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VLSI Design
Dr. Vijay Rao Kumbhare
Assistant Professor (ECE)
K L University, Hyderabad
Session Outcome: 1 Remember the IC era and Understand the MOS transistor analysis
Session No. 03
22-12-2022
1
24-04-2023
Integrated Circuit
• IC
• Integrated circuit
2
24-04-2023
• ICs have three key advantages over digital circuits built from discrete components
Small size
ICs are much smaller.
High speed
Communication within a chip is faster.
Low power consumption
Logic operations within a chip take much less power
Device
Physics
Device
Electronics
Two-Transistor Circuits
(Inverters)
Combinational and Sequential
Circuits
Regular Structures ROMs, RAMs, PLAs
VLSI Sub-Systems, Adders, Multipliers
System-Related Issues, Reliability, Manufacturability,
Testability
Increasing Complexity
3
24-04-2023
Introduction to VLSI Design
VLSI Design
Analog
MOS
Mirror and
Steering
MOS Cascade
and Cascode
OPAMP
Amplifier
Feedback
Digital
Static Design
Conventional
Static CMOS
Logic
Ratioed Logic
Transmission
Gate Logic
Pass Transistor
Dynamic
Design
Domino logic np-CMOS
4
24-04-2023
5
Design Abstraction Levels
System Requirements
Architecture Definition and Logic Design
VLSI Design and Layout
Design Verification
Pass
Mask Generation
Silicon Processing
To: Wafer Testing Packaging and Reliability Qualification
Design Rule Checking and
Circuit Simulation (SPICE)
Technology, Design Rules, Device Models
Fail
24-04-2023
Levels of Design
• Specifications
• IO, Goals and Objectives, Function, Costs
• Architectural Description
• VHDL, Verilog, Behavioral, Large Blocks
• Logic Design
• Gates plus Registers
• Circuit Design
• Transistors sized for power and speed
• Discrete Logic, Technology Mapping
• Layout
• Size, Interconnect, Parasitic
6
24-04-2023
Design Abstraction
7
24-04-2023
Technology Evolution
8
24-04-2023
NMOS
9
24-04-2023
10
24-04-2023
PMOS
Fabrication
• nMOS - Early process with which only nMOS transistors
could be fabricated
11
24-04-2023
• pMOS - Similar to nMOS process, but only pMOS transistors
could be fabricated
• CMOS - Complementary Metal Oxide Semiconductor process with which
both pMOS and nMOS could be fabricated on the same substrate
CMOS FABRICATION PROCESS
• The CMOS fabrication process involves both pMOS and
nMOS transistors
12
24-04-2023
• An inverter is taken as an example to explain the CMOS
process
• An inverter contains both pMOS and nMOS transistors
BASIC MOS TRANSISTORS
(a) nMOS Enhancement mode transistor (b) nMOS depletion mode transistor
FIGURE 1 MOS transistors (V0 = 0 V. Source gate and substrate to 0 V). 13
24-04-2023
MOS Transistor
MOS Capacitor
Vg < 0
When a negative voltage is
applied to the gate
Accumulation
MOS Capacitor
Vg > 0
Depletion
When a small positive voltage
is applied to the gate
Depletion
MOS Capacitor
0 > Vg > Vth
Inversion
When a positive voltage above threshold voltage
is applied to the gate
Channel
NMOS Transistor
Vgs = 0
NO Channel, Ids = 0 CUT-OFF
NMOS Transistor
Vgs >Vth
NMOS Transistor
• The formation of channel does not
guarantee a drain to source current
Ids
• Following the Ohm’s law, there has to
be a potential difference between
drain and source so that current
flows
• Therefore for Ids to flow, Vds > 0
Vgs >Vth
Shape of the channel
• If Vgs > Vth then channel is
formed and symmetric
• In this case there is no current
flow because Vds = 0
Shape of the channel
Vgs > Vth CHANNEL SYMMETRIC
Shape of the channel
• If Vgs > Vth, then channel is
formed and has a trapezoidal
shape
• In this case, Ids > 0 because Vds >
0
• Under these conditions NMOS is
said to be in ohmic/linear region
Shape of the channel
Vgs > Vth, then channel is formed and has a Trapezoidal shape
Transistor in Ohmic/Linear Region
Shape of the channel
• If Vgs > Vth, then channel is
formed but it is pinched off at
the drain
• Under these conditions NMOS
is said to be at the edge of
saturation region
Shape of the channel
• If Vgs > Vth then channel is
formed but it does not exist
till the drain region
• Under these conditions NMOS
is said to be in the saturation
region
• Even without channel formed
completely till the drain, the
current flows from drain to
source due to drift
• In saturation region, Ids is
independent of Vds
Shape of the channel
Vgs > Vth CHANNEL PINCHED OFF
TRANSISTOR IN SATURATION REGION
Vgs > Vth is usually written as Vds > Vgs - Vth
IV Characteristics
The IV Characteristics we derive now are from IDEAL Model
Too many secondary effects are neglected in this model
In Cut-off region Ids = 0
In Linear Region, Ids depends on
 How much charge is in the channel?
