1. The document discusses two types of wavelength dispersive spectrometers (WDS): Rowland circle WDS and parallel beam WDS.
2. Rowland circle WDS uses curved diffractors to focus diffracted x-rays, but suffers from low intensities for low energy x-rays when used on SEMs.
3. Parallel beam WDS uses a collimating optic near the sample and flat diffractors, providing excellent intensities across all energies without complicated geometry.
Brighten your future with led landscape lightingseanmullarkey
Brighten your future with LED Landscape Lighting
Sean Mullarkey, Applied Water Technologies
What's the big deal with LED lights, how can they save your customer money, what are their short comings, how can they add a new profit center for your business. Find out the latest on this cutting edge technology.
LED landscape lighting FAQ's and benefits. Presented by Sean Mullarkey TriState Water Works, Cincinnati Ohio
The document discusses optimization problems involving minimum variance portfolios and maximum return portfolios with multiple assets and constraints. It presents formulations for minimizing portfolio variance with 2 and 3 assets, including with additional constraints. It also presents an optimization problem to maximize the return of a portfolio with 3 assets and additional constraints, reducing it to 2 variables and solving it graphically.
This document provides information about Watson Lighting and the types of lighting solutions they provide for various commercial and residential projects. It describes several lighting installations Watson completed for hotels, resorts, and residential estates. It also includes tables listing Watson's architectural feature lighting and downlighting/uplighting units with details on lamp type, wattage, lifespan, usage, and distance. The lighting solutions are designed to be aesthetically pleasing while also providing safety, security and low maintenance.
Versão do seminário apresentado por Celia Olivero (Horiba) na seção UCS do Instituto Nacional de Engenharia de Superfícies no dia 28 de junho para um público de 18 estudantes, professores e profissionais de empresas.
This document discusses Silicon Drift Detectors (SDD) for use in synchrotron energy dispersive X-ray fluorescence (EDXRF) spectroscopy. It begins with an introduction to SDDs, explaining their structure and operating principle. It then describes the features and high performance of SDDs, including high count rates up to 500,000 counts per second and excellent energy resolution of 125 eV FWHM at 5.9 keV. Applications of SDDs in EDXRF spectroscopy and portable XRF devices are also mentioned. In the concluding remarks, the key advantages of SDDs are summarized as having lower capacitance than conventional silicon detectors, allowing better energy resolution at higher count rates.
The Thermo Scientific NextGuard x-ray detection system provides cost-effective and sensitive detection of foreign objects in packaged food products. It uses a unique non-linear x-ray detector design that eliminates inspection blind spots and ensures 100% detection for any product size or shape. The system offers options for customization, easy maintenance, and is designed for use in compliance with worldwide food safety standards.
Choosing the right EDS detector - Thermo ScientificCarl Millholland
There are 3 main drivers in specifying an EDS detector:
• Energy resolution @ Mn k-alpha
• Sensitivity
• Solid angle
How relevant are these specifications in determining the performance of an EDS detector?
How do I choose the right detector for your lab?
Logitoring - log-driven monitoring and the Rocket scienceEDS Systems
Talking about a common way of delivering, storing and analyzing monitoring/log/trace data flows.
Do the data in monitoring have the same
nature as data in logging?
Brighten your future with led landscape lightingseanmullarkey
Brighten your future with LED Landscape Lighting
Sean Mullarkey, Applied Water Technologies
What's the big deal with LED lights, how can they save your customer money, what are their short comings, how can they add a new profit center for your business. Find out the latest on this cutting edge technology.
LED landscape lighting FAQ's and benefits. Presented by Sean Mullarkey TriState Water Works, Cincinnati Ohio
The document discusses optimization problems involving minimum variance portfolios and maximum return portfolios with multiple assets and constraints. It presents formulations for minimizing portfolio variance with 2 and 3 assets, including with additional constraints. It also presents an optimization problem to maximize the return of a portfolio with 3 assets and additional constraints, reducing it to 2 variables and solving it graphically.
This document provides information about Watson Lighting and the types of lighting solutions they provide for various commercial and residential projects. It describes several lighting installations Watson completed for hotels, resorts, and residential estates. It also includes tables listing Watson's architectural feature lighting and downlighting/uplighting units with details on lamp type, wattage, lifespan, usage, and distance. The lighting solutions are designed to be aesthetically pleasing while also providing safety, security and low maintenance.
Versão do seminário apresentado por Celia Olivero (Horiba) na seção UCS do Instituto Nacional de Engenharia de Superfícies no dia 28 de junho para um público de 18 estudantes, professores e profissionais de empresas.
This document discusses Silicon Drift Detectors (SDD) for use in synchrotron energy dispersive X-ray fluorescence (EDXRF) spectroscopy. It begins with an introduction to SDDs, explaining their structure and operating principle. It then describes the features and high performance of SDDs, including high count rates up to 500,000 counts per second and excellent energy resolution of 125 eV FWHM at 5.9 keV. Applications of SDDs in EDXRF spectroscopy and portable XRF devices are also mentioned. In the concluding remarks, the key advantages of SDDs are summarized as having lower capacitance than conventional silicon detectors, allowing better energy resolution at higher count rates.
The Thermo Scientific NextGuard x-ray detection system provides cost-effective and sensitive detection of foreign objects in packaged food products. It uses a unique non-linear x-ray detector design that eliminates inspection blind spots and ensures 100% detection for any product size or shape. The system offers options for customization, easy maintenance, and is designed for use in compliance with worldwide food safety standards.
Choosing the right EDS detector - Thermo ScientificCarl Millholland
There are 3 main drivers in specifying an EDS detector:
• Energy resolution @ Mn k-alpha
• Sensitivity
• Solid angle
How relevant are these specifications in determining the performance of an EDS detector?
How do I choose the right detector for your lab?
Logitoring - log-driven monitoring and the Rocket scienceEDS Systems
Talking about a common way of delivering, storing and analyzing monitoring/log/trace data flows.
Do the data in monitoring have the same
nature as data in logging?
Silicon Drift Detectors for Energy Dispersive X- Ray Fluorescence ( SDDEXRF)Saleh Qutaishat
This document discusses Silicon Drift Detectors (SDD) for use in synchrotron energy dispersive X-ray fluorescence (EDXRF) spectroscopy. It begins with an introduction to SDDs, explaining their structure and operating principle. It then describes the features and high performance of SDDs, including their high count rate, good energy resolution, and large active area. The document presents spectra from an Fe55 source taken with an SDD and includes diagrams of detector modules, cooling systems, and integration with spectroscopy systems. It concludes by emphasizing the key advantages of SDDs for spectroscopy applications like their lower noise and ability to operate at higher count rates than conventional semiconductor detectors.
XPS can be used to characterize polymers at the surface. It provides both elemental and chemical information about the top 10 nm of a sample. Elemental identification and quantification is possible from survey spectra. High resolution region spectra can identify functional groups and chemical environments through chemical shifts. XPS can map the distribution of elements and chemical states across a sample surface. Depth profiling with cluster ion beams maintains chemical information during sputtering and allows buried layers and interfaces to be analyzed. XPS was used to characterize a fluoropolymer coating on PET and PTFE, identifying the chemical structure and confirming it matched the expected structure from the plasma deposition process.
