This document discusses several methods for X-ray diffraction analysis of crystal structures, including the Laue method, Bragg spectrometer method, rotating crystal method, and powder crystal method. The methods utilize X-rays generated by a cathode ray tube and directed at a crystal sample to produce a diffraction pattern that can reveal the internal crystal structure. Key steps involve collimating the X-ray beam, positioning the crystal sample, and recording the diffraction pattern on photographic plates or films. Analysis of the diffraction patterns allows identification of crystal structures.