P
        ulsed laser deposition (PLD), also sometimes referred as
        laser evaporation, laser assisted deposition, laser ablation
        deposition, and laser molecular beam epitaxy (laser-MBE),
is an inexpensive, flexible, and user-friendly thin film growth tech-
nique [1]. Introduced in the 60-th [2], it attracted attention in the
80-th due to the raised interest in the growth of high-temperature
superconducting oxides, such as YBa2Cu3O7 (YBCO). Here, it
was essential to achieve stoichiometric transfer at high oxygen
pressure in order to synthesize high quality films. Even the first at-
tempts of thin film fabrication of this complex oxide with PLD
were successful [3] making this technique extremely popular.
Since then PLD was used to grow oxides [4], nitrides [5], chalco-
genide glasses [6], and metals [7]. Even nanocrystalline diamond
and SiC films were deposited using PLD [8,9]. PLD also
witnessed significant technical innovations and improvements
resulting in the development of advanced combinatorial PLD [10]
and laser MBE [11] systems.
   PLD, unlike many other deposition techniques, is based on the
very intuitive principles. A high-power pulsed laser is focused on
the target positioned in the vacuum chamber, as shown in
Figure 1. The target is ablated after each pulse forming a plume




Figure 1. The schematics of the PLD system. PLD chamber is equipped
with the substrate heater and a carousel housing a number of targets.
Laser beam is rastered over the target surface for better film uniformity.



                                                                      59
film composition mimics composition of the target and complex
                                                                         alloys, such as superconducting (YBa2Cu3O7), ferroelectric
                                                                         (Ba0.6Sr0.4TiO3), and multiferroic (By2FeCrO6) oxides, can be
                                                                         grown without the need of individual atomic flux calibration. In
                                                                         addition, use of external energy source (laser) allows film growth
                                                                         both in the high-vacuum conditions and in the mTorr pressure
                                                                         range. If the proper pumping and exhaust system is available,
                                                                         corrosive gases (ozone), and reactive atmospheres (H2, H2S, and
                                                                         CH4) can be used.
                                                                            Clearly, PLD is one of the most flexible thin film growth
                                                                         techniques.
                                                                            In spite of the sound simplicity, laser – target interaction and
                                                                         material transfer are rather complicated processes. They can be
                                                                         separated in a few steps, as shown in Figure 4. First, laser beam
                                                                         is focused onto the surface of the target. Due to the high power
                                                                         (∼ 1 J per pulse) and short duration (∼ 30 ns) of the pulse, surface
                                                                         of the target is rapidly heated above evaporation temperature.

Figure 2. The photograph of the PLD system built by PVD Products
Inc.

of atoms, molecules, and particulates directed towards the heated
substrate located a few centimeters away of it. The species con-
dense at the substrate surface resulting in the film growth. This
technique requires only the use of a pulsed (Nd:YAG, ruby, or ex-
cimer) laser and a basic 8” – 16” spherical or box vacuum cham-
ber evacuated by the diffusion or turbomolecular pump. If
epitaxial growth of multilayered structures is desired, chamber is
equipped with the rotatable multi-target carousel (with three 2” or
six 1” targets) and a substrate heater. Since such system can be
built on a limited budget, PLD became extremely popular for ac-
ademic research. In addition, a number of companies (AMBP
Tech, DCA Instruments, PVD Products Inc., Pascal Technologies
Inc., and SVT Associates) recently entered the market historically
dominated by a single pioneer company (Neocera Inc.) driving
the prices of the turn-key systems, similar to shown in Figure 2,        Figure 3. The schematics of the PLD system with the laser beam shared
                                                                         between four deposition chambers.
significantly down.
