In the following presentation, we highlight field-proven, relevant test solutions based on a cryogenic wafer-probe station. Special attention is given to overcoming the calibration standards instability, contact repeatability and reliability issues caused by the extreme environmental conditions. We will present the solution that enabled characterizing of RF MEMS devices at cryogenic condition with the benchmarking level of measurement accuracy and confidence.
Using contactless probing techniques, this feature allows you to perform calibrated in-circuit voltage and current time-domain measurements under large-signal conditions, on printed-circuit boards (PCB) or on wafer, at locations which are normally unreachable using standard VNA techniques.
Using contactless probing techniques, this feature allows you to perform calibrated in-circuit voltage and current time-domain measurements under large-signal conditions, on printed-circuit boards (PCB) or on wafer, at locations which are normally unreachable using standard VNA techniques.
Embedded systems increasingly employ digital, analog and RF signals all of which are tightly synchronized in time. Debugging these systems is challenging in that one needs to measure a number of different signals in one or more domains (time, digital, frequency) and with tight time synchronization. This session will discuss how a digital oscilloscope can be used to effectively debug these systems, and some of the instrumentation considerations that go along with this.
Stability under Large-Signal Conditions PresentationNMDG NV
This presentation demonstrates calibrated small-signal S-parameters extraction under large-signal conditions, performed in parallel with the calibrated large-signal measurements provided by the ZVxPlus nonlinear extension kits.
The extracted S-parameters allow calculating the different stability criteria as well as the stability circles over the full frequency bandwidth of the selected network analyser.
Join us for a LIVE WEBINAR on this topic! Wednesday, November 14, 2:00pm ET
http://bit.ly/XPgjO7
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Embedded systems increasingly employ digital, analog and RF signals all of which are tightly synchronized in time. Debugging these systems is challenging in that one needs to measure a number of different signals in one or more domains (time, digital, frequency) and with tight time synchronization. This session will discuss how a digital oscilloscope can be used to effectively debug these systems, and some of the instrumentation considerations that go along with this.
Stability under Large-Signal Conditions PresentationNMDG NV
This presentation demonstrates calibrated small-signal S-parameters extraction under large-signal conditions, performed in parallel with the calibrated large-signal measurements provided by the ZVxPlus nonlinear extension kits.
The extracted S-parameters allow calculating the different stability criteria as well as the stability circles over the full frequency bandwidth of the selected network analyser.
Join us for a LIVE WEBINAR on this topic! Wednesday, November 14, 2:00pm ET
http://bit.ly/XPgjO7
Wide bandwidth modulation is becoming more common in communications. The emergence of the 802.11ac wireless Ethernet standard has extended the modulation bandwidth to 160 MHz which requires very wide band measurement equipment to measure. This presentation illustrates the details of a measurement method that uses a real time digital down converter and post processing software that measures the performance of this signal.
IEEE SWTW 2012 Road to 450 mm Semiconductor Wafers - Ira Feldman li2Ira Feldman
Ira Feldman's presentation about the wafer probe impact of the transition to 450 mm semiconductor wafers from IEEE Semiconductor Wafer Test Workshop (SWTW) 2012.
Achieving Market Dominance through Technology Leadership -Cascade Microtech, Inc. is the leading provider of advanced probing systems, non-memory probes and sockets, from design through production
Probe Card Cost Drivers from Architecture to Zero Defects - IEEE Semiconductor Wafer Test Workshop 2011 presentation by Ira Feldman (www.hightechbizdev.com)
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The field of applications for IR cameras is wide, and they are used in many different industries, science, and public-safety sectors.
What are the principles that stand behind such applications? Which sensor types should be used and when do wavelength filters help to detect the things that need to be seen?
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As big data concepts have germinated, and are combined with new and improved data visualization techniques and faster processing capabilities, the opportunity to inject intelligence into ITS has finally emerged. Users for the first time have the tools available to data mine, actively spotting trends which were nearly impossible previously.
While the introduction of wide spread ANPR has been reasonably slow, both camera and ANPR technology has become mainstream. In addition, this same camera when used in conjunction with clever software can also: identify wrong way running, speed enforcement, Amber, Silver and LEO alerts, average speed analysis, objects in a road, vehicle classification and a host of other capabilities, which would otherwise require a barrage of additional sensors.
The dawn of integrated ANPR solutions is upon us, these systems have been widely used in a variety of applications from congestion charging to open road tolling, and have been proven to be robust, reliable, and accurate – with many vendors offering systems with accuracy level well in excess of 95%, even in free-flow environments.
