SlideShare a Scribd company logo
UNIVERSITY OF BOTSWANA
FACULTY OF ENGINEERING AND TECHNOLOGY
DEPARTMENT OF ELECTRICAL ENGINEERING
DIGITAL ELECTRONICS (EEB 322)
LAB 1: LOGIC GATES AND COMBINATIONAL CIRCUITS
DATE OF LAB SESSION: 24 MARCH 2016
AUTHOR: BOSA THEOPHILUS NTSHOLE
STUDENT ID: 201301848
2
Table of Contents
AIMOF EXPERIMENT..........................................................................................................................3
INTRODUCTION..................................................................................................................................3
MATERIALS USED IN THE EXPERIMENT.................................................................................................4
THEORY..............................................................................................................................................4
a. The AND Gate..........................................................................................................................4
b. The OR Gate............................................................................................................................4
c. The NOT Gate..........................................................................................................................5
d. NAND GATE.............................................................................................................................5
e. NOR GATE...............................................................................................................................5
f. XOR GATE ...............................................................................................................................6
PROCEDURE.......................................................................................................................................6
RESULTS.............................................................................................................................................7
DISCUSSION .......................................................................................................................................9
RECOMMENDATIONS .........................................................................................................................9
CONCLUSION......................................................................................................................................9
REFFERENCES.....................................................................................................................................9
3
AIM OF EXPERIMENT
The main purpose of this experiment is to acquire basics of circuit wiring and gate behavior by
connecting relevant logic gates into simple circuits.
INTRODUCTION
In this experiment, the understanding of logic gates was used to perform basic logical hardware
functions. Logic gates are the basic building blocks for digital electronic circuits thus by
performing logical operations on one or more logical inputs to produce a single logical output.
The experiment covers using AND, OR and NOT Boolean expressions to carry out Boolean
functions which were used to come up with practical constructions of electronic circuits and
deriving other complex logic gates. The importance of this experiment is to acquire the
combination logic circuitry knowledge which is cheaper through practice in order to combine
two or more logic gates to form a required logical function in the industry or at industrial level.
The main basic examples of logic gates were stated earlier in the introduction and others include
NAND gate which its functions can be derived from AND and NOT gates, the NOR gate which
its functions can be derived from OR and NOTgates and lastly the XOR gate which is also
known as the exclusive OR gate. Examples are depicted below;
U 3A
74 LS00D
1
2
3
U 1A
74 LS04D
21
1
2
13
12
U 7A
74 LS11D
U 4A
74 LS08D
1
2
3
U 2A
74 LS02D
2
3
1
74 LS86N
1
2
3
U 5A U 6A
74 LS32N
1
2
3
Figure 1: (U3A-2 INPUT NAND GATE, U1A-NOT GATE (INVERTER), U7A-3 INPUT AND GATE,
U4A- 2 INPUT AND GATE, U2A- 2INPUT NOR GATE, U5A- 2 INPUT XOR GATE, U6A-2 INPUT OR
GATE)
4
MATERIALS USEDIN THE EXPERIMENT
- C.A.D.E.T breadboard
- 1 x 74LS00 Quad 2-input NAND Gate
- 1 x 74LS02 Quad 2-input NORGate
- 1 x 74LS04 Hex Inverter Gate
- 1 x 74LS08 Quad 2-input AND Gate
- 1 x 74LS11 Triple 3-input AND Gate
- 1 x 74LS32 Quad 2 –input OR Gate
- 1 x 74LS86 Quad 2- input XOR Gate
- Jumper wires
THEORY
a. The AND Gate
The AND gate gives a high output only when both input 1 and input 2 are high, but for other
conditions it gives a low output. It operates just the same as two switches in series. Below is an
AND gate depicted with inputs 1 and 2 and output 3;
U 4A
74 LS08D
1
2
3
Figure 2: THE AND GATE
b. The OR Gate
An OR gate with inputs 1 and 2 gives an output of a 1when 1 or 2 is a ‘1’. The OR gate is
visualized as an electrical circuit involving two switches in parallel. Below is depicted a typical
OR gate with inputs 1 and 2 and output 3;
U 6A
74 LS32N
1
2
3
Figure 3: THE OR GATE
5
c. The NOT Gate
A not gate has just one input and one output, giving output when the input is 0 and a 0 output
when input is 1. Thus it gives an output which is an inversion of the input and is known as an
inverter. It is depicted below;
U 1A
74 LS04D
21
Figure 4: THE NOT GATE
d. NAND GATE
The NAND gate can be considered as a combination of AND gate followed by NOTgate. Thus
when input 1 is ‘1’ and input 2 is ‘1’, output is zero, all other inputs giving output of ‘1’.it is
depicted below;
U 3A
74 LS00D
1
2
3
Figure 5: THE NAND GATE
e. NOR GATE
The NOR gate can be as a combination of OR gate followed by a NOT gate. Thus when input 1
or input 2 is ‘1’ there is an output of 0. It is just an OR gate with the outputs inverted. It is
depicted below;
6
U 2A
74 LS02D
2
3
1
Figure 6: THE NOR GATE
f. XOR GATE
The EXCLUSIVE-OR gate (XOR) can be considered to be an OR gate with a NOT gate applied
to one of the inputs to invert it before it reaches the OR gate. Alternatively it can be considered
as an AND gate with a NOT gate applied to one of the inputs to invert it before the input reaches
the AND gate. It is depicted below;
74 LS86N
1
2
3
U 5A
Figure 7: THE XOR GATE
PROCEDURE
The 74LS04 inverter gate was wired together with a switch (circuit breaker) to check if the chips
were receiving power by comparing the practical outputs with the specifications given. One of
the gates was chosen and a wire was connected to its input pin and the output pin was connected
to ground of the power source. The power was turned on then the input was changed to the gate
by connecting the input pin wire to switch on the C.A.D.E.T and the response was observed and
recorded the outcome on truth table. The same procedure was repeated for connecting the
NAND, NOR, AND and OR gates which had 2 inputs each. The outcomes were recorded
respectively.
A simple circuit was the connected as in the picture on below;
7
U 1A
74 LS04D
21
U 2A
74 LS02D
2
3
1
74 LS86N
1
2
3
U 5A
1
2
13
12
U 7A
74 LS11D
Figure 8: simple combination circuit
The outcomes using the same procedures but this time for 3 inputs were then recorded.
RESULTS
a. Table showing schematic truth table for inverter obtained from practical observations
X (INPUT) F (OUTPUT)
0 1
1 0
b. Table indicating the obtained responses of 2 inputs AND, OR, NAND, NOR and XOR
gates.
X
(I/P 1)
Y
(I/P 2)
AND
(O/P 1)
OR
(O/P 2)
NAND
(O/P 3)
NOR
(O/P 3)
XOR
(O/P 4)
0 0 0 0 1 1 0
0 1 0 1 1 0 1
1 0 0 1 1 0 1
1 1 1 1 0 0 0
c. Table indicating the obtained responses when connecting a simple combination circuit in
figure 8.
8
A(I/P 1) B(I/P 2) C(I/P 3) F(O/P)
0 0 0 0
0 0 1 0
0 1 0 1
0 1 1 1
1 0 0 1
1 0 1 1
1 1 0 1
1 1 1 0
9
DISCUSSION
A lot of time was consumed by arguments since each group was made up of six people per
working station. Other parties did not come prepared, a lot of time was consumed by trying to
figure out and understanding first the theory and methodology used to carry out the experiment
so much time which we could have used to carry out the experiment had elapsed. Another thing
that made the experiment almost impossible to perform was lack of space, our work station was
over crowded because the space in the work station was limited. This is a concern because time
and again we had to reconnect our circuits, more especially the combination circuit, due to
coiling up of jumper wires which made it difficult to trace the connections. Also, most of the
apparatus used was very old that after connections were made, in most cases no outcome was
traced or found leading to spending much time trouble shooting and fault finding rather than just
taking readings we are sure of. There was deflection in practical outcomes here and there
basically due to reasons stated in the discussion.
RECOMMENDATIONS
The University Of Botswana Electrical Engineering Department should start ordering laboratory
equipment that is up to date and the already existing laboratory materials should be services
regularly more especially before students come into the laboratory. The servicing should be
carried out by the laboratory technicians thoroughly and the Electrical Engineering Department
should perform thorough inspections on the serviced lab equipment in order to check if they need
to be replaced or not. Electrical engineering students should always come prepared to the
laboratory session so that much time can be spent on the experiment rather than discussing first
what exactly should be done. Each student should participate thus having a task that one is
capable of performing because they would have prepared thoroughly for the lab session. More
equipment should be availed at the labs to avoid students over-crowding on one working station.
CONCLUSION
The logic circuit wiring basics were acquired perfectly through gate behavior observation and
considerations. It was also found out that practical results recorded were corresponding to
theoretical results so every practical observation matched its expectations thus the practical
results were exactly the same as the theoretical results. The combination circuit connections were
perfect and all the other connections that were made gave all the right or expected results.
REFFERENCES
- Mechatronics, Electronic Control Systems in Mechanical and Electrical Engineering
(fifth edition) by W.Bolton.
- Lab manual
- Automation and Robotics.pdf by Miltiadis A. Boboulos.