 How fast is the charge moving?
Channel Charge
 MOS structure looks like parallel plate capacitor while
operating in inversion
Gate – oxide – channel
Carrier Velocity
• Charge is carried by electron in NMOS
• Carrier velocity v is proportional to lateral E-field between source and drain
•
•
• Time for the carriers to cross the channel
NMOS Linear IV
• NOW, we know
• How much charge is in the channel (QChannel)
• How much time each carrier takes to cross the channel
NMOS Saturation IV
• When Vgd < Vth channel pinches off at the drain region
• This condition is written as Vds > Vdsat = Vgs – Vth
• Now the drain source voltage no longer causes increase in current
NMOS IV Characterisitcs
0
1
2
3
4
5
6
0 0.5 1 1.5 2 2.5
Ids = 0 Vgs < Vth
Cutoff region
Linear/ Resistive region
Vgs > Vth
Vds < Vdsat
Saturation region
Vgs > Vth
Vds > Vdsat
Problems
• For the circuit shown, use the the NMOS equations to find Id and Vds
• For the NMOS, VTH = 1.5V and β = 1 mA/V2
Problems
• For the circuit shown, use the the NMOS equations to find Id and Vds
• For the NMOS, VTH = 1.5V and β = 1 mA/V2
Problems
For the circuit shown, use the the NMOS equations to find Id and Vds
For the NMOS, VTH = 1.5V and β = 0.5 mA/V2
Problems
• For the circuit shown, use the the NMOS equations to find Id and Vds
• For the NMOS, VTH = 1V and β = 1 mA/V2
Problems
For the circuit shown, use the the NMOS equations to find Id and Vds
For the NMOS, VTH = 1.5V and β = 0.5 mA/V2
Problems
• Design the circuit at right (by choosing β for the NMOS and the value
of RD) so that ID = 10 mA and VDS = 0.2 V. The NMOS has VT = 1 V.
How much power is being dissipated in the resistor and the
NMOS?
nMOS Inverter with resistive pull up
• The sharpness of the transfer characteristic
increases with increasing load
• Logic 0 level for a high input decreases with
increasing load
NOTE: Look at the Ltspice simulation for more
clarity
nMOS inverter with diode load
• The sharpness of the transfer characteristic
increases with increasing W/L ratio of the load
transistor
• Logic 0 level for a high input decreases with
increasing W/L ration
NOTE: Look at the Ltspice simulation for more
clarity
CMOS Inverter properties
• Full rail to rail swing
• Low output impedance
• Extremely high input impedance
• Large Fanout
• No direct path from VDD to GND which leads to LOW POWER
CMOS inverter Static Behaviour
0
0.5
1
1.5
2
2.5
0 0.5 1 1.5 2 2.5
VIn
Vout
NMOS off
PMOS res
NMOS sat
PMOS res
NMOS sat
PMOS sat
NMOS res
PMOS sat NMOS res
PMOS off
VM
Transient Behaviour
Vin = 0
Low to High Transition
Propagation Delay α Rp Cout
Vin = 1
HIGH to Low Transition
Propagation Delay α Rn Cout
Transient Behaviour
• How can we build a faster inverter?
