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Properties of MBE-Grown ZnBeSe: Study
of Be Isoelectronic Traps and of Dopant Behavior
I.L. Kuskovsky1
Þ (a), Y. Gu (a), M. van der Voort (a), C. Tian (a), B. Kim (a),
I.P. Herman (a), G.F. Neumark (a), S.P. Guo (b), O. Maksimov (b),
and M.C. Tamargo (b)
(a) Department of Applied Physics and Applied Mathematics, Columbia University,
New York, NY 10027, USA
(b) Chemistry Department, City College of CUNY, New York, NY 10007, USA
(Received July 27, 2001; accepted September 30, 2001)
Subject classification: 71.35.–y; 71.55.Gs; 78.55.Et; 78.66.Hf; S8.12
In this paper we present studies on undoped, Cl-doped, and N-doped ZnBeSe using photolumines-
cence (PL). We show that the dominant PL from undoped samples is ‘‘effective mass” type and
suggest that it is of isoelectronic origin. We also show that the binding energy of both donor and
acceptor impurities increases with Be concentration.
Introduction II–VI wide bandgap semiconductors are of high interest for fabricating
devices emitting light in the green and blue spectral regions. However, such devices
have short ‘‘lifetimes” [1]. The use of Be in ZnSe based alloys (i.e. Zn1ÀxBexSe ternary
alloy) has been suggested [2] to improve the hardness of the material [3, 4], and as a
result the device lifetime. In this paper we present PL studies of both undoped and
doped ZnBeSe that shed some light on the nature of the luminescent transitions of
these materials.
Undoped ZnBeSe Our samples are nominally undoped, grown by molecular beam
epitaxy (MBE). For the details of the growth procedure see Guo et al. [5]. The domi-
nant feature in all samples consists of a strong, fairly sharp line (sometimes consisting
of two peaks, with a splitting less than 3 meV) in the near band edge region with
several weaker lines on the low-energy side, and, at least in samples with less than 6%
Be, two lines on the high-energy side [6]. (Samples with Be concentrations higher than
6% do not show these two peaks due to larger lattice mismatch.) We attributed the
dominant line to bound excitons, the peaks on the low energy side to phonon replicas
of the main peak(s), and the high energy peaks to free excitons [6], with their location
giving the excitonic bandgap.
To further understand the possible origin of the dominant PL features, we performed
PL temperature (T) and pressure (P) studies. We plot in Figs. 1a and b the peak en-
ergy as a function of temperature and pressure, respectively. The temperature depen-
dence was fitted to Varshni’s formula, EðTÞ ¼ Eð0Þ À aPLT2
=ðbPL þ TÞ (see Ref. [7]),
giving aPL ¼ 9:0 Â 10À4
eV/K and bPL ¼ 365K, which are very close to values obtained
earlier for the ZnSe [8, 9] bandgap. The pressure dependence was fitted to a quadratic
formula, EðPÞ ¼ Eð1 atmÞ þ aPP þ bPP2
, where aP and bP are the linear and quadratic
phys. stat. sol. (b) 229, No. 1, 239–243 (2002)
# WILEY-VCH Verlag Berlin GmbH, 13086 Berlin, 2002 0370-1972/02/22901-0239 $ 17.50þ.50/0
1
) Corresponding author; Tel.: 1-212-854-1580; Fax: 1-212-854-8257; e-mail: ik29@clumbia.edu
pressure coefficients, respectively. This resulted in aP ¼ 6:61 meV/kbar and
bP ¼ À1:1 Â 10À2
meV/(kbar)2
, i.e. values which are very close to those obtained for
the pressure shift of the ZnSe bandgap [10, 11]. These two observations mean that the
defect responsible for the PL is of ‘‘effective mass” nature, since it is well known that
in the ‘‘effective mass” approximation all relevant states are formed from the band
wavefunctions and, thus, all energy levels follow the band edge with temperature and
pressure.