   PLD has a number of advantages when compared with other
deposition techniques. Similar to sputtering and e-beam evapo-
ration, growth is performed in the vacuum environment mini-
mizing unintentional impurity incorporation. Different compo-
sitions of the same alloy as well as different materials can be de-
posited in the same chamber with the only necessity to switch the
targets. If there is a problem of cross-contamination, laser (the
most expansive part of the system) can be shared between a few
deposition chambers, as shown in Figure 3, just slightly increas-
ing the total system cost. Relatively high deposition rates, typically
∼100s Å/min, can be achieved with the film thickness being con-
trolled in real time by simply turning the laser on and off. There-
fore, both multi-micrometer thick and a few nanometer thin films
can be deposited. In addition, if the chamber is equipped with a
carousel housing a number of targets, multilayered structures can
be grown without the need to break vacuum when changing be-
                                                                         Figure 4. The schematic diagram of the absorption and the ejection
tween materials.                                                         processes during the PLD. A) Photo-absorption followed by rapid
   Nearly stoichiometric material transfer, due to the congruent         heating of the surface layer; B) Surface melting and vaporization; C)
evaporation of the elements and compounds irrespective of their          Formation and expansion of atomic plume; D) Plume expansion at low
evaporating points, is another important advantage of PLD. Thus,         pressures; E) Plume expansion at high pressures.


60                                            vtcmag@optonline.net                             July 2008 • Vacuum Technology & Coating
highly energetic ions (100 eV-500 eV) and low energetic atoms
                                                                      (10–50 eV). The high-energy fraction expands much faster reach-
                                                                      ing the substrate first. When the high-energy ions hit the substrate,
                                                                      they transfer kinetic energy activating diffusion of the surface
                                                                      atoms, implanting atoms into the substrate, and re-sputtering
                                                                      substrate atoms, as shown in Figure 5a. Next, re-sputtered
                                                                      substrate atoms collide with the stream of slower-expanding
                                                                      target atoms with lower kinetic energy. A high-temperature colli-
                                                                      sion region characterized by high plasma and particle density
                                                                      forms above the substrate, as shown in Figure 5b. Processes of
                                                                      thermalization, condensation, and cluster formation start in this
                                                                      region diminishing plasma density and finally dissolving the layer.
                                                                      Finally, target atoms with the lowest kinetic energy (∼ 10 eV)
                                                                      reach the substrate without interaction with the re-sputtered
                                                                      substrate atoms, as shown in Figure 5c.
                                                                         Therefore, film nucleation occurs under the heavy supersatu-
                                                                      ration and the growth conditions are fare from the thermodynamic
                                                                      equilibrium. The process can be separated into three steps:
                                                                       a) High-energy ion implantation, surface diffusion activation,
                                                                          and re-sputtering;
                                                                       b) Cluster condensation from the collision zone;
                                                                       c) Adsorption of the low-energy ablated species.
                                                                         These steps are repeated after each laser pulse. While the high
                                                                      degree of supersaturation favors two-dimensional (2D) nucleation
                                                                      of highly dense and small clusters, high kinetic energy of arriving
                                                                      species activates surface migration promoting layer-by-layer film
Figure 5. The schematic diagram of the plasma plume-substrate         growth. Thus, films obtained by PLD are usually dense, exhibit
interaction                                                           high degree of texture, and demonstrate good adhesion proper-
Evaporating material forms a dense vapor layer above it. Laser        ties. These properties are desirable both for the electronic materi-
beam interacts with the evaporated material dissociating molec-       als and optical or tribological coatings.
ular species desorbed from the target. Photoionization (via the          In spite of these advantages, a few shortcomings stalled broad
non-resonant multiphoton processes) causes plasma formation.          industrial application of PLD. First, sub-surface boiling, expul-
Once formed, plasma attenuates laser beam by inelastic free elec-     sion of the liquid layer by shock wave pressure recoil, and
tron scattering preventing further interaction between the laser      exfoliation lead to the target splashing and particulate deposition.
beam and the target.                                                  These particulates vary in size from below hundred nanometers to
   Due to the pressure differential, plasma expands from the tar-     a few micrometers. They greatly affect growth of the subsequent
get surface forming the ''plasma plume". Internal thermal and ion-    layers, degrade electrical properties of the films, and produce films
ization energies are converted into the kinetic energy reaching a     with the rough surface. Second, plasma plume has a very narrow
few hundred electron volts (eV). The kinetic energy of the species    angular distribution, which can be fitted by a cosnϕ curve (4 < n
and the spatial distribution of the plume strongly depend on the      < 10 depending on the deposition pressure), resulting in the
chamber pressure. In general:                                         non-uniform wafer coverage. Although this was not important for
                                                                      academic research where 5×5 mm2 substrates were routinely used,
 a) The plume is very narrow and forward directed at low pres-        it made problematic industrial application where 4” wafer had to
    sures (10-5 - 10-4 Torr). The kinetic energy of the species is    be handled.
