Microcracks in photovoltaic modules were studied to understand their effect on power output. Various crack detection techniques were examined including optical transmission, infrared ultrasound lock-in thermography, and electroluminescence imaging. Cracks were classified based on orientation and effects. While small cracks may not impact power initially, as cracks grow and become Mode B or C, power loss increases due to reduced active cell area. The conclusion is that silicon wafer cracks can cause up to 2.5% power loss if electrical connection is maintained, and modules can tolerate up to 8% loss of cell active area before impacting output.