Thus, both temperature and pressure studies show ‘‘effective mass” behavior, even
though the exciton has a larger ionization energy. According to Ref. [12] ZnBeSe is a
completely miscible system and we do not believe that the same atom can both change
the bandgap and also create a localized level. Thus, we suggest that a complex of Be
introduces an isoelectronic trap, and therefore the observed PL is due to isoelectronic
bound excitons. Since the Be atom is substantially smaller than Zn, it is quite probable
that Be will introduce a short-range potential which would lead to the formation of an
isoelectronic trap [13]. Moreover, since the ionization energy of Be is slightly smaller
than that of Zn, according to the theory of Hopfield et al. [14] this would lead to
having the trap capturing a hole first, with an electron subsequently captured via the
Coulomb attraction, i.e. there is formation of an isoelectronic donor. Such a donor is
expected to be effective mass like [14], and the observed effective mass behavior in our
experiments confirms that this is indeed the case.
Doped ZnBeSe Figure 2 shows PL data from three typical ZnBeSe:Cl samples. It is
plausible to assume that the observed PL is due to neutral donor (Cl) bound excitons.
It is interesting to compare the peak positions of the bound excitonic line with reported
ZnBeSe bandgap values. There are several reports on the dependence of the ZnBeSe
direct bandgap, e.g. [15] or the excitonic bandgap, e.g. [6, 12, 16] on Be concentration.
(We would like to note that the data in Ref. [12] are referred to as the bandgap; how-
ever, the ZnSe data-point of 2.80 eV clearly suggests that the obtained dependence
provides the excitonic bandgap.) In Refs. [12, 16] similar dependences of the bandgap
on composition of 23 and 24 meV per %, respectively, were reported. In Ref. [15] the
bandgap values were obtained at room temperature via absorption experiments and
have only four data-points. The best fit of these data can be obtained if a quadratic
240 I.L. Kuskovsky et al.: Properties of MBE-Grown ZnBeSe: Isoelectronic Traps
Fig. 1. Peak position of the domi-
nant PL from undoped ZnBeSe
as a function of a) temperature;
b) pressure
dependence on the Be composition is assumed. Similarly, a quadratic dependence was
reported in Ref. [6].
Since Refs. [15, 16] pertain to bulk crystals, for our comparison we shall use only
data from Refs. [6, 12] corrected for the binding energy of the ZnSe free exciton
(20 meV).
The peak position for the sample with 1% Be is about 2:827 eV, while the corre-
sponding bandgap values are 2:845 eV with use of [12] and 2:857 eV with [6]. Thus, the
PL peak is below the edge of the bandgap by 18 meV if we use Ref. [12] and by
30 meV if we use Ref. [6]. Clearly, 18 meV is an unrealistic number since it is smaller
than the free exciton binding energy (20 meV in ZnSe); on the other hand, 30 meV
seems quite realistic (the position of the Cl bound exciton is 25–26 meV below the
ZnSe band edge); moreover, one expects an increase of the excitonic binding energy in
ZnBeSe due to a decrease of the dielectric function. Indeed, the binding energy of a
hydrogenic impurity would increase as the dielectric constant decreases with the in-
crease of the bandgap due to the higher Be concentration. (A simple theory, see e.g.
[17], predicts that dielectric constant decreases as a square of the bandgap.) When we
consider the 3:3% Be sample, the peak here is at 2:877 eV while the bandgaps values
reported are 2:898 eV [12] and 2:916 eV [6]. Again, the separation calculated using the
first value is 21 meV, which appears too small, while the second value gives 40 meV,
which we believe is more likely. (Both approaches give a larger binding energy for the
2:7% Be sample, which admittedly we find puzzling.)
We, however, note that the range of our data is for samples with relatively low Be
concentrations, since at higher Be content the binding energy of free excitons is ex-
pected to increase, and the observed bending [6] of the excitonic bandgap would not
represent a real bandgap value. Thus we suggest that an extension of this investigation
toward higher Be content material is needed.