More Related Content

What's hot

Voltage regulator
Voltage regulatorVoltage regulator
Voltage regulator
niiraz
 
Solution of skill Assessment Control Systems Engineering By Norman S.Nise 6t...
Solution of skill Assessment  Control Systems Engineering By Norman S.Nise 6t...Solution of skill Assessment  Control Systems Engineering By Norman S.Nise 6t...
Solution of skill Assessment Control Systems Engineering By Norman S.Nise 6t...
janicetiong
 
Digital control systems (dcs) lecture 18-19-20
Digital control systems (dcs) lecture 18-19-20Digital control systems (dcs) lecture 18-19-20
Digital control systems (dcs) lecture 18-19-20
Ali Rind
 
KCL and KVL
KCL and KVLKCL and KVL
KCL and KVL
140120109032
 
First order circuits linear circuit analysis
First order circuits linear circuit analysisFirst order circuits linear circuit analysis
First order circuits linear circuit analysis
ZulqarnainEngineerin
 
Instrumentation Lab. Experiment #3 Report: Operational Amplifiers
Instrumentation Lab. Experiment #3 Report: Operational AmplifiersInstrumentation Lab. Experiment #3 Report: Operational Amplifiers
Instrumentation Lab. Experiment #3 Report: Operational Amplifiers
mohammad zeyad
 