This document discusses X-ray fluorescence (XRF), a technique used to analyze the chemical composition of materials. XRF works by exciting a sample with an X-ray source, which causes fluorescent X-rays to be emitted from the sample that are characteristic of its elemental composition. The document covers the basic principles of XRF, how it is used to generate spectra to analyze samples, common instrumentation including X-ray sources and detectors, sample preparation methods, applications in fields like mining and environmental analysis, and limitations of the technique.
Scanning Electron Microscope- Energy - Dispersive X -Ray Microanalysis (Sem E...Nani Karnam Vinayakam
The document discusses scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX or EDS) analysis. It provides details on:
- How an SEM works by scanning a sample with a focused electron beam and detecting signals from electron interactions with the sample.
- The components of an SEM including the electron gun, detectors for secondary electrons and backscattered electrons.
- How EDX analysis identifies elements by measuring the energy of X-rays emitted when electrons change energy levels.
- Parameters that affect EDX analysis such as count rate, accelerating voltage, and take-off angle.
Windows Deployment Services (WDS) is used to install Windows operating systems on client machines. It provides faster installation than previous methods by copying only two files from the installation media. WDS requires a configured DNS, DHCP server, and domain controller to provide network services and authentication support during installation. The documentation then provides step-by-step instructions for configuring a WDS server by adding the role, specifying installation folders and network settings, and importing operating system installation images.
This document provides an overview of X-ray fluorescence (XRF) spectroscopy. It discusses XRF theory, instrumentation, hardware, and applications. XRF uses X-rays to excite a sample, and a detector then measures the fluorescent X-rays emitted from the sample that are characteristic of its elemental composition. The document compares wavelength dispersive XRF and energy dispersive XRF, and describes the components of XRF systems including X-ray sources, detectors, filters, and electronics. It provides examples of XRF applications in qualitative and quantitative elemental analysis across various industries.
Wavelength dispersive spectrometers use crystals to diffract x-rays of specific wavelengths from a sample into a detector. They work by aligning the crystal, sample, and detector on a curved surface called the Rowland circle. Flat crystals with collimators and curved crystals with slits can be used to improve the resolution of x-ray wavelengths detected. WDS is useful for non-destructive elemental analysis of small spots down to ppm concentrations but cannot detect elements below boron.
The document discusses the functions and working principles of an energy dispersive spectrometer (EDS). EDS can determine the chemical composition of materials down to the micron scale by detecting the characteristic x-rays emitted when the material is exposed to an electron beam. The EDS system includes an x-ray detector that converts x-ray energies into electrical signals and a multi-channel analyzer to separate the signals by energy into an elemental composition spectrum. Factors such as detector resolution, sample properties, and operating conditions can affect the accuracy of elemental quantification by EDS.
XRF & XRD analysis techniques are used to analyze materials. X-rays were discovered in 1895 by Wilhelm Conrad Roentgen. Over time, scientists developed an understanding of X-ray diffraction and how to use it for crystallography. By the mid-20th century, powder diffractometry techniques and databases had been established. X-rays are electromagnetic waves or photon beams with wavelengths between 0.01 to 10 nm, corresponding to energies from 0.125 to 125 keV. They can be hazardous due to their ionizing properties, requiring safety precautions as they are invisible, travel in straight lines at the speed of light, and can cause serious injury.
The document discusses X-ray fluorescence (XRF) theory and applications. XRF involves bombarding a sample with X-rays, which causes fluorescent X-rays to be emitted from the sample that are characteristic of its elemental composition. This allows for both qualitative and quantitative elemental analysis. Key advantages of XRF include rapid, nondestructive analysis of major and trace elements in various materials. Common applications include analysis of soils, minerals, metals, and more in fields like geology, archaeology, and environmental analysis.
This document discusses the concept of an X-ray interferometer called MAXIM that could achieve micro-arcsecond resolution. It would consist of an optics spacecraft holding multiple flat mirrors in formation with a detector spacecraft to form interference patterns. The goal is to image phenomena like black hole accretion disks and supernovae with much higher resolution than current telescopes. A pathfinder mission is proposed with 100 microarcsecond resolution using two spacecraft separated by 1.4 meters as a technology demonstration.
Transmission Electron Microscope_Lecture1.pptxBagraBay
The transmission electron microscope can be used to image microstructural features at high magnifications, perform elemental analysis, and determine crystal structures. Samples must be thinly sectioned or ion milled to be electron transparent. Imaging techniques like bright field and dark field are used to reveal structural features based on diffraction contrast. Selected area diffraction patterns can be indexed to identify crystal structures and orientations. The transmission electron microscope thus provides valuable microscopic and crystallographic information about materials at high resolution.
SiC: An advanced semiconductor material for power devicesSOUMEN GIRI
The document provides an overview of wide bandgap semiconductors like silicon carbide for replacing silicon in power electronics applications. It discusses the crystal structure and properties of silicon carbide that give it advantages over silicon like higher breakdown voltage and thermal stability. These allow silicon carbide devices to operate at higher voltages, temperatures, and frequencies. The document compares the performance of commercial silicon carbide Schottky diodes to silicon PN diodes, showing the silicon carbide diodes have lower conduction and switching losses. Adopting silicon carbide power electronics can provide benefits like increased efficiency and reduced system size and cooling requirements.
- X-ray interferometry could enable unprecedented resolution, improving on the Hubble Space Telescope by orders of magnitude. Laboratory tests have demonstrated interferometry is possible using simple configurations of grazing incidence flats/mirrors. A space-based observatory design is proposed using an array of flats separated by distances up to kilometers to form fringes and image celestial sources. The technique could have applications for high-contrast imaging of exoplanets by taking advantage of reduced scattering at grazing incidence angles.
Semiconductor
If a valence Electron acquires sufficient kinetic energy to break its covalent bond and fills the void created by a hole then a vacancy, or hole will be created in the covalent bond that released the electron
Hence there is a transfer of holes to the left and electrons to the right
The document summarizes the history of light emitting diodes (LEDs). It discusses several important figures in LED development including Captain Henry Joseph Round in 1907, Oleg Vladimirovich Losev in 1927, Nick Holonyak in 1962, and Shuji Nakamura in the 1990s. It provides brief biographies of each inventor and their key contributions to advancing LED technology.
Introduction to smith Chart
Introduction to smith Chart
Normalized Impedance
Constant Resistance Circles
Constant Reactance ‘Arcs’
Plot a Complex Impedance
What about Admittance?
Analysis of Single stub Tuner
VSWR and Transmission Lines
Analysis of Single stub tuner
Analysis of Double-Stub Tuner
Difference between single stub matching and double stub matching
A 50 ohm transmission line is terminated to load of 25+50j. The length of the transmission line is 3.3 lemda.
Find:
(a)Reflection coefficient
(b)VSWR
(c)Input impedance
(d)Input admittance
The document discusses various properties of solids including magnetic, electrical, and crystalline properties. It defines different types of magnetic behaviors such as paramagnetism, diamagnetism, and ferromagnetism. It also describes properties of conductors, semiconductors, and insulators based on their band structure. The document further discusses crystal structures, unit cells, voids, defects in crystals, and the differences between crystalline and amorphous solids.
This document covers Chapter 5 on diodes. It discusses the basic operation and characteristics of semiconductor diodes including their I-V curve. It also covers the operation of specific diodes like Zener diodes, Schottky diodes, and photodiodes. The applications of diodes in rectifiers, clippers, and clampers are described. Learning outcomes include explaining diode characteristics and circuits, solving load-line analysis, and analyzing rectifier and clipper/clamper output voltages.
