Wilhelm Röntgen discovered X-rays in 1895 and Max von Laue established X-ray crystal diffraction in 1912 using X-rays to analyze the structure of crystals. X-ray diffraction works by firing X-rays at a crystalline sample and observing the scattered rays, which can be used to determine the location of atoms in the crystal based on the Bragg condition of diffraction. There are two main methods for X-ray diffraction - the Laue method which uses a single crystal sample and front scattering, and powder diffraction which analyzes polycrystalline samples using Debye-Scherrer cameras or modern diffractometers. The patterns obtained from X-ray diffraction can be analyzed using Rietveld refinement to determine