Multiplexers and Demultiplexers
Multiplexers and DemultiplexersMultiplexers and Demultiplexers
Multiplexers and Demultiplexers
GargiKhanna1
 
module1:Introduction to digital electronics
module1:Introduction to digital electronicsmodule1:Introduction to digital electronics
module1:Introduction to digital electronics
chandrakant shinde
 
Lti system
Lti systemLti system
Lti system
Fariza Zahari
 
Pulse modulation
Pulse modulationPulse modulation
Pulse modulation
mpsrekha83
 
Bipolar Junction Transistor (BJT) DC and AC Analysis
Bipolar Junction Transistor (BJT) DC and AC AnalysisBipolar Junction Transistor (BJT) DC and AC Analysis
Bipolar Junction Transistor (BJT) DC and AC Analysis
Jess Rangcasajo
 
Chapter 3: Simplification of Boolean Function
Chapter 3: Simplification of Boolean FunctionChapter 3: Simplification of Boolean Function
Chapter 3: Simplification of Boolean Function
Er. Nawaraj Bhandari
 
555 Timer (detailed presentation)
555 Timer (detailed presentation)555 Timer (detailed presentation)
555 Timer (detailed presentation)
Tanish Gupta
 
Hw1 solution
Hw1 solutionHw1 solution
Hw1 solution
iqbal ahmad
 
SILICON CONTROLLED RECTIFIER,THYRISTOR,SCR
SILICON CONTROLLED RECTIFIER,THYRISTOR,SCRSILICON CONTROLLED RECTIFIER,THYRISTOR,SCR
SILICON CONTROLLED RECTIFIER,THYRISTOR,SCR
arulbarathi kandhi
 
Registers siso, sipo
Registers siso, sipoRegisters siso, sipo
Registers siso, sipo
DEPARTMENT OF PHYSICS
 
Properties of dft
Properties of dftProperties of dft
Properties of dft
HeraldRufus1
 
Sequential Logic Circuit
Sequential Logic CircuitSequential Logic Circuit
Sequential Logic Circuit
Ramasubbu .P
 

What's hot (20)

Voltage regulator
Voltage regulatorVoltage regulator
Voltage regulator
 
Solution of skill Assessment Control Systems Engineering By Norman S.Nise 6t...
Solution of skill Assessment  Control Systems Engineering By Norman S.Nise 6t...Solution of skill Assessment  Control Systems Engineering By Norman S.Nise 6t...
Solution of skill Assessment Control Systems Engineering By Norman S.Nise 6t...
 
Digital control systems (dcs) lecture 18-19-20
Digital control systems (dcs) lecture 18-19-20Digital control systems (dcs) lecture 18-19-20
Digital control systems (dcs) lecture 18-19-20
 
KCL and KVL
KCL and KVLKCL and KVL
KCL and KVL
 
First order circuits linear circuit analysis
First order circuits linear circuit analysisFirst order circuits linear circuit analysis
First order circuits linear circuit analysis
 
Instrumentation Lab. Experiment #3 Report: Operational Amplifiers
Instrumentation Lab. Experiment #3 Report: Operational AmplifiersInstrumentation Lab. Experiment #3 Report: Operational Amplifiers
Instrumentation Lab. Experiment #3 Report: Operational Amplifiers
 
Multiplexers and Demultiplexers
Multiplexers and DemultiplexersMultiplexers and Demultiplexers
Multiplexers and Demultiplexers
 
module1:Introduction to digital electronics
module1:Introduction to digital electronicsmodule1:Introduction to digital electronics
module1:Introduction to digital electronics
 
Lti system
Lti systemLti system
Lti system
 
Presentation1
Presentation1Presentation1
Presentation1
 
Pulse modulation
Pulse modulationPulse modulation
Pulse modulation
 
Bipolar Junction Transistor (BJT) DC and AC Analysis
Bipolar Junction Transistor (BJT) DC and AC AnalysisBipolar Junction Transistor (BJT) DC and AC Analysis
Bipolar Junction Transistor (BJT) DC and AC Analysis
 
Chapter 3: Simplification of Boolean Function
Chapter 3: Simplification of Boolean FunctionChapter 3: Simplification of Boolean Function
Chapter 3: Simplification of Boolean Function
 
555 Timer (detailed presentation)
555 Timer (detailed presentation)555 Timer (detailed presentation)
555 Timer (detailed presentation)
 
Transistor as a switch
Transistor as a switch Transistor as a switch
Transistor as a switch
 
Hw1 solution
Hw1 solutionHw1 solution
Hw1 solution
 
SILICON CONTROLLED RECTIFIER,THYRISTOR,SCR
SILICON CONTROLLED RECTIFIER,THYRISTOR,SCRSILICON CONTROLLED RECTIFIER,THYRISTOR,SCR
SILICON CONTROLLED RECTIFIER,THYRISTOR,SCR
 
Registers siso, sipo
Registers siso, sipoRegisters siso, sipo
Registers siso, sipo
 
Properties of dft
Properties of dftProperties of dft
Properties of dft
 
Sequential Logic Circuit
Sequential Logic CircuitSequential Logic Circuit
Sequential Logic Circuit
 