    preserved since almost no scattering with the background gas         However, these problems were mostly solved in the last years
    occurs.                                                           by the joint efforts of a number of research groups.
 b) Splitting of the high energy ions from the less energetic            It was shown that particulates, which have much lower veloc-
    species increases in the intermediate pressure range (1 - 10      ities than the atomic and ionic species, can be removed from
    mTorr). The kinetic energy of the high energy ions is partially   the plume using a mechanical velocity filter [12]. More elaborate
    attenuated by the multiple collisions with the background gas.    techniques involving collisions between two plasma plumes
 c) Diffusion-like expansion of the ablated material occurs at        (cross-beam PLD) [13], magnetic field filtering [14], and
    higher pressures (> 0.1 Torr). High energy ions loose energy      positioning the substrate edge-on inside the plume (off-axis
    through the multiple scattering processes.                        deposition) instead of being directly perpendicular to it (on-axis
                                                                      deposition) [15] were also developed.
  As was previously mentioned, plasma plume consists of both             A few schemes were implicated to improve film uniformity.


Vacuum Technology & Coating • July 2008                    www.vactechmag.com or www.vtcmag.com                                        61
Figure 6. Principle of the multi-beam pulsed laser deposition approach   Figure 7. The schematics of the multi-beam PLD integrated with the
(insert) and deviation of the deposition rate of TiCxN1−x over the de-   commercial MBE system [20].
posited area [17].
                                                                         2. H. M. Smith and A. F. Turner, Appl. 0pt., 4 147 (1965).
Rastering of the laser beam over the rotating target, which was          3. D. Dijkkamp, T. Venkatesan, X. D. Wu, S. A. Shaheen, N. Jasrawi,Y.
performed using a programmable kinematic mount installed on                 H. Min-Lee, W. L. McLean and M. Croft, Appl. Phys. Lett., 51, 619
the last mirror of the optical train, allowed deposition of the films       (1987).
with the uniform coverage over the large wafer areas [16]. Other         4. T. Venkatesan, K. S. Harshavardhan, M. Strikovski, J. Kim in “Thin
                                                                            Films and Heterostructures for Oxide Electronics” edited by S. B.
approaches included tilting of the rotating target during the laser
                                                                            Ogale, Springer, (2005).
ablation, off-axis deposition, and positioning of the target with
                                                                         5. G. Leggieri, A. P. Caricato, M. Fernandez, M. Martino, P. Mengucci,
the center of the plasma plume being slightly offset from the cen-          G. Barucca, Recent Research Developments in Applied Physics, 5,
ter of the rotating substrate. In addition, a multi-beam PLD tech-          339 (2002).
nique produced films with a very low thickness deviation (∼ 5%)          6. M. Frumar, B. Frumarova, P. Nemec, T. Wagner, J. Jedelsky, M.
over the 4” wafers. In this case, three laser beams were focused on         Hrdlicka, J. Non-Crystalline Solids, 352, 544 (2006).
the same target and the improved uniformity was achieved by the          7. A. J. Francis and P. A. Salvador, J. Mat. Res., 22, 89 (2007).
optimized superposition of the generated plasma plumes, as               8. A. Keffous, K. Bourenane, M. Kechouane, N. Gabouze, T. Kerdja,
shown in Figure 6 [17, 18].                                                 Vacuum, 81, 632 (2007).
   Multilayered coatings were deposited on the 4” wafers using           9. T. Hara, T. Yoshitake, T. Fukugawa, L. Y. Zhu, M. Itakura, N.
multi-beam PLD combined with the standard MBE into a novel                  Kuwano, Y. Tomokiyo, K. Nagayama, Diamond and Related Mate-
                                                                            rials, 13, 679 (2004).
hybrid beam deposition [19,20]. The growth system was equipped
                                                                         10. M. Lippmaa, T. Koida, H. Minami, Z. W. Jin, M. Kawasaki, H.
both with the effusion cells and multi-target carousel, quarts crys-
                                                                              Koinuma, Appl. Surf. Sci., 189, 205 (2002).
tal monitor for flux calibration, ellipsometer and Reflective High       11. H. Koinuma, M. Kawasaki, M. Yoshimoto, Mat. Res. Soc. Symp.