The document describes the structure and content of an electronics lesson on diode applications. It includes an introduction, learning objectives, table of contents, lecture material, and assessment. The lecture covers diode overview, rectifier circuits, clippers, clampers, Zener diodes, and voltage multiplication. Example circuits and calculations are provided for each topic.
Silicon Drift Detectors for Energy Dispersive X- Ray Fluorescence ( SDDEXRF)Saleh Qutaishat
This document discusses Silicon Drift Detectors (SDD) for use in synchrotron energy dispersive X-ray fluorescence (EDXRF) spectroscopy. It begins with an introduction to SDDs, explaining their structure and operating principle. It then describes the features and high performance of SDDs, including their high count rate, good energy resolution, and large active area. The document presents spectra from an Fe55 source taken with an SDD and includes diagrams of detector modules, cooling systems, and integration with spectroscopy systems. It concludes by emphasizing the key advantages of SDDs for spectroscopy applications like their lower noise and ability to operate at higher count rates than conventional semiconductor detectors.
XPS can be used to characterize polymers at the surface. It provides both elemental and chemical information about the top 10 nm of a sample. Elemental identification and quantification is possible from survey spectra. High resolution region spectra can identify functional groups and chemical environments through chemical shifts. XPS can map the distribution of elements and chemical states across a sample surface. Depth profiling with cluster ion beams maintains chemical information during sputtering and allows buried layers and interfaces to be analyzed. XPS was used to characterize a fluoropolymer coating on PET and PTFE, identifying the chemical structure and confirming it matched the expected structure from the plasma deposition process.
This document discusses X-ray fluorescence (XRF), a technique used to analyze the chemical composition of materials. XRF works by exciting a sample with an X-ray source, which causes fluorescent X-rays to be emitted from the sample that are characteristic of its elemental composition. The document covers the basic principles of XRF, how it is used to generate spectra to analyze samples, common instrumentation including X-ray sources and detectors, sample preparation methods, applications in fields like mining and environmental analysis, and limitations of the technique.
Scanning Electron Microscope- Energy - Dispersive X -Ray Microanalysis (Sem E...Nani Karnam Vinayakam
The document discusses scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX or EDS) analysis. It provides details on:
- How an SEM works by scanning a sample with a focused electron beam and detecting signals from electron interactions with the sample.
- The components of an SEM including the electron gun, detectors for secondary electrons and backscattered electrons.
- How EDX analysis identifies elements by measuring the energy of X-rays emitted when electrons change energy levels.
- Parameters that affect EDX analysis such as count rate, accelerating voltage, and take-off angle.
Windows Deployment Services (WDS) is used to install Windows operating systems on client machines. It provides faster installation than previous methods by copying only two files from the installation media. WDS requires a configured DNS, DHCP server, and domain controller to provide network services and authentication support during installation. The documentation then provides step-by-step instructions for configuring a WDS server by adding the role, specifying installation folders and network settings, and importing operating system installation images.
This document provides an overview of X-ray fluorescence (XRF) spectroscopy. It discusses XRF theory, instrumentation, hardware, and applications. XRF uses X-rays to excite a sample, and a detector then measures the fluorescent X-rays emitted from the sample that are characteristic of its elemental composition. The document compares wavelength dispersive XRF and energy dispersive XRF, and describes the components of XRF systems including X-ray sources, detectors, filters, and electronics. It provides examples of XRF applications in qualitative and quantitative elemental analysis across various industries.
Wavelength dispersive spectrometers use crystals to diffract x-rays of specific wavelengths from a sample into a detector. They work by aligning the crystal, sample, and detector on a curved surface called the Rowland circle. Flat crystals with collimators and curved crystals with slits can be used to improve the resolution of x-ray wavelengths detected. WDS is useful for non-destructive elemental analysis of small spots down to ppm concentrations but cannot detect elements below boron.
The document discusses the functions and working principles of an energy dispersive spectrometer (EDS). EDS can determine the chemical composition of materials down to the micron scale by detecting the characteristic x-rays emitted when the material is exposed to an electron beam. The EDS system includes an x-ray detector that converts x-ray energies into electrical signals and a multi-channel analyzer to separate the signals by energy into an elemental composition spectrum. Factors such as detector resolution, sample properties, and operating conditions can affect the accuracy of elemental quantification by EDS.
XRF & XRD analysis techniques are used to analyze materials. X-rays were discovered in 1895 by Wilhelm Conrad Roentgen. Over time, scientists developed an understanding of X-ray diffraction and how to use it for crystallography. By the mid-20th century, powder diffractometry techniques and databases had been established. X-rays are electromagnetic waves or photon beams with wavelengths between 0.01 to 10 nm, corresponding to energies from 0.125 to 125 keV. They can be hazardous due to their ionizing properties, requiring safety precautions as they are invisible, travel in straight lines at the speed of light, and can cause serious injury.
The document discusses X-ray fluorescence (XRF) theory and applications. XRF involves bombarding a sample with X-rays, which causes fluorescent X-rays to be emitted from the sample that are characteristic of its elemental composition. This allows for both qualitative and quantitative elemental analysis. Key advantages of XRF include rapid, nondestructive analysis of major and trace elements in various materials. Common applications include analysis of soils, minerals, metals, and more in fields like geology, archaeology, and environmental analysis.
This document discusses the concept of an X-ray interferometer called MAXIM that could achieve micro-arcsecond resolution. It would consist of an optics spacecraft holding multiple flat mirrors in formation with a detector spacecraft to form interference patterns. The goal is to image phenomena like black hole accretion disks and supernovae with much higher resolution than current telescopes. A pathfinder mission is proposed with 100 microarcsecond resolution using two spacecraft separated by 1.4 meters as a technology demonstration.
Transmission Electron Microscope_Lecture1.pptxBagraBay
The transmission electron microscope can be used to image microstructural features at high magnifications, perform elemental analysis, and determine crystal structures. Samples must be thinly sectioned or ion milled to be electron transparent. Imaging techniques like bright field and dark field are used to reveal structural features based on diffraction contrast. Selected area diffraction patterns can be indexed to identify crystal structures and orientations. The transmission electron microscope thus provides valuable microscopic and crystallographic information about materials at high resolution.
SiC: An advanced semiconductor material for power devicesSOUMEN GIRI
The document provides an overview of wide bandgap semiconductors like silicon carbide for replacing silicon in power electronics applications. It discusses the crystal structure and properties of silicon carbide that give it advantages over silicon like higher breakdown voltage and thermal stability. These allow silicon carbide devices to operate at higher voltages, temperatures, and frequencies. The document compares the performance of commercial silicon carbide Schottky diodes to silicon PN diodes, showing the silicon carbide diodes have lower conduction and switching losses. Adopting silicon carbide power electronics can provide benefits like increased efficiency and reduced system size and cooling requirements.
- X-ray interferometry could enable unprecedented resolution, improving on the Hubble Space Telescope by orders of magnitude. Laboratory tests have demonstrated interferometry is possible using simple configurations of grazing incidence flats/mirrors. A space-based observatory design is proposed using an array of flats separated by distances up to kilometers to form fringes and image celestial sources. The technique could have applications for high-contrast imaging of exoplanets by taking advantage of reduced scattering at grazing incidence angles.