Next we show in Fig. 3a low temperature PL from a typical uniformly doped
Zn0:966Be0:034Se:N sample at different excitation intensities (normalized and shifted
along intensity axis for convenience). The high excitation intensity spectrum consists of
a dominant peak at 2:769 eV and a shoulder at 2:746 eV as well as a small high energy
peak at 2:844 eV. It is clear that the peak at 2:746 eV is not a phonon replica of the
phys. stat. sol. (b) 229, No. 1 (2002) 241
Fig. 2. Low temperature PL from
three ZnBeSe:Cl samples; the in-
set show the peak position as a
function of Be concentration for
all investigated samples
dominant transition as it does not scale with the intensity of the 2:769 eV peak; more-
over, it becomes dominant at lower excitation intensities. In Fig. 3b we show the energy
difference between the dominant peak energy and the bandgap calculated according to
Refs. [6] and [12]. In both cases the binding energies of the relevant impurities increase
with Be content. This corresponds to hydrogenic nature of the impurities as has already
been mentioned above. Note that in the similar case of ZnMgSe:N such a behavior
was not observed, but rather several discrete values for N acceptor were reported, de-
pending on the number of surrounding Mg atoms [19].
If we extrapolate these data to ZnSe values we obtain the following values: 81 meV
if we use Ref. [12] and 105 meV if we use Ref. [6]. We note that previously this PL was
attributed to a donor–acceptor pair (DAP) recombination [6, 18]. Therefore, we can
estimate a sum of the activation energies of acceptors and donors, EA þ EDð Þ, by add-
ing to the above values the Coulomb shift. We take a Coulomb shift of about 25 meV,
which is appropriate for a shallow donor in ZnSe [20]. With this Coulomb shift we
obtain EA þ EDð Þ % 106 meV, using Ref. [12] and EA þ EDð Þ % 130 meV, using Ref. [6]. It
is clear that the latter values are closer to those expected for ZnSe ( EA þ EDð Þ % 137 meV
for a 111 meV acceptor and a 26 meV donor).
Therefore, giving the results for Cl and N doped samples, the bandgap values re-
ported in Ref. [12] seem too low to explain the observed PL, at least in the case of low
Be concentrations. We, therefore, postulate that the bandgap of ZnBeSe first increases
superlinearly, but then it may well become a linear function of Be concentration, as
reported elsewhere [12].
Summary We have investigated the behavior of undoped and doped ZnBeSe alloy
system with Be concentrations less than 6%. We have found that the dominant radia-
tive transition in undoped material is of isoelectronic nature. Also, from a donor bound
excitonic PL as well as a lower energy DAP band, we conclude that the impurity activa-
tion energies increase with Be concentration according to the ‘‘effective mass” approx-
imation. Our data also suggest that the behavior of ZnBeSe bandgap as a function of
Be composition requires further investigation.
242 I.L. Kuskovsky et al.: Properties of MBE-Grown ZnBeSe: Isoelectronic Traps
Fig. 3. a) Intensity dependence of
the PL from a typical ZnBeSe:N
sample; b) energy separation of
the dominant peak from the band-
gap calculated using Ref. [6] (cir-
cles) and Ref. [12] (triangles)
Acknowledgement We would like to acknowledge support from NSF (grant # DMR-
98-05760) for this work.
References
[1] S. Itoh, K. Nakano, and A. Ishibashi, J. Cryst. Growth 214/215, 1029 (2000).
[2] A. Waag, Th. Litz, F. Fischer, H.-J. Lugauer, T. Baron, K. Schull, U. Zehnder, T. Gerhard,
U. Lunz, M. Keim, G. Reuscher, and G. Landwehr, J. Cryst. Growth 184/185, 1 (1998).
[3] C. Verie, J. Cryst. Growth 184/185, 1061 (1998).
[4] K. Maruyama, K. Suto, and J.-I. Nishizawa, J. Cryst. Growth 214/215, 104 (2000).
[5] S. P. Guo, Y. Luo, W. Lin, O. Maksimov, M. C. Tamargo, I. Kuskovsky, C. Tian, and G. F.
Neumark, J. Cryst. Growth 208, 205 (2000).
[6] I. Kuskovsky, C. Tian, G.F. Neumark, S.P. Guo, and M.C. Tamargo, J. Cryst. Growth 214/215,
1058 (2000).
[7] Y.P. Varshni, Physica 34, 149 (1967).
[8] Y. Shirakawa and H. Kukimoto, J. Appl. Phys. 51, 2014 (1980).
[9] K.A. Bowers, Z. Yu, K.J. Gossett, J.W. Cook, Jr., and J.F. Schetzina, J. Electron. Mater. 23,
251 (1994).
[10] J.A. Tuchman, S. Kim, Z. Sui, and I.P. Herman, Phys. Rev. B 46, 13371 (1992).