This presentation identifes how ANPR compares to other sensor technologies, identify the areas where ANPR can and will make a difference as well as identify limitations in the current ITS philosophies.
IEEE Semiconductor Wafer Test Workshop SWTW 2014 - International Technology R...Ira Feldman
Please see full abstract on my blog: http://hightechbizdev.com/2014/06/12/ira-feldman-high-technology-business-development-ieee-semiconductor-wafer-test-workshop-2014-presentation/. Co-authored with Dave Armstrong (Advantest) and Marc Loranger (FormFactor).
Infrared Technology - Seeing the Invisible (Part Two: Camera Technology)Allied Vision
Through specific applications examples with sample images, this presentation introduces you to the basics of infrared (IR) imaging technology. You will learn that in the IR-world things look different and that you can visualize with an IR camera things which you cannot see with your own eyes. To understand “the why”, we touch on some basics about IR radiation and corresponding imaging sensor technologies.
Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013Ira Feldman
My presentation from IEEE SWTW 2013 - For a full description please see my blog:
http://hightechbizdev.com/2013/06/10/ira-feldman-high-technology-business-development-ieee-semiconductor-wafer-test-workshop-2013/
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Presentation, embedded below was developed to bring users up to speed in interpretation of their resistivity data. Class for end users was conducted in Indonesia and included training on field data collection with SibER-48 using ~ 900 m long profile in Wenner-Schlumberger and pole-dipole (remote electrode) 2D tomography. On the second day users received hands-on instructions on data import into RES2DINV software, quality assurance of the data based on visual approach as well as through RMS of the interpretation model.
General discussion about non-uniqueness of the subsurface interpretation model for 1D, 2D, and 3D representations has followed this class.
http://www.surfacetreatments.it/thinfilms
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Speaker: Charles Reece - Jefferson Lab, Newport News (VA) USA | Duration: 20 min.
Abstract
Binping Xiao, Larry Phillips, and Charles Reece
A system for making direct calorimetric measurements of the surface resistance at 7.5 GHz of small samples of variously prepared superconducting surfaces has been commissioned at JLab. The flat, 50 mm diameter sample temperature is regulated independently of the balance of the TE011 sapphire-loaded cavity, enabling Rs and Δλ measurements from 2 K to Tc of the sample. Initial operation, limited by available rf power, has extended to Bpk of 18 mT. The calorimeter resolution is better than 10 nΩ, and the sampled surface area is ~ 0.8 cm2. The SIC has been commissioned with a bulk Nb sample, demonstrating excellent agreement with standard BCS characterizations. Initial application to SRF thin films has begun. We are eager to apply it to non-niobium materials. Preparations for a second generation with extended dynamic range have already begun.
Magnetrol Guide Wave Radar Level Transmitter For Hygienic ApplicationsMiller Energy, Inc.
For hygienic applications, the transmitters are available with a 304 stainless steel housings designed specifically for use in facilities with the special requirements for the wetted and non-wetted materials, process connections and surface finishes of hygienic industries.
UHF/VHFEnergy Harvesting Radio System Physical and MAC Layer Considerationxiaohuzhang
This is my defence slides. There are three parts been talked :
(1) Background and challenges on wireless sensor networks and nodes;
(2) Solutions for the challenges of wireless sensor nodes;
(3) Summary and future research directions.
This presentation was given in Cardiff at the European Society of Rheology Conference in 2009. The presentation is about research in "extreme" areas of rheology and includes work on measuring the viscoelasticity of low viscosity fluids and the limiting extensional viscosity of high viscosity fluids.
2019-06-07 Characterization and research of semiconductors with an FTIR spect...LeonidBovkun
2019-06-07 Educational seminar at EP-3 University of Wuerzburg
I will present particular experiments and related results with FTIR spectrometer, so one may consider these experiments complimentary for you research.
PT. Imelta Guna Arta
Kompleks Medan Industrial Centre Blok D No. 1, Jalan Pulau Menjangan – KIM 2 Medan 20371,
Telp: +6261-6871817
Fax: +6261-6871812
WhatsApp: 0822-14975102
E-mail : esen@imeltagunaarta,marketing@imeltagunaarta.com
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Présentation complète (en anglais) du premier satellite radioamateur géostationnaire QATAR OSCAR-100 / Es'hail2.
Ce satellite a été développé par QARS (Qatar Amateur Radio Society) et es’hailSat (The Qatar satellite Company), sous la direction technique d’AMSAT-DL.