Semiconductor
If a valence Electron acquires sufficient kinetic energy to break its covalent bond and fills the void created by a hole then a vacancy, or hole will be created in the covalent bond that released the electron
Hence there is a transfer of holes to the left and electrons to the right
The document summarizes the history of light emitting diodes (LEDs). It discusses several important figures in LED development including Captain Henry Joseph Round in 1907, Oleg Vladimirovich Losev in 1927, Nick Holonyak in 1962, and Shuji Nakamura in the 1990s. It provides brief biographies of each inventor and their key contributions to advancing LED technology.
Introduction to smith Chart
Introduction to smith Chart
Normalized Impedance
Constant Resistance Circles
Constant Reactance ‘Arcs’
Plot a Complex Impedance
What about Admittance?
Analysis of Single stub Tuner
VSWR and Transmission Lines
Analysis of Single stub tuner
Analysis of Double-Stub Tuner
Difference between single stub matching and double stub matching
A 50 ohm transmission line is terminated to load of 25+50j. The length of the transmission line is 3.3 lemda.
Find:
(a)Reflection coefficient
(b)VSWR
(c)Input impedance
(d)Input admittance
The document discusses various properties of solids including magnetic, electrical, and crystalline properties. It defines different types of magnetic behaviors such as paramagnetism, diamagnetism, and ferromagnetism. It also describes properties of conductors, semiconductors, and insulators based on their band structure. The document further discusses crystal structures, unit cells, voids, defects in crystals, and the differences between crystalline and amorphous solids.
This document covers Chapter 5 on diodes. It discusses the basic operation and characteristics of semiconductor diodes including their I-V curve. It also covers the operation of specific diodes like Zener diodes, Schottky diodes, and photodiodes. The applications of diodes in rectifiers, clippers, and clampers are described. Learning outcomes include explaining diode characteristics and circuits, solving load-line analysis, and analyzing rectifier and clipper/clamper output voltages.
The document describes the structure and content of an electronics lesson on diode applications. It includes an introduction, learning objectives, table of contents, lecture material, and assessment. The lecture covers diode overview, rectifier circuits, clippers, clampers, Zener diodes, and voltage multiplication. Example circuits and calculations are provided for each topic.
This document discusses the characteristics and applications of diodes. It begins by defining what a diode is - an electrical component that allows current to flow in only one direction. It then discusses the different types of diodes including PN junction diodes, Zener diodes, and light emitting diodes. The key characteristics and applications of each diode type are described. The document also covers the forward and reverse biasing of PN junction diodes and examines their V-I characteristics. Common questions about diodes are provided along with answers. Finally, the characteristics and applications of Zener diodes are discussed in more detail.
The document describes an analysis of using an electrostatic shield concept to protect a lunar base from radiation. It discusses the radiation environment, types of radiation and their energy spectra. It then examines passive and active shielding solutions, focusing on electrostatic shields. The document outlines an electrostatic shield design using charged spheres to generate an electric field, and models this using a Lunar Electrostatic Shield Model (LESM) simulation to analyze particle trajectories with and without an applied field. The simulation results suggest the shield design can effectively deflect energetic particles and protect a region near the lunar surface.
X-ray diffraction is used to analyze the crystal structure of materials. Several methods are described, including Laue, rotating crystal, and powder methods. The Laue method determines crystal orientation using a fixed crystal and white radiation. The rotating crystal method uses a single crystal rotated under a monochromatic beam to determine lattice parameters. The powder method bombards a powdered sample with a monochromatic beam to measure all crystal orientations simultaneously and determine lattice parameters. Bragg's law relates the diffraction pattern to the crystal structure.
Towards Crystallization Using a Strong Electric FieldNorbert Radacsi
This document discusses experiments on applying strong electric fields to influence crystallization. Key findings include:
- Crystal growth rates of isonicotinamide and 4-hydroxybenzoic acid increased up to 15 times in the presence of an electric field.
- The induction time for nucleation of isonicotinamide crystals decreased when an electric field was applied.
- Recrystallization of isonicotinamide in the presence of an electric field produced a different polymorph (form II) than without an electric field (form I).
- The electric field is believed to increase local supersaturation through effects like electromigration, leading to changed crystallization behavior.
This document provides information on silicon avalanche photodiodes (Si APDs) produced by Hamamatsu Photonics. It describes different types of Si APDs including short wavelength types optimized for the UV-visible range and near infrared types for wavelengths up to 1100nm. It provides specifications for various Si APD models including their breakdown voltage, temperature coefficient, response speed, gain, and packaging. The document also describes APD modules containing Si APDs and their features for applications such as low-light detection, fiber optics, and laser detection.
p-i-n Solar Cell Modeling with Graphene as ElectrodeWahiduzzaman Khan
Graphene is a 2-D atomic layer of carbon atoms with unique electronic properties like outstanding carrier mobility, high carrier saturation velocity, excellent thermal conductivity, high mechanical strength, transparency, thinness, and flexibility which make graphene an excellent choice of material for advanced applications in future solar cell design. We modeled a solar cell using graphene as the front electrode to study its performance and compare the performance with that of other possible contenders- indium tin oxide (ITO), widely used material at present and carbon nanotube (CNT), another promising material in this regard. Numerical solutions of the electrostatic and transport equations were obtained using the finite-element method. It was found that solar cell with graphene electrode can outperform the others. We also studied its performance as a function of various parameters. The developed model and obtained results are important for the design of solar cell with graphene as electrode.
This document discusses different types of diodes, including their basic functions and applications. It begins with an overview of basic diodes and their current-voltage characteristics. It then focuses on special diodes like Zener diodes, which maintain a relatively constant voltage when operated in reverse breakdown. Other diodes discussed include varactor diodes, light-emitting diodes (LEDs), photodiodes, Schottky diodes, laser diodes, PIN diodes, current regulator diodes, step-recovery diodes, and tunnel diodes. Each type has a specialized function and is commonly used in applications like power regulation, displays, optical communications, and high-frequency switching.
Authoring a personal GPT for your research and practice: How we created the Q...Leonel Morgado
Thematic analysis in qualitative research is a time-consuming and systematic task, typically done using teams. Team members must ground their activities on common understandings of the major concepts underlying the thematic analysis, and define criteria for its development. However, conceptual misunderstandings, equivocations, and lack of adherence to criteria are challenges to the quality and speed of this process. Given the distributed and uncertain nature of this process, we wondered if the tasks in thematic analysis could be supported by readily available artificial intelligence chatbots. Our early efforts point to potential benefits: not just saving time in the coding process but better adherence to criteria and grounding, by increasing triangulation between humans and artificial intelligence. This tutorial will provide a description and demonstration of the process we followed, as two academic researchers, to develop a custom ChatGPT to assist with qualitative coding in the thematic data analysis process of immersive learning accounts in a survey of the academic literature: QUAL-E Immersive Learning Thematic Analysis Helper. In the hands-on time, participants will try out QUAL-E and develop their ideas for their own qualitative coding ChatGPT. Participants that have the paid ChatGPT Plus subscription can create a draft of their assistants. The organizers will provide course materials and slide deck that participants will be able to utilize to continue development of their custom GPT. The paid subscription to ChatGPT Plus is not required to participate in this workshop, just for trying out personal GPTs during it.