Similar to Digital Electronics

Digital Electronics( half adders and full adders)
Digital Electronics( half adders and full adders)Digital Electronics( half adders and full adders)
Digital Electronics( half adders and full adders)
Bosa Theophilus Ntshole
 
Lab no 4
Lab no 4Lab no 4
Lab no 4
Abu-ul-Haris
 
555 timer lab projects
555 timer lab projects555 timer lab projects
555 timer lab projectsBien Morfe
 
Lecture 5
Lecture 5Lecture 5
Lecture 5
Chamila Fernando
 
189626882 ep227-digital-electronics
189626882 ep227-digital-electronics189626882 ep227-digital-electronics
189626882 ep227-digital-electronics
Dimple Bansal
 
Circuit for Square Root of Multiplication
Circuit for Square Root of MultiplicationCircuit for Square Root of Multiplication
Circuit for Square Root of Multiplication
inventy
 
Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )
Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )
Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )
Jikrul Sayeed
 
MODULE TITLE PROGRAMMABLE LOGIC CONTROLLERSTOPIC TITLE.docx
MODULE TITLE    PROGRAMMABLE LOGIC CONTROLLERSTOPIC TITLE.docxMODULE TITLE    PROGRAMMABLE LOGIC CONTROLLERSTOPIC TITLE.docx
MODULE TITLE PROGRAMMABLE LOGIC CONTROLLERSTOPIC TITLE.docx
roushhsiu
 
Clock Generator
Clock Generator Clock Generator
Clock Generator
Omkar Rane
 
Project on orientation programme
Project on orientation programmeProject on orientation programme
Project on orientation programme
Roorkee College of Engineering, Roorkee
 
Problemas de aplicación ley de ohm y ley de watt
Problemas de aplicación  ley de ohm y ley de wattProblemas de aplicación  ley de ohm y ley de watt
Problemas de aplicación ley de ohm y ley de watt
Katheryncaicedo1
 
Unit 3 testing of logic circuits
Unit 3 testing of logic circuitsUnit 3 testing of logic circuits
Unit 3 testing of logic circuits
swagatkarve
 
2th year iv sem de lab manual
2th year iv sem de lab manual2th year iv sem de lab manual
2th year iv sem de lab manual
HARISH KUMAR MAHESHWARI
 
Design of all digital phase locked loop
Design of all digital phase locked loopDesign of all digital phase locked loop
Design of all digital phase locked loop
eSAT Publishing House
 
Electrical Machines
Electrical MachinesElectrical Machines
Electrical Machines
Bosa Theophilus Ntshole
 
Deld lab manual
Deld lab manualDeld lab manual
Deld lab manual
Vivek Kumar Sinha
 
VLSI Testing Techniques
VLSI Testing TechniquesVLSI Testing Techniques
VLSI Testing Techniques
A B Shinde
 
NG3S903 - Electronic Systems Engineering - Fault Modelling Techniques
NG3S903 - Electronic Systems Engineering - Fault Modelling TechniquesNG3S903 - Electronic Systems Engineering - Fault Modelling Techniques
NG3S903 - Electronic Systems Engineering - Fault Modelling TechniquesChris Francis
 
Automatic main gate controller
Automatic main gate controllerAutomatic main gate controller
Automatic main gate controller
PROJECTRONICS
 
Digital Electronics Lab
Digital Electronics LabDigital Electronics Lab
Digital Electronics Lab
Cyber4Tech
 

Similar to Digital Electronics (20)

Digital Electronics( half adders and full adders)
Digital Electronics( half adders and full adders)Digital Electronics( half adders and full adders)
Digital Electronics( half adders and full adders)
 
Lab no 4
Lab no 4Lab no 4
Lab no 4
 
555 timer lab projects
555 timer lab projects555 timer lab projects
555 timer lab projects
 
Lecture 5
Lecture 5Lecture 5
Lecture 5
 
189626882 ep227-digital-electronics
189626882 ep227-digital-electronics189626882 ep227-digital-electronics
189626882 ep227-digital-electronics
 
Circuit for Square Root of Multiplication
Circuit for Square Root of MultiplicationCircuit for Square Root of Multiplication
Circuit for Square Root of Multiplication
 
Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )
Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )
Logic gate tester for IC's ( Digital Electronics and Logic deisgn EE3114 )
 
MODULE TITLE PROGRAMMABLE LOGIC CONTROLLERSTOPIC TITLE.docx
MODULE TITLE    PROGRAMMABLE LOGIC CONTROLLERSTOPIC TITLE.docxMODULE TITLE    PROGRAMMABLE LOGIC CONTROLLERSTOPIC TITLE.docx
MODULE TITLE PROGRAMMABLE LOGIC CONTROLLERSTOPIC TITLE.docx
 
Clock Generator
Clock Generator Clock Generator
Clock Generator
 
Project on orientation programme
Project on orientation programmeProject on orientation programme
Project on orientation programme
 
Problemas de aplicación ley de ohm y ley de watt
Problemas de aplicación  ley de ohm y ley de wattProblemas de aplicación  ley de ohm y ley de watt
Problemas de aplicación ley de ohm y ley de watt
 
Unit 3 testing of logic circuits
Unit 3 testing of logic circuitsUnit 3 testing of logic circuits
Unit 3 testing of logic circuits
 
2th year iv sem de lab manual
2th year iv sem de lab manual2th year iv sem de lab manual
2th year iv sem de lab manual
 