Energy Electron Diffraction (RHEED) for in-situ monitoring, as                Proc., 474, 303 (1997).
shown in Figure 7. Highly p-type doped ZnO, which is extremely           12. T.Yoshitake, G. Shiraishia, K. Nagayama, Appl. Surf. Sci., 197, 379
difficult to produce with other techniques, was also grown using              (2002).
this technique [21]. While the ceramic target was used as a ZnO          13. A. Tselev, A. Gorbunov, W. Pompe, Rev. Sci. Instrum., 72, 2665
source, effusion cell was used to deliver Arsenic (p-type dopant)             (2001).
and RF-plasma source was used to efficiently increase the flux           14. R. Jordan, D. Cole, J. G. Lunney, Appl. Surf. Sci., 109, 403 (1997).
density of available reactive oxygen. Hybrid beam deposition, al-        15. Z. Trajanovic, L. Senapati, R.P. Sharma, T. Venkatesan, Appl. Phys.
though lacking the simplicity of standard PLD, provides a real al-            Lett., 66, 2418 (1995).
                                                                         16. S. Boughaba, M. Islam, J. P. McCaffrey, G. I. Sproule, M. J. Graham,
ternative to the conventional vacuum deposition techniques.
                                                                              Thin Solid Films, 371, 119 (2000).
   Clearly, PLD has very exciting prospects and offers number of
                                                                         17. J. M. Lackner, W. Waldhauser, R. Ebner, B. Major, Surf. Coat. Tech-
advantages over traditional vacuum deposition techniques like                 nol., 188, 519 (2005).
chemical vapor deposition, sputtering and e-beam evaporation.            18. J. M. Lackner, Thin Solid Films, 494, 302 (2006)
Since the problems of particulate deposition and non-uniform             19. M. Panzner, R. Dietsch, Th. Holz, H. Mai, S. Vdlmar, Appl. Surf.
wafer coverage are mostly solved, broader industrial application               Sci., 96, 643 (1996).
of PLD is expected                                                       20. M. Panzner, R. Dietsch, Th. Holz, H. Mai, S. Vdlmar, B. Wehner,
                                                                              Appl. Surf. Sci., 127, 451 (1997).
References                                                               21. Y. R. Ryu, T. S. Lee, H. W. White, J. Crystal Growth, 261, 4, 502
                                                                              (2004).
1. “Pulsed Laser Deposition of Thin Films” edited D. B. Chrisey and G.
   K. Hubler, Wiley-Interscience (1994).




62                                             vtcmag@optonline.net                             July 2008 • Vacuum Technology & Coating

Pulsed laser deposition

  • 2.
    P ulsed laser deposition (PLD), also sometimes referred as laser evaporation, laser assisted deposition, laser ablation deposition, and laser molecular beam epitaxy (laser-MBE), is an inexpensive, flexible, and user-friendly thin film growth tech- nique [1]. Introduced in the 60-th [2], it attracted attention in the 80-th due to the raised interest in the growth of high-temperature superconducting oxides, such as YBa2Cu3O7 (YBCO). Here, it was essential to achieve stoichiometric transfer at high oxygen pressure in order to synthesize high quality films. Even the first at- tempts of thin film fabrication of this complex oxide with PLD were successful [3] making this technique extremely popular. Since then PLD was used to grow oxides [4], nitrides [5], chalco- genide glasses [6], and metals [7]. Even nanocrystalline diamond and SiC films were deposited using PLD [8,9]. PLD also witnessed significant technical innovations and improvements resulting in the development of advanced combinatorial PLD [10] and laser MBE [11] systems. PLD, unlike many other deposition techniques, is based on the very intuitive principles. A high-power pulsed laser is focused on the target positioned in the vacuum chamber, as shown in Figure 1. The target is ablated after each pulse forming a plume Figure 1. The schematics of the PLD system. PLD chamber is equipped with the substrate heater and a carousel housing a number of targets. Laser beam is rastered over the target surface for better film uniformity. 59
  • 3.
