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Device Modeling Report




COMPONENTS: Silicon Carbide Schottky Diode
PART NUMBER: IDH03SG60C
MANUFACTURER: Infineon
REMARK: Professional Model




                 Bee Technologies Inc.




    All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                   1
Circuit Configuration


        U1
        IDH03SG60C




             All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                            2
DIODE MODEL PARAMETERS
  PSpice
   model                                Model description
 parameter
     IS         Saturation Current
     N          Emission Coefficient
     RS         Series Resistance
    IKF         High-injection Knee Current
    CJO         Zero-bias Junction Capacitance
     M          Junction Grading Coefficient
     VJ         Junction Potential
    ISR         Recombination Current Saturation Value
     BV         Reverse Breakdown Voltage(a positive value)
    IBV         Reverse Breakdown Current(a positive value)
     TT         Transit Time
    EG          Energy-band Gap




             All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                            3
Forward Current Characteristics

Circuit Simulation result


                3.0A




                2.0A




                1.0A




                     0A
                          0V               1.0V           2.0V      3.0V         4.0V
                               I(R1)
                                                          V_V1




Evaluation circuit

                                                  R1

                                                  0.01m

                                       V1                        U1
                                                                 IDH03SG60C




                                       0




                      All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                        4
Comparison Graph

Circuit Simulation result




Comparison table


                                             VF (V)
               IF (A)                                                       %Error
                                Measurement           Simulation
                        0.1              0.840                 0.852              1.43
                        0.2              0.938                 0.940              0.21
                        0.5              1.125                 1.113              -1.07
                            1            1.343                 1.336              -0.52
                            2            1.719                 1.726              0.41
                            3            2.094                 2.093              -0.05




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                          5
Reverse Current Characteristic

Circuit Simulation result


                10uA




               1.0uA




               100nA




                10nA




               1.0nA




               100pA
                   100V        200V              300V          400V      500V       600V
                       I(U1:K)
                                                        V_V1




Evaluation circuit

                                            R1

                                            0.01m

                                  V1                              U1
                                                                  IDH03SG60C




                                 0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                           6
Comparison Graph

Circuit Simulation result




Comparison table


                                             IR (nA)
              VR (V)                                                        %Error
                             Measurement               Simulation
                       100               1.300                 1.304              0.33
                       200               2.700                 2.716              0.60
                       400             19.500                20.267               3.93
                       600            200.000               194.911               -2.54




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                          7
Junction Capacitance Characteristic

Circuit Simulation result


               80p


               70p


               60p


               50p


               40p


               30p


               20p


               10p


                  0
                 100mV           1.0V                 10V            100V           1.0KV
                     I(V2)/(600V/1u)
                                                      V(R)




Evaluation circuit


                                                 V2
                                         R

                                                 0

                            V1 = 0       V1                      U1
                            V2 = 600                             IDH03SG60C
                            TD = 0
                            TR = 1us
                            TF = 100ns
                            PW = 100us
                            PER = 10m


                                             0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                            8
Comparison Graph

Circuit Simulation result




Comparison table


                                             C (pF)
              VR (V)                                                        %Error
                                Measurement           Simulation
                            1          60.000                60.057               0.10
                            2          52.500                52.590               0.17
                            5          40.500                40.686               0.46
                       10              32.000                31.944               -0.18
                       20              24.600                24.464               -0.55
                       50              16.600                16.761               0.97
                       100             12.500                12.505               0.04
                       200               9.300                 9.283              -0.18




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                          9

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SPICE MODEL of IDH03SG60C (Professional Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Silicon Carbide Schottky Diode PART NUMBER: IDH03SG60C MANUFACTURER: Infineon REMARK: Professional Model Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 1
  • 2. Circuit Configuration U1 IDH03SG60C All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 2
  • 3. DIODE MODEL PARAMETERS PSpice model Model description parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 3
  • 4. Forward Current Characteristics Circuit Simulation result 3.0A 2.0A 1.0A 0A 0V 1.0V 2.0V 3.0V 4.0V I(R1) V_V1 Evaluation circuit R1 0.01m V1 U1 IDH03SG60C 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 4
  • 5. Comparison Graph Circuit Simulation result Comparison table VF (V) IF (A) %Error Measurement Simulation 0.1 0.840 0.852 1.43 0.2 0.938 0.940 0.21 0.5 1.125 1.113 -1.07 1 1.343 1.336 -0.52 2 1.719 1.726 0.41 3 2.094 2.093 -0.05 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 5
  • 6. Reverse Current Characteristic Circuit Simulation result 10uA 1.0uA 100nA 10nA 1.0nA 100pA 100V 200V 300V 400V 500V 600V I(U1:K) V_V1 Evaluation circuit R1 0.01m V1 U1 IDH03SG60C 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 6
  • 7. Comparison Graph Circuit Simulation result Comparison table IR (nA) VR (V) %Error Measurement Simulation 100 1.300 1.304 0.33 200 2.700 2.716 0.60 400 19.500 20.267 3.93 600 200.000 194.911 -2.54 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 7
  • 8. Junction Capacitance Characteristic Circuit Simulation result 80p 70p 60p 50p 40p 30p 20p 10p 0 100mV 1.0V 10V 100V 1.0KV I(V2)/(600V/1u) V(R) Evaluation circuit V2 R 0 V1 = 0 V1 U1 V2 = 600 IDH03SG60C TD = 0 TR = 1us TF = 100ns PW = 100us PER = 10m 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 8
  • 9. Comparison Graph Circuit Simulation result Comparison table C (pF) VR (V) %Error Measurement Simulation 1 60.000 60.057 0.10 2 52.500 52.590 0.17 5 40.500 40.686 0.46 10 32.000 31.944 -0.18 20 24.600 24.464 -0.55 50 16.600 16.761 0.97 100 12.500 12.505 0.04 200 9.300 9.283 -0.18 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 9