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Safety-Instrumented Systems
A Fault Tree Approach
Joseph Belland, Isograph Inc.
David Wiseman, Isograph Ltd.
Safety-Instrumented Systems
 Critical Processes or systems
 Found in many different industries
 Malfunction may cause risk
 Safety, environmental, or financial
 Examples:
 Chemical reactor
 Nuclear generator
 Airbag
Safety-Instrumented Systems
 Mitigate risks of critical systems
 Restores system to safe state in event of
hazardous condition
 Three elements
 Inputs: Monitor system, detect hazardous
conditions
 Logic solver: interprets inputs
 Final elements: halt the system or process or
restore it to failsafe state
SIS Example: HIPPS
Example Fault Tree
OR
Top event
(hazard)
VOTE
2
Vote gate
AND
Logic gate
EV2
Basic event
EV3
Dormant
event
EV4
Basic event
EV5
Basic event
EV6
Basic event
Construction Logic
 SIS terminology: vote to trip
 Fault Trees: failure logic
SIS trip logic 1ooN NooN MooN
Fault Tree Gate
AND OR (N-M+1)
Construction Logic Example
VALVES
Both valves
fail open
VALVE1
Block valve
1 fails open
VALVE2
Block valve
2 fails open
XV XV
VALVES1
Either valve
fails open
VALVE3
Block valve
1 fails open
VALVE4
Block valve
2 fails open
Generic SIS Tree
PFD
SIS failed
dangerous
INPUTS LOGIC SOLVER FINAL ELEMENTS
HIPPS Fault Tree
HIPPS PFD
HIPPS fails to
stop over-
pressurization
PTS
2
2 of 3 pressure
transmitters fail
to register a high
pressure
VALVES
Both valves
fail open
LS
Logic Solver
fails to send
trip signal
PT1
Pressure
Transmitter 1
fails low
PT2
Pressure
Transmitter 2
fails low
PT3
Pressure
Transmitter 3
fails low
VALVE1
Block valve
1 fails open
VALVE2
Block valve
2 fails open
Failure Data
λ SD
λ SU
λ DU
λ DD
Failure Data
 Fault Trees constructed for a single
hazard
 Basic events contribute to that hazard
 Dangerous or Safe failures only
Failure Data
 Commonly-used data
 Failure rate
 MTTR
 Test interval
 Dangerous failure %
 Diagnostic coverage
 Proof test coverage
 Used in equation to solve PFD
Common Cause Failures
 Affect multiple components
simultaneously
 Reduce effectiveness of redundancy
 Beta factor
 Percent of failures due to CCF
 FT assumes independence
 CCFs must be accounted for
 Separate basic event
 Implicit inclusion
Explicit CCF Inclusion
SYS
System
failure
IND
Both
components fail
independently
COMP CCF
Components
fail due to
CCF
COMP1 IND
Component 1
independent
failure
COMP2 IND
Component 2
independent
failure
Implicit CCF Inclusion
SYS2
System
failure
COMP1
Component
1 failure
COMP
CCF
COMP2
Component
2 failure
COMP
CCF
Logic and PFDAVG
 FT methods:
1. Solve component PFDAVG
2. Apply system logic to calculate system
PFDAVG
 IEC 61508-6
1. Apply system logic
2. Solve PFDAVG
𝑓(𝑥) ∙ 𝑓(𝑥) ≠ 𝑓(𝑥) ∙ 𝑓(𝑥)
HIPPS Example
 Block valves
 IEC 61508-6: 3.949E-3
 FT: 3.348E-3
 Optimistic
 Compensating algorithm needed
 Markov analysis
 FT program with compensation: 3.913E-3
HIPPS Analysis
 SIL 2
PFDavg λ (/hour) MTBF
(hours)
RRF
4.7E-3 6.193E-7 1,622,000 212.8
Spurious Trip Analysis
 How often SIS engages unnecessarily
 “Safe” failures
 FT used to quantify MTTFspurious
 Failure data: safe failure rate
 Logical reverse of PFD Fault Tree
HIPPS Spurious Trip FT
HIPPS SPURIOUS
MTTF=1.622E+05
HIPPS
engages
unnecessarily
PTS
2
2 of 3 pressure
transmitters
falsely register
high pressure
VALVES
Valve system
engages
unnecessarily
LS
Logic Solver
fails to send
trip signal
PT1
Pressure
Transmitter
1 fails high
PT2
Pressure
Transmitter
2 fails high
PT3
Pressure
Transmitter
3 fails high
VALVE1
Block valve
1 fails closed
VALVE2
Block valve
2 fails closed
Optimization
 Advantage of computer programs
 How can we improve reliability?