Design of all digital phase locked loop
Design of all digital phase locked loopDesign of all digital phase locked loop
Design of all digital phase locked loop
 
Electrical Machines
Electrical MachinesElectrical Machines
Electrical Machines
 
Deld lab manual
Deld lab manualDeld lab manual
Deld lab manual
 
VLSI Testing Techniques
VLSI Testing TechniquesVLSI Testing Techniques
VLSI Testing Techniques
 
NG3S903 - Electronic Systems Engineering - Fault Modelling Techniques
NG3S903 - Electronic Systems Engineering - Fault Modelling TechniquesNG3S903 - Electronic Systems Engineering - Fault Modelling Techniques
NG3S903 - Electronic Systems Engineering - Fault Modelling Techniques
 
Automatic main gate controller
Automatic main gate controllerAutomatic main gate controller
Automatic main gate controller
 
Digital Electronics Lab
Digital Electronics LabDigital Electronics Lab
Digital Electronics Lab
 

Recently uploaded

Tutorial for 16S rRNA Gene Analysis with QIIME2.pdf
Tutorial for 16S rRNA Gene Analysis with QIIME2.pdfTutorial for 16S rRNA Gene Analysis with QIIME2.pdf
Tutorial for 16S rRNA Gene Analysis with QIIME2.pdf
aqil azizi
 
Ethernet Routing and switching chapter 1.ppt
Ethernet Routing and switching chapter 1.pptEthernet Routing and switching chapter 1.ppt
Ethernet Routing and switching chapter 1.ppt
azkamurat
 
Swimming pool mechanical components design.pptx
Swimming pool  mechanical components design.pptxSwimming pool  mechanical components design.pptx
Swimming pool mechanical components design.pptx
yokeleetan1
 
Planning Of Procurement o different goods and services
Planning Of Procurement o different goods and servicesPlanning Of Procurement o different goods and services
Planning Of Procurement o different goods and services
JoytuBarua2
 
BPV-GUI-01-Guide-for-ASME-Review-Teams-(General)-10-10-2023.pdf
BPV-GUI-01-Guide-for-ASME-Review-Teams-(General)-10-10-2023.pdfBPV-GUI-01-Guide-for-ASME-Review-Teams-(General)-10-10-2023.pdf
BPV-GUI-01-Guide-for-ASME-Review-Teams-(General)-10-10-2023.pdf
MIGUELANGEL966976
 
哪里办理(csu毕业证书)查尔斯特大学毕业证硕士学历原版一模一样
哪里办理(csu毕业证书)查尔斯特大学毕业证硕士学历原版一模一样哪里办理(csu毕业证书)查尔斯特大学毕业证硕士学历原版一模一样
哪里办理(csu毕业证书)查尔斯特大学毕业证硕士学历原版一模一样
insn4465
 
01-GPON Fundamental fttx ftth basic .pptx
01-GPON Fundamental fttx ftth basic .pptx01-GPON Fundamental fttx ftth basic .pptx
01-GPON Fundamental fttx ftth basic .pptx
benykoy2024
 
一比一原版(IIT毕业证)伊利诺伊理工大学毕业证成绩单专业办理
一比一原版(IIT毕业证)伊利诺伊理工大学毕业证成绩单专业办理一比一原版(IIT毕业证)伊利诺伊理工大学毕业证成绩单专业办理
一比一原版(IIT毕业证)伊利诺伊理工大学毕业证成绩单专业办理
zwunae
 
Online aptitude test management system project report.pdf
Online aptitude test management system project report.pdfOnline aptitude test management system project report.pdf
Online aptitude test management system project report.pdf
Kamal Acharya
 
Fundamentals of Induction Motor Drives.pptx
Fundamentals of Induction Motor Drives.pptxFundamentals of Induction Motor Drives.pptx
Fundamentals of Induction Motor Drives.pptx
manasideore6
 
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&BDesign and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Sreedhar Chowdam
 
ACRP 4-09 Risk Assessment Method to Support Modification of Airfield Separat...
ACRP 4-09 Risk Assessment Method to Support Modification of Airfield Separat...ACRP 4-09 Risk Assessment Method to Support Modification of Airfield Separat...
ACRP 4-09 Risk Assessment Method to Support Modification of Airfield Separat...
Mukeshwaran Balu
 
Fundamentals of Electric Drives and its applications.pptx
Fundamentals of Electric Drives and its applications.pptxFundamentals of Electric Drives and its applications.pptx
Fundamentals of Electric Drives and its applications.pptx
manasideore6
 
5214-1693458878915-Unit 6 2023 to 2024 academic year assignment (AutoRecovere...
5214-1693458878915-Unit 6 2023 to 2024 academic year assignment (AutoRecovere...5214-1693458878915-Unit 6 2023 to 2024 academic year assignment (AutoRecovere...
5214-1693458878915-Unit 6 2023 to 2024 academic year assignment (AutoRecovere...
ihlasbinance2003
 
PPT on GRP pipes manufacturing and testing
PPT on GRP pipes manufacturing and testingPPT on GRP pipes manufacturing and testing
PPT on GRP pipes manufacturing and testing
anoopmanoharan2
 
spirit beverages ppt without graphics.pptx
spirit beverages ppt without graphics.pptxspirit beverages ppt without graphics.pptx
spirit beverages ppt without graphics.pptx
Madan Karki
 
