The document provides an overview of semiconductor technology and industry. It discusses the history and evolution of transistor technology from the point contact transistor to today's nanowire transistors. It describes Moore's law and how transistor counts have increased exponentially over time due to scaling. The document also outlines the semiconductor manufacturing process and describes the infrastructure required for wafer fabrication facilities. It analyzes cost structures, yield optimization, and industry consolidation trends. Finally, it discusses future opportunities around applications like 5G, AI, and big data driving demand rather than technology alone.
Nanometer layout handbook at high speed designMinho Park
I made this contents for whom is about to layout own's IC design. I think it would be helpful to consider layouts about high speed Rx / Tx.
Specially it was aimed giga hertz bandwidth I/O with its ESD protection (I am still working on that items to rearrange with my knowledge to my experiences)
I showed up all references and all images (except originals) are belong to own's copy rights.
In semiconductor design, standard-cell methodology is a method of designing application-specific integrated circuits (ASICs) with mostly digital-logic features. Standard-cell methodology is an example of design abstraction, whereby a low-level very-large-scale integration (VLSI) layout is encapsulated into an abstract logic representation (such as a NAND gate).
Cell-based methodology – the general class to which standard cells belong – makes it possible for one designer to focus on the high-level (logical function) aspect of digital design, while another designer focuses on the implementation (physical) aspect. Along with semiconductor manufacturing advances, standard-cell methodology has helped designers scale ASICs from comparatively simple single-function ICs (of several thousand gates), to complex multi-million gate system-on-a-chip (SoC) devices.
Using polysilicon as a gate contact instead of metal in CMOSEng Ansam Hadi
Using polysilicon as a gatecontact instead of metal in CMOS
Complementary metal oxide semiconductor (CMOS technology) is used to construct ICs and this technology is used in digital logic circuits
Nanometer layout handbook at high speed designMinho Park
I made this contents for whom is about to layout own's IC design. I think it would be helpful to consider layouts about high speed Rx / Tx.
Specially it was aimed giga hertz bandwidth I/O with its ESD protection (I am still working on that items to rearrange with my knowledge to my experiences)
I showed up all references and all images (except originals) are belong to own's copy rights.
In semiconductor design, standard-cell methodology is a method of designing application-specific integrated circuits (ASICs) with mostly digital-logic features. Standard-cell methodology is an example of design abstraction, whereby a low-level very-large-scale integration (VLSI) layout is encapsulated into an abstract logic representation (such as a NAND gate).
Cell-based methodology – the general class to which standard cells belong – makes it possible for one designer to focus on the high-level (logical function) aspect of digital design, while another designer focuses on the implementation (physical) aspect. Along with semiconductor manufacturing advances, standard-cell methodology has helped designers scale ASICs from comparatively simple single-function ICs (of several thousand gates), to complex multi-million gate system-on-a-chip (SoC) devices.
Using polysilicon as a gate contact instead of metal in CMOSEng Ansam Hadi
Using polysilicon as a gatecontact instead of metal in CMOS
Complementary metal oxide semiconductor (CMOS technology) is used to construct ICs and this technology is used in digital logic circuits
Define Width and Height of Core and Die (http://www.vlsisystemdesign.com/PD-F...VLSI SYSTEM Design
https://www.udemy.com/vlsi-academy
The very first step in chip design is floorplanning, in which the width and height of the chip, basically the area of the chip, is defined. A chip consists of two parts, 'core' and 'die'.
I made this presentation for you , I hope its useful for you all, and I hate Plagiarism please, I also used some slides here but I mentioned all in the last slide :)
Hope you can get benefits from it
As we push through lower technology nodes in the IC and chip design, the wire width goes thinner along with transistor size. This makes the wire resistance more dominant on 16nm and below technology nodes. This increasing resistance and the decreasing width of metal wires introduce many Electromigration and IR drop issues. These two issues play major roles in reducing the lifespan of an electronic device and are the causes of functionality failure in any electronic devices with lower technology nodes.
In this article, we will discuss the problems of electromigration and IR drop, and techniques to prevent the occurrence of these issues in electronic devices.