Keeping the Output capacitance small
Decreasing ON resistance of the transistor
ON resistance decreases with increasing W/L ratio of the transistor
Transient Behaviour
• When Both PMOS and NMOS are symmetric, VM = VDD/2
• Symmetrical when W/L of PMOS is roughly twice that of NMOS
• This is because the mobility of electrons is roughly twice that of holes
• The inverter can be skewed to be either high or low
• Note: Look into the CMOS inverter characteristics file for better
understanding
Delay Definitions
t
Vin
input
waveform
Vout
output
waveform
t
Vin Vout
50%
tpHL
50%
tf
tpLH
90%
10%
tr
tp = (tpHL + tpLH)/2
Propagation delay
CMOS Layout
CMOS Inverter Layout
CMOS Inverter Stick Diagram
Scaling
• Technology shrinks by 0.7 times every generation
• With every generation we can integrate 2x more functionality
• Cost of a function decreases by 2x
• There is a need for better design
Supply Voltage Scaling
• Continuing technology scaling forces the supply voltages to reduce at
rates similar to device dimensions
• For example 180 nm  1.8 V and for 90 nm  1.1 V
• How does it affect CMOS inverter ?
• Reducing VDD improves transition region gain
• But gain degrades for very low supply voltages
0
0.5
1
1.5
2
2.5
0 0.5 1 1.5 2 2.5
0
0.05
0.1
0.15
0.2
0 0.05 0.1 0.15 0.2
Lambda based design rules
• Layouts allow translation of circuits into actual geometry on silicon
• Layout act as interface between circuit designer and fabrication
engineer
• Design rules define ranges for features
• Minimum space between two metals to avoid short circuit
• Minimum overlap to ensure complete overlap
Design Rules
• Design rules have two major approaches
• Micron rules
• Absolute dimensions are discussed
• Lambda rules
• Depend on a single parameter λ
• λ is usually 0.5 times minimum drawn transistor length
• Advantage of Lambda rules is design rules can be scaled based on λ
• Widely accepted
Rules for metal layer
• Metal layers should have a minimum width and spacing of 4λ
Rule for diffusion layers
• Diffusion layers should have a minimum width and spacing of 4λ
Rules for polysilicon layer
• Polysilicon to have a minimum width of 2λ
• Minimum spacing between two polys must be 3λ
Rules for contacts
• Contacts must be 2λ by 2λ and should be surrounded by 1λ on the
layers above and below
Rule for spacing between contacts
• Contacts must have a spacing of 3λ from each other
CKV
0
0.5
1
1.5
2
2.5
0 0.5 1 1.5 2 2.5
Vout (V)
X 10-4
Vin = 1.0V
Vin = 1.5V
Vin = 2.0V
Vin = 2.5V
Vin = 0V
Vin = 0.5V
Vin = 1.0V
Vin = 1.5V
Vin = 0.5V
Vin = 2.0V
Vin = 2.5V
Vin = 2V
Vin = 1.5V
Vin = 1V
Vin = 0.5V
Vin = 0V
PMOS NMOS
0.25um, W/Ln = 1.5, W/Lp = 4.5, VDD = 2.5V, VTn = 0.4V, VTp = -0.4V
CMOS Inverter VTC
Noise Margin
Noise Margin dictates the amount of noise a gate
can withstand before it does not recognise the
input
Noise Margin
Latch Up in CMOS
• Latchup refers to short circuit formed between
power and ground rails in an IC leading to high
current and damage to the IC
• This is due to interaction between parasitic pnp and
npn transistors.
• These form a +ve feedback loop, short circuit the
power rail and ground rail, which eventually causes
excessive current, and can even permanently
damage the device
Latch Up in CMOS
• Q1 is double emitter pnp transistor whose base is formed by n well
substrate of PMOS, two emitters are formed by source and drain
terminal of PMOS and collector is formed by substrate(p type) of
NMOS.
Latch Up in CMOS
Q2 is double emitter npn transistor whose base is formed by p-
substrate, two emitters are formed by source and drain terminal
of NMOS and collector is formed by substrate(N Well) of PMOS
Latch Up in CMOS
• Collector current of one transistor Q1 is fed as input base current to
another transistor Q2
• Collector current of Q2, Ic2 = β2 * Ib2
• This collector current Ic2 is fed as input base current Ib1 to transistor
Q1
• In this way both transistors feedback each other and the collector
current of each goes on multiplying.
Latch Up in CMOS
• If β1 *β2 >=1, both transistors will conduct a high saturation
current
• This current eventually becomes so large that it may damage the
device.