SBE Filter Tuning 101 by Jeremy Ruck November 2015kmsavage
What everyone ought to know about Filter Tuning – Try your hand at it. The retuning process will include basic information and characteristics of filters, and the following detailed steps for returning:
• Identification of equipment and tools
• Analyzer set-up
• Pre-setting and loading settings
The step-by-step guide will ensure efficient tuning. We feel the hands-on approach is the most desirable method of explaining LPTV filter tuning technology.
How can variables be measured in environments that are too hot, too cold, or moving too fast for traditional circuit-based sensors? A new technology for obtaining multiple, real-time measurements under extreme environmental conditions is being developed under Phase 1 and 2 funding contracts from NASA's Kennedy Space Center’s Small Business Technology Transfer (STTR) program. Opportunities for early deployment licensing and Phase 3 STTR contracts are now being accepted.
Passive, remote measuring systems can be created using new Orthogonal Frequency Code (OFC) multiplexing techniques and specially developed, next-generation SAW sensors. As a result, very cost-effective applications such as spaceflight sensing (for instance, temperature, pressure, or acceleration monitoring), remote cryogenic fluid level sensing, or an almost limitless number of other rigorous monitoring applications are possible.
UiPath Test Automation using UiPath Test Suite series, part 5DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 5. In this session, we will cover CI/CD with devops.
Topics covered:
CI/CD with in UiPath
End-to-end overview of CI/CD pipeline with Azure devops
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Lyndsey Byblow, Test Suite Sales Engineer @ UiPath, Inc.
Alt. GDG Cloud Southlake #33: Boule & Rebala: Effective AppSec in SDLC using ...James Anderson
Effective Application Security in Software Delivery lifecycle using Deployment Firewall and DBOM
The modern software delivery process (or the CI/CD process) includes many tools, distributed teams, open-source code, and cloud platforms. Constant focus on speed to release software to market, along with the traditional slow and manual security checks has caused gaps in continuous security as an important piece in the software supply chain. Today organizations feel more susceptible to external and internal cyber threats due to the vast attack surface in their applications supply chain and the lack of end-to-end governance and risk management.
The software team must secure its software delivery process to avoid vulnerability and security breaches. This needs to be achieved with existing tool chains and without extensive rework of the delivery processes. This talk will present strategies and techniques for providing visibility into the true risk of the existing vulnerabilities, preventing the introduction of security issues in the software, resolving vulnerabilities in production environments quickly, and capturing the deployment bill of materials (DBOM).
Speakers:
Bob Boule
Robert Boule is a technology enthusiast with PASSION for technology and making things work along with a knack for helping others understand how things work. He comes with around 20 years of solution engineering experience in application security, software continuous delivery, and SaaS platforms. He is known for his dynamic presentations in CI/CD and application security integrated in software delivery lifecycle.
Gopinath Rebala
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Generative AI Deep Dive: Advancing from Proof of Concept to ProductionAggregage
Join Maher Hanafi, VP of Engineering at Betterworks, in this new session where he'll share a practical framework to transform Gen AI prototypes into impactful products! He'll delve into the complexities of data collection and management, model selection and optimization, and ensuring security, scalability, and responsible use.
State of ICS and IoT Cyber Threat Landscape Report 2024 previewPrayukth K V
The IoT and OT threat landscape report has been prepared by the Threat Research Team at Sectrio using data from Sectrio, cyber threat intelligence farming facilities spread across over 85 cities around the world. In addition, Sectrio also runs AI-based advanced threat and payload engagement facilities that serve as sinks to attract and engage sophisticated threat actors, and newer malware including new variants and latent threats that are at an earlier stage of development.
The latest edition of the OT/ICS and IoT security Threat Landscape Report 2024 also covers:
State of global ICS asset and network exposure
Sectoral targets and attacks as well as the cost of ransom
Global APT activity, AI usage, actor and tactic profiles, and implications
Rise in volumes of AI-powered cyberattacks
Major cyber events in 2024
Malware and malicious payload trends
Cyberattack types and targets
Vulnerability exploit attempts on CVEs
Attacks on counties – USA
Expansion of bot farms – how, where, and why
In-depth analysis of the cyber threat landscape across North America, South America, Europe, APAC, and the Middle East
Why are attacks on smart factories rising?