Electromigration is the gradual displacement of metal atoms in a semiconductor. It occurs when the current density is high enough to cause the drift of metal ions in the direction of the electron flow, and is characterized by the ion flux density. This density depends on the magnitude of forces that tend to hold the ions in place, i.e., the nature of the conductor, crystal size, interface and grain-boundary chemistry, and the magnitude of forces that tend to dislodge them, including the current density, temperature and mechanical stresses.
The Power supply in the chip is distributed uniformly through metal layers (Vdd & Vss) across the design. These metal layers have finite amount of resistance. When voltage is applied to this metal wires current starts flowing through the metal layers and some voltage is dropped due to that resistance of metal wires and current. this drop is called as IR drop.
Multiple patterning is a class of technologies for manufacturing integrated circuits (ICs), developed for photolithography to enhance the feature density. The simplest case of multiple patterning is double patterning, where a conventional lithography process is enhanced to produce double the expected number of features. The resolution of a photoresist pattern is believed to blur at around 45 nm half-pitch. For the semiconductor industry, therefore, double patterning was introduced for the 32 nm half-pitch node and below. This presentation gives us an insight of why multiple patterning is an important to give us a better resolution below 32nm.
https://www.udemy.com/vlsi-academy
Usually, while drawing any circuit on paper, we have only one 'vdd' at the top and one 'vss' at the bottom. But on a chip, it becomes necessary to have a grid structure of power, with more than one 'vdd' and 'vss'. The concept of power grid structure would be uploaded soon. It is actually the scaling trend that drives chip designers for power grid structure.
A VLSI (Very Large Scale Integration) system integrates millions of “electronic components” in a small area (few mm2 few cm2).
design “efficient” VLSI systems that has:
Circuit Speed ( high )
Power consumption ( low )
Design Area ( low )
Analog Mixed-Signal Design in FinFET Processes Design World
While industry pundits have forecasted the end of analog design in the next leading edge process, the reality is that the practice is still going strong, and there’s no end in sight. Not only are teams still designing data converters, PLLs, filters, and other analog goodies in the latest processes (including FinFET), but design teams are reaching higher levels of performance than they did in yesterday’s processes. The new processes have, without a doubt, changed the task of analog design, and the designer’s toolkit has had to undergo a major revision. Many of our old techniques have become a lot less relevant, and today’s designer needs to have a good handle on a broad set of new techniques.
Some of the changes are a result of designers targeting processes for very digital applications (supply voltages of 0.8V and less). Others are a result of the size of the devices (matching of small devices is poor, matching of very small devices is worse). Changes are also a result of the new fabrication techniques that must be used to make the devices (unit-sized devices and no mixing of different device types - resistor and I/O device ghettos are required). Of course, there’s great news: the transistors are wonderfully fast and the digital is almost free.
View this webinar to:
-Gain an understanding of the challenges of analog design in the new world of leading-edge processes
-Learn about design techniques that take advantage of the characteristics of today’s design reality
Define Width and Height of Core and Die (http://www.vlsisystemdesign.com/PD-F...VLSI SYSTEM Design
https://www.udemy.com/vlsi-academy
The very first step in chip design is floorplanning, in which the width and height of the chip, basically the area of the chip, is defined. A chip consists of two parts, 'core' and 'die'.
I made this presentation for you , I hope its useful for you all, and I hate Plagiarism please, I also used some slides here but I mentioned all in the last slide :)
Hope you can get benefits from it
As we push through lower technology nodes in the IC and chip design, the wire width goes thinner along with transistor size. This makes the wire resistance more dominant on 16nm and below technology nodes. This increasing resistance and the decreasing width of metal wires introduce many Electromigration and IR drop issues. These two issues play major roles in reducing the lifespan of an electronic device and are the causes of functionality failure in any electronic devices with lower technology nodes.
In this article, we will discuss the problems of electromigration and IR drop, and techniques to prevent the occurrence of these issues in electronic devices.
Electromigration is the gradual displacement of metal atoms in a semiconductor. It occurs when the current density is high enough to cause the drift of metal ions in the direction of the electron flow, and is characterized by the ion flux density. This density depends on the magnitude of forces that tend to hold the ions in place, i.e., the nature of the conductor, crystal size, interface and grain-boundary chemistry, and the magnitude of forces that tend to dislodge them, including the current density, temperature and mechanical stresses.
