Transmission electron microscopy (TEM) uses an electron beam to observe very small specimens. It was developed in 1931 and is commonly used globally in science and engineering. TEM has three main parts: an electron gun, condenser system, and image producing and recording systems. It can magnify up to 2 million times and is used for applications ranging from biology to nanotechnology. While powerful, TEMs are also expensive, large, require significant maintenance, and have a tedious specimen preparation process.