    film composition mimicscomposition of the target and complex alloys, such as superconducting (YBa2Cu3O7), ferroelectric (Ba0.6Sr0.4TiO3), and multiferroic (By2FeCrO6) oxides, can be grown without the need of individual atomic flux calibration. In addition, use of external energy source (laser) allows film growth both in the high-vacuum conditions and in the mTorr pressure range. If the proper pumping and exhaust system is available, corrosive gases (ozone), and reactive atmospheres (H2, H2S, and CH4) can be used. Clearly, PLD is one of the most flexible thin film growth techniques. In spite of the sound simplicity, laser – target interaction and material transfer are rather complicated processes. They can be separated in a few steps, as shown in Figure 4. First, laser beam is focused onto the surface of the target. Due to the high power (∼ 1 J per pulse) and short duration (∼ 30 ns) of the pulse, surface of the target is rapidly heated above evaporation temperature. Figure 2. The photograph of the PLD system built by PVD Products Inc. of atoms, molecules, and particulates directed towards the heated substrate located a few centimeters away of it. The species con- dense at the substrate surface resulting in the film growth. This technique requires only the use of a pulsed (Nd:YAG, ruby, or ex- cimer) laser and a basic 8” – 16” spherical or box vacuum cham- ber evacuated by the diffusion or turbomolecular pump. If epitaxial growth of multilayered structures is desired, chamber is equipped with the rotatable multi-target carousel (with three 2” or six 1” targets) and a substrate heater. Since such system can be built on a limited budget, PLD became extremely popular for ac- ademic research. In addition, a number of companies (AMBP Tech, DCA Instruments, PVD Products Inc., Pascal Technologies Inc., and SVT Associates) recently entered the market historically dominated by a single pioneer company (Neocera Inc.) driving the prices of the turn-key systems, similar to shown in Figure 2, Figure 3. The schematics of the PLD system with the laser beam shared between four deposition chambers. significantly down. PLD has a number of advantages when compared with other deposition techniques. Similar to sputtering and e-beam evapo- ration, growth is performed in the vacuum environment mini- mizing unintentional impurity incorporation. Different compo- sitions of the same alloy as well as different materials can be de- posited in the same chamber with the only necessity to switch the targets. If there is a problem of cross-contamination, laser (the most expansive part of the system) can be shared between a few deposition chambers, as shown in Figure 3, just slightly increas- ing the total system cost. Relatively high deposition rates, typically ∼100s Å/min, can be achieved with the film thickness being con- trolled in real time by simply turning the laser on and off. There- fore, both multi-micrometer thick and a few nanometer thin films can be deposited. In addition, if the chamber is equipped with a carousel housing a number of targets, multilayered structures can be grown without the need to break vacuum when changing be- Figure 4. The schematic diagram of the absorption and the ejection tween materials. processes during the PLD. A) Photo-absorption followed by rapid Nearly stoichiometric material transfer, due to the congruent heating of the surface layer; B) Surface melting and vaporization; C) evaporation of the elements and compounds irrespective of their Formation and expansion of atomic plume; D) Plume expansion at low evaporating points, is another important advantage of PLD. Thus, pressures; E) Plume expansion at high pressures. 60 vtcmag@optonline.net July 2008 • Vacuum Technology & Coating
  • 4.
