This document contains a SPICE model for the TOSHIBA 20DL2CZ47A general purpose rectifier diode. It includes the SPICE subcircuit listing with model parameters, graphs comparing forward and reverse characteristics of the model to measurements, and an evaluation of the model's reverse recovery behavior.

1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
COMPONENTS:
DIODE/ GENERAL PURPOSE RECTIFIER/ STANDARD
PART NUMBER: 20DL2CZ47A
MANUFACTURER: TOSHIBA
Device Modeling Report
Bee Technologies Inc.

2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
SPICE MODEL
*$
* PARTNUMBER: 20DL2CZ47A
* MANUFACTURER: TOSHIBA
* All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
.SUBCKT 20DL2CZ47A_s 1 2 3
D1 1 3 20DL2CZ47A
D2 2 3 20DL2CZ47A
.MODEL 20DL2CZ47A D
+ IS=100.00E-12
+ N=1.0941
+ RS=13.708E-3
+ IKF=52.492E-3
+ CJO=342.41E-12
+ M=.40902
+ VJ=.48194
+ BV=200
+ IBV=50.000E-6
+ ISR=0
+ TT=18.558E-9
.ENDS
*$

3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
PSpice model
parameter
Model description
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap

4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
V_V1
0.4V 0.8V 1.2V 1.6V 2.0V
I(R1)
100mA
1.0A
10A
100A
0
U1 20DL2CZ47A_sR1
0.01m
IOPEN
0Adc
V1
0Vdc
Forward Current Characteristic
Circuit Simulation Result
Evaluation Circuit

5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Comparison Graph
Circuit Simulation Result
Simulation Result
Ifwd(A)
Vfwd(V)
%Error
Measurement Simulation
0.1 0.610 0.611 -0.164
0.2 0.650 0.648 0.308
0.5 0.700 0.702 -0.286
1 0.750 0.749 0.133
2 0.800 0.801 -0.125
5 0.900 0.896 0.444
10 1.000 0.980 2.000

6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
V(N00037)
100mV 1.0V 10V 100V
I(V2)/(200/1us)
10p
100p
1.0n
IOPEN
0Adc
0
V2
0Vdc
U1
20DL2CZ47A_s
V1
TD = 0
TF = 10ns
PW = 5us
PER = 50us
V1 = 0
TR = 1us
V2 = 200
Capacitance Characteristic
Circuit Simulation Result
Evaluation Circuit

7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Comparison Graph
Circuit Simulation Result
Simulation Result
Vrev(V)
Cj(pF)
%Error
Measurement Simulation
0 339.500 339.500 0.000
0.1 316.500 315.969 0.168
0.2 298.100 296.100 0.671
0.5 256.200 254.820 0.539
1 217.500 215.856 0.756
2 175.700 174.388 0.747
5 127.500 126.169 1.044
10 97.900 96.977 0.943
20 74.039 73.608 0.582
50 53.930 51.500 4.506
100 40.770 38.755 4.942

8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
0
R1
50
U1 20DL2CZ47A_s
V1
TD = 0
TF = 10ns
PW = 20us
PER = 50us
V1 = -9.33V
TR = 10ns
V2 = 10.72V
IOPEN
0Adc
Time
19.94us 19.98us 20.02us 20.06us 20.10us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
Reverse Recovery Characteristic
Circuit Simulation Result
Evaluation Circuit
Compare Measurement vs. Simulation
Measurement Simulation %Error
trr 29.200 ns 29.160 ns - 0.137

9. All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Reverse Recovery Characteristic Reference
Trj =8.4(ns)
Trb=20.8(ns)
Conditions: Ifwd=Irev=0.2(A), Rl=50
Example
Relation between trj and trb
Measurement