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VLSI_MOS.pptx

  • 1. VLSI Design Dr. Vijay Rao Kumbhare Assistant Professor (ECE) K L University, Hyderabad Session Outcome: 1 Remember the IC era and Understand the MOS transistor analysis Session No. 03 22-12-2022 1 24-04-2023
  • 2. Integrated Circuit • IC • Integrated circuit 2 24-04-2023 • ICs have three key advantages over digital circuits built from discrete components Small size ICs are much smaller. High speed Communication within a chip is faster. Low power consumption Logic operations within a chip take much less power
  • 3. Device Physics Device Electronics Two-Transistor Circuits (Inverters) Combinational and Sequential Circuits Regular Structures ROMs, RAMs, PLAs VLSI Sub-Systems, Adders, Multipliers System-Related Issues, Reliability, Manufacturability, Testability Increasing Complexity 3 24-04-2023
  • 4. Introduction to VLSI Design VLSI Design Analog MOS Mirror and Steering MOS Cascade and Cascode OPAMP Amplifier Feedback Digital Static Design Conventional Static CMOS Logic Ratioed Logic Transmission Gate Logic Pass Transistor Dynamic Design Domino logic np-CMOS 4 24-04-2023
  • 5. 5 Design Abstraction Levels System Requirements Architecture Definition and Logic Design VLSI Design and Layout Design Verification Pass Mask Generation Silicon Processing To: Wafer Testing Packaging and Reliability Qualification Design Rule Checking and Circuit Simulation (SPICE) Technology, Design Rules, Device Models Fail 24-04-2023
  • 6. Levels of Design • Specifications • IO, Goals and Objectives, Function, Costs • Architectural Description • VHDL, Verilog, Behavioral, Large Blocks • Logic Design • Gates plus Registers • Circuit Design • Transistors sized for power and speed • Discrete Logic, Technology Mapping • Layout • Size, Interconnect, Parasitic 6 24-04-2023
  • 11. Fabrication • nMOS - Early process with which only nMOS transistors could be fabricated 11 24-04-2023 • pMOS - Similar to nMOS process, but only pMOS transistors could be fabricated • CMOS - Complementary Metal Oxide Semiconductor process with which both pMOS and nMOS could be fabricated on the same substrate
  • 12. CMOS FABRICATION PROCESS • The CMOS fabrication process involves both pMOS and nMOS transistors 12 24-04-2023 • An inverter is taken as an example to explain the CMOS process • An inverter contains both pMOS and nMOS transistors
  • 13. BASIC MOS TRANSISTORS (a) nMOS Enhancement mode transistor (b) nMOS depletion mode transistor FIGURE 1 MOS transistors (V0 = 0 V. Source gate and substrate to 0 V). 13 24-04-2023
  • 15. MOS Capacitor Vg < 0 When a negative voltage is applied to the gate Accumulation
  • 16. MOS Capacitor Vg > 0 Depletion When a small positive voltage is applied to the gate Depletion
  • 17. MOS Capacitor 0 > Vg > Vth Inversion When a positive voltage above threshold voltage is applied to the gate Channel
  • 18. NMOS Transistor Vgs = 0 NO Channel, Ids = 0 CUT-OFF
  • 20. NMOS Transistor • The formation of channel does not guarantee a drain to source current Ids • Following the Ohm’s law, there has to be a potential difference between drain and source so that current flows • Therefore for Ids to flow, Vds > 0 Vgs >Vth
  • 21. Shape of the channel • If Vgs > Vth then channel is formed and symmetric • In this case there is no current flow because Vds = 0
  • 22. Shape of the channel Vgs > Vth CHANNEL SYMMETRIC
  • 23. Shape of the channel • If Vgs > Vth, then channel is formed and has a trapezoidal shape • In this case, Ids > 0 because Vds > 0 • Under these conditions NMOS is said to be in ohmic/linear region
  • 24. Shape of the channel Vgs > Vth, then channel is formed and has a Trapezoidal shape Transistor in Ohmic/Linear Region
  • 25. Shape of the channel • If Vgs > Vth, then channel is formed but it is pinched off at the drain • Under these conditions NMOS is said to be at the edge of saturation region
  • 26. Shape of the channel • If Vgs > Vth then channel is formed but it does not exist till the drain region • Under these conditions NMOS is said to be in the saturation region • Even without channel formed completely till the drain, the current flows from drain to source due to drift • In saturation region, Ids is independent of Vds
  • 27. Shape of the channel Vgs > Vth CHANNEL PINCHED OFF TRANSISTOR IN SATURATION REGION Vgs > Vth is usually written as Vds > Vgs - Vth
  • 28. IV Characteristics The IV Characteristics we derive now are from IDEAL Model Too many secondary effects are neglected in this model In Cut-off region Ids = 0 In Linear Region, Ids depends on  How much charge is in the channel?  How fast is the charge moving?