The binding of cosmological structures by massless topological defectsSérgio Sacani
Assuming spherical symmetry and weak field, it is shown that if one solves the Poisson equation or the Einstein field
equations sourced by a topological defect, i.e. a singularity of a very specific form, the result is a localized gravitational
field capable of driving flat rotation (i.e. Keplerian circular orbits at a constant speed for all radii) of test masses on a thin
spherical shell without any underlying mass. Moreover, a large-scale structure which exploits this solution by assembling
concentrically a number of such topological defects can establish a flat stellar or galactic rotation curve, and can also deflect
light in the same manner as an equipotential (isothermal) sphere. Thus, the need for dark matter or modified gravity theory is
mitigated, at least in part.
Describing and Interpreting an Immersive Learning Case with the Immersion Cub...Leonel Morgado
Current descriptions of immersive learning cases are often difficult or impossible to compare. This is due to a myriad of different options on what details to include, which aspects are relevant, and on the descriptive approaches employed. Also, these aspects often combine very specific details with more general guidelines or indicate intents and rationales without clarifying their implementation. In this paper we provide a method to describe immersive learning cases that is structured to enable comparisons, yet flexible enough to allow researchers and practitioners to decide which aspects to include. This method leverages a taxonomy that classifies educational aspects at three levels (uses, practices, and strategies) and then utilizes two frameworks, the Immersive Learning Brain and the Immersion Cube, to enable a structured description and interpretation of immersive learning cases. The method is then demonstrated on a published immersive learning case on training for wind turbine maintenance using virtual reality. Applying the method results in a structured artifact, the Immersive Learning Case Sheet, that tags the case with its proximal uses, practices, and strategies, and refines the free text case description to ensure that matching details are included. This contribution is thus a case description method in support of future comparative research of immersive learning cases. We then discuss how the resulting description and interpretation can be leveraged to change immersion learning cases, by enriching them (considering low-effort changes or additions) or innovating (exploring more challenging avenues of transformation). The method holds significant promise to support better-grounded research in immersive learning.
Unlocking the mysteries of reproduction: Exploring fecundity and gonadosomati...AbdullaAlAsif1
The pygmy halfbeak Dermogenys colletei, is known for its viviparous nature, this presents an intriguing case of relatively low fecundity, raising questions about potential compensatory reproductive strategies employed by this species. Our study delves into the examination of fecundity and the Gonadosomatic Index (GSI) in the Pygmy Halfbeak, D. colletei (Meisner, 2001), an intriguing viviparous fish indigenous to Sarawak, Borneo. We hypothesize that the Pygmy halfbeak, D. colletei, may exhibit unique reproductive adaptations to offset its low fecundity, thus enhancing its survival and fitness. To address this, we conducted a comprehensive study utilizing 28 mature female specimens of D. colletei, carefully measuring fecundity and GSI to shed light on the reproductive adaptations of this species. Our findings reveal that D. colletei indeed exhibits low fecundity, with a mean of 16.76 ± 2.01, and a mean GSI of 12.83 ± 1.27, providing crucial insights into the reproductive mechanisms at play in this species. These results underscore the existence of unique reproductive strategies in D. colletei, enabling its adaptation and persistence in Borneo's diverse aquatic ecosystems, and call for further ecological research to elucidate these mechanisms. This study lends to a better understanding of viviparous fish in Borneo and contributes to the broader field of aquatic ecology, enhancing our knowledge of species adaptations to unique ecological challenges.
Or: Beyond linear.
Abstract: Equivariant neural networks are neural networks that incorporate symmetries. The nonlinear activation functions in these networks result in interesting nonlinear equivariant maps between simple representations, and motivate the key player of this talk: piecewise linear representation theory.
Disclaimer: No one is perfect, so please mind that there might be mistakes and typos.
dtubbenhauer@gmail.com
Corrected slides: dtubbenhauer.com/talks.html
Remote Sensing and Computational, Evolutionary, Supercomputing, and Intellige...University of Maribor
Slides from talk:
Aleš Zamuda: Remote Sensing and Computational, Evolutionary, Supercomputing, and Intelligent Systems.
11th International Conference on Electrical, Electronics and Computer Engineering (IcETRAN), Niš, 3-6 June 2024
Inter-Society Networking Panel GRSS/MTT-S/CIS Panel Session: Promoting Connection and Cooperation
https://www.etran.rs/2024/en/home-english/
Immersive Learning That Works: Research Grounding and Paths ForwardLeonel Morgado
We will metaverse into the essence of immersive learning, into its three dimensions and conceptual models. This approach encompasses elements from teaching methodologies to social involvement, through organizational concerns and technologies. Challenging the perception of learning as knowledge transfer, we introduce a 'Uses, Practices & Strategies' model operationalized by the 'Immersive Learning Brain' and ‘Immersion Cube’ frameworks. This approach offers a comprehensive guide through the intricacies of immersive educational experiences and spotlighting research frontiers, along the immersion dimensions of system, narrative, and agency. Our discourse extends to stakeholders beyond the academic sphere, addressing the interests of technologists, instructional designers, and policymakers. We span various contexts, from formal education to organizational transformation to the new horizon of an AI-pervasive society. This keynote aims to unite the iLRN community in a collaborative journey towards a future where immersive learning research and practice coalesce, paving the way for innovative educational research and practice landscapes.
Current Ms word generated power point presentation covers major details about the micronuclei test. It's significance and assays to conduct it. It is used to detect the micronuclei formation inside the cells of nearly every multicellular organism. It's formation takes place during chromosomal sepration at metaphase.
ESR spectroscopy in liquid food and beverages.pptxPRIYANKA PATEL
With increasing population, people need to rely on packaged food stuffs. Packaging of food materials requires the preservation of food. There are various methods for the treatment of food to preserve them and irradiation treatment of food is one of them. It is the most common and the most harmless method for the food preservation as it does not alter the necessary micronutrients of food materials. Although irradiated food doesn’t cause any harm to the human health but still the quality assessment of food is required to provide consumers with necessary information about the food. ESR spectroscopy is the most sophisticated way to investigate the quality of the food and the free radicals induced during the processing of the food. ESR spin trapping technique is useful for the detection of highly unstable radicals in the food. The antioxidant capability of liquid food and beverages in mainly performed by spin trapping technique.
The cost of acquiring information by natural selectionCarl Bergstrom
This is a short talk that I gave at the Banff International Research Station workshop on Modeling and Theory in Population Biology. The idea is to try to understand how the burden of natural selection relates to the amount of information that selection puts into the genome.
It's based on the first part of this research paper:
The cost of information acquisition by natural selection
Ryan Seamus McGee, Olivia Kosterlitz, Artem Kaznatcheev, Benjamin Kerr, Carl T. Bergstrom
bioRxiv 2022.07.02.498577; doi: https://doi.org/10.1101/2022.07.02.498577
3. 3
• The result:
• Best energy resolution
• Best peak-to-background
Why WDS?
EDS
WDS
4. 4
The Challenge of WDS
• Hypothetical sample in an SEM
• For microanalysis, sample is normal to the electron beam
5. 5
The Challenge of WDS
• X-rays are emitted from the excitation volume in a
3-dimensional hemispherical wavefront
6. 6
The Challenge of WDS
• Get diverging X-rays to diffract off of a diffractor and then be
counted by a detector at a meaningful intensity
• Flat diffractors:
• Simple geometry
• X-rays interact with diffractor with different θ
• X-rays continue to diverge after diffraction → low count rates at detector.
