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Device Modeling Report



    COMPONENTS: MOSFET (Professional)
    PART NUMBER: 2SK2992
    MANUFACTURER: TOSHIBA
    Body Diode (Professional) / ESD Protection Diode




                      Bee Technologies Inc.

.

          All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
MOSFET MODEL PARAMETERS

PSpice model
                                       Model description
 parameters
   LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
   THETA       Mobility Modulation
   KAPPA       Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




           All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result



                                    10
                                                         Measurement
                                                         Simulation
          TRANSCONDUCTANCE Gfs(s)




                                     1




                                    0.1
                                          0    0.2    0.4    0.6    0.8     1     1.2    1.4    1.6      1.8    2
                                                                   DRIAN CURRENT ID (A)



Comparison table

                                                                   Gfs(S)
                                    Id(A)          Measurement              Simulation           Error(%)
                                     0.1                0.09704                 0.09804           1.03051
                                     0.2                    0.22927                0.22727        -0.87232
                                     0.4                    0.34854                0.35054            0.57382
                                     1.2                    0.56366                0.55787        -1.02722
                                     1.6                    0.70985                0.70765        -0.30992
                                      2                     1.03093                1.04033            0.91180




                                          All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result

   2.0A



   1.6A



   1.2A



   0.8A



   0.4A



      0A
           0V         2V             4V             6V           8V           10V
                I(Vsense)
                                          V_VGS

Evaluation circuit

                                               Vsense



                                          U1 2SK2992_pro




                                                                      VDS
                                                                      10Vdc


            VGS




                                      0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                            2
                                                  Measurement
                                                  Simulation
                           1.6
    DRAIN CURRENT ID (A)




                           1.2



                           0.8



                           0.4




                            0
                                 0            2                4            6            8            10
                                                  GATE-SOURCE VOLTAGE VGS (V)

Simulation Result


                                                                   VGS(V)
                                     ID(A)                                                    Error (%)
                                                   Measurement           Simulation
                                     0.1                       3.4000            3.4298           0.8765
                                     0.2                       3.6500            3.6456          -0.1205
                                     0.4                       4.0000            3.9700          -0.7500
                                     1.2                       4.7000            4.7187           0.3979
                                     1.6                       5.0000            5.0006           0.0120
                                      2                        5.3000            5.3807           1.5217




                                       All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result

    220mA

    198mA

    176mA

    154mA

    132mA

    110mA

     88mA

     66mA

     44mA

     22mA

        0A
             0V 0.1V      0.3V                 0.5V           0.7V            0.9V
                I(Vsense)
                                               V_VDS

Evaluation circuit

                                                   Vsense



                                           U1 2SK2992_pro




                                                                        VDS


               VGS
               10Vdc




                                           0


Simulation Result

        ID=0.5A, VGS=10V             Measurement            Simulation          Error (%)
               R DS (on)                       2.2                 2.2             0.000




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result

   16V


   14V


   12V


   10V


    8V


    6V


    4V


    2V


    0V
         0      1n   2n               3n     4n      5n      6n       7n         8n      9n       10n
             V(W1:3)
                                                  Time*1mA


Evaluation circuit

                                                                        Vsense



                                                             U1 2SK2992_pro


                                                                                                    I1
                                                                                          D1
                                                                                         Dbreak     1Adc

                                   W1
                                      +

                                      -
             I2
                  TD = 0            W                                                               VD
                              ION = 0A                                                              160Vdc
                              IOFF = 1mA


                                                             0




Simulation Result

             VDD=160V,
                                     Measurement             Simulation               Error (%)
               ID=1A
                Qgs                        0.3600 nC             0.3590 nC             -0.2778
                  Qgd                      1.0800 nC             1.0850 nC              0.4630
                  Qg                       3.920 nC              3.9000 nC              0.5100




                           All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Gate Charge Characteristic                                                            Reference




                                                VGS-Qg
                  16
                               VDD=22V
                  14

                  12

                  10
        VGS (V)




                  8

                  6

                  4

                  2

                  0
                       0              1               2               3               4
                                                   Qg (nC)




                       All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Capacitance Characteristic


                                                                Measurement
                                                                Simulation




Simulation Result


                                         Cbd(pF)
           VDS(V)        Measurement               Simulation             Error(%)
             5                  24.000                   24.119                0.496
             10                     19.000                  18.911               -0.468
             20                     13.500                  13.514               0.104
             50                       7.600                  7.615               0.197




                  All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result

   12V
   11V
   10V
    9V
    8V
    7V
    6V
    5V
    4V
    3V
    2V
    1V
    0V
   -1V
   -2V
    0.85us       0.95us       1.05us                 1.15us              1.25us
         V(L3:1)*1   V(L2:2)/10
                                  Time


Evaluation circuit

                                                              Vsense                  RL
                                                                                  3