 Importance Analysis
 Sensitivity Analysis
Importance Analysis
 Event contribution to system failure
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Block valves Pressure
transmitters
Logic solver
Sensitivity Analysis
 Repeated changes of events to see
effect on TOP gate
 Test different basic event inputs
 Example
 Different block valve test intervals
τ
(months)
4 6 8 12 18 24
PFDavg 1.028E-3 1.274E-3 1.547E-3 2.174E-3 3.314E-3 4.700E-3
Conclusion
 Fault Tree Analysis
 Useful tool for evaluating SIS
 Well-developed methodology
 Plenty of programs exist
 Can model complex system logic
 Can model PFD/Spurious trips
 CCFs taken into account
 Importance and sensitivity considerations
Questions?
JBelland@isograph.com
DWiseman@isograph.com

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Using fault trees to analyze Safety Instrumented Systems

  • 1. Safety-Instrumented Systems A Fault Tree Approach Joseph Belland, Isograph Inc. David Wiseman, Isograph Ltd.
  • 2. Safety-Instrumented Systems  Critical Processes or systems  Found in many different industries  Malfunction may cause risk  Safety, environmental, or financial  Examples:  Chemical reactor  Nuclear generator  Airbag
  • 3. Safety-Instrumented Systems  Mitigate risks of critical systems  Restores system to safe state in event of hazardous condition  Three elements  Inputs: Monitor system, detect hazardous conditions  Logic solver: interprets inputs  Final elements: halt the system or process or restore it to failsafe state
  • 5. Example Fault Tree OR Top event (hazard) VOTE 2 Vote gate AND Logic gate EV2 Basic event EV3 Dormant event EV4 Basic event EV5 Basic event EV6 Basic event
  • 6. Construction Logic  SIS terminology: vote to trip  Fault Trees: failure logic SIS trip logic 1ooN NooN MooN Fault Tree Gate AND OR (N-M+1)
  • 7. Construction Logic Example VALVES Both valves fail open VALVE1 Block valve 1 fails open VALVE2 Block valve 2 fails open XV XV VALVES1 Either valve fails open VALVE3 Block valve 1 fails open VALVE4 Block valve 2 fails open
  • 8. Generic SIS Tree PFD SIS failed dangerous INPUTS LOGIC SOLVER FINAL ELEMENTS
  • 9. HIPPS Fault Tree HIPPS PFD HIPPS fails to stop over- pressurization PTS 2 2 of 3 pressure transmitters fail to register a high pressure VALVES Both valves fail open LS Logic Solver fails to send trip signal PT1 Pressure Transmitter 1 fails low PT2 Pressure Transmitter 2 fails low PT3 Pressure Transmitter 3 fails low VALVE1 Block valve 1 fails open VALVE2 Block valve 2 fails open
  • 10. Failure Data λ SD λ SU λ DU λ DD
  • 11. Failure Data  Fault Trees constructed for a single hazard  Basic events contribute to that hazard  Dangerous or Safe failures only
  • 12. Failure Data  Commonly-used data  Failure rate  MTTR  Test interval  Dangerous failure %  Diagnostic coverage  Proof test coverage  Used in equation to solve PFD
  • 13. Common Cause Failures  Affect multiple components simultaneously  Reduce effectiveness of redundancy  Beta factor  Percent of failures due to CCF  FT assumes independence  CCFs must be accounted for  Separate basic event  Implicit inclusion
  • 14. Explicit CCF Inclusion SYS System failure IND Both components fail independently COMP CCF Components fail due to CCF COMP1 IND Component 1 independent failure COMP2 IND Component 2 independent failure