[11] M. Ming Li, D. J. Strachan, T. Ritter, M. Tamargo, and B. A. Weinstein, Phys. Rev. B 50,
4385 (1994).
[12] C. Chauvet, E. Tournie´, and J.P. Faurie, J. Cryst. Growth 214/215, 95 (2000).
[13] W. Allen, J. Phys. C 4, 1936 (1971).
[14] J.J. Hopfield, D.G. Thomas, and R.T. Lynch, Phys. Rev. Lett. 17, 312 (1966).
[15] J. Zakrzewski, F. Firszt, S. Łegowski, H. Meczyn´ska, B. Sekulska, J. Szatkowski, and W. Pasz-
kowicz, Microelectron. J. 31, 821 (2000).
[16] A. Bakaluk, A.A. Wronkowska, A. Wronkowski, H. Arwin, F. Firszt, S. Łegowski, H. Mec-
zyn´ska, and J. Szatkowski, Appl. Surf. Sci. 175/176, 531 (2001).
[17] J.M. Ziman, Principles of the Theory of Solids, Cambrifdge University Press, Cambridge 1965.
[18] E. Tournie and J.-P. Fourie, Appl. Phys. Lett. 75, 382 (1999).
[19] C. Morhain, D. Seghier, B. Vo¨gele, C. O’Donnell, K.A. Prior, B.C. Cavenett, and H.P. Gislason,
J. Cryst. Growth 214/215, 482 (2000).
[20] G.F. Neumark, L. Radomsky, and I. Kuskovskiy, Proc. SPIE 2346, 159 (1994).
phys. stat. sol. (b) 229, No. 1 (2002) 243
Properties of MBE-Grown ZnBeSe: Study of Be Isoelectronic Traps and of Dopant Behavior

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Properties of MBE-Grown ZnBeSe: Study of Be Isoelectronic Traps and of Dopant Behavior

  • 1. Properties of MBE-Grown ZnBeSe: Study of Be Isoelectronic Traps and of Dopant Behavior I.L. Kuskovsky1 Þ (a), Y. Gu (a), M. van der Voort (a), C. Tian (a), B. Kim (a), I.P. Herman (a), G.F. Neumark (a), S.P. Guo (b), O. Maksimov (b), and M.C. Tamargo (b) (a) Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY 10027, USA (b) Chemistry Department, City College of CUNY, New York, NY 10007, USA (Received July 27, 2001; accepted September 30, 2001) Subject classification: 71.35.–y; 71.55.Gs; 78.55.Et; 78.66.Hf; S8.12 In this paper we present studies on undoped, Cl-doped, and N-doped ZnBeSe using photolumines- cence (PL). We show that the dominant PL from undoped samples is ‘‘effective mass” type and suggest that it is of isoelectronic origin. We also show that the binding energy of both donor and acceptor impurities increases with Be concentration. Introduction II–VI wide bandgap semiconductors are of high interest for fabricating devices emitting light in the green and blue spectral regions. However, such devices have short ‘‘lifetimes” [1]. The use of Be in ZnSe based alloys (i.e. Zn1ÀxBexSe ternary alloy) has been suggested [2] to improve the hardness of the material [3, 4], and as a result the device lifetime. In this paper we present PL studies of both undoped and doped ZnBeSe that shed some light on the nature of the luminescent transitions of these materials. Undoped ZnBeSe Our samples are nominally undoped, grown by molecular beam epitaxy (MBE). For the details of the growth procedure see Guo et al. [5]. The domi- nant feature in all samples consists of a strong, fairly sharp line (sometimes consisting of two peaks, with a splitting less than 3 meV) in the near band edge region with several weaker lines on the low-energy side, and, at least in samples with less than 6% Be, two lines on the high-energy side [6]. (Samples with Be concentrations higher than 6% do not show these two peaks due to larger lattice mismatch.) We attributed the dominant line to bound excitons, the peaks on the low energy side to phonon replicas of the main peak(s), and the high energy peaks to free excitons [6], with their location giving the excitonic bandgap. To further understand the possible origin of the dominant PL features, we performed PL temperature (T) and pressure (P) studies. We plot in Figs. 1a and b the peak en- ergy as a function of temperature and pressure, respectively. The temperature depen- dence was fitted to Varshni’s formula, EðTÞ ¼ Eð0Þ À aPLT2 =ðbPL þ TÞ (see Ref. [7]), giving aPL ¼ 9:0 Â 10À4 eV/K and bPL ¼ 365K, which are very close to values obtained earlier for the ZnSe [8, 9] bandgap. The pressure dependence was fitted to a quadratic formula, EðPÞ ¼ Eð1 atmÞ þ aPP þ bPP2 , where aP and bP are the linear and quadratic phys. stat. sol. (b) 229, No. 1, 239–243 (2002) # WILEY-VCH Verlag Berlin GmbH, 13086 Berlin, 2002 0370-1972/02/22901-0239 $ 17.50þ.50/0 1 ) Corresponding author; Tel.: 1-212-854-1580; Fax: 1-212-854-8257; e-mail: ik29@clumbia.edu