                                                                                       200

         V1 = 0                                         U1 2SK2992_pro

         V2 = 20          R2              L3   2
         TD = 1u                                                                                VD
                                        30nH
                          200                                                                     100Vdc
         TR = 10n    V1
                                 R1
         TF = 10n
                                  200
         PW = 10u

         PER = 10m

                                                        0




Simulation Result

          ID=0.5A,
         VDD= 100V,              Measurement                   Simulation                    Error(%)
         VGS=0/10V
           Td(on)                        17.000    ns             17.012          ns           0.0706




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result                              6V         5V
   1.0A
                                                                             4.7V
                                    8.0V
   0.9A

                               10V                                                   4.5V
   0.8A

   0.7A
                                                                                     4.3V
   0.6A

   0.5A

   0.4A                                                                         4V

   0.3A
                                                                              3.75V
   0.2A
                                                                            VGS= 3.5V
   0.1A

      0A
           0V           1.0V                2.0V              3.0V             4.0V         5.0V
                I(Vsense)
                                                    V_VDS

Evaluation circuit

                                                   Vsense



                                            U1 2SK2992_pro



                                                                   VDS




                VGS




                                           0




                      All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result

     5.0A




     1.0A




   100mA
      500mV                                                         1.0V          1.2V
          I(R1)
                                              V_V1

Evaluation Circuit

                            R1


                             0.01m
                                               U1 2SK2992_pro


                   V1
            0Vdc




                              0




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                                         10
                                                            Measurement
                                                            Simulation
         DRAIN REVERSE CURRENT IDR (A)




                                          1




                                         0.1
                                               0.5               0.7                0.9                1.1
                                                             SOURCE-DRAIN VOLTAGE VSD (V)

Simulation Result

                                                                    VSD(V)
                                         IDR(A)                                                           %Error
                                                          Measurement    Simulation
                                           0.1                  0.7500         0.7469                        -0.4133
                                           0.2                  0.7800         0.7800                         0.0000
                                           0.5                  0.8300         0.8320                         0.2410
                                            1                   0.9200         0.9210                         0.1087
                                           1.5                  1.0200         1.0132                        -0.6667




                                                 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Reverse Recovery Characteristic (Body Diode)

Circuit Simulation Result

    400mA




    200mA




       0A




   -200mA




   -400mA
       0.4us     0.8us              1.2us          1.6us       2.0us      2.4us
           I(R1)
                                            Time


Evaluation Circuit

                                 R1 50



            V1 = -9.3V                                         U1 D2SK2992_PRO

            V2 = 10.8V

            TD = 100n

            TR = 6ns     V1

            TF = 5.7ns

            PW = 1us

            PER = 50us

                                                   0




Compare Measurement vs. Simulation

                       Measurement                 Simulation                    Error (%)
              trj             196.000       ns             196.120 ns                  0.061
             trb              108.000       ns             108.500 ns                  0.463
              trr             304.000       ns             305.200 ns                  0.395



                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Reverse Recovery Characteristic (Body Diode)                                   Reference




Trj= (196ns)
Trb= (108ns)
Conditions:Ifwd=0.2,lrev=0.2(A),Rl=50




                                                           Example




                                  Relation between trj and trb




                All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Zener Voltage Characteristic
Circuit Simulation Result

   10mA

     9mA

     8mA

     7mA

     6mA

     5mA

     4mA

     3mA

     2mA

     1mA

      0A
           0V    5V 10V              20V       30V           40V       50V        60V
                I(R1)
                                              V_V1

Evaluation Circuit


                                                     U1 2SK2992_pro


                              R1


                             0.01m

                   V1                                                     IOPEN
            0Vdc                                                           0Adc




                               0




                        All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                                Reference