Cyber risk predictions
Axis of attacks – Europe
Systemic attacks in the Middle East
Download the full report from here:
https://sectrio.com/resources/ot-threat-landscape-reports/sectrio-releases-ot-ics-and-iot-security-threat-landscape-report-2024/
Essentials of Automations: The Art of Triggers and Actions in FMESafe Software
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We’ll kick things off by showcasing the most commonly used event-based triggers, introducing you to various automation workflows like manual triggers, schedules, directory watchers, and more. Plus, see how these elements play out in real scenarios.
Whether you’re tweaking your current setup or building from the ground up, this session will arm you with the tools and insights needed to transform your FME usage into a powerhouse of productivity. Join us to discover effective strategies that simplify complex processes, enhancing your productivity and transforming your data management practices with FME. Let’s turn complexity into clarity and make your workspaces work wonders!
Securing your Kubernetes cluster_ a step-by-step guide to success !KatiaHIMEUR1
Today, after several years of existence, an extremely active community and an ultra-dynamic ecosystem, Kubernetes has established itself as the de facto standard in container orchestration. Thanks to a wide range of managed services, it has never been so easy to set up a ready-to-use Kubernetes cluster.
However, this ease of use means that the subject of security in Kubernetes is often left for later, or even neglected. This exposes companies to significant risks.
In this talk, I'll show you step-by-step how to secure your Kubernetes cluster for greater peace of mind and reliability.
Dr. Sean Tan, Head of Data Science, Changi Airport Group
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A tale of scale & speed: How the US Navy is enabling software delivery from l...sonjaschweigert1
Rapid and secure feature delivery is a goal across every application team and every branch of the DoD. The Navy’s DevSecOps platform, Party Barge, has achieved:
- Reduction in onboarding time from 5 weeks to 1 day
- Improved developer experience and productivity through actionable findings and reduction of false positives
- Maintenance of superior security standards and inherent policy enforcement with Authorization to Operate (ATO)
Development teams can ship efficiently and ensure applications are cyber ready for Navy Authorizing Officials (AOs). In this webinar, Sigma Defense and Anchore will give attendees a look behind the scenes and demo secure pipeline automation and security artifacts that speed up application ATO and time to production.
We will cover:
- How to remove silos in DevSecOps
- How to build efficient development pipeline roles and component templates
- How to deliver security artifacts that matter for ATO’s (SBOMs, vulnerability reports, and policy evidence)
- How to streamline operations with automated policy checks on container images
Observability Concepts EVERY Developer Should Know -- DeveloperWeek Europe.pdfPaige Cruz
Monitoring and observability aren’t traditionally found in software curriculums and many of us cobble this knowledge together from whatever vendor or ecosystem we were first introduced to and whatever is a part of your current company’s observability stack.
While the dev and ops silo continues to crumble….many organizations still relegate monitoring & observability as the purview of ops, infra and SRE teams. This is a mistake - achieving a highly observable system requires collaboration up and down the stack.
I, a former op, would like to extend an invitation to all application developers to join the observability party will share these foundational concepts to build on:
DevOps and Testing slides at DASA ConnectKari Kakkonen
My and Rik Marselis slides at 30.5.2024 DASA Connect conference. We discuss about what is testing, then what is agile testing and finally what is Testing in DevOps. Finally we had lovely workshop with the participants trying to find out different ways to think about quality and testing in different parts of the DevOps infinity loop.
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
LF Energy Webinar: Electrical Grid Modelling and Simulation Through PowSyBl -...DanBrown980551
Do you want to learn how to model and simulate an electrical network from scratch in under an hour?
Then welcome to this PowSyBl workshop, hosted by Rte, the French Transmission System Operator (TSO)!
During the webinar, you will discover the PowSyBl ecosystem as well as handle and study an electrical network through an interactive Python notebook.
PowSyBl is an open source project hosted by LF Energy, which offers a comprehensive set of features for electrical grid modelling and simulation. Among other advanced features, PowSyBl provides:
- A fully editable and extendable library for grid component modelling;
- Visualization tools to display your network;
- Grid simulation tools, such as power flows, security analyses (with or without remedial actions) and sensitivity analyses;
The framework is mostly written in Java, with a Python binding so that Python developers can access PowSyBl functionalities as well.
What you will learn during the webinar:
- For beginners: discover PowSyBl's functionalities through a quick general presentation and the notebook, without needing any expert coding skills;
- For advanced developers: master the skills to efficiently apply PowSyBl functionalities to your real-world scenarios.