Hierarchical Digital Twin of a Naval Power System
Hierarchical Digital Twin of a Naval Power SystemHierarchical Digital Twin of a Naval Power System
Hierarchical Digital Twin of a Naval Power System
Kerry Sado
 
CHINA’S GEO-ECONOMIC OUTREACH IN CENTRAL ASIAN COUNTRIES AND FUTURE PROSPECT
CHINA’S GEO-ECONOMIC OUTREACH IN CENTRAL ASIAN COUNTRIES AND FUTURE PROSPECTCHINA’S GEO-ECONOMIC OUTREACH IN CENTRAL ASIAN COUNTRIES AND FUTURE PROSPECT
CHINA’S GEO-ECONOMIC OUTREACH IN CENTRAL ASIAN COUNTRIES AND FUTURE PROSPECT
jpsjournal1
 
Nuclear Power Economics and Structuring 2024
Nuclear Power Economics and Structuring 2024Nuclear Power Economics and Structuring 2024
Nuclear Power Economics and Structuring 2024
Massimo Talia
 
Harnessing WebAssembly for Real-time Stateless Streaming Pipelines
Harnessing WebAssembly for Real-time Stateless Streaming PipelinesHarnessing WebAssembly for Real-time Stateless Streaming Pipelines
Harnessing WebAssembly for Real-time Stateless Streaming Pipelines
Christina Lin
 

Recently uploaded (20)

Tutorial for 16S rRNA Gene Analysis with QIIME2.pdf
Tutorial for 16S rRNA Gene Analysis with QIIME2.pdfTutorial for 16S rRNA Gene Analysis with QIIME2.pdf
Tutorial for 16S rRNA Gene Analysis with QIIME2.pdf
 
Ethernet Routing and switching chapter 1.ppt
Ethernet Routing and switching chapter 1.pptEthernet Routing and switching chapter 1.ppt
Ethernet Routing and switching chapter 1.ppt
 
Swimming pool mechanical components design.pptx
Swimming pool  mechanical components design.pptxSwimming pool  mechanical components design.pptx
Swimming pool mechanical components design.pptx
 
Planning Of Procurement o different goods and services
Planning Of Procurement o different goods and servicesPlanning Of Procurement o different goods and services
Planning Of Procurement o different goods and services
 
BPV-GUI-01-Guide-for-ASME-Review-Teams-(General)-10-10-2023.pdf
BPV-GUI-01-Guide-for-ASME-Review-Teams-(General)-10-10-2023.pdfBPV-GUI-01-Guide-for-ASME-Review-Teams-(General)-10-10-2023.pdf
BPV-GUI-01-Guide-for-ASME-Review-Teams-(General)-10-10-2023.pdf
 
哪里办理(csu毕业证书)查尔斯特大学毕业证硕士学历原版一模一样
哪里办理(csu毕业证书)查尔斯特大学毕业证硕士学历原版一模一样哪里办理(csu毕业证书)查尔斯特大学毕业证硕士学历原版一模一样
哪里办理(csu毕业证书)查尔斯特大学毕业证硕士学历原版一模一样
 
01-GPON Fundamental fttx ftth basic .pptx
01-GPON Fundamental fttx ftth basic .pptx01-GPON Fundamental fttx ftth basic .pptx
01-GPON Fundamental fttx ftth basic .pptx
 
一比一原版(IIT毕业证)伊利诺伊理工大学毕业证成绩单专业办理
一比一原版(IIT毕业证)伊利诺伊理工大学毕业证成绩单专业办理一比一原版(IIT毕业证)伊利诺伊理工大学毕业证成绩单专业办理
一比一原版(IIT毕业证)伊利诺伊理工大学毕业证成绩单专业办理
 
Online aptitude test management system project report.pdf
Online aptitude test management system project report.pdfOnline aptitude test management system project report.pdf
Online aptitude test management system project report.pdf
 
Fundamentals of Induction Motor Drives.pptx
Fundamentals of Induction Motor Drives.pptxFundamentals of Induction Motor Drives.pptx
Fundamentals of Induction Motor Drives.pptx
 
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&BDesign and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
 
ACRP 4-09 Risk Assessment Method to Support Modification of Airfield Separat...
ACRP 4-09 Risk Assessment Method to Support Modification of Airfield Separat...ACRP 4-09 Risk Assessment Method to Support Modification of Airfield Separat...
ACRP 4-09 Risk Assessment Method to Support Modification of Airfield Separat...
 
Fundamentals of Electric Drives and its applications.pptx
Fundamentals of Electric Drives and its applications.pptxFundamentals of Electric Drives and its applications.pptx
Fundamentals of Electric Drives and its applications.pptx
 
5214-1693458878915-Unit 6 2023 to 2024 academic year assignment (AutoRecovere...
5214-1693458878915-Unit 6 2023 to 2024 academic year assignment (AutoRecovere...5214-1693458878915-Unit 6 2023 to 2024 academic year assignment (AutoRecovere...
5214-1693458878915-Unit 6 2023 to 2024 academic year assignment (AutoRecovere...
 