7. 7
Meeting the Challenge
• All WDS spectrometers consist of
• Diffractor
• Proportional counter (a.k.a., detector)
• Flowing P10 gas (90% Ar, 10% CH4)
• Sealed Xe
• Some WDS spectrometers include an X-ray optic near sample
• There are two types of spectrometers that have been
developed to meet the WDS challenge
• Rowland circle WDS
• Parallel beam WDS
8. 8
Meeting the Challenge: Intensity
• For WDS, the count rate is a function of
• X-ray generation
• Accelerating voltage
• Beam current
• Vacuum
• Sample composition
• Sample preparation
• Solid Angle and Optic
• Diffractor size
• Diffractor distance from sample
• Size of optic
• Reflectance and/or transmittance of optic
• Other
• Diffractor “reflectance”
• Type of gas in detector
• Pressure of gas in detector
• Transmittance of detector window
• Ambient temperature
• Presence / transmittance of spectrometer window
9. 9
Rowland Circle WDS: The Classic Solution (c. 1882)
• Curved diffractors focus the diffracted X-rays on to detector
• Requires complex motion so that the sample, diffractor, and
detector remain on a circle of fixed radius
11. 11
Rowland Circle WDS: The Classic Solution
• To maintain RC geometry, diffractor must move away from
sample for low-energy X-rays
• The result is a decrease in solid angle → low intensity (c/(s×nA))
for low energy X-rays
13. 13
Rowland Circle WDS: Solid Angle
102030405060
SolidAngle
θ
Solid angle as a function of θ
14. 14
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Rowland Circle WDS: SEM Solid Angle
Mo/B4C
2d = 200
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
Moon or Sun
15. 15
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Mo/B4C or C/W
2d = 145
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
16. 16
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Ni/C or C/W
2d = ~100
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
17. 17
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Ni/C or Cr/Sc or C/W
2d = ~80
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
18. 18
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
W/Si or C/W
2d = 60
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
19. 19
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
W/Si
2d = 45
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
20. 20
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
TAP
2d = 25.757
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
21. 21
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
PET
2d = 8.742
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
22. 22
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
LiF (200)
2d = 4.027
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
23. 23
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
LiF (220)
2d = 2.848
Rowland Circle WDS: SEM solid angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
210 mm SEM
SAdiff = 661 mm2
24. 24
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Rowland Circle WDS: SEM Solid Angle
Solid angle as a function of energy
210 mm SEM
SAdiff = 661 mm2
Be B O Al Si Ti Fe Cu Sr
LiF (200)
2d = 4.027
PET
2d = 8.742
TAP
2d = 25.757
Mo/B4C
2d = 200
Cr/Sc
2d = ~80
25. 25
Rowland Circle WDS: The Electron Microprobe (EPMA)
• Electron microscope with typically 5 RC-WDS spectrometers
• Spectrometers can concurrently analyze the same or different elements
• 2 or 4 diffractors in each spectrometer
26. 26
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Rowland Circle WDS: EPMA Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
160 mm EPMA
SAdiff = 704 mm2
210 mm SEM
SAdiff = 661 mm2
27. 27
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Rowland Circle WDS: EPMA Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
160 mm EPMA
SAdiff = 704 mm2
210 mm SEM
SAdiff = 661 mm2
160 mm EPMA
SAdiff = 1320 mm2
28. 28
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Rowland Circle WDS: EPMA Solid Angle
Solid angle as a function of energy
Be B O Al Si Ti Fe Cu Sr
160 mm EPMA
SAdiff = 704 mm2
210 mm SEM
SAdiff = 661 mm2
160 mm EPMA
SAdiff = 1320 mm2
LiF (200)
2d = 4.027PET
2d = 8.742
TAP
2d = 25.757
Ni/C
2d = ~100
W/Si
2d = 60
W/Si
2d = 45
29. 29
Rowland Circle WDS: The Classic Solution
• Pros
• Excellent energy resolution
• Excellent peak-to-background
• Cons
• Complicated spectrometer geometry
• Best results when the chamber is designed for the spectrometer.
• X-rays measured with large θ have low intensities
• Typically relies on an optical microscope to ensure sample is at proper
working distance
Not commonly available to the SEM user.
Requires a horizontal geometry
30. 30
Parallel Beam WDS: A Modern Approach
• Parallel beam WDS spectrometer
• Collimating optic is located near (~ 20 mm) from sample
• Grazing incidence
• Polycapillary
• Hybrid
• Parallel X-ray beam incident on diffractor
• No Rowland circle geometry needed
• Diffractor is flat
32. 32
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.01
0.02
0.03
0.04
0.05
0.06
Parallel Beam WDS: A Modern Approach
Polycapillary
Be B O Al Si Ti Fe Cu Sr
33. 33
X-ray Energy (keV)
0.1 1 10
SolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
Parallel Beam WDS: A Modern Approach
Solid Angle ≠ Intensity
Grazing incidence
Polycapillary
Hybrid
Be B O Al Si Ti Fe Cu Sr
34. 34
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
Parallel Beam WDS: A Modern Approach
Grazing incidence
Polycapillary
Hybrid
Be B O Al Si Ti Fe Cu Sr
35. 35
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
Parallel Beam WDS: A Modern Approach
Grazing incidence
Polycapillary
Hybrid
210 mm SEM
Be B O Al Si Ti Fe Cu Sr
36. 36
Parallel Beam WDS: A Modern Approach
• Pros
• Excellent energy resolution
• Excellent peak-to-background
• Excellent intensity
• Cons
• Cannot accommodate a slit to modestly improve energy resolution with
a large intensity cost
37. 37
Head-to-Head Comparison: SEM and EMP
• Identical accelerating voltage and beam current
• PB-WDS with hybrid optic
• 1 spectrometer
• Sealed Xe detector
• Flat diffractors
• 160 mm RC-WDS
• 5 spectrometers
• 3 detectors with 0.1 atm P10 flow
• 2 detectors with 1 atm P10 flow
• Curved diffractors (Johann and Johansson)
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr) 0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
Seddio and Fournelle 2015
39. 39
Head-to-Head Comparison: SEM and EMP
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
LiF (200)
2d = 4.027
40. 40
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
Head-to-Head Comparison: SEM and EMP
PET
2d = 8.742
LiF (200)
2d = 4.027
41. 41
Head-to-Head Comparison: SEM and EMP
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
TAP
2d = 25.757
PET
2d = 8.742
42. 42
Head-to-Head Comparison: SEM and EMP
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
TAP
2d = 25.757
43. 43
Head-to-Head Comparison: SEM and EMP
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
Ni/C
2d = ~100
W/Si
2d = 60
44. 44
Head-to-Head Comparison: SEM and EMP
X-ray Energy (keV)
0.1 1 10
EffectiveSolidAngle(sr)
0.00
0.02
0.04
0.06
0.08
0.10
0.12
0.14
Ni/C
2d = ~100
Mo/B4C
2d = 200
45. 45
Conclusions
• RC-WDS
• Excellent solution when microscope is designed primarily for WDS
• Yields impractically low intensities on SEMs
• PB-WDS
• Unrivaled low energy X-ray intensity
• High energy X-ray intensities consistent with the best RC-WDS
intensities on an SEM
Editor's Notes
What is WDS?
Unlike EDS, in which all X-ray wavelengths are counted concurrently, WDS counts only one wavelength at a time.
All WDS relies on Bragg’s Law.
The full X-ray continuum is incident on a diffractor.
Only X-rays whose wavelength satisfy nλ = 2d sinθ undergo constructive interference and are reflected to a detector.
Why WDS?
Of any microanalytical technique, WDS has the best energy resolution and the best peak-to-background ratio.