  • 29. Channel Charge  MOS structure looks like parallel plate capacitor while operating in inversion Gate – oxide – channel
  • 30. Carrier Velocity • Charge is carried by electron in NMOS • Carrier velocity v is proportional to lateral E-field between source and drain • • • Time for the carriers to cross the channel
  • 31. NMOS Linear IV • NOW, we know • How much charge is in the channel (QChannel) • How much time each carrier takes to cross the channel
  • 32. NMOS Saturation IV • When Vgd < Vth channel pinches off at the drain region • This condition is written as Vds > Vdsat = Vgs – Vth • Now the drain source voltage no longer causes increase in current
  • 33. NMOS IV Characterisitcs 0 1 2 3 4 5 6 0 0.5 1 1.5 2 2.5 Ids = 0 Vgs < Vth Cutoff region Linear/ Resistive region Vgs > Vth Vds < Vdsat Saturation region Vgs > Vth Vds > Vdsat
  • 34. Problems • For the circuit shown, use the the NMOS equations to find Id and Vds • For the NMOS, VTH = 1.5V and β = 1 mA/V2
  • 35. Problems • For the circuit shown, use the the NMOS equations to find Id and Vds • For the NMOS, VTH = 1.5V and β = 1 mA/V2
  • 36. Problems For the circuit shown, use the the NMOS equations to find Id and Vds For the NMOS, VTH = 1.5V and β = 0.5 mA/V2
  • 37. Problems • For the circuit shown, use the the NMOS equations to find Id and Vds • For the NMOS, VTH = 1V and β = 1 mA/V2
  • 38. Problems For the circuit shown, use the the NMOS equations to find Id and Vds For the NMOS, VTH = 1.5V and β = 0.5 mA/V2
  • 39. Problems • Design the circuit at right (by choosing β for the NMOS and the value of RD) so that ID = 10 mA and VDS = 0.2 V. The NMOS has VT = 1 V. How much power is being dissipated in the resistor and the NMOS?
  • 40. nMOS Inverter with resistive pull up • The sharpness of the transfer characteristic increases with increasing load • Logic 0 level for a high input decreases with increasing load NOTE: Look at the Ltspice simulation for more clarity
  • 41. nMOS inverter with diode load • The sharpness of the transfer characteristic increases with increasing W/L ratio of the load transistor • Logic 0 level for a high input decreases with increasing W/L ration NOTE: Look at the Ltspice simulation for more clarity
  • 42. CMOS Inverter properties • Full rail to rail swing • Low output impedance • Extremely high input impedance • Large Fanout • No direct path from VDD to GND which leads to LOW POWER
  • 43. CMOS inverter Static Behaviour 0 0.5 1 1.5 2 2.5 0 0.5 1 1.5 2 2.5 VIn Vout NMOS off PMOS res NMOS sat PMOS res NMOS sat PMOS sat NMOS res PMOS sat NMOS res PMOS off VM
  • 44. Transient Behaviour Vin = 0 Low to High Transition Propagation Delay α Rp Cout Vin = 1 HIGH to Low Transition Propagation Delay α Rn Cout
  • 45. Transient Behaviour • How can we build a faster inverter? Keeping the Output capacitance small Decreasing ON resistance of the transistor ON resistance decreases with increasing W/L ratio of the transistor
  • 46. Transient Behaviour • When Both PMOS and NMOS are symmetric, VM = VDD/2 • Symmetrical when W/L of PMOS is roughly twice that of NMOS • This is because the mobility of electrons is roughly twice that of holes • The inverter can be skewed to be either high or low • Note: Look into the CMOS inverter characteristics file for better understanding
  • 51. Scaling • Technology shrinks by 0.7 times every generation • With every generation we can integrate 2x more functionality • Cost of a function decreases by 2x • There is a need for better design