The Power supply in the chip is distributed uniformly through metal layers (Vdd & Vss) across the design. These metal layers have finite amount of resistance. When voltage is applied to this metal wires current starts flowing through the metal layers and some voltage is dropped due to that resistance of metal wires and current. this drop is called as IR drop.
Multiple patterning is a class of technologies for manufacturing integrated circuits (ICs), developed for photolithography to enhance the feature density. The simplest case of multiple patterning is double patterning, where a conventional lithography process is enhanced to produce double the expected number of features. The resolution of a photoresist pattern is believed to blur at around 45 nm half-pitch. For the semiconductor industry, therefore, double patterning was introduced for the 32 nm half-pitch node and below. This presentation gives us an insight of why multiple patterning is an important to give us a better resolution below 32nm.
https://www.udemy.com/vlsi-academy
Usually, while drawing any circuit on paper, we have only one 'vdd' at the top and one 'vss' at the bottom. But on a chip, it becomes necessary to have a grid structure of power, with more than one 'vdd' and 'vss'. The concept of power grid structure would be uploaded soon. It is actually the scaling trend that drives chip designers for power grid structure.
A VLSI (Very Large Scale Integration) system integrates millions of “electronic components” in a small area (few mm2 few cm2).
design “efficient” VLSI systems that has:
Circuit Speed ( high )
Power consumption ( low )
Design Area ( low )
Analog Mixed-Signal Design in FinFET Processes Design World
While industry pundits have forecasted the end of analog design in the next leading edge process, the reality is that the practice is still going strong, and there’s no end in sight. Not only are teams still designing data converters, PLLs, filters, and other analog goodies in the latest processes (including FinFET), but design teams are reaching higher levels of performance than they did in yesterday’s processes. The new processes have, without a doubt, changed the task of analog design, and the designer’s toolkit has had to undergo a major revision. Many of our old techniques have become a lot less relevant, and today’s designer needs to have a good handle on a broad set of new techniques.
Some of the changes are a result of designers targeting processes for very digital applications (supply voltages of 0.8V and less). Others are a result of the size of the devices (matching of small devices is poor, matching of very small devices is worse). Changes are also a result of the new fabrication techniques that must be used to make the devices (unit-sized devices and no mixing of different device types - resistor and I/O device ghettos are required). Of course, there’s great news: the transistors are wonderfully fast and the digital is almost free.
View this webinar to:
-Gain an understanding of the challenges of analog design in the new world of leading-edge processes
-Learn about design techniques that take advantage of the characteristics of today’s design reality
We are at the threshold of 4th industry revolution. The economy will be digital. Data will be the most important commodity. The infrastructures to collect, transmit and process data will be the determining factor of the strength of the future economy.
An introduction to the basic working mechanism of bitcoin and blockchain: how bitcoin works, bitcoin network, nodes, miners, hashing, difficulty and nonce, etc, why bitcoin mining consumes so much energy. Variations of blockchain, MDL.
This presentation discusses the operating curve management for the productivity improvement. The OCM is pioneered by IBM and adapted by many semiconductor companies. It is intended for wafer fab operation, but is applicable to any manufacturing operation. It is not merely a theory, but has been put into practice in many factories with visible results. When it is used with other management and productivity improvement techniques, such as Hoshin or Kanban or Just in time system, the result is even better. It is a very flexible system, but requires a lot of work in both hardware and software system for the implementation. It addresses issues and solutions at equipment level, operator level, engineering level, materials flow, and overall management.
Transcript: Selling digital books in 2024: Insights from industry leaders - T...BookNet Canada
The publishing industry has been selling digital audiobooks and ebooks for over a decade and has found its groove. What’s changed? What has stayed the same? Where do we go from here? Join a group of leading sales peers from across the industry for a conversation about the lessons learned since the popularization of digital books, best practices, digital book supply chain management, and more.