WDS is able to resolve confusing EDS X-ray interferences.
The challenge of WDS is to get diverging X-rays to diffract off of a diffractor and then be counted by a detector at a meaningful intensity.
The simplest arrangement of sample, diffractor, and detector would be to use a flat diffractor.
However, X-rays are incident on the diffractor with different angles.
Note that θ at the left of the diffractor is larger than θ at the right.
The result would be that different wavelengths would be diffracted across the diffractor.
Moreover, X-rays would continue to diverge after diffraction yielding a very low intensity at the detector.
All WDS spectrometers consist of a diffractor and a proportional counter.
In practice, two kinds of proportional counters are used: flowing P10 gas or sealed Xe.
Some spectrometers also include an optic located near the sample.
In order to meet the challenge of WDS, two main types of spectrometers have been developed: Rowland circle spectrometers and parallel beam spectrometers.
The intensity measured by a WDS spectrometer is a function of many factors.
Some factors are beyond the control of the spectrometer such as accelerating voltage, beam current, SEM vacuum, and sample composition and preparation.
However, the design of the spectrometer can influence the measured intensity in many ways.
Today, we’ll investigate the effects that diffractor solid angle and the presence of an X-ray optic have on intensity in Rowland circle and parallel beam spectrometers.
The factors involved are the diffractor size, the distance of the diffractor from the sample, the size of the optic, and the reflectance and/or transmittance of the optic.
Other spectrometer-dependant factors include diffractor reflectance, the type of gas in the detector, the pressure of gas in the detector, the transmittance of the detector window, the ambient temperature, and the presence/transmittance of a window between the SEM chamber and the spectrometer.
First, let’s examine Rowland circle WDS spectrometers.
The concept of the Rowland circle was first developed by Henry Rowland around 1880, and it was applied to X-ray microanalysis about 60 years ago.
In order to count monochromatic X-rays, Rowland circle geometry requires sample, diffractor, and detector to be positioned on an imaginary circle of fixed radius, “R.”
The diffracted X-rays can be semi-focused on the detector by using Johann diffractors, which are bent to a radius of 2R.
True focusing can be achieved by using Johansson diffractors, which are bent to a radius of 2R and then ground to a radius of R.
Both diffractor types are commonly used.
In practice, the crystal diffractors are made as the Johansson type, and the layered diffractors are made in the Johann type because they are they are difficult to manufacture as Johansson.
This animation depicts the motion of a Rowland circle spectrometer.
The colors represent the relative energies of X-rays with red being low and violet being high.
Note that when higher energy X-rays are being analyzed, the diffractor is relatively close to the sample and when lower energy X-rays are being analyzed, the diffractor is relatively far from the sample.
The distance between the sample and diffractor can be expressed as a function of θ or as a function of wavelength.
The solid angle of an object describes how big the object appears to be to an observer and is defined as the surface area of the object divided by the square of the distance between the observer and the object.
For example, the sun is very big, but very far.
The moon is much smaller than the sun, but much closer to Earth.
The sun and the moon have approximately the same solid angle in the sky.
It is important to note that the solid angle of a Rowland circle spectrometer is defined by the X-ray being analyzed and cannot simply be improved by moving the spectrometer closer to the sample, as it can with EDS.
In the case of a Rowland circle spectrometer, the larger the solid angle of a diffractor, the more X-rays incident on the diffractor, and the more X-rays that can be diffracted to the detector.
In Rowland circle geometry, the rotation of the diffractor requires that the solid angle of the diffractor be scaled by sinθ.
The solid angle of the diffractor can then be expressed as a function of θ or as a function of wavelength.
For a diffractor with a given 2d-spacing and area, the solid angle as a function of θ would look like this.
The solid angles achievable by different Rowland circle spectrometers can be calculated and compared if the Rowland circle radii and diffractor areas are known.
Here is a plot of the solid angle in steradians as a function of X-ray energy with the location of a few K-alpha lines for reference.
First, we will examine the solid angles achievable by Rowland circle spectrometers on SEMs.
The radius of the Rowland circle is 210 mm, which is the radius available for Rowland circle WDS systems available on SEMs.
The diffractor area is 661 square-mm as is available on that system.
The solid angle as a function of X-ray energy is plotted for a many diffractors with different 2d-spacings.
Different Rowland circle spectrometer manufacturers offer different diffractors.
For the sake of comparison, I have plotted most of them.
For reference, the arrow points to the solid angle of the moon or sun.
Rowland circle spectrometers mounted on SEMs can typically accommodate 4 to 6 diffractors.
Users would typically choose to include the diffractors in their system that offer the maximum range of X-ray energies.
Such a selection for an SEM may look like this.
Again, as we saw in the animation, on a given diffractor, higher energy X-rays can be measured with greater solid angle than lower energy X-rays.
For example, note the solid angle of O K-alpha as measured on Cr/Sc compared to that measured on TAP.
Another example commonly encountered is the vastly different intensities of Si K-alpha measured on TAP and PET.
However, with a Rowland circle spectrometer on an SEM, mechanical limitations prohibit the analysis of Si K-alpha with TAP, whereas TAP is the preferred diffractor with which to analyze Si K-alpha on all microprobe spectrometers.
The electron microprobe is an electron microscope that is specifically designed for Rowland circle WDS analysis.
They typically have 5 Rowland circle spectrometers, which allow the user to analyze multiple or the same elements concurrently on multiple spectrometers.
Each spectrometer can hold 2 or 4 diffractors.
Because the microprobe is specifically designed for Rowland circle WDS, the circle radii on microprobes can be smaller than it is for SEM Rowland circles.
Common Rowland circle radii for microprobes are 140 mm and 160 mm, and they are typically available with 300 and 704 square-mm diffractors, respectively.
The plot has been amended with solid angle calculations for microprobe with a 160 mm Rowland circle and a 704 square-mm diffractor.
The solid angle is strongly improved at all energies and for all diffractors.
For a given diffractor, the Rowland circle geometry still yields dramatic changes in solid angle as a function of energy.
In Rowland circle systems, there is no way to avoid these dramatic solid angle variations.
In order to compensate for the relatively poor intensities achieved at the low-energy spectrometer positions, microprobe manufactures provide two options for improving the overall solid angles of their spectrometers.
These enhancements are either using larger diffractors or choosing a smaller Rowland circle radius.
In red, is the solid angle of the same Rowland spectrometer in blue, but with a diffractor with nearly twice the area, which nearly doubles the solid angle.
Again, the reason we care about the solid angle of the diffractor is because it is directly proportional to the intensity measured by the detector.
So since these enhanced spectrometers are so much better, why wouldn’t you only use them?
For spectrometers with large diffractors, only 2 diffractors fit in a spectrometer at once.
Smaller diffractors allow up to 4 diffractors to fit in a spectrometer at once.
Additionally, enhanced spectrometers with smaller Rowland circles can only fit on a microprobe where the manufacturer permits.
Here I have limited the plot to diffractors and spectrometers in an actual university microprobe.
Not all diffractors can be used concurrently.
Only two spectrometers are enhanced with large crystals.
But multiple spectrometers can have the same the same diffractors which effectively adds the solid angles.
The same selection of 5 diffractors for the SEM Rowland circle is included in pink.
This is why you don’t replace your microprobe with a single RC spectrometer.
As with all WDS systems, Rowland circle spectrometers, on SEMs and microprobes, yield excellent energy resolution and peak-to-background ratios.