PPT on GRP pipes manufacturing and testing
PPT on GRP pipes manufacturing and testingPPT on GRP pipes manufacturing and testing
PPT on GRP pipes manufacturing and testing
 
spirit beverages ppt without graphics.pptx
spirit beverages ppt without graphics.pptxspirit beverages ppt without graphics.pptx
spirit beverages ppt without graphics.pptx
 
Hierarchical Digital Twin of a Naval Power System
Hierarchical Digital Twin of a Naval Power SystemHierarchical Digital Twin of a Naval Power System
Hierarchical Digital Twin of a Naval Power System
 
CHINA’S GEO-ECONOMIC OUTREACH IN CENTRAL ASIAN COUNTRIES AND FUTURE PROSPECT
CHINA’S GEO-ECONOMIC OUTREACH IN CENTRAL ASIAN COUNTRIES AND FUTURE PROSPECTCHINA’S GEO-ECONOMIC OUTREACH IN CENTRAL ASIAN COUNTRIES AND FUTURE PROSPECT
CHINA’S GEO-ECONOMIC OUTREACH IN CENTRAL ASIAN COUNTRIES AND FUTURE PROSPECT
 
Nuclear Power Economics and Structuring 2024
Nuclear Power Economics and Structuring 2024Nuclear Power Economics and Structuring 2024
Nuclear Power Economics and Structuring 2024
 
Harnessing WebAssembly for Real-time Stateless Streaming Pipelines
Harnessing WebAssembly for Real-time Stateless Streaming PipelinesHarnessing WebAssembly for Real-time Stateless Streaming Pipelines
Harnessing WebAssembly for Real-time Stateless Streaming Pipelines
 