             All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

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SPICE MODEL of 2SK2992 (Professional+BDP Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: MOSFET (Professional) PART NUMBER: 2SK2992 MANUFACTURER: TOSHIBA Body Diode (Professional) / ESD Protection Diode Bee Technologies Inc. . All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 2. MOSFET MODEL PARAMETERS PSpice model Model description parameters LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 3. Transconductance Characteristic Circuit Simulation Result 10 Measurement Simulation TRANSCONDUCTANCE Gfs(s) 1 0.1 0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 DRIAN CURRENT ID (A) Comparison table Gfs(S) Id(A) Measurement Simulation Error(%) 0.1 0.09704 0.09804 1.03051 0.2 0.22927 0.22727 -0.87232 0.4 0.34854 0.35054 0.57382 1.2 0.56366 0.55787 -1.02722 1.6 0.70985 0.70765 -0.30992 2 1.03093 1.04033 0.91180 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 4. Vgs-Id Characteristic Circuit Simulation result 2.0A 1.6A 1.2A 0.8A 0.4A 0A 0V 2V 4V 6V 8V 10V I(Vsense) V_VGS Evaluation circuit Vsense U1 2SK2992_pro VDS 10Vdc VGS 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 5. Comparison Graph Circuit Simulation Result 2 Measurement Simulation 1.6 DRAIN CURRENT ID (A) 1.2 0.8 0.4 0 0 2 4 6 8 10 GATE-SOURCE VOLTAGE VGS (V) Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 0.1 3.4000 3.4298 0.8765 0.2 3.6500 3.6456 -0.1205 0.4 4.0000 3.9700 -0.7500 1.2 4.7000 4.7187 0.3979 1.6 5.0000 5.0006 0.0120 2 5.3000 5.3807 1.5217 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 6. Rds(on) Characteristic Circuit Simulation result 220mA 198mA 176mA 154mA 132mA 110mA 88mA 66mA 44mA 22mA 0A 0V 0.1V 0.3V 0.5V 0.7V 0.9V I(Vsense) V_VDS Evaluation circuit Vsense U1 2SK2992_pro VDS VGS 10Vdc 0 Simulation Result ID=0.5A, VGS=10V Measurement Simulation Error (%) R DS (on) 2.2  2.2  0.000 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 7. Gate Charge Characteristic Circuit Simulation result 16V 14V 12V 10V 8V 6V 4V 2V 0V 0 1n 2n 3n 4n 5n 6n 7n 8n 9n 10n V(W1:3) Time*1mA Evaluation circuit Vsense U1 2SK2992_pro I1 D1 Dbreak 1Adc W1 + - I2 TD = 0 W VD ION = 0A 160Vdc IOFF = 1mA 0 Simulation Result VDD=160V, Measurement Simulation Error (%) ID=1A Qgs 0.3600 nC 0.3590 nC -0.2778 Qgd 1.0800 nC 1.0850 nC 0.4630 Qg 3.920 nC 3.9000 nC 0.5100 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 8. Gate Charge Characteristic Reference VGS-Qg 16 VDD=22V 14 12 10 VGS (V) 8 6 4 2 0 0 1 2 3 4 Qg (nC) All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 9. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Measurement Simulation Error(%) 5 24.000 24.119 0.496 10 19.000 18.911 -0.468 20 13.500 13.514 0.104 50 7.600 7.615 0.197 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 10. Switching Time Characteristic Circuit Simulation result 12V 11V 10V 9V 8V 7V 6V 5V 4V 3V 2V 1V 0V -1V -2V 0.85us 0.95us 1.05us 1.15us 1.25us V(L3:1)*1 V(L2:2)/10 Time Evaluation circuit Vsense RL 3 200 V1 = 0 U1 2SK2992_pro V2 = 20 R2 L3 2 TD = 1u VD 30nH 200 100Vdc TR = 10n V1 R1 TF = 10n 200 PW = 10u PER = 10m 0 Simulation Result ID=0.5A, VDD= 100V, Measurement Simulation Error(%) VGS=0/10V Td(on) 17.000 ns 17.012 ns 0.0706 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 11. Output Characteristic Circuit Simulation result 6V 5V 1.0A 4.7V 8.0V 0.9A 10V 4.5V 0.8A 0.7A 4.3V 0.6A 0.5A 0.4A 4V 0.3A 3.75V 0.2A VGS= 3.5V 0.1A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(Vsense) V_VDS Evaluation circuit Vsense U1 2SK2992_pro VDS VGS 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 12. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 5.0A 1.0A 100mA 500mV 1.0V 1.2V I(R1) V_V1 Evaluation Circuit R1 0.01m U1 2SK2992_pro V1 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 13. Comparison Graph Circuit Simulation Result 10 Measurement Simulation DRAIN REVERSE CURRENT IDR (A) 1 0.1 0.5 0.7 0.9 1.1 SOURCE-DRAIN VOLTAGE VSD (V) Simulation Result VSD(V) IDR(A) %Error Measurement Simulation 0.1 0.7500 0.7469 -0.4133 0.2 0.7800 0.7800 0.0000 0.5 0.8300 0.8320 0.2410 1 0.9200 0.9210 0.1087 1.5 1.0200 1.0132 -0.6667 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic (Body Diode) Circuit Simulation Result 400mA 200mA 0A -200mA -400mA 0.4us 0.8us 1.2us 1.6us 2.0us 2.4us I(R1) Time Evaluation Circuit R1 50 V1 = -9.3V U1 D2SK2992_PRO V2 = 10.8V TD = 100n TR = 6ns V1 TF = 5.7ns PW = 1us PER = 50us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) trj 196.000 ns 196.120 ns 0.061 trb 108.000 ns 108.500 ns 0.463 trr 304.000 ns 305.200 ns 0.395 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 15. Reverse Recovery Characteristic (Body Diode) Reference Trj= (196ns) Trb= (108ns) Conditions:Ifwd=0.2,lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 16. Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 20V 30V 40V 50V 60V I(R1) V_V1 Evaluation Circuit U1 2SK2992_pro R1 0.01m V1 IOPEN 0Vdc 0Adc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 17. Zener Voltage Characteristic Reference All Rights Reserved Copyright (C) Bee Technologies Inc. 2006