SPICE MODEL of MALS068X (Professional Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: ZENER DIODE /PROFESSIONAL
PART NUMBER: MALS068X
MANUFACTURER: PANASONIC
Bee Technologies Inc.
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

2. PSpice model
Model description
parameter
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

3. Reverse Characteristic
Circuit Simulation Result
10mA
1.0mA
100uA
10uA
1.0uA
100nA
10nA
1.0nA
100pA
0V 5V 10V
I(Vsense)
V_V1
Evaluation circuit
Vsense
V1
MALS068X
0Vdc
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

4. Comparison Graph
Circuit Simulation Result
Simulation Result
VR(V)
IR(mA) Error (%)
Measurement Simulation
100p 3.810 3.781 -0.761
1n 4.580 4.590 0.218
10n 5.370 5.388 0.335
100n 6.200 6.184 -0.258
1u 6.685 6.735 0.748
10u 6.870 6.820 -0.728
100u 6.950 6.890 -0.863
1m 7.020 6.967 -0.755
10m 7.100 7.128 0.394
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

5. Junction Capacitance Characteristic
Circuit Simulation Result
15pA
10pA
5pA
0.1V 1.0V 2.0V 3.0V 4.0V 5.0V 6.0V
-I(X_U3.D1)/(100/1u)
V(V2:+)
Evaluation circuit
V2
0Vdc
V1 = 0 V1
V2 = 100 U3
TD = 0
TR = 1us MALS068X
TF = 1us
PW = 5us
PER = 10us
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

6. Comparison Graph
Circuit Simulation Result
Simulation Result
Ct(pF)
VR(V) Error (%)
Measurement Simulation
0.100 13.700 13.770 0.511
0.200 13.500 13.491 -0.067
0.500 12.850 12.870 0.156
1.000 12.200 12.197 -0.025
2.000 11.400 11.402 0.018
5.000 10.300 10.284 -0.155
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

7. Forward Characteristic
Circuit Simulation Result
100mA
50mA
0A
0V 5V 10V
I(Vsense)
V_V1
Evaluation circuit
Vsen se
V1
0V dc MA LS0 68 X
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

8. Comparison Graph
Circuit Simulation Result
Simulation Result
VF(V)
IF(mA) Error (%)
Measurement Simulation
1.000 7.020 6.788 -3.305
2.000 7.028 6.870 -2.248
5.000 7.050 6.992 -0.823
10.000 7.100 7.105 0.070
20.000 7.230 7.255 0.346
50.000 7.560 7.569 0.119
100.000 8.090 7.970 -1.483
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

9. Forward Characteristic Reference
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

10. Reverse Recovery Characteristic
Circuit Simulation Result
40mA
30mA
20mA
10mA
0mA
-10mA
-20mA
-30mA
-40mA
0.996us 1.004us 1.012us 1.020us 1.028us 1.036us
I(R1)
Time
valuation circuit
R1
50
V1 U7
MALS068X
0
Compare
Measurement vs. Simulation
Trr Measurement Simulation Error(%)
Trj+Trb 10.200 ns 10.193 ns -0.069
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

11. Reverse Recovery Characteristic Reference
Measurement
trj=1.2(ns)
trb=9.0(ns)
Conditions:Ifwd=Irev=0.03(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (C) Bee Technologies Inc. 2006