Digital Electronics

  • 1. UNIVERSITY OF BOTSWANA FACULTY OF ENGINEERING AND TECHNOLOGY DEPARTMENT OF ELECTRICAL ENGINEERING DIGITAL ELECTRONICS (EEB 322) LAB 1: LOGIC GATES AND COMBINATIONAL CIRCUITS DATE OF LAB SESSION: 24 MARCH 2016 AUTHOR: BOSA THEOPHILUS NTSHOLE STUDENT ID: 201301848
  • 2. 2 Table of Contents AIMOF EXPERIMENT..........................................................................................................................3 INTRODUCTION..................................................................................................................................3 MATERIALS USED IN THE EXPERIMENT.................................................................................................4 THEORY..............................................................................................................................................4 a. The AND Gate..........................................................................................................................4 b. The OR Gate............................................................................................................................4 c. The NOT Gate..........................................................................................................................5 d. NAND GATE.............................................................................................................................5 e. NOR GATE...............................................................................................................................5 f. XOR GATE ...............................................................................................................................6 PROCEDURE.......................................................................................................................................6 RESULTS.............................................................................................................................................7 DISCUSSION .......................................................................................................................................9 RECOMMENDATIONS .........................................................................................................................9 CONCLUSION......................................................................................................................................9 REFFERENCES.....................................................................................................................................9
  • 3. 3 AIM OF EXPERIMENT The main purpose of this experiment is to acquire basics of circuit wiring and gate behavior by connecting relevant logic gates into simple circuits. INTRODUCTION In this experiment, the understanding of logic gates was used to perform basic logical hardware functions. Logic gates are the basic building blocks for digital electronic circuits thus by performing logical operations on one or more logical inputs to produce a single logical output. The experiment covers using AND, OR and NOT Boolean expressions to carry out Boolean functions which were used to come up with practical constructions of electronic circuits and deriving other complex logic gates. The importance of this experiment is to acquire the combination logic circuitry knowledge which is cheaper through practice in order to combine two or more logic gates to form a required logical function in the industry or at industrial level. The main basic examples of logic gates were stated earlier in the introduction and others include NAND gate which its functions can be derived from AND and NOT gates, the NOR gate which its functions can be derived from OR and NOTgates and lastly the XOR gate which is also known as the exclusive OR gate. Examples are depicted below; U 3A 74 LS00D 1 2 3 U 1A 74 LS04D 21 1 2 13 12 U 7A 74 LS11D U 4A 74 LS08D 1 2 3 U 2A 74 LS02D 2 3 1 74 LS86N 1 2 3 U 5A U 6A 74 LS32N 1 2 3 Figure 1: (U3A-2 INPUT NAND GATE, U1A-NOT GATE (INVERTER), U7A-3 INPUT AND GATE, U4A- 2 INPUT AND GATE, U2A- 2INPUT NOR GATE, U5A- 2 INPUT XOR GATE, U6A-2 INPUT OR GATE)
  • 4. 4 MATERIALS USEDIN THE EXPERIMENT - C.A.D.E.T breadboard - 1 x 74LS00 Quad 2-input NAND Gate - 1 x 74LS02 Quad 2-input NORGate - 1 x 74LS04 Hex Inverter Gate - 1 x 74LS08 Quad 2-input AND Gate - 1 x 74LS11 Triple 3-input AND Gate - 1 x 74LS32 Quad 2 –input OR Gate - 1 x 74LS86 Quad 2- input XOR Gate - Jumper wires THEORY a. The AND Gate The AND gate gives a high output only when both input 1 and input 2 are high, but for other conditions it gives a low output. It operates just the same as two switches in series. Below is an AND gate depicted with inputs 1 and 2 and output 3; U 4A 74 LS08D 1 2 3 Figure 2: THE AND GATE b. The OR Gate An OR gate with inputs 1 and 2 gives an output of a 1when 1 or 2 is a ‘1’. The OR gate is visualized as an electrical circuit involving two switches in parallel. Below is depicted a typical OR gate with inputs 1 and 2 and output 3; U 6A 74 LS32N 1 2 3 Figure 3: THE OR GATE
  • 5. 5 c. The NOT Gate A not gate has just one input and one output, giving output when the input is 0 and a 0 output when input is 1. Thus it gives an output which is an inversion of the input and is known as an inverter. It is depicted below; U 1A 74 LS04D 21 Figure 4: THE NOT GATE d. NAND GATE The NAND gate can be considered as a combination of AND gate followed by NOTgate. Thus when input 1 is ‘1’ and input 2 is ‘1’, output is zero, all other inputs giving output of ‘1’.it is depicted below; U 3A 74 LS00D 1 2 3 Figure 5: THE NAND GATE e. NOR GATE The NOR gate can be as a combination of OR gate followed by a NOT gate. Thus when input 1 or input 2 is ‘1’ there is an output of 0. It is just an OR gate with the outputs inverted. It is depicted below;
  • 6. 6 U 2A 74 LS02D 2 3 1 Figure 6: THE NOR GATE f. XOR GATE The EXCLUSIVE-OR gate (XOR) can be considered to be an OR gate with a NOT gate applied to one of the inputs to invert it before it reaches the OR gate. Alternatively it can be considered as an AND gate with a NOT gate applied to one of the inputs to invert it before the input reaches the AND gate. It is depicted below; 74 LS86N 1 2 3 U 5A Figure 7: THE XOR GATE PROCEDURE The 74LS04 inverter gate was wired together with a switch (circuit breaker) to check if the chips were receiving power by comparing the practical outputs with the specifications given. One of the gates was chosen and a wire was connected to its input pin and the output pin was connected to ground of the power source. The power was turned on then the input was changed to the gate by connecting the input pin wire to switch on the C.A.D.E.T and the response was observed and recorded the outcome on truth table. The same procedure was repeated for connecting the NAND, NOR, AND and OR gates which had 2 inputs each. The outcomes were recorded respectively. A simple circuit was the connected as in the picture on below;
  • 7. 7 U 1A 74 LS04D 21 U 2A 74 LS02D 2 3 1 74 LS86N 1 2 3 U 5A 1 2 13 12 U 7A 74 LS11D Figure 8: simple combination circuit The outcomes using the same procedures but this time for 3 inputs were then recorded. RESULTS a. Table showing schematic truth table for inverter obtained from practical observations X (INPUT) F (OUTPUT) 0 1 1 0 b. Table indicating the obtained responses of 2 inputs AND, OR, NAND, NOR and XOR gates. X (I/P 1) Y (I/P 2) AND (O/P 1) OR (O/P 2) NAND (O/P 3) NOR (O/P 3) XOR (O/P 4) 0 0 0 0 1 1 0 0 1 0 1 1 0 1 1 0 0 1 1 0 1 1 1 1 1 0 0 0 c. Table indicating the obtained responses when connecting a simple combination circuit in figure 8.
  • 8. 8 A(I/P 1) B(I/P 2) C(I/P 3) F(O/P) 0 0 0 0 0 0 1 0 0 1 0 1 0 1 1 1 1 0 0 1 1 0 1 1 1 1 0 1 1 1 1 0
  • 9. 9 DISCUSSION A lot of time was consumed by arguments since each group was made up of six people per working station. Other parties did not come prepared, a lot of time was consumed by trying to figure out and understanding first the theory and methodology used to carry out the experiment so much time which we could have used to carry out the experiment had elapsed. Another thing that made the experiment almost impossible to perform was lack of space, our work station was over crowded because the space in the work station was limited. This is a concern because time and again we had to reconnect our circuits, more especially the combination circuit, due to coiling up of jumper wires which made it difficult to trace the connections. Also, most of the apparatus used was very old that after connections were made, in most cases no outcome was traced or found leading to spending much time trouble shooting and fault finding rather than just taking readings we are sure of. There was deflection in practical outcomes here and there basically due to reasons stated in the discussion. RECOMMENDATIONS The University Of Botswana Electrical Engineering Department should start ordering laboratory equipment that is up to date and the already existing laboratory materials should be services regularly more especially before students come into the laboratory. The servicing should be carried out by the laboratory technicians thoroughly and the Electrical Engineering Department should perform thorough inspections on the serviced lab equipment in order to check if they need to be replaced or not. Electrical engineering students should always come prepared to the laboratory session so that much time can be spent on the experiment rather than discussing first what exactly should be done. Each student should participate thus having a task that one is capable of performing because they would have prepared thoroughly for the lab session. More equipment should be availed at the labs to avoid students over-crowding on one working station. CONCLUSION The logic circuit wiring basics were acquired perfectly through gate behavior observation and considerations. It was also found out that practical results recorded were corresponding to theoretical results so every practical observation matched its expectations thus the practical results were exactly the same as the theoretical results. The combination circuit connections were perfect and all the other connections that were made gave all the right or expected results. REFFERENCES - Mechatronics, Electronic Control Systems in Mechanical and Electrical Engineering (fifth edition) by W.Bolton. - Lab manual - Automation and Robotics.pdf by Miltiadis A. Boboulos.