  • 2. pressure coefficients, respectively. This resulted in aP ¼ 6:61 meV/kbar and bP ¼ À1:1 Â 10À2 meV/(kbar)2 , i.e. values which are very close to those obtained for the pressure shift of the ZnSe bandgap [10, 11]. These two observations mean that the defect responsible for the PL is of ‘‘effective mass” nature, since it is well known that in the ‘‘effective mass” approximation all relevant states are formed from the band wavefunctions and, thus, all energy levels follow the band edge with temperature and pressure. Thus, both temperature and pressure studies show ‘‘effective mass” behavior, even though the exciton has a larger ionization energy. According to Ref. [12] ZnBeSe is a completely miscible system and we do not believe that the same atom can both change the bandgap and also create a localized level. Thus, we suggest that a complex of Be introduces an isoelectronic trap, and therefore the observed PL is due to isoelectronic bound excitons. Since the Be atom is substantially smaller than Zn, it is quite probable that Be will introduce a short-range potential which would lead to the formation of an isoelectronic trap [13]. Moreover, since the ionization energy of Be is slightly smaller than that of Zn, according to the theory of Hopfield et al. [14] this would lead to having the trap capturing a hole first, with an electron subsequently captured via the Coulomb attraction, i.e. there is formation of an isoelectronic donor. Such a donor is expected to be effective mass like [14], and the observed effective mass behavior in our experiments confirms that this is indeed the case. Doped ZnBeSe Figure 2 shows PL data from three typical ZnBeSe:Cl samples. It is plausible to assume that the observed PL is due to neutral donor (Cl) bound excitons. It is interesting to compare the peak positions of the bound excitonic line with reported ZnBeSe bandgap values. There are several reports on the dependence of the ZnBeSe direct bandgap, e.g. [15] or the excitonic bandgap, e.g. [6, 12, 16] on Be concentration. (We would like to note that the data in Ref. [12] are referred to as the bandgap; how- ever, the ZnSe data-point of 2.80 eV clearly suggests that the obtained dependence provides the excitonic bandgap.) In Refs. [12, 16] similar dependences of the bandgap on composition of 23 and 24 meV per %, respectively, were reported. In Ref. [15] the bandgap values were obtained at room temperature via absorption experiments and have only four data-points. The best fit of these data can be obtained if a quadratic 240 I.L. Kuskovsky et al.: Properties of MBE-Grown ZnBeSe: Isoelectronic Traps Fig. 1. Peak position of the domi- nant PL from undoped ZnBeSe as a function of a) temperature; b) pressure
  • 3. dependence on the Be composition is assumed. Similarly, a quadratic dependence was reported in Ref. [6]. Since Refs. [15, 16] pertain to bulk crystals, for our comparison we shall use only data from Refs. [6, 12] corrected for the binding energy of the ZnSe free exciton (20 meV). The peak position for the sample with 1% Be is about 2:827 eV, while the corre- sponding bandgap values are 2:845 eV with use of [12] and 2:857 eV with [6]. Thus, the PL peak is below the edge of the bandgap by 18 meV if we use Ref. [12] and by 30 meV if we use Ref. [6]. Clearly, 18 meV is an unrealistic number since it is smaller than the free exciton binding energy (20 meV in ZnSe); on the other hand, 30 meV seems quite realistic (the position of the Cl bound exciton is 25–26 meV below the ZnSe band edge); moreover, one expects an increase of the excitonic binding energy in ZnBeSe due to a decrease of the dielectric function. Indeed, the binding energy of a hydrogenic impurity would increase as the dielectric constant decreases with the in- crease of the bandgap due to the higher Be concentration. (A simple theory, see e.g. [17], predicts that dielectric constant decreases