This document discusses techniques for testing non-volatile memory devices like ROM and hybrid devices that cannot be overwritten. It describes using checksums and cyclic redundancy checks (CRC) to test the validity of data stored in these memory devices. Checksums involve computing and storing a value based on the data, then recomputing and comparing it to the original to check for errors. CRC is a more advanced checksum algorithm designed to detect common data errors. The document also discusses control and status registers that interfaces processors with peripheral devices, benefits of developing device drivers, components of a device driver, and using watchdog timers to protect against software hangs.