  • 52. Supply Voltage Scaling • Continuing technology scaling forces the supply voltages to reduce at rates similar to device dimensions • For example 180 nm  1.8 V and for 90 nm  1.1 V • How does it affect CMOS inverter ? • Reducing VDD improves transition region gain • But gain degrades for very low supply voltages 0 0.5 1 1.5 2 2.5 0 0.5 1 1.5 2 2.5 0 0.05 0.1 0.15 0.2 0 0.05 0.1 0.15 0.2
  • 53. Lambda based design rules • Layouts allow translation of circuits into actual geometry on silicon • Layout act as interface between circuit designer and fabrication engineer • Design rules define ranges for features • Minimum space between two metals to avoid short circuit • Minimum overlap to ensure complete overlap
  • 54. Design Rules • Design rules have two major approaches • Micron rules • Absolute dimensions are discussed • Lambda rules • Depend on a single parameter λ • λ is usually 0.5 times minimum drawn transistor length • Advantage of Lambda rules is design rules can be scaled based on λ • Widely accepted
  • 55. Rules for metal layer • Metal layers should have a minimum width and spacing of 4λ
  • 56. Rule for diffusion layers • Diffusion layers should have a minimum width and spacing of 4λ
  • 57. Rules for polysilicon layer • Polysilicon to have a minimum width of 2λ • Minimum spacing between two polys must be 3λ
  • 58. Rules for contacts • Contacts must be 2λ by 2λ and should be surrounded by 1λ on the layers above and below
  • 59. Rule for spacing between contacts • Contacts must have a spacing of 3λ from each other
  • 60. CKV 0 0.5 1 1.5 2 2.5 0 0.5 1 1.5 2 2.5 Vout (V) X 10-4 Vin = 1.0V Vin = 1.5V Vin = 2.0V Vin = 2.5V Vin = 0V Vin = 0.5V Vin = 1.0V Vin = 1.5V Vin = 0.5V Vin = 2.0V Vin = 2.5V Vin = 2V Vin = 1.5V Vin = 1V Vin = 0.5V Vin = 0V PMOS NMOS 0.25um, W/Ln = 1.5, W/Lp = 4.5, VDD = 2.5V, VTn = 0.4V, VTp = -0.4V CMOS Inverter VTC
  • 61. Noise Margin Noise Margin dictates the amount of noise a gate can withstand before it does not recognise the input
  • 63. Latch Up in CMOS • Latchup refers to short circuit formed between power and ground rails in an IC leading to high current and damage to the IC • This is due to interaction between parasitic pnp and npn transistors. • These form a +ve feedback loop, short circuit the power rail and ground rail, which eventually causes excessive current, and can even permanently damage the device
  • 64. Latch Up in CMOS • Q1 is double emitter pnp transistor whose base is formed by n well substrate of PMOS, two emitters are formed by source and drain terminal of PMOS and collector is formed by substrate(p type) of NMOS.
  • 65. Latch Up in CMOS Q2 is double emitter npn transistor whose base is formed by p- substrate, two emitters are formed by source and drain terminal of NMOS and collector is formed by substrate(N Well) of PMOS
  • 66. Latch Up in CMOS • Collector current of one transistor Q1 is fed as input base current to another transistor Q2 • Collector current of Q2, Ic2 = β2 * Ib2 • This collector current Ic2 is fed as input base current Ib1 to transistor Q1 • In this way both transistors feedback each other and the collector current of each goes on multiplying.
  • 67. Latch Up in CMOS • If β1 *β2 >=1, both transistors will conduct a high saturation current • This current eventually becomes so large that it may damage the device.

Editor's Notes

  1. or equivalently Vgs > Vgd
  2. and Vgs = Vgd, In a MOS transistor, the channel shape is a function of two voltages: Vgs and Vgd
  3. and Vgs = Vgd
  4. Vgd In a MOS transistor, the channel shape is a function of two voltages: Vgs and Vgd
  5. Vgd >
  6. and Vgd = Vth In a MOS transistor, the channel shape is a function of two voltages: Vgs and Vgd
  7. and Vgd < Vth,
  8. and Vgd < Vth and Vgd < Vth