    highly energetic ions(100 eV-500 eV) and low energetic atoms (10–50 eV). The high-energy fraction expands much faster reach- ing the substrate first. When the high-energy ions hit the substrate, they transfer kinetic energy activating diffusion of the surface atoms, implanting atoms into the substrate, and re-sputtering substrate atoms, as shown in Figure 5a. Next, re-sputtered substrate atoms collide with the stream of slower-expanding target atoms with lower kinetic energy. A high-temperature colli- sion region characterized by high plasma and particle density forms above the substrate, as shown in Figure 5b. Processes of thermalization, condensation, and cluster formation start in this region diminishing plasma density and finally dissolving the layer. Finally, target atoms with the lowest kinetic energy (∼ 10 eV) reach the substrate without interaction with the re-sputtered substrate atoms, as shown in Figure 5c. Therefore, film nucleation occurs under the heavy supersatu- ration and the growth conditions are fare from the thermodynamic equilibrium. The process can be separated into three steps: a) High-energy ion implantation, surface diffusion activation, and re-sputtering; b) Cluster condensation from the collision zone; c) Adsorption of the low-energy ablated species. These steps are repeated after each laser pulse. While the high degree of supersaturation favors two-dimensional (2D) nucleation of highly dense and small clusters, high kinetic energy of arriving species activates surface migration promoting layer-by-layer film Figure 5. The schematic diagram of the plasma plume-substrate growth. Thus, films obtained by PLD are usually dense, exhibit interaction high degree of texture, and demonstrate good adhesion proper- Evaporating material forms a dense vapor layer above it. Laser ties. These properties are desirable both for the electronic materi- beam interacts with the evaporated material dissociating molec- als and optical or tribological coatings. ular species desorbed from the target. Photoionization (via the In spite of these advantages, a few shortcomings stalled broad non-resonant multiphoton processes) causes plasma formation. industrial application of PLD. First, sub-surface boiling, expul- Once formed, plasma attenuates laser beam by inelastic free elec- sion of the liquid layer by shock wave pressure recoil, and tron scattering preventing further interaction between the laser exfoliation lead to the target splashing and particulate deposition. beam and the target. These particulates vary in size from below hundred nanometers to Due to the pressure differential, plasma expands from the tar- a few micrometers. They greatly affect growth of the subsequent get surface forming the ''plasma plume". Internal thermal and ion- layers, degrade electrical properties of the films, and produce films ization energies are converted into the kinetic energy reaching a with the rough surface. Second, plasma plume has a very narrow few hundred electron volts (eV). The kinetic energy of the species angular distribution, which can be fitted by a cosnϕ curve (4 < n and the spatial distribution of the plume strongly depend on the < 10 depending on the deposition pressure), resulting in the chamber pressure. In general: non-uniform wafer coverage. Although this was not important for academic research where 5×5 mm2 substrates were routinely used, a) The plume is very narrow and forward directed at low pres- it made problematic industrial application where 4” wafer had to sures (10-5 - 10-4 Torr). The kinetic energy of the species is be handled. preserved since almost no scattering with the background gas However, these problems were mostly solved in the last years occurs. by the joint efforts of a number of research groups. b) Splitting of the high energy ions from the less energetic It was shown that particulates, which have much lower veloc- species increases in the intermediate pressure range (1 - 10 ities than the atomic and ionic species, can be removed from mTorr). The kinetic energy of the high energy ions is partially the plume using a mechanical velocity filter [12]. More elaborate attenuated by the multiple collisions with the background gas. techniques involving collisions between two plasma plumes c) Diffusion-like expansion of the ablated material occurs at (cross-beam PLD) [13], magnetic field filtering [14], and higher pressures (> 0.1 Torr). High energy ions loose energy positioning the substrate edge-on inside the plume (off-axis through the multiple scattering processes. deposition) instead of being directly perpendicular to it (on-axis deposition) [15] were also developed. As was previously mentioned, plasma plume consists of both A few schemes were implicated to improve film uniformity. Vacuum Technology & Coating • July 2008 www.vactechmag.com or www.vtcmag.com 61
  • 5.