GraphSummit Singapore | The Art of the Possible with Graph - Q2 2024Neo4j
Neha Bajwa, Vice President of Product Marketing, Neo4j
Join us as we explore breakthrough innovations enabled by interconnected data and AI. Discover firsthand how organizations use relationships in data to uncover contextual insights and solve our most pressing challenges – from optimizing supply chains, detecting fraud, and improving customer experiences to accelerating drug discoveries.
SAP Sapphire 2024 - ASUG301 building better apps with SAP Fiori.pdfPeter Spielvogel
Building better applications for business users with SAP Fiori.
• What is SAP Fiori and why it matters to you
• How a better user experience drives measurable business benefits
• How to get started with SAP Fiori today
• How SAP Fiori elements accelerates application development
• How SAP Build Code includes SAP Fiori tools and other generative artificial intelligence capabilities
• How SAP Fiori paves the way for using AI in SAP apps
20240605 QFM017 Machine Intelligence Reading List May 2024
Wafer-Level RF MEMS Devices Characterization in Cryogenic Environment
1. 16th IEEE European Test Symposium
May 23-27, 2011
Wafer-Level RF MEMS Devices
Characterization in Cryogenic
Environment
Gavin Fisher, Andrej Rumiantsev,
Frank-Michael Werner, Stojan Kanev
2. Outline
RF MEMS Test Challenges
System Solution for RF MEMS
Measurement Examples
Conclusion
3. RF MEMS Test Challenges
MEMS device: microsystem based planar fabrication technology
combining mechanical and electrical functions (multi-physics
interaction)
Testing and characterization are extremely sensitive to ambient
parameters
Tests require:
– Controlled (closed) environment
– RF and microwave interface
For RF testing thermal stability of probes and cables is
essential to maintain calibration stability
– Core solution, Keep probes and cables at DUT temperature
– Calibration monitoring to provide accurate feedback of
calibration state
4. RF MEMS Test Challenges (cont.)
Probing of whole wafer, wafer pieces and dies
Maintenance of calibration substrates
Contact reliability
Contact repeatability
Electrical performance of RF probes
Temperature stability of calibration standards
Integration with various test instrumentation
5. Outline
RF MEMS Test Challenges
System Solution for RF MEMS
Measurement Examples
Conclusion
6. Putting a Prober Inside a Vacuum Chamber
Reserve 4x RF Feedthrough
67 GHz
Reserve for
Reserve PH #8
for PH #9 DC Triax
Fixed cold shield
4x DC Triax
Feedthrough
PH #6 PH #3
67GHz DC Triax
PH #5 PH #2
67GHz 67GHz
PH #4 PH #1
DC Triax 67GHz
Removable
cold shield
PH #7 Reserve
DC Triax for PH #10
Venting Valve
Y X
Z
Chuck Stage
Control
8. Cryogenic System for Device Characterization
Temperature range: 4K … 675K
Up to 8 positioners
Low signal IV/CV: <100fA
High frequency: up to 67GHz
Integration kits for Agilent and
Keithley
EM shielding and light tightness
9. Motion Monitoring in Cryogenic Environment
Integration with Polytec MSA-500 Micro System
Analyzer
Example of RF MEMS Switch
10. Features – Wafer, Sample and Die Carriers
Carrier solution for Manual Systems
prepared for fixing RF calibration
substrates
Special carrier solution for Special carrier solution for diced
Standard 200 mm wafer carrier fixing multiple single substrates pieces with various shapes
11. Features – Vacuum Positioners
Easy and reliable probe landing
Short and stiff arms
Manipulation from outside by rotary
feedthroughs
Magnetic foot (standard) for highest
flexibility in probe configuration
12 mm XYZ movement range
Arms:
– DC triaxial flex
– DC for AP&T
– RF for IZI Probe etc.
– DC&RF for
Multi IZI Probes
12. Features – Vacuum Positioners
DC probes (triax, coax)
AP&T probe for CV
RF Probe up to 67GHz
Multi IZI Probes
Cryogenic probe arms with
active probe and cable cooling
to ensure stable
measurements
High vacuum feedthroughs
Calibration substrates
13. Outline
RF MEMS Test Challenges
System Solution for RF MEMS
Measurement Examples
Conclusion
14. System Features: System Drift, 4 Hours
|Sij' - Sij|/|Sij| and |Sii' - Sii|
0.15
System Drift, 4K
System Drift, RT
0.10
0.05
0
0 10 20 30 40
Frequency (GHz)
System drift @ 4K is comparable with the room temperature
H. Geissler, A. Rumiantsev, S. Schott, P. Sakalas, and M. Schroter, "A novel probe station for helium temperature on-wafer
measurements " in ARFTG Microwave Measurements Conference-Fall, 68th, 2006, pp. 67-73.