Link to video recording: https://bnctechforum.ca/sessions/selling-digital-books-in-2024-insights-from-industry-leaders/
Presented by BookNet Canada on May 28, 2024, with support from the Department of Canadian Heritage.
State of ICS and IoT Cyber Threat Landscape Report 2024 previewPrayukth K V
The IoT and OT threat landscape report has been prepared by the Threat Research Team at Sectrio using data from Sectrio, cyber threat intelligence farming facilities spread across over 85 cities around the world. In addition, Sectrio also runs AI-based advanced threat and payload engagement facilities that serve as sinks to attract and engage sophisticated threat actors, and newer malware including new variants and latent threats that are at an earlier stage of development.
The latest edition of the OT/ICS and IoT security Threat Landscape Report 2024 also covers:
State of global ICS asset and network exposure
Sectoral targets and attacks as well as the cost of ransom
Global APT activity, AI usage, actor and tactic profiles, and implications
Rise in volumes of AI-powered cyberattacks
Major cyber events in 2024
Malware and malicious payload trends
Cyberattack types and targets
Vulnerability exploit attempts on CVEs
Attacks on counties – USA
Expansion of bot farms – how, where, and why
In-depth analysis of the cyber threat landscape across North America, South America, Europe, APAC, and the Middle East
Why are attacks on smart factories rising?
Cyber risk predictions
Axis of attacks – Europe
Systemic attacks in the Middle East
Download the full report from here:
https://sectrio.com/resources/ot-threat-landscape-reports/sectrio-releases-ot-ics-and-iot-security-threat-landscape-report-2024/
Smart TV Buyer Insights Survey 2024 by 91mobiles.pdf91mobiles
91mobiles recently conducted a Smart TV Buyer Insights Survey in which we asked over 3,000 respondents about the TV they own, aspects they look at on a new TV, and their TV buying preferences.
Connector Corner: Automate dynamic content and events by pushing a buttonDianaGray10
Here is something new! In our next Connector Corner webinar, we will demonstrate how you can use a single workflow to:
Create a campaign using Mailchimp with merge tags/fields
Send an interactive Slack channel message (using buttons)
Have the message received by managers and peers along with a test email for review
But there’s more:
In a second workflow supporting the same use case, you’ll see:
Your campaign sent to target colleagues for approval
If the “Approve” button is clicked, a Jira/Zendesk ticket is created for the marketing design team
But—if the “Reject” button is pushed, colleagues will be alerted via Slack message
Join us to learn more about this new, human-in-the-loop capability, brought to you by Integration Service connectors.
And...
Speakers:
Akshay Agnihotri, Product Manager
Charlie Greenberg, Host
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
Kubernetes & AI - Beauty and the Beast !?! @KCD Istanbul 2024Tobias Schneck
As AI technology is pushing into IT I was wondering myself, as an “infrastructure container kubernetes guy”, how get this fancy AI technology get managed from an infrastructure operational view? Is it possible to apply our lovely cloud native principals as well? What benefit’s both technologies could bring to each other?
Let me take this questions and provide you a short journey through existing deployment models and use cases for AI software. On practical examples, we discuss what cloud/on-premise strategy we may need for applying it to our own infrastructure to get it to work from an enterprise perspective. I want to give an overview about infrastructure requirements and technologies, what could be beneficial or limiting your AI use cases in an enterprise environment. An interactive Demo will give you some insides, what approaches I got already working for real.
Elevating Tactical DDD Patterns Through Object CalisthenicsDorra BARTAGUIZ
After immersing yourself in the blue book and its red counterpart, attending DDD-focused conferences, and applying tactical patterns, you're left with a crucial question: How do I ensure my design is effective? Tactical patterns within Domain-Driven Design (DDD) serve as guiding principles for creating clear and manageable domain models. However, achieving success with these patterns requires additional guidance. Interestingly, we've observed that a set of constraints initially designed for training purposes remarkably aligns with effective pattern implementation, offering a more ‘mechanical’ approach. Let's explore together how Object Calisthenics can elevate the design of your tactical DDD patterns, offering concrete help for those venturing into DDD for the first time!