as a square of the bandgap.) When we consider the 3:3% Be sample, the peak here is at 2:877 eV while the bandgaps values reported are 2:898 eV [12] and 2:916 eV [6]. Again, the separation calculated using the first value is 21 meV, which appears too small, while the second value gives 40 meV, which we believe is more likely. (Both approaches give a larger binding energy for the 2:7% Be sample, which admittedly we find puzzling.) We, however, note that the range of our data is for samples with relatively low Be concentrations, since at higher Be content the binding energy of free excitons is ex- pected to increase, and the observed bending [6] of the excitonic bandgap would not represent a real bandgap value. Thus we suggest that an extension of this investigation toward higher Be content material is needed. Next we show in Fig. 3a low temperature PL from a typical uniformly doped Zn0:966Be0:034Se:N sample at different excitation intensities (normalized and shifted along intensity axis for convenience). The high excitation intensity spectrum consists of a dominant peak at 2:769 eV and a shoulder at 2:746 eV as well as a small high energy peak at 2:844 eV. It is clear that the peak at 2:746 eV is not a phonon replica of the phys. stat. sol. (b) 229, No. 1 (2002) 241 Fig. 2. Low temperature PL from three ZnBeSe:Cl samples; the in- set show the peak position as a function of Be concentration for all investigated samples
  • 4. dominant transition as it does not scale with the intensity of the 2:769 eV peak; more- over, it becomes dominant at lower excitation intensities. In Fig. 3b we show the energy difference between the dominant peak energy and the bandgap calculated according to Refs. [6] and [12]. In both cases the binding energies of the relevant impurities increase with Be content. This corresponds to hydrogenic nature of the impurities as has already been mentioned above. Note that in the similar case of ZnMgSe:N such a behavior was not observed, but rather several discrete values for N acceptor were reported, de- pending on the number of surrounding Mg atoms [19]. If we extrapolate these data to ZnSe values we obtain the following values: 81 meV if we use Ref. [12] and 105 meV if we use Ref. [6]. We note that previously this PL was attributed to a donor–acceptor pair (DAP) recombination [6, 18]. Therefore, we can estimate a sum of the activation energies of acceptors and donors, EA þ EDð Þ, by add- ing to the above values the Coulomb shift. We take a Coulomb shift of about 25 meV, which is appropriate for a shallow donor in ZnSe [20]. With this Coulomb shift we obtain EA þ EDð Þ % 106 meV, using Ref. [12] and EA þ EDð Þ % 130 meV, using Ref. [6]. It is clear that the latter values are closer to those expected for ZnSe ( EA þ EDð Þ % 137 meV for a 111 meV acceptor and a 26 meV donor). Therefore, giving the results for Cl and N doped samples, the bandgap values re- ported in Ref. [12] seem too low to explain the observed PL, at least in the case of low Be concentrations. We, therefore, postulate that the bandgap of ZnBeSe first increases superlinearly, but then it may well become a linear function of Be concentration, as reported elsewhere [12]. Summary We have investigated the behavior of undoped and doped ZnBeSe alloy system with Be concentrations less than 6%. We have found that the dominant radia- tive transition in undoped material is of isoelectronic nature. Also, from a donor bound excitonic PL as well as a lower energy DAP band, we conclude that the impurity activa- tion energies increase with Be concentration according to the ‘‘effective mass” approx- imation. Our data also suggest that the behavior of ZnBeSe bandgap as a function of Be composition requires further investigation. 242 I.L. Kuskovsky et al.: Properties of MBE-Grown ZnBeSe: Isoelectronic Traps Fig. 3. a) Intensity dependence of the PL from a typical ZnBeSe:N sample; b) energy separation of the dominant peak from the band- gap calculated using Ref. [6] (cir- cles) and Ref. [12] (triangles)
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