However, the complicated geometry of the Rowland circle requires that the microscope chamber be designed especially for the purpose of Rowland circle WDS.
On an SEM, the Rowland circle requires many compromises.
X-rays measured with large θ have low intensities.
This is especially true for low energy X-rays such as B K-alpha.
Additionally, most Rowland circle WDS systems include an optical microscope in-line with the electron column to ensure that the sample is at proper working distance.
This typically isn’t available to the SEM user.
To account for this, most Rowland circle WDS systems are mounted with an inclined or horizontal geometry.
Inclined Rowland circle spectrometers are less susceptible to the loss of intensity resulting from small deviations from the analytical working distance.
However, rigorous quantitative Rowland circle WDS analysis still requires that standards and samples are both measured at the same working distance.
Also, even with a horizontal Rowland circle spectrometer intensity still drops off with deviation from the analytical working distance.
Parallel beam WDS spectrometers are a modern innovation of the WDS technique.
It adds an X-ray optic to the spectrometer that collimates the diverging X-rays and, like an EDS spectrometer, is inserted very close to the sample.
There are 3 kinds of collimating optics used in parallel beam WDS spectrometers.
Grazing incidence optics are parabolic mirrors that work by the same principles as the mirrors in some telescopes or that can be used to cook food with sunlight.
Instead of incoming parallel light being focused to a point, the source of the diverging X-rays are oriented to the focus point of the parabolic mirror and are then collimated.
A polycapillary optic works much like a fiber optic.
The most recent innovation in collimating X-ray optics is a hybrid in which a polycapillary optic is situated at the center of a grazing incidence optic.
With a parallel beam of X-rays, no Rowland circle geometry is necessary.
The diffractors can be flat.
This is an animation of the motion of a parallel beam WDS spectrometer.
The full X-ray continuum is collimated by the optic and is incident on the diffractor.
Monochromatic X-rays are then diffracted to the detector.
The color represents the relative X-ray energy with red being low and violet being high.
θ is the angle of the diffractor with the incident X-rays.
4 diffractors are given and the X-ray energies diffracted for that θ are given.
Let’s investigate the solid angles relevant to parallel beam WDS and compare it with the Rowland circle systems.
The solid angle of the diffractors is inconsequential because with a parallel beam, the X-ray flux of the diffractor is not a function of the distance between the diffractor and the sample.
It is the solid angle of the X-ray optic that is important because, ideally, every X-ray that is incident on the optic is collimated and incident on the diffractor.
Here the solid angle of a policapillary optic is plotted along with the Rowland circle calculations.Because the optic only has one analytical distance from the sample, its solid angle does not change.
The solid angle of the grazing incidence and hybrid optics have been added to the plot.
Note that that the scale of the Y-axis has changed significantly.
The hybrid solid angle is the sum of the solid angles of the grazing incidence and polycapillary optics.
For Rowland circle WDS, the solid angle of the diffractor is directly proportional to the intensity of the X-rays incident on the diffractor.
However, this is not the case for parallel beam WDS because the reflectance and/or transmittance of the optic has a strong effect on the intensity observed at the diffractor.
Here, the solid angles of the parallel beam optics have been scaled by their reflectance and transmittance.
The Y-axis can no longer truly be “solid angle.”
I have termed it “effective solid angle” which should be interpreted as the relative intensity observed at the diffractor.
Now the calculated solid angles can be meaningfully compared.
The effective solid angle of the grazing incidence optic is excellent for X-rays below ~0.5 keV.
Above ~0.5 keV, it fails to reflect a meaningful number of X-rays.
The polycapillary optic yields a rather consistent effective solid angle of ~0.018 sr between 0–7 keV.
The hybrid optic yields an effective solid angle that it the sum of the effective solid angles of the grazing incidence and polycapillary optics.
The Rowland circle WDS solid angles are plotted in the background for comparison.
It is evident that parallel beam WDS yields the highest X-ray flux at the diffractors for low energy X-rays for a single spectrometer,
and microprobe Rowland circle WDS can yield the highest X-ray flux for high energy X-rays.
However, it is best to compare WDS systems available for the SEMS.
The grazing incidence optic dramatically outperforms the SEM Rowland circle below ~0.3 keV but is inferior above that.
The polycapillary optic outperforms or matches the effective solid angle of the SEM Rowland circle between ~0-8 keV.
Above 8 keV, the SEM Rowland circle outperforms the polycapillary but not dramatically.
The hybrid optic optic outperforms or matches the effective solid angle of the SEM Rowland circle between ~0-8 keV and dramaically outperforms the SEM Rowland circle WDS below ~0.3 keV.
It is noteworthy that there are few cases in which X-ray interferences occur above ~8 keV.
Parallel beam WDS yields excellent energy resolution, peak-to-background ratios, and intensities, especially at lower X-ray energies.
However, because the X-rays incident on the detector are parallel, a slit cannot be inserted in front of the detector in order to modestly improve energy resolution as can be done with Rowland circle WDS.
The problem with slitting the detector is that doing so dramatically decreases the measured intensity.
In order to confirm the calculated theoretical results, a head-to-head- comparison was done.
Intensities on metal standards were measured with a parallel beam spectrometer with a hybrid optic mounted on an SEM and an electron microprobe with 5 160 mm radius Rowland circle spectrometers.
When possible, all analytical conditions were kept identical such as samples, accelerating voltage, and beam current.
Some differences were unavoidable.
The parallel beam system uses a sealed Xe proportional counter.
The microprobe uses a proportional counter with 0.1 atm of flowing P10 gas in 3 spectrometers for the measurement or lower energy X-rays and a proportional counter with 1 atm of flowing P10 gas in 2 spectrometers for the measurement or higher energy X-rays.
Here are he results for measure the intensity of Cu K-alpha.
The “LiF*” refers to the LiF220 crystal.
The microprobe spectrometer with a large LiF and a high-pressure detector yields more than double the measured intensity obtained on the SEM LiF.
Based on effective solid angle, one would expect this difference to be much greater; however, the Xe proportional counter is much more effective at counting high energy X-rays relative to the P10 used by the microprobe.
In fact, on the LiF 220 crystal measurements, the SEM out performs the microprobe with a regular sized crystal even though the effective solid angle is slightly greater for the microprobe.
The Fe K-alpha results are similar to those for Cu.
The microprobe slightly outperforms with the large diffractor and high-pressure counter although a greater difference is expected.
The measurement of Ti K-alpha yields similar results between the microprobe and the SEM.
The microprobe outperforms the SEM when measuring Si K-alpha on Tap, but not on PET.
Remember that on the 210 mm Rowland circle WDS available on an SEM, Si cannot be measured with TAP.
The Al K-alpha intensity measured on the microprobe is about double that measured in the SEM.
For C K-alpha, the SEM outperforms the microprobe.
Note that the same Ni/C 2d-spacings were not available for this experiment.
As expected, the SEM strongly outperforms the B K-alpha intensities measured on the microprobe.
Rowland circle WDS is a tried and true technique that yields excellent results when the microscope is designed specifically for those spectrometers and multiple spectrometers can be fit to the instrument concurrently.
On an SEM, Rowland circle WDS yields impractically low intensities.
Parallel beam WDS with a hybrid optic unequivocally yields the best intensities for low energy X-rays.
It matches or exceeds the intensities for high energy X-rays obtained by Rowland circle WDS on an SEM.