GDG Cloud Southlake #33: Boule & Rebala: Effective AppSec in SDLC using Deplo...James Anderson
Effective Application Security in Software Delivery lifecycle using Deployment Firewall and DBOM
The modern software delivery process (or the CI/CD process) includes many tools, distributed teams, open-source code, and cloud platforms. Constant focus on speed to release software to market, along with the traditional slow and manual security checks has caused gaps in continuous security as an important piece in the software supply chain. Today organizations feel more susceptible to external and internal cyber threats due to the vast attack surface in their applications supply chain and the lack of end-to-end governance and risk management.
The software team must secure its software delivery process to avoid vulnerability and security breaches. This needs to be achieved with existing tool chains and without extensive rework of the delivery processes. This talk will present strategies and techniques for providing visibility into the true risk of the existing vulnerabilities, preventing the introduction of security issues in the software, resolving vulnerabilities in production environments quickly, and capturing the deployment bill of materials (DBOM).
Speakers:
Bob Boule
Robert Boule is a technology enthusiast with PASSION for technology and making things work along with a knack for helping others understand how things work. He comes with around 20 years of solution engineering experience in application security, software continuous delivery, and SaaS platforms. He is known for his dynamic presentations in CI/CD and application security integrated in software delivery lifecycle.
Gopinath Rebala
Gopinath Rebala is the CTO of OpsMx, where he has overall responsibility for the machine learning and data processing architectures for Secure Software Delivery. Gopi also has a strong connection with our customers, leading design and architecture for strategic implementations. Gopi is a frequent speaker and well-known leader in continuous delivery and integrating security into software delivery.
Software Delivery At the Speed of AI: Inflectra Invests In AI-Powered QualityInflectra
In this insightful webinar, Inflectra explores how artificial intelligence (AI) is transforming software development and testing. Discover how AI-powered tools are revolutionizing every stage of the software development lifecycle (SDLC), from design and prototyping to testing, deployment, and monitoring.
Learn about:
• The Future of Testing: How AI is shifting testing towards verification, analysis, and higher-level skills, while reducing repetitive tasks.
• Test Automation: How AI-powered test case generation, optimization, and self-healing tests are making testing more efficient and effective.
• Visual Testing: Explore the emerging capabilities of AI in visual testing and how it's set to revolutionize UI verification.
• Inflectra's AI Solutions: See demonstrations of Inflectra's cutting-edge AI tools like the ChatGPT plugin and Azure Open AI platform, designed to streamline your testing process.
Whether you're a developer, tester, or QA professional, this webinar will give you valuable insights into how AI is shaping the future of software delivery.
Key Trends Shaping the Future of Infrastructure.pdfCheryl Hung
Keynote at DIGIT West Expo, Glasgow on 29 May 2024.
Cheryl Hung, ochery.com
Sr Director, Infrastructure Ecosystem, Arm.
The key trends across hardware, cloud and open-source; exploring how these areas are likely to mature and develop over the short and long-term, and then considering how organisations can position themselves to adapt and thrive.
4. How technology started
On Dec.,23,1947, John
Bardeen and Walter
Brattain demonstrated a
point contact transistor
at Bell Lab
On July 4, 1951, William
Shockley built and
demonstrated a junction
transistor
Three of them won 1956
Nobel prize of Physics
4
5. Kilby’s integrated circuit 1958
On September 12,
1958 Jack Kilby at
Texas Instrument put
two transistors on the
same Silicon.
Integrated circuit
was born (2000 Nobel
prize of Physics)
5
6. Moore’s Law
• Moore’s Law: Gordon Moore, founder of Intel,
predicted that the number of transistors on
integrated circuit could double every two years.
• Semiconductor industry today is a $460 billion
industry.
• Semiconductor is the foundation of trillion
dollars electronics industry
6
10. 11/14/2018
10
Intel 4004 – 2,300 transistors – 10 um
Intel’s integrated circuit 1970
The industry of IC was born.
