SPICE MODEL of L308CC in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: PIN Diode
PART NUMBER: L308CC
MANUFACTURER: Litec Corporation
Bee Technologies Inc.
All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

2. PSpice model
Model description
parameter
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

3. Forward Current Characteristic
Circuit Simulation Result
100mA
10mA
1.0mA
100uA
0.4V 0.6V 0.8V 1.0V 1.2V
I(R1)
V_V1
Evaluation Circuit
R1
0.01m
V1 U1
0Vdc
L308CC
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

4. Comparison Graph
Circuit Simulation Result
Simulation Result
VF(V)
IF(mA) Error(%)
Measurement Simulation
0.100 0.550 0.550 0.000
0.200 0.585 0.585 0.000
0.500 0.630 0.633 0.476
1.000 0.670 0.671 0.149
2.000 0.707 0.706 -0.141
5.000 0.755 0.754 -0.132
10.000 0.790 0.790 0.000
20.000 0.825 0.825 0.000
50.000 0.875 0.874 -0.114
100.000 0.908 0.909 0.110
All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

5. Junction Capacitance Characteristic
Circuit Simulation Result
10p
1.0p
100f
10f
100mV 1.0V 10V 100V
I(V2)/(50V/1us)
V(N00033)
Evaluation Circuit
V2
0Vdc
V2 = 50 V1 U1
TD = 0 L308CC
V1 = 0
TR = 1us
PW = 50us
TF = 10ns
PER = 10us
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

6. Comparison Graph
Circuit Simulation Result
Simulation Result
Ct(pF)
VR+0.65(V) Error(%)
Measurement Simulation
1.650 1.397 1.397 0.036
2.650 1.396 1.396 0.000
5.650 1.350 1.351 0.074
10.650 1.300 1.301 0.077
20.650 1.200 1.201 0.083
30.650 1.130 1.106 -2.124
All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

7. Reverse Characteristic
Circuit Simulation Result
1.0uA
100nA
10nA
1.0nA
100pA
1.0V 10V 100V 1.0KV
- I(V1)
V_V1
Evaluation Circuit
R1
0.01m
V1 U1
0Vdc L308CC
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

8. Comparison Graph
Circuit Simulation Result
Simulation Result
VR(V)
IR(nA) Error(%)
Measurement Simulation
0.182 5.500 5.490 -0.182
0.200 11.420 11.482 0.543
0.300 45.000 45.056 0.124
0.400 78.700 78.643 -0.072
0.500 110.000 110.000 0.000
All Rights Reserved Copyright (C) Bee Technologies Inc. 2005