SPICE MODEL of 2SC2712 in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Evaluation Report
COMPONENTS: TRANSISTOR
PART NUMBER: 2SC2712
MANUFACTURER: TOSHIBA
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

2. Pspice model
Model description
parameter
IS Saturation Current
BF Ideal Maximum Forward Beta
NF Forward Current Emission Coefficient
VAF Forward Early Voltage
IKF Forward Beta Roll-off Knee Current
ISE Non-ideal Base-Emitter Diode Saturation Current
NE Non-ideal Base-Emitter Diode Emission Coefficient
BR Ideal Maximum Reverse Beta
NR Reverse Emission Coefficient
VAR Reverse Early Voltage
IKR Reverse Beta Roll-off Knee Current
ISC Non-ideal Base-Collector Diode Saturation Current
NC Non-ideal Base-Collector Diode Emission Coefficient
NK Forward Beta Roll-off Slope Exponent
RE Emitter Resistance
RB Base Resistance
RC Series Collector Resistance
CJE Zero-bias Emitter-Base Junction Capacitance
VJE Emitter-Base Junction Potential
MJE Emitter-Base Junction Grading Coefficient
CJC Zero-bias Collector-Base Junction Capacitance
VJC Collector-base Junction Potential
MJC Collector-base Junction Grading Coefficient
FC Coefficient for Onset of Forward-bias Depletion
Capacitance
TF Forward Transit Time
XTF Coefficient for TF Dependency on Vce
VTF Voltage for TF Dependency on Vce
ITF Current for TF Dependency on Ic
PTF Excess Phase at f=1/2pi*TF
TR Reverse Transit Time
EG Activation Energy
XTB Forward Beta Temperature Coefficient
XTI Temperature Coefficient for IS
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

3. Transistor hFE-IC Characteristics
Circuit Simulation Result
1.0K
100
10
100uA 1.0mA 10mA 100mA 300mA
I(vsence)/ IB(Q1)
I(vsence)
Evaluation Circuit
v sence
0Vdc
Q1
C2712Y
V1
6Vdc
I1
0Adc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

4. Comparison Graph
Circuit Simulation Result
1000
Measurement
Simulation
100
hFE(S)
10
0.1 1 10 100 1000
-IC(mA)
Simulation Result
hFE
Ic(mA) Error(%)
Measurement Simulation
0.1 140.000 158.000 12.857
0.2 140.000 158.000 12.857
0.5 140.000 158.000 12.857
1 140.000 158.000 12.857
2 140.000 158.000 12.857
5 140.000 158.000 12.857
10 140.000 158.000 12.857
20 140.000 157.000 12.143
50 140.000 154.000 10.000
100 135.000 150.000 11.111
200 91.000 143.000 57.143
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

5. VCE(Sat)-IC Characteristics
Circuit Simulation Result
3.0V
1.0V
100mV
10mV
100uA 1.0mA 10mA 100mA 300mA
V(Q1:c)
IC(Q1)
Evaluation Circuit
VC
Q1
C2712Y
F1
F
I1 10
0Adc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

6. Comparison Graph
Circuit Simulation Result
100
Measurement
Simulation
10
VCE(SAT)
1
0.1
0.01
0.1 1 10 100 1000
IC(mA)
Simulation Result
VCE(sat)
IC(mA) Error(%)
Measurement Simulation
0.1 0.042 0.057 35.714
0.2 0.040 0.057 42.500
0.5 0.038 0.057 50.000
1 0.038 0.058 52.632
2 0.037 0.061 64.865
5 0.038 0.068 78.947
10 0.041 0.080 95.122
20 0.048 0.101 110.417
50 0.070 0.161 130.000
100 0.105 0.255 142.857
200 0.195 0.435 123.077
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

7. VBE(Sat)-IC Characteristics
Circuit Simulation Result
30V
10V
1.0V
100mV
100uA 1.0mA 10mA 100mA 300mA
V(Q1:b)
IC(Q1)
Evaluation Circuit
VC
Q1
C2712Y
F1
F
I1 10
0Adc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

8. Comparison Graph
Circuit Simulation Result
2
Measurement
Simulation
1.5
VBE(SAT)
1
0.5
0
0.1 1 10 100 1000
IC(mA)
Simulation Result
VBE(sat)
IC(A) Error(%)
Measurement Simulation
0.1 0.600 0.598 -0.333
0.2 0.610 0.616 0.984
0.5 0.635 0.642 1.102
1 0.650 0.664 2.154
2 0.680 0.688 1.176
5 0.720 0.730 1.389
10 0.760 0.773 1.711
20 0.810 0.835 3.086
50 0.900 0.968 7.556
100 0.980 1.140 16.327
200 1.050 1.437 36.857
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

9. Output Characteristics
Circuit Simulation Result
240mA
3.0
200mA
2.0
160mA
1.0
120mA
0.5
80mA
40mA
IB=0.2mA
A
0A
0V 1.0V 2.0V 3.0V 4.0V 5.0V 6.0V 7.0V
IC(Q1)
V_V1
Evaluation Circuit
Q1
C2712Y
10Vdc
I1 V1
0Adc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

10. Output Characteristics Reference
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006