    Figure 6. Principleof the multi-beam pulsed laser deposition approach Figure 7. The schematics of the multi-beam PLD integrated with the (insert) and deviation of the deposition rate of TiCxN1−x over the de- commercial MBE system [20]. posited area [17]. 2. H. M. Smith and A. F. Turner, Appl. 0pt., 4 147 (1965). Rastering of the laser beam over the rotating target, which was 3. D. Dijkkamp, T. Venkatesan, X. D. Wu, S. A. Shaheen, N. Jasrawi,Y. performed using a programmable kinematic mount installed on H. Min-Lee, W. L. McLean and M. Croft, Appl. Phys. Lett., 51, 619 the last mirror of the optical train, allowed deposition of the films (1987). with the uniform coverage over the large wafer areas [16]. Other 4. T. Venkatesan, K. S. Harshavardhan, M. Strikovski, J. Kim in “Thin Films and Heterostructures for Oxide Electronics” edited by S. B. approaches included tilting of the rotating target during the laser Ogale, Springer, (2005). ablation, off-axis deposition, and positioning of the target with 5. G. Leggieri, A. P. Caricato, M. Fernandez, M. Martino, P. Mengucci, the center of the plasma plume being slightly offset from the cen- G. Barucca, Recent Research Developments in Applied Physics, 5, ter of the rotating substrate. In addition, a multi-beam PLD tech- 339 (2002). nique produced films with a very low thickness deviation (∼ 5%) 6. M. Frumar, B. Frumarova, P. Nemec, T. Wagner, J. Jedelsky, M. over the 4” wafers. In this case, three laser beams were focused on Hrdlicka, J. Non-Crystalline Solids, 352, 544 (2006). the same target and the improved uniformity was achieved by the 7. A. J. Francis and P. A. Salvador, J. Mat. Res., 22, 89 (2007). optimized superposition of the generated plasma plumes, as 8. A. Keffous, K. Bourenane, M. Kechouane, N. Gabouze, T. Kerdja, shown in Figure 6 [17, 18]. Vacuum, 81, 632 (2007). Multilayered coatings were deposited on the 4” wafers using 9. T. Hara, T. Yoshitake, T. Fukugawa, L. Y. Zhu, M. Itakura, N. multi-beam PLD combined with the standard MBE into a novel Kuwano, Y. Tomokiyo, K. Nagayama, Diamond and Related Mate- rials, 13, 679 (2004). hybrid beam deposition [19,20]. The growth system was equipped 10. M. Lippmaa, T. Koida, H. Minami, Z. W. Jin, M. Kawasaki, H. both with the effusion cells and multi-target carousel, quarts crys- Koinuma, Appl. Surf. Sci., 189, 205 (2002). tal monitor for flux calibration, ellipsometer and Reflective High 11. H. Koinuma, M. Kawasaki, M. Yoshimoto, Mat. Res. Soc. Symp. Energy Electron Diffraction (RHEED) for in-situ monitoring, as Proc., 474, 303 (1997). shown in Figure 7. Highly p-type doped ZnO, which is extremely 12. T.Yoshitake, G. Shiraishia, K. Nagayama, Appl. Surf. Sci., 197, 379 difficult to produce with other techniques, was also grown using (2002). this technique [21]. While the ceramic target was used as a ZnO 13. A. Tselev, A. Gorbunov, W. Pompe, Rev. Sci. Instrum., 72, 2665 source, effusion cell was used to deliver Arsenic (p-type dopant) (2001). and RF-plasma source was used to efficiently increase the flux 14. R. Jordan, D. Cole, J. G. Lunney, Appl. Surf. Sci., 109, 403 (1997). density of available reactive oxygen. Hybrid beam deposition, al- 15. Z. Trajanovic, L. Senapati, R.P. Sharma, T. Venkatesan, Appl. Phys. though lacking the simplicity of standard PLD, provides a real al- Lett., 66, 2418 (1995). 16. S. Boughaba, M. Islam, J. P. McCaffrey, G. I. Sproule, M. J. Graham, ternative to the conventional vacuum deposition techniques. Thin Solid Films, 371, 119 (2000). Clearly, PLD has very exciting prospects and offers number of 17. J. M. Lackner, W. Waldhauser, R. Ebner, B. Major, Surf. Coat. Tech- advantages over traditional vacuum deposition techniques like nol., 188, 519 (2005). chemical vapor deposition, sputtering and e-beam evaporation. 18. J. M. Lackner, Thin Solid Films, 494, 302 (2006) Since the problems of particulate deposition and non-uniform 19. M. Panzner, R. Dietsch, Th. Holz, H. Mai, S. Vdlmar, Appl. Surf. wafer coverage are mostly solved, broader industrial application Sci., 96, 643 (1996). of PLD is expected 20. M. Panzner, R. Dietsch, Th. Holz, H. Mai, S. Vdlmar, B. Wehner, Appl. Surf. Sci., 127, 451 (1997). References 21. Y. R. Ryu, T. S. Lee, H. W. White, J. Crystal Growth, 261, 4, 502 (2004). 1. “Pulsed Laser Deposition of Thin Films” edited D. B. Chrisey and G. K. Hubler, Wiley-Interscience (1994). 62 vtcmag@optonline.net July 2008 • Vacuum Technology & Coating