The document discusses algorithms for testing embedded memories in FPGAs. It introduces the March C algorithm for memory testing and proposes an optimized March C algorithm. The optimized algorithm reduces testing time by applying concurrency - it tests multiple memory subgroups simultaneously. The document implements BIST architectures using both the basic and optimized March C algorithms and compares their performance in terms of time, area and speed for testing embedded memory in FPGAs. The optimized March C algorithm requires less time to test memory compared to other architectures.