11. 11/14/2018
11
Intel 10 core xeon westmere – 2 billion transistors – 32 nm
2018
A12, Kirin 980 are
made at TSMC
Snapdragon is made
at Samsung
7 nm, 6.9 b transistors
7 nm
10 nm, 5.3 b transistors 7 nm, 6.9 b transistors
Integrated circuits 2018
12. Cross section of
an Integrated
Circuit
transistor
Minimum feature size
11/14/2018
12
13. 3D view of integrated circuit
Oxide removed
Silicon substrate
Poly silicon
Metal conductor
11/14/2018
13
17. Large and small transistors
• Scaling factor κ
17
Substrate doping must increase to reduce
the depletion layer thickness in source and
drain.
gate
source drain
Electron flow
Operation voltage
Gate oxide
Depletion layer
N+ N+
P
18. 18
α = reduction of dimension/ reduction of voltage.
α = 1.75 ~ 5
19. Ideal shrink
• All dimensions reduce by κ
• Substrate doping for both NMOS Na, PMOS Nd
must increase by κ to keep the same depletion
layer thickness
• Power supply must reduce by κ to keep the same
electrical field across gate
• Capacity of transistor reduces by 1/ κ, but not by
1/ κ2 because gate oxide becomes thinner
• Inversion charge per transistor keeps the same
(Q=CV)
19
20. Ideal shrink
• Circuit delay τ is proportional to capacitance,
thus reduces by 1/ κ. Frequency f is the inverse
of τ .
• Power dissipation per transistor is due to the
charging and discharging of transistor load. P =
CV dd
2
f = Q Vdd f = i Vdd.
• Power density is the power dissipation per area,
is thus unchanged.
20
22. Actual shrink
• Actual shrink is non-ideal because
▫ Threshold voltage is limited by Silicon property
▫ At low Vdd, signal to noise ratio decreases
▫ At small geometry, parasitic resistance and
capacity increases.
▫ Transistors become more leaky
▫ Vds SAT=Vgs - Vth
• Therefore, Vdd cannot shrink by κ. Rather,
• α = κ / reduction of voltage.
• α = 1 ~ 5
22
24. VDD scaling from 0.25 um to 10 nm
24
Conventional transistor
α=1.5
α=2.75
α=5
25. Smaller transistors => more leakage
• Gate leakage: When gate oxide becomes thinner,
high electrical field across oxide causes higher
gate tunneling current.
• Subthreshold leakage: When gate becomes
smaller faster than the Source Drain voltage
becomes smaller, field across Source/Well and
Drain increases, causing higher ionization.
• Holes created by ionization flow to substrate
causing leakage.
25
29. Short channel effect
29
Short channel Long channel
DSDS
Blue region = most negative voltage, Red region = most positive voltage
30. Short channel effect
30
long
When channel shortens, potential drop at depletion regions
merges.
long short
Channel length
Drain Induced
Barrier Lowering
DIBL
32. Gate leakage vs. subthreshold leakage
32
Gate leakage
Subthreshold leakage
Subthreshold leakage is sensitive to T
33. Steep subthreshold FET
33
current
Gate voltage
Threshold voltage Vth
Ideal subthreshold slope
Steep subthreshold slope
Non-ideal subthreshold slope
VDD
Steep SS FET
Subthreshold slope =
decade of current/mv
44. IC going 3D, and chip level packaging
• When devices cannot be shrunk anymore, they
are going 3D.
▫ 3D in wafer processing such as 3D NAND
▫ 3D in packaging
▫ WLP allows chips using different technologies,
such as DRAM, NAND and logic processed
separately.
44
55. Wafer fab
• Wafer fab is a highly specialized factory
• Cleanroom –
▫ temperature,
▫ humidity,
▫ vibration,
▫ particle,
▫ air flow,
▫ electrostatic charge,
▫ electromagnetic wave
11/14/2018
55
56. Utilities
• Power - power substation (80KVA), power
distribution, emergency power, backup power,
• Water (300CMH) - DI water, cooling water,
• Bulk gases -N2, O2, compressed air
• Specialty gases, natural gas
• Chemicals,
• Exhaust piping, exhaust treatment,
• Liquid waste drain, waste treatment plant
• Factory automation (MES), AMHS, equipment
automation, data automation
56
57. Fab automation
• Equipment automation..