15. Wincal XE – Cal monitoring alarms
Wincal can perform a spot measurement and
provide alarm if system has drifted beyond limits
16. Measurement aid – Wincal XE
Probing at cryogenic temperatures can be challenging and it is helpful
to be able to check that good contact is established
Wincal XE can do this with a single button press
17. Wincal XE Advanced reporting
Wincal can perform pad parasitic removal de-
embedding and parameter extraction“on the fly”
18. Temperature Stability of Standards
Line (Thru) Load
Temperature stable wafer-level calibration standards for
accurate measurements down to 4K
A. Rumiantsev, R. Doerner, and P. Sakalas, "Verification of wafer-level calibration accuracy at cryogenic temperatures " in
ARFTG Microwave Measurements Conference-Fall, 68th, 2006, pp. 134-140.
19. Cryogenic |Z| Probe Contact Repeatability @ 4K
First Contact Second Contact
0 DB(|S[1,1]|) 0
Thru DB(|S[1,1]|)
-10 -10
Thru_2
-20 DB(|S[2,2]|) -20
Thru DB(|S[2,2]|)
-30 -30 Thru_2
-40 -40
-50 -50
-60 -60
-70 -70
-80 -80
-90 -90
-100 -100
0 10 20 30 40 50 0.04 10.04 20.04 30.04 40.04 50
Frequency (GHz) FREQUENCY (GHz)
Excellent contact repeatability guarantees reliable and
trustable results
*Measured with thru standard
20. RF MEMS Switch
Procedure:
– S parameters measurement before
cycling
– C(V) measurement
– Cycling @ 100 Hz, unipolar, 55V, 50%
duty cycle
– S-parameters after cycling
To do and outcome :
– Extraction of ∆V vs. cycles
– Pull-in Pull-out parameters dependence
on the environment conditions
21. CV Curves for Different Testing Conditions
1 .2
1
(1 ) 2
1 .0
(2 ) 3
10
(3) 4
(4) 0.8
C (p F )
0.6
∆V (V)
0.4
1
0.2
0.0
10 1 00 1 000 -80 -60 -40 -2 0 0 20 40 60 80
N b o f c yc le s Vo ltag e (V)
1: Room ambient @ ~296°C, 45% RH
2: Vacuum @ 1.4E-5 mbar – 296K
3: N2 @ 1.02 atm – 296K
4: Vacuum @ 2.2E-6 mbar – 223K
22. S-Parameters for Different Testing Conditions
B E F O R E C YC L IN G B E F O R E C YC L IN G
0
0.0
Before cycling
-0.5
-2 0
-1 .0
S 1 1 (d B )
S 2 1 (d B )
-1 .5
-40 (1 ) (1 )
(2 ) (2 )
-2 .0
(3) (3)
-60 (4) (4)
-2 .5
0 10 20 30 40 50 60 -3.0
0 10 20 30 40 50 60
GHz
GHz
0.0
0
After 1000 cycles
-0.5
-2 0
-1 .0
S 2 1 (d B )
S 1 1 (d B )
(1 )
-1 .5
-40 (1 ) (2 )
(2 ) (3)
-2 .0 (4)
(3)
(4)
-60
-2 .5
0 10 20 30 40 50 60 0 10 20 30 40 50 60
GHz GHz
23. Outline
RF MEMS Test Challenges
System Solution for RF MEMS
Measurement Examples
Conclusion
24. Conclusion
Wafer-level testing of RF MEMS significantly reduces
fabrication cost and time to market
Cryogenic Probe Systems covering the whole range
of RF MEMS test requirements are available
System design and measurement know-how of
Cascade Microtech provides you with “environment
independent” measurement accuracy, repeatability
and confidence in your results
25. Acknowledgement
Jason Ruan, Alexandre Rumeau,
Laurent Bary and Fabio Coccetti
from CNRS, LAAS, Toulouse (France)
for excellent support with the
measurement results
of the RF Switches
26. Questions?
If you have any questions or comments, please
contact:
Frank-Michael Werner
Business Manager
VAC / CRYO Systems and MEMS Test
E-mail: frank-michael.werner@cmicro.com
Office: +49 (35240) 73-330
Mobile: +49 151 1210 8668