  • 15. Implicit CCF Inclusion SYS2 System failure COMP1 Component 1 failure COMP CCF COMP2 Component 2 failure COMP CCF
  • 16. Logic and PFDAVG  FT methods: 1. Solve component PFDAVG 2. Apply system logic to calculate system PFDAVG  IEC 61508-6 1. Apply system logic 2. Solve PFDAVG 𝑓(𝑥) ∙ 𝑓(𝑥) ≠ 𝑓(𝑥) ∙ 𝑓(𝑥)
  • 17. HIPPS Example  Block valves  IEC 61508-6: 3.949E-3  FT: 3.348E-3  Optimistic  Compensating algorithm needed  Markov analysis  FT program with compensation: 3.913E-3
  • 18. HIPPS Analysis  SIL 2 PFDavg λ (/hour) MTBF (hours) RRF 4.7E-3 6.193E-7 1,622,000 212.8
  • 19. Spurious Trip Analysis  How often SIS engages unnecessarily  “Safe” failures  FT used to quantify MTTFspurious  Failure data: safe failure rate  Logical reverse of PFD Fault Tree
  • 20. HIPPS Spurious Trip FT HIPPS SPURIOUS MTTF=1.622E+05 HIPPS engages unnecessarily PTS 2 2 of 3 pressure transmitters falsely register high pressure VALVES Valve system engages unnecessarily LS Logic Solver fails to send trip signal PT1 Pressure Transmitter 1 fails high PT2 Pressure Transmitter 2 fails high PT3 Pressure Transmitter 3 fails high VALVE1 Block valve 1 fails closed VALVE2 Block valve 2 fails closed
  • 21. Optimization  Advantage of computer programs  How can we improve reliability?  Importance Analysis  Sensitivity Analysis
  • 22. Importance Analysis  Event contribution to system failure 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 Block valves Pressure transmitters Logic solver
  • 23. Sensitivity Analysis  Repeated changes of events to see effect on TOP gate  Test different basic event inputs  Example  Different block valve test intervals τ (months) 4 6 8 12 18 24 PFDavg 1.028E-3 1.274E-3 1.547E-3 2.174E-3 3.314E-3 4.700E-3
  • 24. Conclusion  Fault Tree Analysis  Useful tool for evaluating SIS  Well-developed methodology  Plenty of programs exist  Can model complex system logic  Can model PFD/Spurious trips  CCFs taken into account  Importance and sensitivity considerations

Editor's Notes

  1. High-integrity pressure protection system Seen in petrochemical applications Prevent over-pressurization in fluid line or vessel Over-pressurization can cause rupture or explosion HIPPS shuts off inputs to mitigate risk
  2. What is it? Deductive hazard analysis Identifies causes of hazard (TOP event) TOP event linked to basic events via logic gates Basic (bottom) events represent component failures or events Quantitative Probabilistic failure data inputs Reliability metric outputs Uses Boolean algebra/probability math
  3. SIS component failures typically divided into: Safe detected Safe undetected Dangerous detected Dangerous undetected
  4. FTA used to analyse single hazard Demand failure of HIPPS Dangerous failures only Spurious trip of HIPPS Safe failures only
  5. Sometime safe and dangerous failure modes must be modelled in separate events Some software allow all modes to be built into single event
  6. X_Mean * Y_Mean = Mean(X * Y) if there is no correlation between X and Y, i.e. They are independent Why would this be the case if a cut set includes >1 dormant event?
  7. (see paper for details)
  8. Reverse of MooN is N – M +1. AND becomes OR (not for TOP gate, though)
  9. Calculated by comparing probability of hazard if event never occurs, to when it does occur (normal result). Here, block valves contribute to 89% of demand failures.
  10. Tau = test intervals tried