▫ Allows each equipment to operate by itself at a
push of bottom
▫ Collects operation data
• Factory automation
▫ Wafer transport system
▫ Manufacturing execution system
• Data automation
▫ Collect equipment data, operation data
▫ Monitor and analyze data in real time
57
67. Principle of cleanroom
• Cleanroom controls temperature, humidity,
vibration and particle
• Temperature, particle, humidity are controlled
by
▫ Take outside air
▫ Cools down to condense vapor
▫ Heats up to desired temperature 21C
▫ Inject vapor to desired humidity 45%
▫ Filter through HEPA filter
▫ Create laminar flow
67
83. Largest variation of cost - yield
Yield = number of good chips / total chips on a
wafer
Yield loss can happen at every step of
manufacturing
▫ In-line – scrap, rework
▫ DC parameter test – downgrade
▫ Wafer sort - probe yield
▫ Packaging yield loss
▫ Burn-in yield loss
▫ Final test yield loss
11/14/2018
83
84. Yield loss
• Defects (systematic and random)
• Process deviation
• Mis-operation
• Bad quality materials
• Utility problems
• Process windows vs design windows
• Capability of equipment
11/14/2018
84
85. Racing against time – new technology
introduction
11/14/2018
85
• When new technology is introduced, yield is low,
therefore, cost is high
• When yield is improved, cost is reduced
• However, the price also drops
• The cost has to be reduced faster than the price
drops in order to guarantee a window of profit
89. Cost of wafer fab vs. market size
Cost of a typical fab $500 m
Total worldwide market $120 b
Ratio of 240 to 1
Cost of a typical fab $10 b
Total worldwide market $430 b
Ratio of 43 to 1
11/14/2018
89
90. Cost goes up x6 faster than sales
• In 18 years, the market size only doubled, but
the cost of factory increase by 12 times
• That means cost increases 6 times faster than
sales
▫ 193 nm scanner costs $60 m each and EUV
scanner costs >$120 m
▫ Number of process steps increase from 200 to 700
=> more labor, more materials, more utilities
▫ Sales price drops (such as computer/ TV/ cell
phone/ digital camera)
11/14/2018
90
91. The rise of foundry business model
• Before 1990, semiconductor industry was
dominated by IDM (Integrated device
manufacturer).
• After 2000, semiconductor industry is
dominated by design houses and foundry
(except for memory).
• Even design houses are becoming capital
intensive. A mask set for 20 nm chip costs >$1
million
91
92. Consolidation has happened
• Each generation of technology costs $500 m to
develop
• Technology becomes obsolete quickly. New
technology means better performance, lower
cost.
• Any company less than $10 b can neither afford
to build a new fab or to develop new technology
(8 semiconductor companies > $12 b)
• Trend is for consolidation.
11/14/2018
92
93. Return on investment is not
guaranteed
• However, the investment (R&D and factory)
does not guarantee returns because
▫ Technology development may not be successful
▫ Margin is ultra thin
▫ The market size is barely sufficient to allow top 2
companies in each business area to be profitable
11/14/2018
93
94. NAND market
• NAND is the key component of data storage.
• Data storage is the corner stone of data center.
• Data center drives cloud computing, internet,
Big Data, blockchain, Fintech and artificial
intelligence, and is the most important
infrastructure of 21st century.
• The country which controls NAND is like the
country which controls petroleum in 20th
century.
94
95. What is the future
• End of technology roadmap is in sight. In a
decade, transistor will be only few atoms big.
• Market will be driven by applications rather than
semiconductor technology.
• Applications like 5G, Big Data, cloud computing,
artificial intelligence, blockchain will drive
demand
• In the past, the leader is the company that can
evolve new technology sooner than others
• In the future, the leader is the company that can
have the most efficient production
11/14/2018
95
96. Evolution of business model
96
Chip design
and sales
Chip
foundry
System
integration
System house
Design house
Fab
Chip design
and sales
In house fab
System
integration
Chip design
and sales
Chip
foundry
System
integration
PAST NOW FUTURE
97. Summary
• By 2025, semiconductor industry will face the
end of technology development and Moore’s law
will breakdown
• By then, semiconductor industry can only grow
with diversified applications rather than higher
performance.
11/14/2018
97