rate is accompanied by a low pass filter to keep the signal bandwidth below 50 MHz.
The main advantage of high resolution decimation mode is that the dynamic signal behavior is preserved since no averaging is done between acquisitions. The upper figure shows how the high resolution mode combines samples and reduces the sampling rate. The lower image shows the drain to source voltage of the switched mode power supply. The waveform shape is preserved even for this highly dynamic signal. History mode can be used to view each individual group of three pulses at any instant in time.
Viewing multiple waveforms is important in evaluating switched mode power supplies since many different test points need to be probed. For example the voltage and current waveforms as shown here.
By using independent grids on the display, each signal is digitized using full resolution
The common practice of reducing the waveform to ½ size and then using the offset control to position the traces so that they are not overlapping has the effect of reducing the resolution by as much as one bit. Here we show two voltage waveforms on the same voltage scale except one was acquired at full scale while the other was acquired at ½ scale. The zoom traces compare the resolution of both traces showing the approximately 2x more noise on the signal that was acquired using ½ scale.
The fast switching speeds encountered in SPMS designs require good probing practice to measure correctly. For example, long ground leads result in high inductance at the probe tip and ringing and overshoot in the time domain signal. In cases such as the one shown here, the ripple voltage is almost 2x as large when measured with a long ground lead.
Even though switching speeds are generally in the 1 MHz or lower rates, the edges can be very fast and so the bandwidth requirements may be many times higher. In the waveform above the voltage ripple was measured using an active probe which had a bandwidth of greater than 1 GHz. The measured ripple is even lower in this case due to the much lower overshoot of the active probe.
Both vertical and horizontal resolution are important so sacrificing sampling rate fore more bits is not often a good idea. Short, high amplitude peaks can damage active components so it is important to be able to measure them. For example, a 10 V/ns slew rate increases 1 V between samples when acquired at 10 Gs/s while it covers 5 V between samples when sampled at 2 Gs/s. This is a 5x reduction in resolution but, compared with the resolution of the A/D, sampling rate is the limiting factor.
To summarize: the best accuracy is achieved by using active probes if possible and keeping leads as short as possible, maximizing sampling rate and bandwidth and using averaging or, where appropriate, high resolution mode.
Power is measured by first measuring the voltage and current and then computing the power as V*I. It is important to de-skew the current and voltage probes so that the instantaneous value of the power is properly measured. Here we show the result of skew between the current and voltage probes on power in a switching loss measurement. Note that the loss can be either over or under estimated as a result of skew.
Demonstrate the use of the RT-ZF20 for de-skewing current and voltage probes.